FIELD OF INVENTION
[0001] This invention relates to a multilayer stack comprising layers based on copper, nickel,
gold and platinum, in the given order, which may be used for the preparation of electrodes
or electrical conductors with enhanced corrosion resistance.
[0002] In certain embodiments, this invention relates to a method of manufacturing said
multilayer stack and its use, as well as to a method of improving the corrosion resistance
of nickel-plated copper.
BACKGROUND OF THE INVENTION
[0003] Platinum (Pt) is a commonly used material for electrical contacts, particularly in
wet chemical processing, and serves as a catalyst for many commercial applications,
including fuel cells, petroleum industry and autocatalytic converters. Platinum electrodes
with catalytic activity find widespread use throughout all fields of electrochemistry.
Especially for medical applications (e.g. in neural stimulators or biochemical sensors,
working or counter electrodes), electrodes comprising Pt have gained increased interest
due to its biocompatibility and resistance to oxidation (e.g., by blood, sweat or
saline solution).
[0004] Since Pt is of low abundance and expensive, a cost reduction is typically achieved
by forming a stack of multiple metal layers including a Pt layer as outermost layer.
[0005] For this purpose, it is known to use a copper (Cu) layer, plate the same with a nickel
(Ni) layer for improved mechanical strength and corrosion stability and forming a
Pt layer on the Ni layer. By using Ni in the intermediate layer, problems with poor
adhesion between the Cu and Pt layer due to the relatively large potential difference
between the metals may be avoided. For instance,
CN 113394417 B discloses the aforementioned three-layer structure in a core-shell configuration
and reports a higher stability of the catalyst compared with pure Pt.
[0006] CN 105154931 A discloses a method of electroplating a base layer made of nickel, titanium, tantalum,
copper or silver with platinum by electrodeposition from an electroplating solution.
[0007] However, the corrosion resistance of the described multilayer stacks tends to be
insufficient for many applications. Moreover, it has been found that copper and/or
nickel may diffuse into the platinum layer in corrosive environments (especially in
chlorinated media and under oxidizing conditions, e.g. in presence of H
2O
2) and thus negatively affect the catalytic performance, mechanical properties and/or
lifetime of the multilayer stack.
[0008] Therefore, it remains desirable to provide a Pt-containing multilayer stack which
exhibits an improved corrosion resistance and enables prolonged functionality (e.g.
as electrode catalyst or electrical conductor), thus widening the options for potential
applications while still maintaining lower manufacturing costs compared to pure Pt.
[0009] Moreover, it would be desirable to provide a method of effectively improving the
corrosion resistance of nickel-plated copper.
SUMMARY OF THE INVENTION
[0010] The present invention solves this object with the subject matter of the claims as
defined herein. The advantages of the present invention will be further explained
in detail in the section below and further advantages will become apparent to the
skilled artisan upon consideration of the invention disclosure.
[0011] Generally speaking, in one aspect the present invention provides a multilayer stack
comprising: a Cu-based layer; a Ni-based layer provided over the Cu-based layer; an
Au-based layer provided over the Ni-based layer; and a Pt-based layer provided over
the Au-based layer.
[0012] In another aspect, the present invention provides a method of manufacturing the aforementioned
multilayer stack, comprising: providing a Ni/Cu-multilayer film comprising a Ni-based
layer and a Cu-based layer; depositing a layer of Au on the Ni-based layer to form
an Au-based layer, and depositing a layer of Pt on the Au-based layer to form a Pt-based
layer.
[0013] In a further aspect, the present invention relates to the use of the aforementioned
multilayer stack as an electrode or an electrical conductor in electrical connectors
and/or electric circuits.
[0014] In yet another aspect, the present invention provides a method of improving the corrosion
resistance of Ni-plated Cu, the method comprising the steps of: depositing a layer
of Au on the surface of the Ni-plated Cu to form an Au-based layer, and depositing
a layer of Pt on the Au-based layer to form a Pt-based layer.
[0015] In a further aspect, the present invention porvides a biosensor or a medical device
comprising aforementioned multilayer stack.
