TECHNICAL FIELD
[0001] The present disclosure relates to the field of pharmaceutical chemistry, specifically
to a crystal of 4'-substituted nucleoside, and a preparation method therefor, a composition
thereof and use thereof.
BACKGROUND
[0002] HIV infection causes the onset of AIDS. Since the first case of AIDS was discovered
in the United Stated in 1981, there have currently been approximately 39 million AIDS
patients in the world. AIDS has become a maj or threat to human health. The replication
of human immunodeficiency virus (HIV) is completed through processes such as adsorption,
invasion and uncoating, reverse transcription, and synthesis, assembly, release and
maturation of integrated viral RNA and proteins, etc. Each of these links could be
used as a target for HIV-inhibiting drugs. After more than 30 years of research, 40
HIV therapeutic drugs including combined drugs have been approved by the U.S. FDA
for clinical use. According to the mechanisms of action of these drugs, they can be
mainly divided into several categories such as nucleoside and non-nucleoside reverse
transcriptase inhibitors, protease inhibitors, invasion inhibitors, and integrase
inhibitors. These drugs are effective in inhibiting the HIV replication, but none
of them could cure AIDS. Moreover, after a period of treatment with these drugs, the
drug resistance of viruses will continue to develop, making the existing drug therapies
ineffective. Therefore, the combination of HIV inhibitors with different mechanisms
of action has become a standard strategy for treatment of AIDS. Nevertheless, even
if drugs are combined to treat AIDS, new drug resistance will emerge continuously.
Thus, there still remains a need to continue to search for AIDS therapeutic drugs
with new mechanisms of action. Additionally, to date, all AIDS therapeutic drugs have
to be taken at least once a day, and long-term medication has become a burden for
patients. Therefore, it is necessary to develop long-acting drugs for AIDS treatment.
[0003] 2'-Deoxynucleosides are the main class of HIV inhibitors used in clinical practice,
and they exert their drug effects by inhibiting reverse transcriptase. At present,
all the clinical nucleoside inhibitors for HIV are 3'-deoxynucleosides. Owing to the
absence of 3'-OH, the drug terminates the DNA elongation of HIV after embedded in
the DNA of HIV, thereby becoming a terminator of DNA synthesis of HIV and thus achieving
the effect of inhibiting the HIV replication. In recent years, nucleosides with 3'-OH,
such as compound (I) (C.A.
Stoddart et al Antimicrob. Agents Chemother. 2015, 59, 4190) and compound (II) (Q .
Wang et al Eur. J. Med .Chem. 2011, 46, 4178) have been successively reported to have significant inhibitory activities against
HIV Their structures are characterized by the presence of a large substituent at the
4'-position, such as the ethynyl group in compound (I) and the azide group in compound
(2). As a result of introduction of these large substituents, the nucleoside phosphates
are bound into the viral DNA, and then the elongation of viral DNA becomes slow or
terminates due to the steric hindrance effect, thereby fulfilling the purpose of inhibiting
the HIV replication.
[0004] Among adenine nucleosides, the introduction of 2-fluorine increases the HIV inhibitory
activity (EC
50 = 11 nM for EdA) of 4'-ethynyl-2'-deoxyadenosine (EC
50 = 0.05 nM for Compound 1, EFdA) by 2200 times (
E. Michailidis et al J. Biol. Chem. 2009, 284,35681).
[0005] The U.S. patent (
J. Chang US8835615, 2014) discloses the chemical structure of compound (3) (2R,3R,4S,5R)-5-(6-amino-2-fluoro-9H-purin-9-yl)-2-ethynyl-4-fluoro-2-(hydroxymethyl)tetrahydrofuran-3-ol.
Subsequently, the Chinese patent (
Junbiao CHANG, CN109893536 B, 2021) discloses the activity against HIV (EC
50 = 0.9 nM) and safety (without significant cytotoxicity within the tested dose range,
CC
50>8000 nM) of compound (3), and also discloses the crystal form A of compound (3).
The DSC and TGA studies have found that the molecular weight of the compound is 311.24,
and the weight loss of the crystal form A is 9.0% at 110°C, indicating that crystal
form A contains a solvated crystal of one molecule of methanol (theoretical methanol
content: 9.33%), and methanol will be lost upon heating.

Structures of Some Nucleoside Compounds under Research
SUMMARY
[0006] The present inventors have conducted intensive studies on the crystal form of the
compound (3) and found that compound (3) forms numerous crystal forms under different
conditions. However, a majority of crystal forms are unstable. The present inventors
have unexpectedly found the type XVIII crystal exhibits very excellent physical properties,
such as ease of preparation and stable crystal form, which is convenient for mass
production and quality control of drugs and is quite suitable as a crystal form of
compound (3) in the preparation of a drug.

