(19)
(11) EP 4 771 528 A1

(12)

(43) Date of publication:
08.07.2026 Bulletin 2026/28

(21) Application number: 23801623.2

(22) Date of filing: 06.10.2023
(51) International Patent Classification (IPC): 
G06F 30/33(2020.01)
G06F 30/398(2020.01)
G06F 11/07(2006.01)
G06F 119/02(2020.01)
(52) Cooperative Patent Classification (CPC):
G06F 30/33; G06F 30/398; G06F 2119/02; G06F 11/079
(86) International application number:
PCT/US2023/076199
(87) International publication number:
WO 2025/075648 (10.04.2025 Gazette 2025/15)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
KH MA MD TN

(71) Applicant: Siemens Industry Software Inc.
Plano, TX 75024 (US)

(72) Inventors:
  • VEDA, Gaurav
    Pasadena, California 91105-2270 (US)
  • SHARMA, Manish
    Wilsonville, Oregon 97070-7777 (US)
  • KLINGENBERG, Robert R.
    Wilsonville, Oregon 97070-7777 (US)
  • D'SOUZA, Jayant C.
    Wilsonville, Oregon 97070-7777 (US)

(74) Representative: HKW Intellectual Property PartG mbB 
Theresienhöhe 12
80339 München
80339 München (DE)

   


(54) LAYOUT-BASED SYSTEMATIC DEFECT DETERMINATIONS THROUGH DESIGN UNIQUENESS AND REPEATER OVERLAP