BRIEF DESCRIPTION OF THE DRAWINGS
[0016]
FIG. 1 is a schematic representation of an exemplary embodiment of the multilayer
stack of the present invention.
FIG. 2A is a schematic representation of an exemplary embodiment of the multilayer
stack of the present invention including a substrate.
FIG. 2B is a schematic representation of an exemplary embodiment of the multilayer
stack of the present invention including a substrate with a channel/cavity.
FIG. 3 is a schematic representation of an exemplary embodiment of the multilayer
stack of the present invention with covered edges and substrate.
FIG. 4A illustrates an exemplary embodiment of the multilayer stack of the present
invention with a core-shell structure.
FIG. 4B is a schematic representation of an exemplary embodiment of the multilayer
stack of the present invention including a substrate with a channel/cavity.
DETAILED DESCRIPTION OF THE INVENTION
[0017] For a more complete understanding of the present invention, reference is now made
to the following description of the illustrative embodiments thereof:
Multilayer Stack
[0018] In a first embodiment, the present invention generally relates to a multilayer stack
comprising: a Cu-based layer; a Ni-based layer provided over the Cu-based layer; an
Au-based layer provided over the Ni-based layer; and a Pt-based layer provided over
the Au-based layer.
[0019] Specifically, it has been found that a surprisingly high improvement of the corrosion
resistance may be achieved by utilizing the specific order of layers within the stack.
Although Cu, Ni and Au are substantially more prone to corrosion than Pt (especially
in chlorinated media such as salt spray solution or phosphate-buffered saline) and
oxidizing electrochemical environment (e.g. upon exposure to hydrogen peroxide), providing
said three-layer stack underneath the Pt-based layer enhances the properties attributed
to the Pt-based layer to an unexpected degree (i.e. synergistically).
[0020] Although other layers may be interposed between each layer of the stack, it is preferred
that the Pt-based layer is in contact with the Au-based layer. Independently or in
combination, it is preferred that the Cu-based layer is provided in contact with the
Ni-based layer. Independently or in combination, the Ni-based layer is provided in
contact with the Au-based layer. In an especially preferred embodiment, no layers
are interposed between the Cu-, Ni-, Au- and Pt-based layers. An exemplary configuration
of said embodiment is illustrated in Fig. 1, with the Cu-based layer (1), Ni-based
layer (2), Au-based layer (3) and Pt-based layer (4) being provided in contact with
each other. In Fig. 1, an optional additional functional layer (5), which will be
described in further detail below, is provided over and in contact with the Pt-based
layer (4).
[0021] The multilayer stack may further comprise a substrate on which the stack is placed,
deposited or adhered to via chemical adhesives, preferably via the Cu-based layer.
[0022] Figures 2A and 2B show preferred configurations of a multilayer stack on a substrate
(17/27).
[0023] The substrate (17/27) is not particularly limited and may include polymer, silicon,
ceramic substrates, glass, fabric, paper and combinations thereof. As examples of
polymers, polyetheretherketone (PEEK), polyphenylsulfone (PPSU), polyethylene terephthalate
(PET), polyimide (PI), polyetherimide (PEI), liquid crystal polymer (LCP) or epoxy
glass may be mentioned, for example), ceramics or paper. Preferred substrate materials
from the perspective of biocompatibility include epoxy glass, polyethylene terephthalate
(PET), polyetherimide (PEI), among which polyetherimide (PEI) is especially preferred.
Typically, the substrate thickness ranges from 20 to 200 µm, more preferably between
50 and 150 µm.
[0024] The substrate may further comprise one or more channels or cavities (28), as illustrated
in Fig. 2B, which may be punched into the substrate, for example. In such a configuration,
the Cu-based layer (21) may be provided with deposits of further metal layers (preferably
a Ni layer (29a) and an Au layer (29b) in this order, with the Ni layer (29a) being
in contact with the Cu-based layer (21)) extending into the channel or cavity (28)
and covering the Cu-based layer (21) from the side opposed to the Ni-based layer (22).
In general, the Cu-based layer essentially consists of Cu or an alloy having Cu as
its principal component. Accordingly, the Cu-based layer comprises at least 50 wt.-%
of Cu, and preferably comprises at least 85 wt.-%, more preferably at least 90 wt.-%
Cu based on the total weight of the Cu-based layer. In a further preferred embodiment,
the Cu-based layer essentially consists of Cu.
