(19)
(11) EP 3 479 099 A1

(12)

(43) Date of publication:
08.05.2019 Bulletin 2019/19

(21) Application number: 17740541.2

(22) Date of filing: 30.06.2017
(51) International Patent Classification (IPC): 
G01N 21/31(2006.01)
G01J 3/45(2006.01)
 G01B 9/02(2006.01)
G01N 21/47(2006.01)
(86) International application number:
PCT/US2017/040325
(87) International publication number:
WO 2018/005987 (04.01.2018 Gazette 2018/01)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME
Designated Validation States:
MA MD

(30) Priority: 30.06.2016 IN 201641022596

(71) Applicant: General Electric Company
Schenectady, NY 12345 (US)

(72) Inventors:
  • BEKAL, Anish
    Bangalore Karnataka 560066 (IN)
  • SHARMA, Rachit
    Bangalore Karnataka 560066 (IN)
  • VARTAK, Sameer, Dinkar
    Bangalore Karnataka 560066 (IN)

(74) Representative: Illingworth-Law, William Illingworth 
GPO Europe GE International Inc. The Ark 201 Talgarth Road Hammersmith
London W6 8BJ
London W6 8BJ (GB)

   


(54) SYSTEMS AND METHODS FOR INTERROGATING PARAMETERS AT A PLURALITY OF LOCATIONS IN A SAMPLE