(19)
(11) EP 3 428 674 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
08.06.2022 Bulletin 2022/23

(45) Mention of the grant of the patent:
27.04.2022 Bulletin 2022/17

(21) Application number: 17191111.8

(22) Date of filing: 14.09.2017
(51) International Patent Classification (IPC): 
G01R 35/00(2006.01)
G01R 27/32(2006.01)
(52) Cooperative Patent Classification (CPC):
G01R 27/32; G01R 35/005

(54)

COMB SIGNAL GENERATOR, MEASURING DEVICE AND METHOD

KAMMSIGNALGENERATOR, MESSVORRICHTUNG UND VERFAHREN

GÉNÉRATEUR DE SIGNAL DE PEIGNE, DISPOSITIF DE MESURE ET PROCÉDÉ


(84) Designated Contracting States:
AL AT BE BG CY CZ DE DK EE ES FI FR GB GR HR HU IS IT LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

(30) Priority: 12.07.2017 US 201715648387

(43) Date of publication of application:
16.01.2019 Bulletin 2019/03

(73) Proprietor: Rohde & Schwarz GmbH & Co. KG
81671 München (DE)

(72) Inventor:
  • Leibfritz, Martin
    85653 Aying (DE)

(74) Representative: Rupp, Christian et al
Mitscherlich PartmbB Patent- und Rechtsanwälte Sonnenstraße 33
80331 München
80331 München (DE)


(56) References cited: : 
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US-A1- 2015 377 941
   
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  • BEN REJEB MARWEN ET AL: "Phase calibration for coherent multi-harmonic modulated signal measurements using nonlinear vector network analyzer", 2016 IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM (IMS), IEEE, 22 May 2016 (2016-05-22), pages 1-4, XP032941285, DOI: 10.1109/MWSYM.2016.7540261 [retrieved on 2016-08-10]
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  • HUANG JIANMING ET AL: "Wideband NVNA phase calibration based on multisine standards and phase alignment", 2016 IEEE INTERNATIONAL CONFERENCE ON MICROWAVE AND MILLIMETER WAVE TECHNOLOGY (ICMMT), IEEE, vol. 1, 5 June 2016 (2016-06-05), pages 201-203, XP033013846, DOI: 10.1109/ICMMT.2016.7761723 [retrieved on 2016-11-28]
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  • MOHAMMED EL YAAGOUBI ET AL: "Time-Domain Calibrated Measurements of Wideband Multisines Using a Large-Signal Network Analyzer", IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES, PLENUM, USA, vol. 55, no. 5, 1 May 2008 (2008-05-01), pages 1180-1192, XP011207324, ISSN: 0018-9480
  • REMLEY K A: "Practical applications of nonlinear measurements", MICROWAVE MEASUREMENT CONFERENCE, 2009. ARFTG '09. 73RD ARFTG, IEEE, PISCATAWAY, NJ, USA, 12 June 2009 (2009-06-12), pages 1-15, XP031540637, ISBN: 978-1-4244-3442-8
   
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