[0025] Notably, the expression "essentially consists of" used herein is understood to define
that the respective layer consists of the material except from unavoidable impurities,
which may be present in an amount of up to 0.5 wt.-% of the respective layer.
[0026] In analogy, Ni-based layer essentially consists of Ni or an alloy having Ni as its
principal component. Accordingly, the Ni-based layer comprises at least 50 wt.-% of
Ni and preferably comprises at least 85 wt.-%, more preferably at least 90 wt.-% Ni
based on the total weight of the Ni-based layer. The presence of the Ni-based layer
provides an improved adhesion to subsequent coating layers (e.g. the Au-based layer).
[0027] Ni plating is generally also thought of as a barrier which prevents the diffusion
of copper into the outer layers. However, it has been found that the Ni-based layer
cannot prevent Cu from diffusing into the Pt-layer and degrading the corrosion resistance
and ultimately the electrical properties of the Pt layer. For this purpose, the present
invention comprises the Au-based layer as an effective barrier preventing diffusion
of both Cu and Ni into the Pt-based layer.
[0028] In a preferred embodiment, a layer of Ni-P alloy (see 16 and 26 in Figs. 2A and 2B,
respectively) may be deposited between the Ni-based layer and the Au-based layer to
improve the mechanical, tribological and electrochemical features.
[0029] The Au-based layer essentially consists of Au or an alloy having Au as its principal
component. Accordingly, the Au-based layer comprises at least 50 wt.-% of Au and preferably
comprises at least 85 wt.-%, more preferably at least 90 wt.-% Au based on the total
weight of the Au-based layer. In a further preferred embodiment, the Au-based layer
essentially consists of Au.
[0030] In another preferred embodiment, the Au-based layer comprises a sub-layer of flash-deposited
Au having a higher porosity than the rest of the Au-based layer, with a preferred
thickness in the range of 5 to 30 nm, more preferably between 8 to 20 nm. In this
configuration, the flash-deposited sub-layer is preferably in contact with the Ni-based
layer or the layer of NiP alloy, if present.
[0031] It is preferred that the Pt-based layer comprises at least 95 wt.-%, more preferably
at least 97 wt.-% and further preferably at least 99 wt.-% Pt based on the total weight
of the Pt-based layer. In an especially preferred embodiment, the Pt-based layer essentially
consists of Pt.
[0032] Alternatively, the Pt-based layer essentially consists of a Pt alloy comprising Pt
as its principal component. Accordingly, the Pt-based layer comprises at least 50
wt.-% Pt based on the total weight of the Pt-based layer, more preferably at least
60 wt.-% of Pt.
[0033] A layer containing one or more platinum group metals other than Pt (i.e. ruthenium
(Ru), rhodium (Rh), palladium (Pd), osmium (Os) and/or iridium (Ir)) may be interposed
between the Au-based layer and the Pt-based layer. Among these metals, Pd is preferred.
Such layer may essentially consist of one or more of Ru, Rh, Pd, Os and Ir, or essentially
consist of an alloy having one of the aforemention metals as its principal component.
[0034] If Cu, Ni, Au and/or Pt are present as principal components of alloys in any of the
aforementioned layers, such alloys preferably comprise one or more metals selected
from transition metals. Among preferred transition metals, Au, Co, Cu, Ni, and/or
Fe may be mentioned.
[0035] In addition, metal oxides (including, but not limited to CeO
2, WO
3, TazO
5, Nb
2O
5, and ZrO
2) may be present in the Pt-based layer to alter the catalytic activity for the desired
purpose.
[0036] The thickness of each layer is not particularly limited and may be suitably selected
by the skilled artisan depending on the desired properties and purpose of the multilayer
stack.
[0037] While not being limited thereto, the Cu-based layer typically has a thickness of
from 1 to 50 µm, in embodiments from 10 to 40 µm, more preferably from 15 to 30 µm.
