| (84) |
Designated Contracting States: |
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AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL
NO PL PT RO RS SE SI SK SM TR |
| (30) |
Priority: |
11.04.2019 US 201962832836 P 05.12.2019 US 201962944335 P
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| (43) |
Date of publication of application: |
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16.02.2022 Bulletin 2022/07 |
| (73) |
Proprietor: AMO Development, LLC |
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Irvine, CA 92618 (US) |
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| (72) |
Inventors: |
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- DEWEY, David A.
Santa Ana, CA 92705 (US)
- WILTBERGER, Michael
Santa Clara, CA 95050 (US)
- GOODING, Phillip
Mountain View, CA 94041 (US)
- SCHUELE, Georg
Portola Valley, CA 94028 (US)
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| (74) |
Representative: Carpmaels & Ransford LLP |
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One Southampton Row London WC1B 5HA London WC1B 5HA (GB) |
| (56) |
References cited: :
WO-A1-2014/172545 US-A1- 2014 135 920
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WO-A1-2019/133314 US-A1- 2018 008 462
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- HONGQIANG MA et al.: "A Simple Marker-Assisted 3D Nanometer Drift Correction Method
for Superresolution Microscopy", Biophysical Journal, vol. 112, no. 10 2017, pages
2196-2208, XP085033964, ISSN: 0006-3495, DOI: 10.1016/j.bpj.2017.04.025 Retrieved
from the Internet: URL:https://doi.org/10.1016/i.bpj.2017.04. 025
- "Raith e_LiNE Software Operation Manual", Mix & Match Exposure, 10 April 2005 (2005-04-10),
pages 1-116, XP055748843,
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