(19)
(11) EP 3 377 876 A1

(12)

(43) Date of publication:
26.09.2018 Bulletin 2018/39

(21) Application number: 16795052.6

(22) Date of filing: 14.11.2016
(51) International Patent Classification (IPC): 
G01N 21/27(2006.01)
C12Q 1/68(2018.01)
G01N 33/58(2006.01)
G01N 15/10(2006.01)
(86) International application number:
PCT/EP2016/077540
(87) International publication number:
WO 2017/084998 (26.05.2017 Gazette 2017/21)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME
Designated Validation States:
MA MD

(30) Priority: 16.11.2015 WO PCT/EP2015/194657

(71) Applicant: QIAGEN Instruments AG
8634 Hombrechtikon (CH)

(72) Inventors:
  • TIEDTKE, Hans-Jürgen
    8634 Hombrechtikon (CH)
  • QUINTEL, Harald, Horst
    8266 Steckborn (CH)
  • BLANDEAU, Rémy
    8645 Jona (CH)

(74) Representative: Banse & Steglich Patentanwälte PartmbB 
Patentanwaltskanzlei Herzog-Heinrich-Straße 23
80336 München
80336 München (DE)

   


(54) CALIBRATION PROBE AND METHOD FOR CALIBRATING AN ELECTRONIC DEVICE