[0038] Independently or in combination, the Ni-based layer typically has a thickness of
from 0.4 to 50 µm, in embodiments from 0.5 to 20 µm, more preferably from 1 to 5 µm.
[0039] It may be preferred that the Au-based layer has a minimum thickness of 15 nm and
preferably a thickness of from 20 nm to 500 nm.
[0040] Moreover, in order to make full use of the advantages of the present invention, the
Pt-based layer has a thickness of 15 nm or larger, preferably from 20 nm to 600 nm
and further preferably from 25 to 500 nm.
[0041] An additional functional layer (5) may be optionally provided over and preferably
in contact with the Pt-based layer (4).
[0042] Normally, a Pt-based layer obtained by electroplating through an electroplating solution
will be smooth, shiny and low in porosity. One approach to increase the surface area
of the Pt-based layer without increasing the surface is to electroplate Pt rapidly,
which results in a Pt surface which commonly known as "platinum black". Pt black has
a porous and rough surface which is less dense and less reflective than shiny Pt.
[0043] In embodiments, it may be therefore preferable that the multilayer stack additionally
comprises a layer of platinum black over the Pt-based layer as an additional functional
layer (5), which is further preferably in contact with the Pt-based layer (4). In
further preferred embodiments, the layer of platinum black preferably has a specific
surface area in the range of from 2 to 50 m
2/g, more preferably of from 20 to 50 m
2/g. The thickness of the platinum black layer is not particularly limited and may
be suitably adjusted to balance the structural integrity with the desired catalytic
activity.
[0044] In an alternative embodiment, as illustrated in Figs. 2A and 2B, the multilayer stack
of the present invention may further comprise a second Au-based layer (15/25) over
the Pt-based layer (14/24) as an additional functional layer, which is further preferably
in contact with the Pt-based layer (14/24). The second Au-based layer (15/25) may
cover the Pt-based layer (14/24) partly or entirely and may provide the multilayer
stack with an enhanced metallic appearance. The second Au-based layer (15/25) may
consist of Au or an alloy having Au as its principal component. Accordingly, the Au-based
layer (15/25) comprises at least 50 wt.-% of Au. A non-limiting example of an Au-Cu
alloy deposited on a metal surface to provide electric contact pads with a rose gold
appearance is disclosed in
EP 3 892 759 A1.
[0045] In a preferred embodiment also shown in Fig. 2A and 2B, the second Au-based layer
(15/25) may also comprise a sub-layer (15a/25a) of flash-deposited Au having a higher
porosity than the rest of the second Au-based layer (15/25), with a preferred thickness
in the range of 5 to 30 nm, more preferably between 8 to 20 nm. In this configuration,
the flash-deposited sub-layer (15a/25a) is preferably in contact with the Pt-based
layer (14/24).
[0046] In order to exert the corrosion protection function more effectively, it may be preferred
that each cover layer of the stack extends over the sides of the underlying layer.
An example thereof is illustrated in Fig. 3, wherein the Ni-based layer (32) extends
over and covers the sides of the Cu-based layer (31), the Au-based layer (33) extends
over and covers the sides of the Ni-based layer (32), the Pt-based layer (34) extends
over and covers the sides of the Au-based layer (33). In such a configuration, the
optional functional layer (35) may or may not extend over and cover the sides of the
Pt-based layer (34), The shape in which the multilayer stack is provided is not particularly
limited and may include cylindrical, rod-shaped and flat (e.g. rectangular, circular,
etc.) geometries.
[0047] In a preferred embodiment illustrated in Fig. 4A, the multilayer stack exhibits a
core-shell configuration, wherein the Cu-based layer (41) represents the core and
is enclosed by a shell formed by - in the given order - the Ni-based layer (42), the
Au-based layer (43), the Pt-based layer (44) and the optional functional layer (45).
Such a configuration is especially preferred for substrateless stacks.
[0048] However, the configuration may also be used in combination with a continous substrate
(not shown) or a substrate comprising a channel or cavity, as illustrated in Fig.
4B.
