Field of the Invention
[0001] The present application relates to a driving circuit or a demodulation signal generator,
and more particularly, to a driving circuit or a demodulation signal generator capable
of driving flap pair to perform differential movement and consuming low power.
Background of the Invention
[0002] Speaker driver and back enclosure are two major design challenges in the speaker
industry. It is difficult for a conventional speaker to cover an entire audio frequency
band, e.g., from 20 Hz to 20 KHz. To produce high fidelity sound with high enough
sound pressure level (SPL), both the radiating/moving surface and volume/size of back
enclosure for the conventional speaker are required to be sufficiently large.
[0003] Ultrasonic air pulse generator has been investigated to produce air pulses or sound
overcoming the design challenges faced by conventional speakers. For ultrasonic air
pulse generator comprising capacitive actuator, high power consumption would be expected
when operating in ultrasonic rate, and not be welcome for portable or consumer electronic
device.
[0004] Therefore, how to design a driving circuit to drive the ultrasonic air pulse generator
which consumes low power is a significant objective in the field.
Summary of the Invention
[0005] The present invention therefore provides a demodulation signal generator for an air-pulse
generator, in order to improve over disadvantages of the prior art.
[0006] This is achieved by a demodulation signal generator according to independent claim
1. The dependent claims pertain to corresponding further developments and improvements.
[0007] As will be seen more clearly from the detailed description following below, a demodulation
signal generator coupled to an air-pulse generator comprises: a first node coupled
to a first flap and a second node coupled to a second flap; and a resonance circuit,
coupled to the first and second nodes, configured to produce a first demodulation
signal on the first node and a second demodulation signal on the second node. The
air-pulse generator comprises a film structure, the film structure comprises a flap
pair, and the flap pair comprises the first flap and the second flap. The resonance
circuit and the flap pair co-perform a resonance operation, such that the first demodulation
signal and the second demodulation signal are generated via the co-performed resonance
operation. The first and the second demodulation signals have opposite polarity. The
first flap receives the first demodulation signal and the second flap receives the
second demodulation signal, such that the flap pair performs a differential movement.
The differential movement is configured to form an opening to perform a demodulation
operation on a modulated air pressure variation generated by the film structure.
Brief Description of the Drawings
[0008]
FIG. 1 illustrates a schematic diagram of an air-pulse generator according to an embodiment
of the present application.
FIG. 2 illustrates wiring schemes according to embodiments of the present application.
FIG. 3 illustrates a schematic diagram of a demodulation signal generator according
to an embodiment of the present application.
FIG. 4 illustrates a schematic diagram of a demodulation signal generator according
to an embodiment of the present application.
FIG. 5 illustrates a timing diagram of the demodulation signal generator of FIG. 4.
FIG. 6 illustrates a schematic diagram of a demodulation signal generator according
to an embodiment of the present application.
FIG. 7 illustrates a timing diagram of the demodulation signal generator of FIG. 6.
FIG. 8 illustrates a schematic diagram of a demodulation signal generator according
to an embodiment of the present application.
FIG. 9 illustrates a schematic diagram of a detection-and-control circuit according
to an embodiment of the present application.
Detailed Description
[0009] In the present invention, the term "coupled to" may refer to direct or indirect connection.
"Component A being coupled to component B" may indicate that component A is directly
connected to component B, or component A is connected to component B via some component
C.
[0011] FIG. 1 illustrates an air-pulse generator (APG) 1 according to an embodiment of the
present application. The APG 1, which may be used in sound reproducing or cooling
application, comprises a film structure 10. The film structure 10 is configured to
perform a modulation operation to produce an ultrasonic acoustic/air wave UAW according
to a sound signal SS and configured to perform a demodulation operation to produce
an ultrasonic pulse array UPA according to the ultrasonic acoustic/air wave UAW. The
modulation operation is performed via a common-mode movement of the film structure
10 and the demodulation operation is performed via a differential-mode movement of
the film structure 10. After an inherent low pass filtering effect of natural/physical
environment and human hearing system, a sound corresponding to the sound signal SS
is reproduced.
[0012] As taught in No.
