(19) |
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(11) |
EP 4 456 051 A3 |
(12) |
EUROPEAN PATENT APPLICATION |
(88) |
Date of publication A3: |
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01.01.2025 Bulletin 2025/01 |
(43) |
Date of publication A2: |
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30.10.2024 Bulletin 2024/44 |
(22) |
Date of filing: 26.04.2024 |
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(51) |
International Patent Classification (IPC):
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(84) |
Designated Contracting States: |
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AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT
NL NO PL PT RO RS SE SI SK SM TR |
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Designated Extension States: |
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BA |
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Designated Validation States: |
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GE KH MA MD TN |
(30) |
Priority: |
28.04.2023 KR 20230056014 12.07.2023 KR 20230090547
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(71) |
Applicant: Samsung Display Co., Ltd. |
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Yongin-si, Gyeonggi-do 17113 (KR) |
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(72) |
Inventors: |
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- KIM, Mingyu
Yongin-si, Gyeonggi-Do (KR)
- KIM, Seyun
Yongin-si, Gyeonggi-Do (KR)
- PARK, Seugnho
Yongin-si, Gyeonggi-Do (KR)
- YIM, Hyungwoo
Yongin-si, Gyeonggi-Do (KR)
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(74) |
Representative: Dr. Weitzel & Partner |
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Patent- und Rechtsanwälte mbB
Friedenstrasse 10 89522 Heidenheim 89522 Heidenheim (DE) |
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(54) |
INSPECTION SYSTEM FOR INSPECTING DISPLAY DEVICE, DISPLAY DEVICE FOR COMPENSATING FOR
DEFECTIVE PIXEL AND DEFECTIVE PIXEL COMPENSATION METHOD |
(57) An inspection system for inspecting a display device including pixels includes a
camera for capturing the display device and providing a sensing image signal and an
inspection device for receiving the sensing image signal and outputting a compensation
signal for compensating for luminance of a defective pixel. The inspection device
includes an image detector outputting a sensing input signal corresponding to the
sensing image signal, a defect coordinate detector detecting the defective pixel based
on the sensing input signal and outputting defect coordinates indicating a position
of the defective pixel, an image analyzer analyzing consistency of the defect coordinates
based on the sensing image signal and the sensing input signal and outputting final
coordinates, and a defect compensation calculator outputting a compensation signal
for adjusting luminance of compensation pixels adjacent to the defective pixel from
among the pixels based on the final coordinates.