PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES - Patent 4505193

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EP 4 505 193 A1

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(43)	Date of publication:
	12.02.2025 Bulletin 2025/07

(21)	Application number: 23724452.0

(22)	Date of filing: 05.04.2023

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International Patent Classification (IPC):

G01R 1/067^(2006.01)

G01R 1/073^(2006.01)

(52)	Cooperative Patent Classification (CPC):
	G01R 1/06722; G01R 1/06744; G01R 1/07314

(86)	International application number:
	PCT/US2023/017636

(87)	International publication number:
	WO 2023/196438 (12.10.2023 Gazette 2023/41)

(84)	Designated Contracting States:
	AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
	Designated Extension States:
	BA
	Designated Validation States:
	KH MA MD TN

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Priority:

07.04.2022 US 202263328677 P
04.04.2023 US 202318295748

(71)	Applicant: Microfabrica Inc.
	Van Nuys, CA 91406 (US)

(72)	Inventors:
	VEERAMANI, Arun S. Vista, California 92081 (US) WU, Ming Ting San Jose, California 95124 (US) SMALLEY, Dennis R. Santa Clarita, California 91321 (US)

(74)	Representative: Botti & Ferrari S.p.A.
	Via Cappellini, 11 20124 Milano 20124 Milano (IT)

(54)	PROBES WITH PLANAR UNBIASED SPRING ELEMENTS FOR ELECTRONIC COMPONENT CONTACT, METHODS FOR MAKING SUCH PROBES, AND METHODS FOR USING SUCH PROBES