ATBE..DEDKESFRGBGRIT..LUNLSEMCPT..SILTLVFIROMKCYALTRBGCZEEHUPLSK..HRIS..MTNORS..SM..................JBDM Ver 2.0.24 - 2999001/03789778CORRECTED EUROPEAN PATENT SPECIFICATIONB8B120240117W184deBibliographieenBibliographyfrBibliographieEP19195852.9201909062020081020221205enenen2024011720240320210310202110202312062023492023060720240117202403G01R 31/28 20060101AFI20200309BHEP H04B 17/0085 20130101 FI20220616BHEP G01R 31/2822 20130101 LI20200303BHEP G01R 29/0892 20130101 LA20200303BHEP H04L 27/2626 20130101 LA20200430BHEP H04L 27/2602 20130101 LI20200430BHEP deVERFAHREN UND VORRICHTUNG ZUR ERZEUGUNG VON TESTSIGNALEN BEI VERSCHIEDENEN TRÄGERFREQUENZENenMETHOD AND DEVICE FOR GENERATING TEST SIGNALS AT DIFFERENT CARRIER FREQUENCIESfrPROCÉDÉ ET DISPOSITIF POUR GÉNÉRER DES SIGNAUX DE TEST À DIFFÉRENTES FRÉQUENCES PORTEUSESUS-A1- 2013 226 499US-A1- 2014 160 955US-A1- 2014 233 623US-A1- 2014 242 919Anritsu Anritsu: "IQproducer(TM) Operation Manual Second Edition", , 25 February 2019 (2019-02-25), XP055673062, Retrieved from the Internet: URL:https://dl.cdn-anritsu.com/en-au/test- measurement/files/Manuals/Operation-Manual /MG3710A/MX370113A_MX269913A_opm_e_2_0.pdfKeysight Keysight: "Keysight Technologies 5G Waveform Generation & Analysis Testbed, Reference Solution Solution Brochure 02 | Keysight | 5G Waveform Generation & Analysis Testbed, Reference Solution -Solution Brochure", , 28 August 2015 (2015-08-28), XP055673440, Retrieved from the Internet: URL:https://tekmarkgroup.com/eshop/image/c atalog/Application/K5G/5992-1030EN_5G_Wave form_Generation.pdfWinklhofer, MaxHelene-Mayer-Ring 1280809 MünchenDELorenzen, RolfDammerbauer Weg 1982024 TaufkirchenDEKrakowski, ClaudiuAm Töpferofen 985586 PoingDEHank, DanielHochriesstr. 981671 MünchenDERohde & Schwarz GmbH & Co. KG100209931P54564/EP Kf/niMühldorfstrasse 1581671 MünchenDERupp, Christianet al101434913Mitscherlich PartmbB Patent- und Rechtsanwälte Karlstraße 780333 MünchenDEALATBEBGCYCZDEDKEEESFIFRGBGRHRHUISITLTLULVMCMKMTNLNOPLPTRORSSESISKSMTR