18/321,757, the film structure 10 comprises a flap pair 102. The flap pair 102 is actuated to
perform the common-mode movement to perform the modulation operation, which is to
produce the ultrasonic acoustic/air wave UAW. Meanwhile, the flap pair 102 is also
actuated to perform the differential-mode movement (or differential movement for brevity)
to perform the demodulation operation, which is to produce the ultrasonic pulse array
UPA, with a pulse rate (e.g., 192 KHz), according to the ultrasonic acoustic/air wave
UAW.
[0013] The flap pair 102 comprises the first flap 101 and the second flap 103. Both the
flaps 101 and 103 are coupled to a modulation signal generator 16 to receive a modulation
signal SM, to be actuated to perform the common-mode movement as well as the modulation
operation. On the other hand, the flaps 101 and 103 are coupled to a demodulation
signal generator 14 to receive a first demodulation signal +SV and a second demodulation
signal -SV, respectively. The demodulation signals +SV and -SV generally have opposite
polarity with respect to a certain level, such that the flaps 101 and 103 can perform
the differential-mode movement as well as the demodulation operation. Specifically,
the differential-mode movement is configured to form an opening 112 (shown in FIG.
2) to perform the demodulation operation on the modulated air wave or pressure variation
UAW generated by the film structure 10, or the flap pair 102.
[0014] The modulation signal SM has a modulation frequency, and the modulation frequency
is the pulse rate (e.g., 192 KHz). The demodulation signal +SV/-SV has a demodulation
frequency. Due to the differential-mode movement of the flap pair, the demodulation
frequency may be half of the pulse rate or half of the modulation frequency (e.g.,
96 KHz).
[0015] Detail wiring schemes between the APG and the (de)modulation signal generator are
illustrated in FIG. 2, where schemes 131-133 are shown. The APG 1 comprises a first
actuator 101A disposed on the flap 101 and a second actuator 103A disposed on the
second flap 103. The actuator 101A/103A comprises a top electrode and a bottom electrode.
In an embodiment, the actuator 101A/103A also comprises a piezoelectric layer which
may be made of PZT (lead zirconate titanate, which is capacitive), sandwiched between
the top and bottom electrodes. In an embodiment, the demodulation signal generator
may be coupled to one electrode of the actuator 101A/103A and the modulation signal
generator may be coupled to another electrode of the actuator 101A/103A. For example,
the demodulation signal generator may be coupled to a top electrode and the modulation
signal generator may be coupled to a bottom electrode of the actuator 101A/103A. In
an embodiment, the modulation and demodulation signal generators may be coupled to
at least one electrode of the actuator 101A/103A.
[0016] FIG. 3 illustrates a schematic diagram of the demodulation signal generator 14 according
to an embodiment of the present application. The demodulation signal generator can
be viewed as a driving circuit configured to drive the flap pair to perform the differential-mode
movement as well as the demodulation operation. In addition to having nodes N101 and
N103 for being coupled to the flaps 101 and 103, respectively, the demodulation signal
generator 14 generally comprises a resonance circuit 140. The demodulation signal
generator 14 produces the demodulation signal +SV to the flap 101 via the node N101
and produces the demodulation signal -SV to the flap 103 via the node N103. The resonance
circuit 140 and the flap pair 102 (the flaps 101 and 103) co-perform a resonance operation,
such that the demodulation signal +SV and -SV with opposite polarity are generated.
[0017] For example, FIG. 4 illustrates a schematic diagram of a demodulation signal generator
24 according to an embodiment of the present application. The demodulation signal
generator 24 comprises a resonance circuit 240, nodes N101, N103, and switches SW
1H, SW
1L, SW
2H, SW
2L. The resonance circuit 240 may be or comprise a swapping module 242. The swapping
module 242 comprises an inductor L and a switching unit SW
ER. In the embodiment shown in FIG. 4, the switching unit comprises a switch SW
ER1. The swapping module 242 is coupled between the nodes N101 and N103.