[0007] In view of the foregoing, the present disclosure provides a type XVIII crystal of
a compound (3). The type XVIII crystal has characteristic peaks at diffraction angles
of 20 values = 9.325°, 15.787°, and 16.55° in an X-ray powder diffraction pattern
obtained by using Cu-Kα radiation, wherein the 20 values are allowed to vary within
an error range.
[0008] The data on diffraction peaks of the type XVIII crystal of compound (3) are as shown
in Table 1 below.
Table 1. XRPD Data on Type XVIII Crystal
Pos. [°2θ] |
Rel. Int. [%] |
9.325 |
27.9 |
15.787 |
14.4 |
16.55 |
31.6 |
[0009] The XRPD pattern of the type XVIII crystal is as shown in FIG. 3.
[0010] In another aspect, the present disclosure provides a method for preparing a type
XVIII crystal of compound (3), comprising: leaving a type XVI or XVII crystal at 40°C
to 160°C, preferably 60°C to 90°C, more preferably 60°C for 1 to 10 days, preferably
5 to 10 days, more preferably 1 day to obtain the type XVIII crystal; preferably,
the preparation step of the type XVI crystal comprises: suspending and stirring the
compound (3) in an ethanol/water mixed solvent at a volume ratio of 10:1-90, preferably
10:1-50, more preferably 10:1-20 for 1 to 72 h, preferably, 1 to 50 h, more preferably
10 to 40 h, more preferably 24 h, and filtering to obtain the type XVI crystal; preferably,
the type XVII crystal is obtained by heating the XVI crystal in a nitrogen atmosphere
to 40°C to 58°C, preferably 55°C and holding for appropriate time; or obtained by
vacuum drying the type XVI crystal at room temperature for 5 to 72 h, preferably 10
to 50 h, more preferably 24 h.
[0011] In another aspect, the present disclosure further provides a pharmaceutical composition,
comprising the type XVIII crystal of compound (3) described above and an optional
pharmaceutical excipient.
[0012] In another aspect, the present disclosure further provides use of a type XVIII crystal
of a compound (3), or the above-mentioned pharmaceutical composition comprising the
type XVIII crystal of the compound (3) and an optional pharmaceutical excipient in
the preparation of a pharmaceutical or pharmaceutical formulation for resisting HIV
or treating AIDS.
[0013] The present disclosure further provides a method for resisting HIV or treating AIDS,
comprising administering, to a subject, an anti-HIV or therapeutically effective dose
of a type XVIII crystal of a compound (3) or the above-mentioned pharmaceutical composition
comprising the type XVIII crystal of the compound (3) and an optional pharmaceutical
excipient.
Advantageous Effects of the Invention
[0014] The present inventors have prepared a myriad of crystal forms of compound (3), most
of which are unstable solid forms. The type XVIII crystal of compound (3) exhibits
excellent physical properties, such as ease of preparation and stable crystal form,
which facilitates mass production and quality control of drugs and suitable as the
crystal form of compound (3) in the drug preparation.
BRIEF DESCRIPTION OF THE DRAWINGS
[0015]
FIG. 1-1 shows the XRPD pattern of the type XVI crystal.
FIG. 1-2 shows the TGA/DSC diagram for type XVI crystal.
FIG. 1-3 shows the three-dimensional view of single-crystal X-ray diffraction molecules
of the type XVI crystal.
FIG. 2-1 shows the XRPD pattern of the type XVII crystal.
FIG. 2-2 shows the DCS-TGA diagram for the type XVII crystal.
FIG. 3 shows the XRPD pattern of the type XVIII crystal.
FIG. 4 shows the XRPD pattern of the type I crystal.
FIG. 5 shows the TGA/DSC diagram for the type I crystal.
FIG. 6 shows the XRPD comparison diagram before and after the type I crystal is heated
to 55°C.
FIG. 7 shows the XRPD pattern of the type I crystal when heated to 100°C.
FIG. 8 shows the XRPD pattern of the type II crystal.
FIG. 9 shows the XRPD pattern of the type IV crystal.
FIG. 10 shows the XRPD pattern of the type V crystal.
FIG. 11 shows the XRPD pattern of the type VI crystal.
FIG. 12 shows the XRPD pattern of the type VII crystal.
FIG. 13 shows the XRPD pattern of the type VIII crystal.
FIG. 14 shows the XRPD pattern of the type IX crystal.
FIG. 15 shows the XRPD pattern of the type X crystal.
FIG. 16 shows the XRPD pattern of the type XI crystal.
FIG. 17 shows the XRPD pattern of the type XII crystal.
FIG. 18 shows the XRPD pattern of the type XIII crystal.