Method of Manufacturing a Multilayer Stack
[0049] In a second embodiment, the present invention relates to a method of manufacturing
a multilayer stack according to the first embodiment described above, comprising:
providing a Ni/Cu-multilayer film comprising a Ni-based layer and a Cu-based layer;
depositing a layer of Au on the Ni-based layer to form an Au-based layer, and depositing
a layer of Pt on the Au-based layer to form a Pt-based layer.
[0050] The method of providing a Ni/Cu-multilayer film comprising a Ni-based layer and a
Cu-based layer is not particularly limited any may be brought about by any method
known to the skilled artisan. For instance, the Ni-layer may be deposited on a Cu
foil or wire (e.g. by electrodeposition from a Ni-salt solution).
[0051] Notably, the Ni/Cu-multilayer film comprising a Ni-based layer and a Cu-based layer
may be provided in the form of a conductive layer of an electrical circuit (e.g. a
printed circuit board or printed wiring board).
[0053] The method depositing a layer of Au on the Ni-based layer to form an Au-based layer
is not particularly limited either and may include electrolytic plating methods and
electroless plating methods (e.g., by using electroless nickel immersion gold (ENIG))
known in the art.
[0054] A flash-deposited Au sublayer may be provided according to methods known in the art,
including, but not limited to electroless methods, such as immersion and chemical
reduction.
[0055] While electroless deposition is also possible, the Pt-based layer is preferably deposited
via electrodeposition from a solution containing a Pt precursor. Generally, such a
precursor will be selected from Pt(II) and Pt(IV) salts. Examples of Pt (II) precursors
include, but are not limited to PtCl
4·5 H
2O, H
2PtCl
6·6 HzO, (NH
4)PtCl
6, Pt(NH
3)
2(NO
2)
2 and dinitrosulphatoplatinites (e.g. based on the complex dihydrogen bis(nitrito-N)[sulphato(2-)-O,O']platinate(2-),
H
2Pt(NO
2)
2SO
4), whereas suitable Pt (IV) precursors include, but are not limited to alkali hexahydroxyplatinates
(e.g. Na
2Pt(OH)
6 or K
2Pt(OH)
6), phosphate salts (e.g. (NH
4)
2HPO
4, Na
2HPO
4).
[0056] Preferably, the Pt-based layer is deposited via electrodeposition from a solution
comprising dihydrogen bis(nitrito-N)[sulphato(2-)-O,O']platinate(2-) (H
2Pt(NO
2)
2SO
4), which favors the deposition of a high-quality Pt-based layer with excellent coverage
and low porosity. The electrodeposition solution may further comprise water-soluble
phosphate, sodium dodecyl sulfate or dodecyl sulfate as an additive. In addition,
the pH conditions may be suitably adjusted according to the selected precursor by
addition of acid or base.
[0057] The reduction of Pt precursor by electroless deposition proceeds in almost the same
manner as in electrochemical deposition, with the difference that electrons are not
provided by an external source but a reducing agent.
[0058] The electrodeposition step as such can be performed by galvanostatic, potentiostatic
or by potentiocyclic methods, which may be suitably selected by the skilled artisan
depending on the desired surface roughness and layer stability, for example. Pulsed
electrodeposition can be employed to alternate different potentials and thus different
processes.
[0059] A Pt-based layer comprising a Pt alloy can be fabricated by co-deposition of two
or more metals from their salts.
[0060] Notably, the steps of manufacturing the multilayer stack of the present invention
may be carried out efficiently and economically through a reel-to-reel process.
Uses of the Multilayer Stack
[0061] In general, the multilayer stack according to the present invention may be of use
in any application which requires superior electrical characteristics, catalytic activity,
biocompatibility, stability and corrosion resistance.
[0062] In a third embodiment, the present invention therefore relates to the use of the
multilayer stack according to the first embodiment described above as an electrode
or an electrical conductor in electrical connectors and/or electric circuits, particularly
in medical devices and biosensors.
[0063] The type of electrodes is not particularly limited. Non-limiting examples include
biosensor electrodes or medical electrodes (e.g., reusable disc type electrodes).
For instance, biosensor applications may involve the use of the multilayer stack of
the present invention as an electrochemical catalyst (e.g. to accelerate the reaction
of enzymes), as a sensor electrode to enhance electron transfer, and for enzymatic
reactions.