[0018] FIG. 5 illustrates a timing diagram of the demodulation signal generator 24. The
swapping module 242 is conducted during a conduction period, e.g., T12 or T21 shown
in FIG. 5. The demodulation signal +SV swaps from a high voltage level V
H to a low voltage level V
L after the conduction period T12, and the demodulation signal -SV swap from the low
voltage level V
L to the high voltage level V
H after the conduction period T12. Similarly, the demodulation signal +SV swaps from
the low voltage level V
L to the high voltage level V
H after the conduction period T21, and the demodulation signal -SV swap from the high
voltage level V
H to the low voltage level V
L after the conduction period T21. Therefore, the voltage level of the first demodulation
signal +SV and the voltage level of the second demodulation signal -SV swap after
the conduction period T12/T21. Meanwhile, the demodulation signal +SV and the demodulation
signal -SV can be viewed as having opposite polarities.
[0019] Referring to FIG. 4 and FIG. 5, the switches SW
1H and SW
1L are coupled to the node N101, while the switches SW
2H and SW
2L are coupled to the node N103. The switches SW
1H and SW
2H receive the high voltage V
H, while the switches SW
1L and SW
2L receive the low voltage V
L.
[0020] During the period T1 (before the conduction period T12), the switches SW
1H and SW
2L are conducted/ON and the switches SW
1L and SW
2H are cutoff/OFF, such that the demodulation signal +SV is at the high voltage V
H and the demodulation signal -SV is at the low voltage V
L. No current flows through the swapping module 242 and the switching unit SW
ER is OFF during the period T1.
[0021] During the period T2 (after the conduction period T12), the switches SW
1H and SW
2L are OFF and the switches SW
1L and SW
2H are ON, such that the demodulation signal +SV is at the low voltage V
L and the demodulation signal -SV is at the high voltage V
H. No current flows through the swapping module 242 and the switching unit SW
ER is OFF during the period T2.
[0022] During the conduction period T12, the switches SW
1H, SW
1L, SW
2H, SW
2L are OFF and the switching unit SW
ER is ON. An electric current is formed from the node N101 to the node N103, which causes
the demodulation signal +SV decreases and the demodulation signal -SV increases. Therefore,
electric energy stored in capacitance corresponding to the actuator 101A would be
transferred to capacitance corresponding to the actuator 103A.
[0023] During the conduction period T21, similarly, the switches SW
1H, SW
1L, SW
2H, SW
2L are OFF and the switching unit SW
ER is ON. An electric current is formed from the node N103 to the node N101, which causes
the demodulation signal +SV increases and the demodulation signal -SV decreases. Therefore,
electric energy stored in capacitance corresponding to the actuator 103A would be
transferred back to capacitance corresponding to the actuator 101A.
[0024] By the ON-OFF operation of the switches (meaning SW
1H, SW
1L, SW
2H, SW
2L and SW
ER1 in FIG. 4), the demodulation signal generator 24 can generate the demodulation signals
+SV and -SV with waveforms illustrated on top of FIG. 5. Note that, even the demodulation
signals +SV and -SV applied to capacitive actuators 101A and 103A comprises plenty
of transitions within periods T12/T21 while APG operating, power consumed by the flap
pair 102 and the demodulation signal generator 24 is low due to energy is recycled
back and forth between N101 and N103, with the help of the resonance circuit 240.
[0025] Applying the demodulation signals +SV and -SV to the flaps 101 and 103, the flap
pair 102 can perform the differential movement.
[0026] In the present application, the flap pair performing the differential movement refers
1) during a transient state/period, one flap moves toward a first direction and the
other flap moves toward a second direction opposite to the first direction; or 2)
during a steady state/period, one flap is actuated to bend upward and the other flap
is actuated to bend downward.
[0027] The differential movement by applying the demodulation signal generator 24 satisfies
both 1) and 2) stated in the above. Specifically, during the steady state period T1
shown in FIG. 5, the flap 101 receives the demodulation signal +SV as the high voltage
V
H and is actuated to bend upward and the flap 103 receives the demodulation signal
-SV as the low voltage V
L and is actuated to bend downward. During the steady state period T2, the flap 101
receives the demodulation signal +SV as low voltage V
L and is actuated to bend downward and the flap 103 receives the demodulation signal
-SV as high voltage V
H and is actuated to bend upward. During the transient period T12 between T1 and T2,
the flap 101 moves toward a -Z direction and the flap 103 moves towards a +Z direction,
which is opposite to the -Z direction.
