(19)
(11) EP 4 256 410 A1

(12)

(43) Date of publication:
11.10.2023 Bulletin 2023/41

(21) Application number: 21820295.0

(22) Date of filing: 18.11.2021
(51) International Patent Classification (IPC): 
G05B 19/418(2006.01)
H01L 21/67(2006.01)
(52) Cooperative Patent Classification (CPC):
H01L 21/67276; G05B 19/41875; G05B 2219/45031; G05B 2219/32201; G05B 2219/32187; G05B 2219/32188; G05B 2219/33002; G05B 2219/32194; G05B 2219/32191
(86) International application number:
PCT/FI2021/050784
(87) International publication number:
WO 2022/117912 (09.06.2022 Gazette 2022/23)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME
Designated Validation States:
KH MA MD TN

(30) Priority: 03.12.2020 FI 20206244

(71) Applicant: Elisa Oyj
00520 Helsinki (FI)

(72) Inventors:
  • SALMENKAITA, Jukka-Pekka
    00520 Helsinki (FI)
  • HEIKKILÄ, Rasmus
    00520 Helsinki (FI)

(74) Representative: Espatent Oy 
Kaivokatu 10 D
00100 Helsinki
00100 Helsinki (FI)

   


(54) MONITORING AND CONTROL OF A SEMICONDUCTOR MANUFACTURING PROCESS