(19)
(11) EP 4 066 166 A1

(12)

(43) Date of publication:
05.10.2022 Bulletin 2022/40

(21) Application number: 20771681.2

(22) Date of filing: 28.08.2020
(51) International Patent Classification (IPC): 
G06N 3/04(2006.01)
G06N 5/04(2006.01)
G06N 5/02(2006.01)
 G06N 5/00(2006.01)
G06N 7/00(2006.01)
(52) Cooperative Patent Classification (CPC):
G06N 3/0445; G06N 5/045; G06N 7/005; G06N 5/003; G06N 5/02
(86) International application number:
PCT/US2020/048401
(87) International publication number:
WO 2021/137897 (08.07.2021 Gazette 2021/27)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME
Designated Validation States:
KH MA MD TN

(30) Priority: 30.12.2019 US 201962954727 P

(71) Applicant: Siemens Corporation
Iselin, NJ 08830 (US)

(72) Inventors:
  • VENUGOPALAN, Janani
    Plainsboro, New Jersey 08536 (US)
  • PATHAK, Sudipta
    Lawrence, New Jersey 08648 (US)
  • XIA, Wei
    Raritan, New Jersey 08869 (US)
  • SRIVASTAVA, Sanjeev
    Chantilly, Virginia 20152 (US)
  • RAMAMURTHY, Arun
    Plainsboro, New Jersey 08536 (US)

(74) Representative: Horn Kleimann Waitzhofer Patentanwälte PartG mbB 
Ganghoferstraße 29a
80339 München
80339 München (DE)

   


(54) BIAS DETECTION AND EXPLAINABILITY OF DEEP LEARNING MODELS