FIG. 19 shows the XRPD comparison diagrams before and after coating and drying the
type XIII crystal.
FIG. 20 shows the XRPD pattern of the type XIV crystal.
FIG. 21 shows the XRPD pattern of the type XV crystal.
DETAILED DESCRIPTION
[0016] The present disclosure will be further illustrated below with reference to specific
experiments. It should be appreciated that these experiments are merely intended to
illustrate the present disclosure and are not intended to limit the scope of protection
for the present disclosure. Experimental methods for which no specific conditions
are indicated in the following experiments are generally carried out according to
conventional conditions or the conditions recommended by the manufacturers. Unless
otherwise defined, all professional and scientific terms used herein have the same
meanings as typically understood by technicians in the art. In addition, any methods
and materials similar or equivalent to those described herein may be applied to the
methods of the present disclosure. The preferred implementation methods and materials
as shown herein are for illustrative purposes only.
[0017] The starting materials used in the experiments of the present disclosure are known
and are commercially available, or may be synthesized by the methods known in the
art.
Experiment 1
Type XVI Crystal and Type XVII Crystal
[0018] Compound (3) was suspended and stirred for 24 h in an ethanol/water mixed solvent
(at a volume ratio of 8:2) and filtered to obtain the type XVI crystal. The XRPD pattern
was as shown in FIG. 1-1 and the DSC-TGA diagram was as shown in FIG. 1-2.
[0019] The single-crystal data on the type XVI crystal were as shown in Table 2.
Table 2. Single-Crystal Data on Type XVI Crystal
Labels |
001-40-1 (In Solvent) |
|
Test formula |
C12 H19 F2 N5 O7 |
|
Molecular weight |
383.32 |
|
Temperature |
296(2) K |
|
Wavelength |
1.54178 Å |
|
Crystal system |
Orthorhombic |
|
Space group |
P212121 |
|
Cell parameters |
a = 6.7413(7) Å |
a= 90°. |
|
b = 11.9385(13) Å |
b= 90°. |
|
c = 20.906(2) Å |
g = 90°. |
Volume |
16825(3) Å3 |
|
Z |
4 |
|
Density (calculated value) |
1.513 Mg/m3 |
|
[0020] The three-dimensional molecular view of the single-crystal X-ray diffraction of the
type XVI crystal was as shown in FIG. 1-3, indicating that each type XVI crystal contained
four waters of crystallization.
[0021] After vacuum drying at room temperature for 24 h, the type XVI crystal showed an
obvious dehydration phenomenon (weight loss: 14.39%), and transformed into a monohydrate
crystal form - type XVII crystal after losing three waters of crystallization. The
XRPD pattern was as shown in FIG. 2-1 and the DCS-TGA diagram was as shown in FIG.
2-2.
[0022] The type XVI crystal was heated to 55°C in a nitrogen atmosphere and held for 2 to
24 h. The XRPD pattern showed that the type XVII crystal was also obtained.
[0023] The type XVII crystal was dried at 90°C for 1 to 24 h and lost one molecule of water
(weight loss: 5.47%) to obtain the type XVIII crystal.
Experiment 2
Type XVIII Crystal
[0024] The type XVI crystal was left at 60°C for 5 days to obtain a type XVIII crystal,
which was an anhydrous crystal. The LC-MS detection and analysis showed that the crystal
did not undergo chemical changes.
[0025] The type XVIII crystal had characteristic peaks at diffraction angles of 2θ values
= 9.325°, 15.787°, and 16.55° in the X-ray powder diffraction pattern obtained by
using the Cu-Kα radiation, where the 20 values were allowed to vary within the error
range.
[0026] The data on diffraction peaks of the type XVIII crystal of compound (3) were as shown
in Table 1 above.
[0027] The XRPD pattern of the type XVIII crystal was as shown in FIG. 3.
Experiment 3
Stability of Type XVI Crystal, Type XVII Crystal and Type XVIII Crystal
[0028] The type XVI crystal and the type XVII crystal were left at 60±5°C for 5 days, respectively.
The XRPD pattern showed that both of them were transformed into the type XVIII crystals.
[0029] The type XVII crystal was left for 5 days under the conditions of 25°C and 92.5±5%
humidity. The XRPD pattern showed that the type XVI crystal was obtained.
[0030] The type XVIII crystal was heated to 150°C or left for 24 h under the conditions
of 25°C and 92.5±5% humidity. The XRPD pattern showed that the crystal form did not
change.
Experiment 4
Type I Crystal
[0031] The solid of compound (3) was dissolved in 2-MeTHF, and n-heptane was added dropwise
at room temperature and stirred for 4 h to precipitate a crystal. The crystal was
filtered and vacuum dried to obtain the type I crystal of compound (3). The XRPD pattern
was as shown in FIG. 4.