[0028] Furthermore, during the conduction/transient/transition period T12/T21, the inductor
L within the resonance circuit 240 and capacitance of the piezoelectric layer within
the actuator 101A/103A would (co-)perform an LC (inductance-capacitance) resonance.
The LC resonance would conduct the current from N101 to N103 during the period T12
and conduct the current from N103 to N101 during the period T21.
[0029] FIG. 6 illustrates a schematic diagram of a demodulation signal generator 34 according
to an embodiment of the present application. The demodulation signal generator 34
is similar to the demodulation signal generator 24, and thus same components are denoted
as the same symbols. Different from the demodulation signal generator 24, the switching
unit SW
ER, within a swapping module 342 or a resonance circuit 340 of the demodulation signal
generator 34, further comprises a switch SW
ER2 coupled between the inductor L and the node N103, where the switches SW
ER1 and SW
ER2 form the switching unit SW
ER, and the inductor L and the switching unit SW
ER form the swapping module 342. In the present application, the switching unit SW
ER being ON refers both the switches SW
ER1 and SW
ER2 are ON, and the switching unit SW
ER being OFF refers at least one of the switches SW
ER1 and SW
ER2 is OFF.
[0030] In an embodiment, the switch SW
ER1/SW
ER2 may be realized by MOSFET (Metal-Oxide-Semiconductor Field-Effect Transistor) with
body diode BD1BD2, shown in a lower portion of FIG. 6. The switch SW
ER1/SW
ER2 is configured such that the body diode BD1BD2 is able to block current when the switch
SW
ER1/SW
ER2 is OFF. In an embodiment, an anode of the body diode BD1BD2 may be coupled to the
node N101/N103 and a cathode of the body diode BD1BD2 may be coupled to the inductor
L. In this case, the body diode BD1BD2 would prevent current flowing from inductor
L to N101/N103 when the switch SW
ER1/SW
ER2 is OFF.
[0031] For the two-switches swapping module 342, it does not have to turn both switches
OFF simultaneously at an end of the conduction period. Instead, given proper configuration
of body diodes, turning only one switch OFF at one time and at an end of the conduction
period T12/T21 is sufficient. For example, at the end of the conduction period T12,
where the demodulation signal +SV decreases and the demodulation signal -SV increases
therewithin (or voltage at the node N101 is less than voltage at the node N103 at
the end of the conduction period T12), the switch SW
ER1 is turned OFF and the switch SW
ER2 may remain ON. In this case, the body diode BD1 with configuration shown in FIG.
6 would block current from the inductor to the node N101. Similarly, at the end of
conduction period T21, the switch SW
ER2 is turned OFF and the switch SW
ER1 may remain ON.
[0032] Timing of the switches SW
ER1 and SW
ER2 may be referred to FIG. 7. Turning one switch (SW
ER1 or SW
ER2) at one time would reduce toggling rate of each switch, and thereby power consumption
of the switches within the swapping module 342 can be further reduced.
[0033] Note that, the switches SW
ER1 and SW
ER2 are not limited to being located on two sides of the inductor L, as shown in FIG.
6. In an embodiment, the switches SW
ER1 and SW
ER2 may be located on the same side of the inductor L (not shown), wherein the body diode
BD1/2 still can block current flowing therethrough when the switch SW
ER1/2 is OFF. As long as the switches SW
ER1 and SW
ER2 are coupled between the nodes N101 and N103, it is within the scope of the present
application.
[0034] In addition to the LC resonance exploited by the resonance circuit 240/340, CMOS(complementary
metal oxide semiconductor)-MEMS(micro electro mechanical systems) resonance/oscillation
may also be used to generate the demodulation signals ±SV.
[0035] FIG. 8 illustrates a schematic diagram of a demodulation signal generator 44 according
to an embodiment of the present application. The demodulation signal generator 44
comprises a resonance circuit 440, which may be or comprise a start-up circuit 442.
The resonance circuit 440 or start-up circuit 442 is coupled to the flaps 101 and
103 and exploits the resonance property of the flaps 101/103 to produce the demodulation
signal ±SV, which can be viewed as co-performing a resonance operation with the flap
pair 102. The start-up circuit 442 comprises a transimpedance amplifier 444, a detection-and-control
circuit 446 and a variable gain amplifier (VGA) 448.
