(19)
(11) EP 3 904 869 B8

(12) CORRECTED EUROPEAN PATENT SPECIFICATION
Note: Bibliography reflects the latest situation

(15) Correction information:
Corrected version no 1 (W1 B1)

(48) Corrigendum issued on:
28.05.2025 Bulletin 2025/22

(45) Mention of the grant of the patent:
12.02.2025 Bulletin 2025/07

(21) Application number: 19901751.8

(22) Date of filing: 06.12.2019
(51) International Patent Classification (IPC): 
G01N 23/207(2018.01)
(52) Cooperative Patent Classification (CPC):
G01N 23/207; G01N 2223/056; G01N 2223/605
(86) International application number:
PCT/CN2019/123593
(87) International publication number:
WO 2020/134959 (02.07.2020 Gazette 2020/27)

(54)

DIFFRACTION DEVICE AND METHOD FOR NON-DESTRUCTIVE TESTING OF INTERNAL CRYSTAL ORIENTATION UNIFORMITY OF WORKPIECE

DIFFRAKTIONSVORRICHTUNG UND VERFAHREN ZUR ZERSTÖRUNGSFREIEN PRÜFUNG DER GLEICHMÄSSIGKEIT DER INNEREN KRISTALLAUSRICHTUNG VON WERKSTÜCKEN

DISPOSITIF DE DIFFRACTION ET PROCÉDÉ DE CONTRÔLE NON DESTRUCTIF D'UNIFORMITÉ DE L'ORIENTATION CRISTALLINE INTERNE D'UNE PIÈCE

(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR

(30) Priority: 28.12.2018 CN 201811621809

(43) Date of publication of application:
03.11.2021 Bulletin 2021/44

(73) Proprietor: The 59th Institute of China Ordnance Industry
Chongqing 400039 (CN)

(72) Inventors:
  • ZHENG, Lin
    Chongqing 400039 (CN)
  • DOU, Shitao
    Chongqing 400039 (CN)
  • HE, Changguang
    Chongqing 400039 (CN)
  • PENG, Zhengkun
    Chongqing 400039 (CN)
  • XIAO, Yong
    Chongqing 400039 (CN)
  • ZHANG, Lunwu
    Chongqing 400039 (CN)
  • ZHANG, Jin
    Chongqing 400039 (CN)
  • FENG, Xianhe
    Chongqing 400039 (CN)

(74) Representative: Lavoix 
Bayerstraße 83
80335 München
80335 München (DE)


(56) References cited: : 
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US-A1- 2010 111 255
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CN-A- 1 485 611
CN-A- 101 358 938
CN-A- 101 592 623
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  • MA CE ET AL: "A new nondestructive instrument for bulk residual stress measurement using tungsten k[alpha]1X-ray", REVIEW OF SCIENTIFIC INSTRUMENTS, AMERICAN INSTITUTE OF PHYSICS, 2 HUNTINGTON QUADRANGLE, MELVILLE, NY 11747, vol. 87, no. 11, November 2016 (2016-11-01), XP012213293, ISSN: 0034-6748, [retrieved on 20161101], DOI: 10.1063/1.4965972
  • HARDING ET AL: "X-ray diffraction imaging-A multi-generational perspective", APPLIED RADIATION AND ISOTOPES, ELSEVIER, OXFORD, GB, vol. 67, no. 2, February 2009 (2009-02-01), pages 287 - 295, XP025846513, ISSN: 0969-8043, [retrieved on 20080814], DOI: 10.1016/J.APRADISO.2008.08.006
   
Note: Within nine months from the publication of the mention of the grant of the European patent, any person may give notice to the European Patent Office of opposition to the European patent granted. Notice of opposition shall be filed in a written reasoned statement. It shall not be deemed to have been filed until the opposition fee has been paid. (Art. 99(1) European Patent Convention).