[0032] The type I crystal of compound (3) had characteristic peaks at diffraction angles
of 2θ values = 7.94°, 8.79°, 9.68°, 11.56°, 13.74°, 14.37°, 15.98°, 17.78°, 19.39°,
and 23.85° in an X-ray powder diffraction pattern obtained by using Cu-Kα radiation.
Table 3. XRPD Data on Type
I Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
7.94 |
79.23 |
8.79 |
44.33 |
9.68 |
100.00 |
11.56 |
11.92 |
13.74 |
11.45 |
14.37 |
51.34 |
15.98 |
12.22 |
17.78 |
4.68 |
19.39 |
33.41 |
23.85 |
35.60 |
[0033] The TGA/DSC diagram for the type I crystal of compound (3) was as shown in FIG. 5.
The crystal suffered from a weight loss of 13.2% when heated to 110°C, and a weight
loss of 3.5% when further heated to 200°C. Three endothermic signals occurred in the
range of 80°C to 140°C. The type I crystal was heated to 55°C under nitrogen protection
and then cooled to room temperature. The sample was removed and exposed to air to
test XRPD. The results were as shown in FIG. 6, where the upper curve was the original
diagram for the crystal form I, the middle curve was the XRPD pattern before heating,
and the lower curve was the XRPD pattern after heating to 55°C, showing that the diffraction
peak intensity of the sample was somewhat decreased. The NMR results showed that the
molar ratio of 2-MeTHF to API was 0.25:1.00 (6.5 wt%) after heating, and 2-MeTHF was
reduced by about 3.5 wt% compared to that before heating. After the type I crystal
was heated to 100°C under the same conditions of nitrogen protection, the XRPD results
were as shown in FIG. 7, showing that the crystal had been transformed into an amorphous
crystal. The NMR results showed that the molar ratio of 2-MeTHF to API was 0.09:1.00
(2.4 wt%) after heating, and 2-MeTHF was reduced by about 7.6 wt% compared to that
before heating.
Experiment 5
Type II Crystal
[0034] The solid of compound (3) was dissolved into 1,4-dioxane/DCM (1-5/10), and n-heptane
was added dropwise to the solution at room temperature and stirred for 4 h to precipitate
a crystal. The crystal was filtered and vacuum dried to obtain the type II crystal
of compound (3). The XRPD pattern was as shown in FIG. 8.
[0035] The type II crystal had characteristic peaks at diffraction angles of 20 values =
6.39°, 7.84°, 10.58°, 12.57°, 14.88°, 15.71°, 16.12°, 19.6°, 22.57°, 23.91°, and 30.62°
in an X-ray powder diffraction pattern obtained by using Cu-Kα radiation.
Table 4. XRPD Data on Type II Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
6.39 |
12.49 |
7.84 |
100.00 |
10.58 |
26.61 |
12.57 |
8.65 |
14.88 |
15.36 |
15.71 |
22.47 |
16.12 |
31.30 |
19.60 |
8.47 |
22.57 |
62.65 |
23.91 |
6.93 |
30.62 |
10.91 |
[0036] The type II crystal changed in the crystal form after vacuum drying at room temperature
for half an hour and transformed into a type III crystal. As the type II crystal was
unstable and had been transformed after dying for a short period of time, no further
studies were carried out on the type II crystal.
Experiment 6
Type IV Crystal
[0037] The solid of compound (3) was suspended and stirred in EtOH for 48 h at room temperature,
and filtered to obtain the type IV crystal. The XRPD pattern was as shown in FIG.
9.
[0038] The type IV crystal had characteristic peaks at diffraction angles of 20 values =
4.28°, 6.03°, 8.50°, 9.53°, 12.76°, 13.58°, 14.84°, 15.45°, 17.02°, 17.61°, 18.17°,
19.12°, 19.60°, 20.97°, 21.38°, 22.66°, 24.99°, 25.99°, 28.47°, 28.82°, 29.80°, 31.24°,
32.66°, and 36.78° in an X-ray powder diffraction pattern obtained by using Cu-Kα
radiation.
Table 5. XRPD Data on Type IV Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
4.28 |
11.98 |
6.03 |
38.66 |
8.50 |
11.78 |
9.53 |
41.18 |
12.76 |
100.00 |
13.58 |
37.85 |
14.84 |
10.63 |
15.45 |
6.39 |
17.02 |
8.33 |
17.61 |
9.35 |
18.17 |
24.53 |
19.12 |
7.80 |
19.60 |
9.64 |
20.97 |
28.26 |
21.38 |
11.19 |
22.66 |
604 |
24.99 |
21.87 |
25.99 |
904 |
28.47 |
6.38 |
28.82 |
8.04 |
29.80 |
11.07 |
31.24 |
5.98 |
32.66 |
4.22 |
36.78 |
1.46 |
[0039] After the type IV crystal was vacuum dried at room temperature for 15 min, decreased
relative intensity of the diffraction peaks could be observed. After the dried crystal
was left closed at room temperature for about 5 days, increased relative intensity
of the diffraction peaks and increased number of diffraction peaks could be observed.
