| (84) |
Designated Contracting States: |
|
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL
NO PL PT RO RS SE SI SK SM TR |
| (43) |
Date of publication of application: |
|
27.03.2024 Bulletin 2024/13 |
| (73) |
Proprietor: Contemporary Amperex Technology
(Hong Kong) Limited |
|
Central, Central And Western District (HK) |
|
| (72) |
Inventors: |
|
- SHU, Annan
Ningde
Fujian 352100 (CN)
- JIANG, Guannan
Ningde
Fujian 352100 (CN)
- WANG, Zhiyu
Ningde
Fujian 352100 (CN)
|
| (74) |
Representative: Gong, Jinping |
|
CocreateIP
Neumarkterstr. 21
81673 München
81673 München (DE) |
| (56) |
References cited: :
CN-A- 110 889 838
CN-A- 111 199 213
CN-A- 112 766 110
CN-A- 114 283 310
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CN-A- 110 969 600
CN-A- 112 256 903
CN-A- 113 706 477
US-A1- 2016 224 892
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| |
|
|
- MAYR MARTIN ET AL: "Weakly Supervised Segmentation of Cracks on Solar Cells Using
Normalized Lp Norm", 2019 IEEE INTERNATIONAL CONFERENCE ON IMAGE PROCESSING (ICIP),
IEEE, 22 September 2019 (2019-09-22), pages 1885 - 1889, XP033647084, DOI: 10.1109/ICIP.2019.8803116
- FIORESI JOSEPH ET AL: "Automated Defect Detection and Localization in Photovoltaic
Cells Using Semantic Segmentation of Electroluminescence Images", IEEE JOURNAL OF
PHOTOVOLTAICS, IEEE, vol. 12, no. 1, 14 December 2021 (2021-12-14), pages 53 - 61,
XP011894841, ISSN: 2156-3381, [retrieved on 20211221], DOI: 10.1109/JPHOTOV.2021.3131059
- AHAN M R ET AL: "AI-assisted Cell-Level Fault Detection and Localization in Solar
PV Electroluminescence Images", PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON
EMERGING NETWORKING EXPERIMENTS AND TECHNOLOGIES, ACMPUB27, NEW YORK, NY, USA, 15
November 2021 (2021-11-15), pages 485 - 491, XP058777949, ISBN: 978-1-4503-9104-7,
DOI: 10.1145/3485730.3493455
- XIAO SHUHAO: "Application of Deep Learning in Surface Quality Detection", MACHINERY
DESIGN & MANUFACTURE, vol. 1, 1 January 2020 (2020-01-01), pages 288 - 292, XP093078413,
DOI: 10.19356/j.cnki.1001-3997.2020.01.072
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