[0064] Non-limiting examples of electrical connectors and electric circuits include connector
pads and integrated circuits in smart cards (SC) (i.e. chip cards, or integrated circuit
cards (ICC or IC cards)), respectively. Herein, the multilayer stack of the present
invention may be used to provide improved resistance against corrosion by sweat, salt
water or oxidizing agents.
Method of improving Corrosion Resistance
[0065] As discussed in the description above, the specific multilayer stack arrangement
according to the present invention provides improved resistance towards corrosion
when compared to configurations without an Au-based layer and/or without a Pt-based
layer.
[0066] A fourth embodiment of the present invention therefore relates to a method of improving
the corrosion resistance of Ni-plated Cu, the method comprising the steps of: depositing
a layer of Au on the surface of the Ni-plated Cu to form an Au-based layer, and depositing
a layer of Pt on the Au-based layer to form a Pt-based layer.
[0067] The steps of depositing the Au-based layer and the Pt-based layer are described in
conjunction with the second embodiment.
[0068] The method according to the fourth embodiment is in principle applicable to all types
of electric components and/or circuits comprising conductors based on Ni-plated Cu.
[0069] While not being limited thereto, an improvement in corrosion resistance may be evaluated
with a neutral salt spray method (5% NaCl) according to ISO 9227 standard tests, for
example. Another test includes the immersion of the specimen in H
2O
2 at ambient temperature (23 ± 2 °C) according to ASTM G31 - 21 (Standard Guide for
Laboratory Immersion Corrosion Testing of Metals) removal of the specimen from the
solution, rinsing with DI water, and measuring corrosion metal loss according to ASTM
G1 - 03 (Standard Practice for Preparing, Cleaning, and Evaluating Corrosion Test
Specimens) and/or analyzing the surface morphology of the tested specimen after a
predetermined immersion duration by scanning electron microscopy (SEM) and/or X-ray
photoelectron spectroscopy (XPS).
Biosensors and Medical Devices
[0070] In a fifth embodiment, the present invention relates to a biosensor or a medical
device comprising the multilayer stack in accordance with the first embodiment.
[0071] A biosensor is understood as an analytical device that combines a biological component
with a physicochemical detector and is used for the detection of a chemical substance.
Herein, components comprising the multilayer stack according to the first embodiment
may be used as electrochemical catalysts (to accelerate the reaction of enzymes, for
example), as sensor electrodes to enhance electron transfer, and as a precursor material
for enzyme modified electrodes, wherein the surface of the multilayer stack is modified
into an enzyme to fix the substrate and maintain enzyme activity. While not being
limited thereto, the biosensor may employed for the detection of bioactive substances
such as glucose, glutamic acid, neurotransmitters or hormones.
[0072] A medical device may also comprise a medical sensor (e.g. sensors in medical pumps
minimally invasive equipment, respiratory care or vital signs monitoring), but is
not limited thereto. For instance, examples of the medical device may also comprise
surgical instrumentation (e.g. marker bands and guidewires for catheters, electrodes
for catheters), electro-medical implants (e.g. pacemakers, hearing aids, heart pumps,
defibrillators, neuromodulation devices), interventional devices (e.g., stents), othopaedic
devices (e.g. knee or hip implants, spinal fixation devices) or the like.
[0073] These embodiments are advantageous in that they fully exploit the excellent biocompatibility,
durability, conductivity and radiopacity of Pt.
[0074] It will be appreciated that the present invention may employ any of the preferred
features specified above with respect to the description of the first to fifth embodiments,
and that the preferred features may be combined in any combination, except for combinations,
where at least some of the features are mutually exclusive.
[0075] Once given the above disclosure, many other features, modifications, and improvements
will become apparent to the skilled artisan.