The analysis showed that the type IV crystal might undergo solvent or water removal
during vacuum drying, and adsorb the moisture in the air upon contact with air, thereby
increasing the degree of crystallinity.
[0040] TGA showed that the type IV crystal was unstable at 120°C with the weight loss of
10.6%, which was a monohydrate crystal form. Under the conditions of nitrogen protection,
the type IV crystal was heated to 141°C and then tested for XRPD. The results showed
that the type IV crystal was transformed into a stable type III crystal at 141°C.
Experiment 7
Type V Crystal
[0041] The solid of compound (3) was suspended and stirred in EtOAc for 48 h at room temperature,
filtered, and vacuum dried at room temperature for 15 min to obtain the type V crystal.
The XRPD pattern was as shown in FIG. 10.
[0042] The type V crystal had characteristic peaks at diffraction angles of 20 values =
4.73°, 9.12°, 11.27°, 13.22°, 15.58°, 17.69°, 18.95°, 21.13°, 22.10°, 24.29°, 26.72°,
27.09°, 28.34°, 29.25°, and 31.76° in an X-ray powder diffraction pattern obtained
by using Cu-Kα radiation.
Table 6. XRPD Data on Type V Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
4.73 |
18.22 |
9.12 |
73.14 |
11.27 |
6.49 |
13.22 |
6.45 |
15.58 |
14.84 |
17.69 |
36.96 |
18.95 |
17.63 |
21.13 |
6.37 |
22.10 |
6.14 |
24.29 |
8.50 |
26.72 |
100.00 |
27.09 |
54.66 |
28.34 |
37.44 |
29.25 |
10.32 |
31.76 |
10.93 |
[0043] The TGA/DSC test results showed that the type V crystal suffered from a weight loss
of 15.4% when heated to 140°C, and a weight loss of 2.8% when further heated to 240°C.
Multiple thermal signals could be observed in the range of 77°C to 203°C. The NMR
results showed that the molar ratio of EtOAc to API was 0.40:1.00 (10.2 wt%).
[0044] The type V crystal was subjected to the variable-temperature XRPD test. A significant
decrease in degree of crystallinity was observed after the sample was purged with
nitrogen for about 20 min. The type V crystal was substantially transformed into an
amorphous crystal after heating to 90°C and 130°C under the nitrogen protection, and
transformed into another crystal after further heated to 154°C. Analyses of the NMR
and TGA results showed that the type V crystal was a solvate.
Experiment 8
Type VI Crystal
[0045] The solid of compound (3) was suspended and stirred in MIBK (methyl isobutyl ketone)
at room temperature for 48 h, filtered, and vacuum dried at room temperature for 15
min to obtain the type VI crystal. The XRPD was as shown in FIG. 11.
[0046] The type VI crystal had characteristic peaks at diffraction angles of 20 values =
5.01°, 5.62°, 7.62°, 8.98°, 9.67°, 9.99°, 11.11°, 12.12°, 14.22°, 15.02°, 15.79°,
18.01°, 19.37°, 22.55°, 24.18°, 25.15°, 26.22°, 29.21°, 30.29°, 31.74°, and 34.00°
in an X-ray powder diffraction pattern obtained by using Cu-Kα radiation.
Table 7. XRPD Data on Type VI Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
5.01 |
100.00 |
5.61 |
52.70 |
7.62 |
6.47 |
8.98 |
47.48 |
9.67 |
15.82 |
9.99 |
11.86 |
11.11 |
6.94 |
12.12 |
950 |
14.22 |
5.81 |
15.02 |
22.06 |
15.79 |
10.91 |
18.01 |
21.26 |
19.37 |
11.80 |
22.55 |
7.32 |
24.18 |
52.18 |
25.15 |
48.50 |
26.22 |
8.15 |
29.21 |
27.36 |
30.29 |
8.21 |
31.74 |
6.34 |
34.00 |
1.75 |
[0047] The TGA/DSC results showed that the type VI crystal suffered from a weight loss of
4.9% when heated to 70°C, and a weight loss of 5.9% when further heated to 130°C.
Multiple thermal signals could be observed in the range of 98°C to 210°C.
[0048] The type VI crystal was heated to 160°C under the nitrogen protection. The XRPD results
showed that the crystal form was transformed.
