(19)
(11) EP 4 771 580 A1

(12)

(43) Date of publication:
08.07.2026 Bulletin 2026/28

(21) Application number: 24818056.4

(22) Date of filing: 15.11.2024
(51) International Patent Classification (IPC): 
G06T 7/00(2017.01)
(52) Cooperative Patent Classification (CPC):
G06T 7/0004; G06T 2207/10004; G06T 2207/10016; G06T 2207/20084; G06T 2207/30148; G06T 2207/20081
(86) International application number:
PCT/IB2024/061393
(87) International publication number:
WO 2025/120423 (12.06.2025 Gazette 2025/24)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
GE KH MA MD TN

(30) Priority: 07.12.2023 US 202363607106 P
31.12.2023 US 202318401557

(71) Applicant: Orbotech Ltd.
8110101 Yavne (IL)

(72) Inventor:
  • RAVEH, Gonen
    7986000 Timorim (IL)

(74) Representative: FRKelly 
Waterways House Grand Canal Quay
Dublin D02 PD39
Dublin D02 PD39 (IE)

   


(54) SEMICONDUCTOR INSPECTION SYSTEM WITH A DEEP NEURAL NETWORK