| (84) |
Designated Contracting States: |
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AL AT BE BG CY CZ DE DK EE ES FI FR GB GR HR HU IS IT LT LU LV MC MK MT NL NO PL PT
RO RS SE SI SK SM TR |
| (43) |
Date of publication of application: |
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04.08.2021 Bulletin 2021/31 |
| (73) |
Proprietor: Rohde & Schwarz GmbH & Co. KG |
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81671 München (DE) |
|
| (72) |
Inventors: |
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- XIE, Feng
81671 München (DE)
- EICHLER, Taro
81671 München (DE)
|
| (74) |
Representative: Novagraaf Group |
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Chemin de l'Echo 3
1213 Onex / Geneva
1213 Onex / Geneva (CH) |
| (56) |
References cited: :
EP-A1- 2 772 862
US-A1- 2015 067 422
US-A1- 2018 026 737
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US-A- 5 115 672
US-A1- 2015 091 594
US-A1- 2019 246 299
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- TUN PYAE PHYO ET AL: "Brushless Synchronous Generator Turn-to-Turn Short Circuit Fault
Detection Using Multilayer Neural Network", 2018 ASIAN CONFERENCE ON ENERGY, POWER
AND TRANSPORTATION ELECTRIFICATION (ACEPT), IEEE, 30 October 2018 (2018-10-30), pages
1-8, XP033498107, DOI: 10.1109/ACEPT.2018.8610686 [retrieved on 2019-01-11]
- TIAN YIN ET AL: "A Review of Fault Diagnosis for Traction Induction Motor", 2018 37TH
CHINESE CONTROL CONFERENCE (CCC), TECHNICAL COMMITTEE ON CONTROL THEORY, CHINESE ASSOCIATION
OF AUTOMATION, 25 July 2018 (2018-07-25), pages 5763-5768, XP033415200, DOI: 10.23919/CHICC.2018.8484044
[retrieved on 2018-10-05]
- MANUEL J BARRAGÃ N ET AL: "Alternate Test of LNAs Through Ensemble Learning of On-Chip
Digital Envelope Signatures", JOURNAL OF ELECTRONIC TESTING ; THEORY AND APPLICATIONS,
KLUWER ACADEMIC PUBLISHERS, BO, vol. 27, no. 3, 6 January 2011 (2011-01-06), pages
277-288, XP019913375, ISSN: 1573-0727, DOI: 10.1007/S10836-010-5193-4
- GUO SHENG ET AL: "Integrating Laplacian Eigenmaps Feature Space Conversion into Deep
Neural Network for Equipment Condition Assessment", AUTOMATIC CONTROL AND COMPUTER
SCIENCES, ALLERTON PRESS, INC. NEW YORK, US, vol. 52, no. 6, 28 January 2019 (2019-01-28),
pages 465-475, XP036687263, ISSN: 0146-4116, DOI: 10.3103/S0146411618060056 [retrieved
on 2019-01-28]
|
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