Experiment 9
Type VII Crystal
[0049] At room temperature, the solid of compound (3) was suspended and stirred for 48 h
in an IPA/toluene (v/v, 1:1) mixed solvent, filtered, and vacuum dried at room temperature
for 15 min to obtain the type VII crystal. The XRPD results were as shown in FIG.
12.
[0050] The type VII crystal had characteristic peaks at diffraction angles of 20 values
= 6.80°, 8.59°, 12.36°, 12.77°, 13.68°, 17.24°, 18.30, 19.32°, 20.77°, 22.20°, 24.47°,
27.81°, 29.32°, and 31.67° in an X-ray powder diffraction pattern obtained by using
Cu-Kα radiation.
Table 8. XRPD Data on Type VII Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
6.80 |
76.64 |
8.59 |
100.00 |
12.36 |
45.49 |
12.77 |
38.03 |
13.68 |
47.03 |
17.24 |
22.07 |
18.30 |
17.43 |
19.32 |
13.81 |
20.77 |
63.08 |
22.20 |
25.93 |
24.47 |
6.55 |
27.81 |
27.02 |
29.32 |
23.87 |
31.67 |
8.90 |
[0051] The TGA/DSC test results showed that the type VII crystal suffered from a weight
loss of 11.2% when heated to 130°C, and multiple thermal signals could be observed
within the range of 88°C to 215°C. Under the nitrogen protection, the type VII crystal
was heated to 130°C and then cooled to room temperature. The sample was removed and
exposed to the air to test XRPD. The results showed that the crystal form was transformed.
Experiment 10
Type VIII Crystal
[0052] The solid of compound (3) was suspended and stirred in a THF/n-heptane (v/v, 1:1)
mixed solvent at 50°C for 48 h, filtered, and vacuum dried at room temperature for
15 min to obtain the type VIII crystal. The XRPD pattern was as shown in FIG. 13.
[0053] The
type VIII crystal had characteristic peaks at diffraction angles of 2θ values = 5.24°, 7.98°, 8.20°,
10.51°, 10.77°, 12.55°13.40°, 14.27°, 15.28°, 16.29°, 16.69°, 17.25°, 18.94°, 19.72°,
21.19°, 23.23°, 24.63°, 26.09°, 26.60°, 30.05°, and 31.77° in an X-ray powder diffraction
pattern obtained by using Cu-Kα radiation.
Table 9. XRPD Diffraction Peak Data on Type VIII Crystal Form
Peak Position [°2θ] |
Relative Peak Intensity [%] |
5.24 |
4.06 |
7.98 |
95.96 |
8.20 |
100.00 |
10.51 |
16.80 |
10.77 |
19.75 |
12.55 |
2904 |
13.40 |
4.75 |
14.27 |
8.18 |
15.28 |
15.07 |
16.29 |
38.51 |
16.69 |
25.75 |
17.25 |
13.01 |
18.94 |
10.57 |
19.72 |
17.57 |
21.19 |
11.64 |
23.23 |
43.54 |
24.63 |
13.72 |
26.09 |
908 |
26.60 |
8.13 |
30.05 |
3.73 |
31.77 |
7.96 |
[0054] The TGA/DSC results showed that the type VIII crystal suffered from a weight loss
of 10.6% when heated to 160°C, and multiple thermal signals could be observed within
the range of 120°C to 220°C. Under the nitrogen protection, the type VIII crystal
was heated to 160°C and then cooled to room temperature. The sample was removed and
exposed to the air to test XRPD. The results showed that the crystal form had been
transformed.
Experiment 11
Type IX Crystal
[0055] At room temperature, the compound (3) was dissolved in a THF/CHCl
3 mixed solvent and volatilized at room temperature to obtain the type IX crystal.
The XRPD pattern was as shown in FIG. 14.
[0056] The type IX crystal had characteristic peaks at diffraction angles of 20 values =
6.47°, 9.57°, 13.56°, 16.84°, 17.61°, 19.36°, 20.06°, 22.45°, and 28.32° in an X-ray
powder diffraction pattern obtained by using Cu-Kα radiation.
Table 10. XRPD Data on Type IX Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
6.47 |
100.00 |
9.57 |
17.93 |
13.56 |
8.20 |
16.84 |
9.22 |
17.61 |
35.46 |
19.36 |
15.63 |
2006 |
21.60 |
22.45 |
49.26 |
28.32 |
13.96 |
[0057] The TGA/DSC results showed that the type IX crystal suffered from a weight loss of
20.3% when heated to 160°C, and multiple thermal signals could be observed within
the range of 130°C to 215°C. After the type IX crystal was left closed at room temperature
for about 3 days, a reduced degree of crystallinity could be observed. The crystal
was heated to 95°C under nitrogen protection and then cooled to room temperature.