[0036] The transimpedance amplifier 444 comprises a first input terminal coupled to the
flap 101 to receive a current i+ and comprises a second input terminal coupled to
the flap 103 to receive a current i-. The transimpedance amplifier 444 generates an
output signal Vo according to the currents i+ and i-. As FIG. 8 shows, the transimpedance
amplifier 444 comprises an operational amplifier, and feedback resistors and feedback
capacitors coupled between the input and output terminals.
[0037] The detection-and-control circuit 446 is coupled to the output terminal of the transimpedance
amplifier 444. The detection-and-control circuit 446 is configured to perform a detection
operation according to the signal Vo, where the detection operation may be an amplitude
detection, a phase detection, a frequency detection operation or a combination thereof.
[0038] The detection-and-control circuit 446 controls the VGA 448, so that the start-up
circuit 442, within a closed loop 46, would satisfy Barkhausen criterion, i.e., a
loop gain greater than or equal to 1 and a loop phase equal to 0 or integer multiple
of 2π. Therefore, the flap pair 102 and the resonance circuit 440 would co-perform
a CMOS-MEMS resonance/oscillation.
[0039] In an embodiment, the detection-and-control circuit 446 may comprises an amplitude
control circuit 4461 (shown in FIG. 9), such that the amplitude control circuit 4461
can control the VGA 448 to form an automatic gain control (AGC) loop, in order to
fulfill Barkhausen criterion.
[0040] In an embodiment, the detection-and-control circuit 446 may perform a frequency detection
operation to track a resonance frequency of the flap 101/103. The frequency detection
operation may be performed by applying a frequency-sweep test signal. In an embodiment,
the detection-and-control circuit 446 may comprise a phase lock loop (PLL) circuit
4462 (shown in FIG. 9). The PLL circuit 4462 is configured to perform the frequency
detection operation to track the resonance frequency of the flap 101/103 or the flap
pair 102.
[0041] In an embodiment, a loop filter (not shown in FIG. 8) may be included to avoid unwanted
oscillation.
[0042] The loop 46, formed by the flap pair 102 and the resonance circuit 440, would perform
a self-sustain oscillation operation. Under the self-sustain oscillation, the displacement
amount of the flap 101/103 can be amplified by Q-times. Note that, Q is the quality
factor of 101 and 103's mechanical resonant mode. Therefore, the input signal amplitude
of +SV and -SV can be reduced by Q-times to sustain wanted displacement, and the power
will be significantly reduced by Q
2 times.
[0043] Note that, FIG. 8 merely illustrates an embodiment of oscillation start-up circuit.
The demodulation signals +SV and -SV can be generated according to any kinds of oscillation
start-up circuit or frequency detection circuit, which is not limited thereto. As
long as resonance/oscillation between the flap pair and the resonance circuit is formed,
it is within the scope of the present application.
[0044] Furthermore, the demodulation signal generator 44 may comprise a phase shifter 41
coupled between the flap 101 and the flap 103. The phase shifter 41 configures a phase
difference between the demodulation signal +SV and the demodulation signal -SV to
be 180°, such that the demodulation signal +SV and -SV would have opposite polarity.
Applying the demodulation signals +SV and -SV to the flaps 101 and 103, the flap pair
102 can perform the differential movement, where the differential movement by applying
the demodulation signal generator 44 satisfies 1) stated in above paragraph.
[0045] In addition, the demodulation signal generator 44 may comprise a frequency multiplier
43, coupled to the start-up circuit 442 and receives an output signal of the start-up
circuit 442, denoted as SV_out. The frequency multiplier 43 is configured to double
the frequency of SV_out to generate an output signal SM_ref, such that the modulation
signal SM is generated according to the signal SM_ref, where a frequency of the output
signal SM_ref is twice of a frequency of the output signal SV_out, such that the demodulation
frequency would be half of the pulse rate or half of the modulation frequency when
the modulation frequency is the pulse rate.
[0046] Note that, the resonance operation co-performed by the resonance circuit 240/340
and the flap pair utilizes electrical resonance of components therein; while the resonance
operation co-performed by the resonance circuit 440 and the flap pair utilizes mechanical
resonance of components therein.
