(19)
(11) EP 4 740 002 A1

(12)

(43) Date of publication:
13.05.2026 Bulletin 2026/20

(21) Application number: 23762270.9

(22) Date of filing: 06.07.2023
(51) International Patent Classification (IPC): 
G01N 21/95(2006.01)
G01N 21/88(2006.01)
H01L 21/66(2006.01)
(52) Cooperative Patent Classification (CPC):
G01N 21/9501; G01N 2021/8822; H10P 74/203
(86) International application number:
PCT/IB2023/000459
(87) International publication number:
WO 2025/008656 (09.01.2025 Gazette 2025/02)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
KH MA MD TN

(71) Applicants:
  • UNITY SEMICONDUCTOR
    38330 Montbonnot-Saint-Martin (FR)
  • Centre National de la Recherche Scientifique
    06905 Sophia Antipolis Cedex (FR)

(72) Inventors:
  • VIENNE, Guillaume
    38700 CORENC (FR)
  • HAKOBYAN, Davit
    38330 SAINT-ISMIER (FR)
  • GENEVET, Patrice
    06130 GRASSE (FR)

(74) Representative: IPAZ 
Parc Les Algorithmes Bâtiment Platon
91190 Saint Aubin
91190 Saint Aubin (FR)

   


(54) DEVICE FOR INSPECTING SUBSTRATES