The sample was removed and exposed to the air to test XRPD. The results showed that
the degree of crystallinity was further decreased. The crystal was heated to 160°C
under the same conditions of nitrogen protection and then cooled to room temperature.
The sample was removed and exposed to the air to test XRPD. The results showed that
its crystal form had been transformed. The analyses of the NMR and TGA results showed
that after heating, the change in crystal form was caused by solvent removal, and
the type IX crystal was a solvate.
Experiment 12
Type X Crystal
[0058] The solid of compound (3) was suspended and stirred in IPAc (isopropyl acetate) at
50°C for 48 h, and filtered to obtain the type X crystal. The XRPD pattern was as
shown in FIG. 15.
[0059] The type X crystal had characteristic peaks at diffraction angles of 20 values =
7.72°, 8.91°, 14.10°, 14.79°, 16.95°, 18.39°, 19.53°, 22.06°, 22.53°, 29.81°, and
31.51° in an X-ray powder diffraction pattern obtained by using Cu-Kα radiation.
Table 11. XRPD Data on Type X Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
7.72 |
100.00 |
8.91 |
8.59 |
14.10 |
4.77 |
14.79 |
24.51 |
16.95 |
2.57 |
18.39 |
2.79 |
19.53 |
4.00 |
22.06 |
35.63 |
22.53 |
17.81 |
29.81 |
12.77 |
31.51 |
4.98 |
[0060] The TGA/DSC results showed that the type X crystal suffered from a weight loss of
7.9% when heated to 130°C, and a weight loss of 4.5% when further heated to 160°C.
Multiple thermal signals could be observed within the range of 126°C to 210°C.
[0061] The type X crystal was subjected to the variable-temperature XRPD test. The results
showed that the position of the diffraction peak shifted after the X crystal was heated
to 120°C while purging with nitrogen; the diffraction peak intensity was significantly
reduced after the type X crystal was further heated to 130°C; and the crystal form
was transformed after the type X crystal was further heated to 145°C.
Experiment 13
Type XI Crystal
[0062] The solid of compound (3) was suspended and stirred in methyl tert-butyl ether for
48 h and filtered to obtain the type XI crystal. The XRPD pattern was as shown in
FIG. 16.
[0063] The type XI crystal had characteristic peaks at diffraction angles of 20 values =
8.42°, 11.29°, 13.02°, 14.72°, 15.01°, 16.55°, 17.23°, 18.49°, 18.90°, 19.67°, 21.37°,
22.42°, 22.67°, 24.14°, 25.08°, 25.44°, 26.02°, 26.44°, 27.63°, 28.14°, 29.67°, 30.32°,
32.95°, 35.96°, 36.59°, and 39.03° in an X-ray powder diffraction pattern obtained
by using Cu-Kα radiation, wherein the error range of the 20 values was ±0.2.
Table 11. XRPD Data on Type XI Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
8.42 |
2.71 |
11.29 |
69.01 |
13.02 |
12.26 |
14.72 |
100.00 |
15.01 |
15.81 |
16.55 |
33.47 |
17.23 |
8.14 |
18.49 |
64.94 |
18.90 |
15.41 |
19.67 |
89.95 |
21.37 |
17.08 |
22.42 |
19.58 |
22.67 |
24.34 |
24.14 |
3.09 |
25.08 |
20.61 |
25.44 |
13.66 |
26.02 |
5.29 |
26.44 |
4.10 |
27.63 |
5.32 |
28.14 |
8.51 |
29.67 |
9.51 |
30.32 |
4.48 |
32.95 |
6.76 |
35.96 |
2.97 |
36.59 |
2.28 |
39.03 |
3.97 |
[0064] The TGA/DSC test results showed that the weight loss of the XI crystal was 19.3%
when heated to 120°C, and multiple thermal signals occurred at approximate 95°C to
210°C.
Experiment 14
Type XII Crystal
[0065] The type III crystal or type XI crystal of compound (3) was suspended and stirred
in purified water at room temperature for 24 h, filtered, and open dried overnight
at room temperature to obtain the type XII crystal. The XRPD pattern was as shown
in FIG. 17.
[0066] The type XII crystal had characteristic peaks at diffraction angles of 20 values
= 8.52°, 11.25°, 14.78°, 15.45°, 17.10°, 19.58°, 22.74°, 23.94°, 26.36°, 30.28°, 31.17°,
and 33.11° in an X-ray powder diffraction pattern obtained by using Cu-Kα radiation.