[0047] One of the most advantages of demodulation signal generator utilizing resonance to
generate demodulation signals ±SV is to reduce power consumption. The resonance operation
is not limited to the LC or CMOS-MEMS resonance stated in the above. Demodulation
signal generator with resonance circuit, exploiting any resonance to generate opposite
polarity demodulation signal generator, is within the scope of the present application.
[0048] In short, the present application utilizes the resonance circuit to co-perform the
resonance operation with the flap pair, so as to generate the demodulation signals
±SV with opposite polarity, where the resonance operation may be LC resonance or Barkhausen-fulfilled
CMOS-MEMS resonance.
1. A demodulation signal generator (14), coupled to an air-pulse generator (1),
characterized by comprising:
a first node (N101) coupled to a first flap (101) and a second node (N103) coupled
to a second flap (103); and
a resonance circuit (140), coupled to the first and second nodes (N101, N103), configured
to produce a first demodulation signal (+SV) on the first node (N101) and a second
demodulation signal (-SV) on the second node (N103);
wherein the air-pulse generator (1) comprises a film structure (10), the film structure
(10) comprises a flap pair (102), the flap pair (102) comprises the first flap (101)
and the second flap (103);
wherein the resonance circuit (140) and the flap pair (102) co-perform a resonance
operation, such that the first demodulation signal (+SV) and the second demodulation
signal (-SV) are generated via the co-performed resonance operation;
wherein the first and the second demodulation signals (+SV, -SV) have opposite polarity;
wherein the first flap (101) receives the first demodulation signal (+SV) and the
second flap (103) receives the second demodulation signal (-SV), such that the flap
pair (102) performs a differential movement;
wherein the differential movement is configured to form an opening (112) to perform
a demodulation operation on a modulated air pressure variation generated by the film
structure (10).
2. The demodulation signal generator (14) of claim 1,
characterized in that,
the air-pulse generator (1) comprises a first actuator (101A) disposed on the first
flap (101) and a second actuator (103A) disposed on the second flap (103);
the first actuator (101A) comprises a first electrode and the second actuator (103A)
comprises a second electrode;
the first node (N101) is coupled to the first electrode and the second node (N103)
is coupled to the second electrode;
the first actuator (101A) comprises a third electrode and the second actuator (103A)
comprises a fourth electrode; and
the third and the fourth electrodes receive a modulation signal (SM), such that the
flap pair (102) performs a common-mode movement to generate the modulated air pressure
variation.
3. The demodulation signal generator (14) of claim 1 or 2,
characterized in that,
the air-pulse generator (1) produces a plurality of air pulses at a pulse rate;
the plurality of air pulses is generated according to the modulated air pressure variation;
and
a demodulation frequency of the first demodulation signal (+SV) is a half of the pulse
rate.
4. The demodulation signal generator (24) of any of claims 1-3,
characterized in that,
the resonance circuit (240) comprises a swapping module (242);
the swapping module (242) is configured to be conducted during a conduction period
(T12, T21); and
a first voltage level (VH) of the first demodulation signal (+SV) and a second voltage level (VL) of the second demodulation signal (-SV) swap after the conduction period (T12, T21).
5. The demodulation signal generator (24) of claim 4,
characterized in that the swapping module (242) comprises an inductor (L) and a switching unit (SW
ER), coupled between the first node (N101) and the second node (N103);
wherein the demodulation signal generator (24) comprises a first switch (SW1H), a second switch (SW1L), a third switch (SW2H) and a fourth switch (SW2L);
wherein the first and second switches (SW1H, SW1L) are coupled to the first node (N101), and the third and fourth switches (SW2H, SW2L) are coupled to the second node (N103).
6. The demodulation signal generator (24) of claim 5,
characterized in that,
during a first period (T1) before the conduction period (T12), the first (SW1H) and the fourth (SW2L) switches are conducted and the second (SW1L) and the third (SW2H) switches are cutoff;
during a second period (T2) after the conduction period (T12), the first (SW1H) and the fourth (SW2L) switches are cutoff and the second (SW1L) and the third (SW2H) switches are conducted;
during the first period (T1) or during the second period (T2), the switching unit
(SWER) is cutoff;
the first and the third switches (SW1H, SW2H) receive a first voltage (VH); and
the second and the fourth switches (SW1L, SW2L) receive a second voltage (VL).