Reference Numerals
[0076]
- 1 / 11 / 21 / 31 / 41 / 51
- copper (Cu)-based layer
- 2 / 12 / 22 / 32 / 42 / 52
- nickel (Ni)-based layer
- 3 / 13 / 23 / 33 / 43 / 53
- gold (Au)-based layer
- 13a / 23a
- flash gold (Au) layer (optional)
- 4 / 14 / 24 / 34 / 44 / 54
- platinum (Pt)-based layer
- 5
- additional functional layer (optional)
- 15/25
- second gold (Au)-based layer (optional)
- 15a / 25 b
- flash gold (Au) layer (optional)
- 16/26
- Ni-P layer (optional)
- 17 / 27 / 37 / 57
- substrate (optional)
- 28 / 58
- channel (optional)
- 29a
- Ni layer (optional)
- 29b
- Au layer (optional)
1. Multilayer stack comprising:
a Cu-based layer;
a Ni-based layer provided over the Cu-based layer;
an Au-based layer provided over the Ni-based layer; and
a Pt-based layer provided over the Au-based layer.
2. Multilayer stack according to claim 1, wherein the Pt-based layer is in contact with
the Au-based layer.
3. Multilayer stack according to claim 1 or claim 2, wherein the Cu-based layer is provided
in contact with the Ni-based layer.
4. Multilayer stack according to any one of claims 1 to 3, wherein the Ni-based layer
is provided in contact with the Au-based layer.
5. Multilayer stack according to any one of claims 1 to 4, wherein the Cu-based layer
comprises at least 85 wt.-% and preferably at least 90 wt.-% Cu based on the total
weight of the Cu-based layer; and/or wherein the Ni-based layer comprises at least
85 wt.-% and preferably at least 90 wt.-% Ni based on the total weight of the Ni-based
layer; and/or wherein the Au-based layer comprises at least 85 wt.-% and preferably
at least 90 wt.-% Au based on the total weight of the Au-based layer.
6. Multilayer stack according to any one of claims 1 to 5, wherein the Au-based layer
has a minimum thickness of 15 nm and preferably a thickness of from 20 nm to 500 nm.
7. Multilayer stack according to any one of claims 1 to 6, wherein the Pt-based layer
comprises at least 95 wt.-%, preferably at least 97 wt.-% and more preferably at least
99 wt.-% Pt based on the total weight of the Pt-based layer.
8. Multilayer stack according to any one of claims 1 to 6, wherein the Pt-based layer
consists of a Pt alloy comprising at least 60 wt.-% of Pt based on the total weight
of the Pt-based layer, and the Pt alloy preferably further comprises a metal selected
from one or more transition metals.
9. Multilayer stack according to any one of claims 1 to 8, wherein the Pt-based layer
has a thickness of 15 nm or larger, preferably from 20 nm to 600 nm and further preferably
from 25 to 500 nm.
10. Multilayer stack according to any one of claims 1 to 9, further comprising a layer
of platinum black over and in contact with the Pt-based layer, the layer of platinum
black preferably having a specific surface area in the range of from 2 to 50 m2/g.
11. Multilayer stack according to any one of claims 1 to 9, further comprising a second
Au-based layer over and in contact with the Pt-based layer.
12. Multilayer stack according to any one of claims 1 to 11, further comprising a substrate
selected from a polymer, silicon, a ceramic substrate, glass, fabric, paper and combinations
thereof.
13. Method of manufacturing a multilayer stack according to any one of claims 1 to 12,
comprising:
providing a Ni/Cu-multilayer film comprising a Ni-based layer and a Cu-based layer;
depositing a layer of Au on the Ni-based layer to form an Au-based layer, and
depositing a layer of Pt on the Au-based layer to form a Pt-based layer.
14. Method of manufacturing a multilayer stack according to claim 13, wherein the Pt-based
layer is deposited via electrodeposition from a solution comprising dihydrogen bis(nitrito-N)[sulphato(2-)-O,O']platinate(2-)
(H2Pt(NO2)2SO4).
15. Use of the multilayer stack according to any one of claims 1 to 12 as an electrode
or an electrical conductor in electrical connectors and/or electric circuits.
16. Method of improving the corrosion resistance of Ni-plated Cu, the method comprising
the steps of:
depositing a layer of Au on the surface of the Ni-plated Cu to form an Au-based layer,
and
depositing a layer of Pt on the Au-based layer to form a Pt-based layer.
17. Biosensor or medical device, comprising the multilayer stack according to any one
of claims 1 to 12.