Table 13. XRPD Data on Type XII Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
8.52 |
80.60 |
11.25 |
6.48 |
14.78 |
2.11 |
15.45 |
100.00 |
17.10 |
8.59 |
19.58 |
2.16 |
22.74 |
2.54 |
23.94 |
6.26 |
26.36 |
2.69 |
30.28 |
0.89 |
31.17 |
4.74 |
33.11 |
0.99 |
[0067] The type XII crystal was subjected to vacuum drying at room temperature for 10 min
and transformed into an amorphous crystal. The samples open dried at room temperature
were characterized by TGA/DSC. The results showed that the weight loss was 59.6% when
the samples were heated to 120°C, and multiple thermal signals occurred within the
range of 50°C to 240°C.
Experiment 15
Type XIII Crystal
[0068] The type III crystal or type XII crystal was suspended and stirred in methanol at
room temperature for about 24 h, and filtered to obtain the type XIII crystal. The
XRPD pattern was as shown in FIG. 18.
[0069] The type XIII crystal had characteristic peaks at diffraction angles of 2θ values
= 6.15°, 7.81°, 9.46°, 13.92°, 14.39°, 14.72°, 15.56°, 17.13°, 17.71°, 18.99°, 23.59°,
25.01°, 25.79°, 26.70°, 28.65°, and 30.56° in an X-ray powder diffraction pattern
obtained by using Cu-Kα radiation.
Table 14. XRPD Data on Type XIII Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
6.15 |
6.08 |
7.81 |
6.94 |
9.46 |
100.00 |
13.92 |
13.20 |
14.39 |
17.75 |
14.72 |
21.73 |
15.56 |
6.59 |
17.13 |
21.65 |
17.71 |
6.16 |
18.99 |
44.51 |
23.59 |
44.06 |
25.01 |
23.40 |
25.79 |
14.48 |
26.70 |
15.76 |
28.65 |
31.80 |
30.56 |
5.10 |
[0070] The type XIII crystal was unstable, and the crystal form was transformed after open
dried at room temperature for about 2 h. Meanwhile, the type XIII crystal was coated
to test XRPD, and new type XIV crystal could be observed. The type XIV crystal was
presumed to be in an unstable intermediate state, and transformed into the type XIII
crystal after removed from the solvent. The XRPD comparison diagram was as shown in
FIG. 19. Rapid transformation of the crystal form of the type XIII crystal was observed
at room temperature.
Experiment 16
Type XIV Crystal
[0071] The type XIII crystal was left in a solvent environment at room temperature and transformed
into the type XIV crystal. The XRPD pattern was as shown in FIG. 20. The type XIV
crystal was transformed into the type XIII crystal after removed from the solvent
environment.
[0072] The type XIV crystal had characteristic peaks at diffraction angles of 2θ values
= 6.94°, 8.75°, 9.21°, 11.16°, 12.82°, 13.82°15.56°, 17.59°, 19.67°, 20.93°, 22.51°,
24.35°, 29.58°, and 31.37° in an X-ray powder diffraction pattern obtained by using
Cu-Kα radiation.
Table 15. XRPD Data on Type XIV Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
6.94 |
76.15 |
8.75 |
100.00 |
9.21 |
10.76 |
11.16 |
6.46 |
12.82 |
49.49 |
13.82 |
9.00 |
15.56 |
14.81 |
17.59 |
27.13 |
19.67 |
4.02 |
20.93 |
36.18 |
22.51 |
25.25 |
24.35 |
62.81 |
29.58 |
36.07 |
31.37 |
11.21 |
Experiment 17
Type XV Crystal
[0073] The type XII crystal was left at 40°C to 90°C for 3 to 12 days to obtain the type
XV crystal. The XRPD pattern was as shown in FIG. 21.
[0074] The type XV crystal had characteristic peaks at diffraction angles of 20 values =
9.247°, 9.982°, 13.4°, 15.781°, 16.55°, 16.929°, 18.704°, 20.14°, 20.78°, 21.1°, 22.497°,
23.654°, 25.013°, 25.667°, 27.026°, 28.186°, 22.715°, 28.822°, 29.265°, and 29.762°
in an X-ray powder diffraction pattern obtained by using Cu-Kα radiation.
Table 16. XRPD Data on Type XV Crystal
Peak Position [°2θ] |
Relative Peak Intensity [%] |
9.247 |
81.6 |
9.982 |
8 |
13.4 |
12.1 |
15.791 |
53.7 |
16.55 |
100 |
16.929 |
62 |
18.704 |
13.2 |
20.14 |
8.2 |
20.78 |
9.9 |
21.1 |
10.5 |
21.54 |
7.8 |
22.497 |
12.8 |
23.654 |
12.6 |
25.013 |
13.2 |
25.667 |
6.3 |
27.026 |
14.9 |
28.186 |
5.4 |
28.822 |
9.9 |
29.265 |
10.2 |
29.762 |
6.1 |
[0075] The weight loss of the type XV crystal was 2.2% when heated to 120°C, and the crystal
form was transformed.