7. The demodulation signal generator (34) of any of claims 1-6, characterized in that the switching unit (SWER) comprises:
a fifth switch (SWER1) and a sixth switch (SWER2), coupled between the first node (N101) and the second node (N103).
8. The demodulation signal generator (34) of claim 7,
characterized in that,
the fifth switch (SWER1) comprises a first body diode (BD1) with a first anode coupled to the first node
(N101);
the sixth switch (SWER2) comprises a second body diode (BD2) with a second anode coupled to the second node
(N103);
during the conduction period (T12), the first demodulation signal (+SV) at the first
node (N101) decreases and the second demodulation signal (-SV) at the second node
(N103) increases;
at an end of the conduction period (T12), the first demodulation signal (+SV) is less
than the second demodulation signal (-SV), and the fifth switch (SWER1) is turned off;
at the end of the conduction period (T12), the sixth switch (SWER2) remains conducted;
during the first period (T1), the sixth switch (SWER2) is cutoff; and
during the second period (T2), the fifth switch (SWER1) is cutoff.
9. The demodulation signal generator (44) of any of claims 1-3,
characterized in that,
the resonance circuit (440) comprises a start-up circuit (442); and
an oscillation is produced by the start-up circuit (442) and the flap pair (102).
10. The demodulation signal generator (44) of claim 9,
characterized in that,
the start-up circuit (442) comprises a transimpedance amplifier (444);
the transimpedance amplifier (444) comprises a first input terminal coupled to the
first flap (101) and a second input terminal coupled to the second flap (103);
the transimpedance amplifier (444) is configured to receive a first current (i+) corresponding
to the first flap (101) and receives a second current (i-) corresponding to the second
flap (103);
the transimpedance amplifier (444) outputs a first output signal (Vo) according to
the first current (i+) and the second current (i-); and
the first and second demodulation signals (+SV, -SV) are generated according to the
first output signal (Vo) of the transimpedance amplifier (444).
11. The demodulation signal generator (44) of claim 10,
characterized in that the start-up circuit (442) further comprises
a detection-and-control circuit (446), coupled to an output terminal of the transimpedance
amplifier (444), and configured to perform a detection operation according to the
first output signal (Vo) of the transimpedance amplifier (444); and
a variable gain amplifier, VGA (448), controlled by the detection-and-control circuit
(446);
wherein the first demodulation signal (+SV) is generated according to a second output
signal of the variable gain amplifier (448).
12. The demodulation signal generator (44) of claim 11,
characterized in that,
the detection-and-control circuit (446) comprises an amplitude control circuit (4461);
and
an automatic gain control, AGC, loop is formed by the amplitude control circuit (4461)
and the VGA (448).
13. The demodulation signal generator (44) of claim 11 or 12, characterized in that the detection-and-control circuit (446) comprises a phase lock loop, PLL, circuit
(4462), configured to perform a frequency detection operation to track a resonance
frequency of the first flap (101).
14. The demodulation signal generator (44) of any of claims 10-13,
characterized in that the transimpedance amplifier (444) comprises:
an operational amplifier;
a feedback resistor coupled between an input terminal and an output terminal of the
operational amplifier; and
a feedback capacitor coupled between the input terminal and the output terminal of
the operational amplifier.
15. The demodulation signal generator (44) of any of claims 1-3 and 9-14,
characterized by further comprising:
a phase shifter (41), coupled to the first flap (101) and the second flap (103);
wherein the phase shifter (41) configures a phase difference between the first demodulation
signal (+SV) and the second demodulation signal (-SV) as 180°.
16. The demodulation signal generator (44) of any of claims 1-3 and 9-14,
characterized by further comprising:
a frequency multiplier (43), coupled to the start-up circuit (442) and receiving a
third output signal (SV_out) of the start-up circuit (442), configured to generate
a fourth output signal (SM_ref);
wherein a frequency of the fourth output signal (SM_ref) is twice of a frequency of
the third output signal (SV_out);
wherein a modulation signal (SM) is generated according to the fourth output signal
(SM_ref);
wherein the modulation signal (SM) is configured to drive the film structure (10),
such that the film structure (10) generates the modulated air pressure variation.