<?xml version="1.0" encoding="UTF-8"?><!--This XML data has been generated under the supervision of the European Patent Office --><!DOCTYPE ep-patent-document PUBLIC "-//EPO//EP PATENT DOCUMENT 1.7//EN" "ep-patent-document-v1-7.dtd">
<ep-patent-document country="EP" date-publ="20250205" doc-number="4500139" dtd-version="ep-patent-document-v1-7" file="23716199.7" id="EP23716199A1" kind="A1" lang="de" status="n"><SDOBI lang="de"><B000><eptags><B001EP>ATBECHDEDKESFRGBGRITLILUNLSEMCPTIESILTLVFIROMKCYALTRBGCZEEHUPLSKBAHRIS..MTNORSMESMMAKHTNMD..........</B001EP><B003EP>*</B003EP><B005EP>X</B005EP><B007EP>0009010-RPUB02</B007EP></eptags></B000><B100><B110>4500139</B110><B130>A1</B130><B140><date>20250205</date></B140><B190>EP</B190></B100><B200><B210>23716199.7</B210><B220><date>20230327</date></B220><B240><B241><date>20240927</date></B241></B240><B250>de</B250><B251EP>de</B251EP><B260>de</B260></B200><B300><B310>102022107686</B310><B320><date>20220331</date></B320><B330><ctry>DE</ctry></B330></B300><B400><B405><date>20250205</date><bnum>202506</bnum></B405><B430><date>20250205</date><bnum>202506</bnum></B430></B400><B500><B510EP><classification-ipcr sequence="1"><text>G01M  11/02        20060101AFI20231006BHEP        </text></classification-ipcr></B510EP><B520EP><classifications-cpc><classification-cpc sequence="1"><text>G01M  11/0257      20130101 FI20230628BHEP        </text></classification-cpc></classifications-cpc></B520EP><B540><B541>de</B541><B542>VERFAHREN UND VORRICHTUNG ZUM BESTIMMEN EINER ABBILDUNGSQUALITÄT EINES ZU PRÜFENDEN OPTISCHEN SYSTEMS</B542><B541>en</B541><B542>METHOD AND DEVICE FOR DETERMINING AN IMAGING QUALITY OF AN OPTICAL SYSTEM TO BE TESTED</B542><B541>fr</B541><B542>PROCÉDÉ ET DISPOSITIF DE DÉTERMINATION D'UNE QUALITÉ D'IMAGERIE D'UN SYSTÈME OPTIQUE À TESTER</B542></B540></B500><B700><B710><B711><snm>Trioptics GmbH</snm><iid>101753327</iid><irf>LO-21-302-P-WO-EP</irf><adr><str>Strandbaddamm 6</str><city>22880 Wedel</city><ctry>DE</ctry></adr></B711></B710><B720><B721><snm>RUPRECHT, Aiko</snm><adr><city>22880 Wedel</city><ctry>DE</ctry></adr></B721><B721><snm>STAUSS, Benjamin</snm><adr><city>22880 Wedel</city><ctry>DE</ctry></adr></B721><B721><snm>ERICHSEN, Patrik</snm><adr><city>22880 Wedel</city><ctry>DE</ctry></adr></B721><B721><snm>WINTERS, Daniel</snm><adr><city>22880 Wedel</city><ctry>DE</ctry></adr></B721><B721><snm>SCHROEDTER, Lasse</snm><adr><city>22880 Wedel</city><ctry>DE</ctry></adr></B721></B720><B740><B741><snm>Waldauf, Alexander</snm><iid>101365603</iid><adr><str>Jenoptik AG
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