(19)
(11) EP 4 371 059 A1

(12)

(43) Date of publication:
22.05.2024 Bulletin 2024/21

(21) Application number: 22842881.9

(22) Date of filing: 14.07.2022
(51) International Patent Classification (IPC): 
G06T 5/50(2006.01)
H04N 5/50(2006.01)
H04N 23/90(2023.01)
G06T 5/00(2006.01)
H04N 23/60(2023.01)
(52) Cooperative Patent Classification (CPC):
G06T 5/50; G06T 2207/20221; G02B 21/0016; G01N 21/8851; G01N 21/9501; G01N 2021/8887; G02B 21/367
(86) International application number:
PCT/US2022/037152
(87) International publication number:
WO 2023/287992 (19.01.2023 Gazette 2023/03)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA ME
Designated Validation States:
KH MA MD TN

(30) Priority: 14.07.2021 US 202117375229

(71) Applicant: Nanotronics Imaging, Inc.
Cuyahoga Falls, Ohio 44223 (US)

(72) Inventors:
  • LEE, Jonathan
    Cuyahoga Falls, OH 44223 (US)
  • LIMOGE, Damas
    Cuyahoga Falls, OH 44223 (US)
  • PUTMAN, Matthew, C.
    Cuyahoga Falls, OH 44223 (US)
  • PUTMAN, John, B.
    Cuyahoga Falls, OH 44223 (US)
  • MOSKIE, Michael
    Cuyahoga Falls, OH 44223 (US)

(74) Representative: Barker Brettell LLP 
100 Hagley Road Edgbaston
Birmingham, West Midlands B16 8QQ
Birmingham, West Midlands B16 8QQ (GB)

   


(54) SYSTEM, METHOD AND APPARATUS FOR MACROSCOPIC INSPECTION OF REFLECTIVE SPECIMENS