(19)
(11) EP 3 405 855 A1

(12)

(43) Date of publication:
28.11.2018 Bulletin 2018/48

(21) Application number: 17703561.5

(22) Date of filing: 23.01.2017
(51) International Patent Classification (IPC): 
G06F 3/041(2006.01)
 G06F 3/044(2006.01)
(86) International application number:
PCT/US2017/014497
(87) International publication number:
WO 2017/127783 (27.07.2017 Gazette 2017/30)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME
Designated Validation States:
MA MD

(30) Priority: 21.01.2016 US 201662281573 P
20.01.2017 US 201715411621

(71) Applicant: Microchip Technology Incorporated
Chandler, AZ 85224-6199 (US)

(72) Inventor:
  • SHARMA, Attma
    Chandler Arizona 85226 (US)

(74) Representative: sgb europe 
Lechnerstraße 25a
82067 Ebenhausen
82067 Ebenhausen (DE)

   


(54) SENSING IMPEDANCE CHANGE IN THE LOCAL SPACE BETWEEN ELECTRODES