(19)
(11) EP 4 771 581 A1

(12)

(43) Date of publication:
08.07.2026 Bulletin 2026/28

(21) Application number: 24818059.8

(22) Date of filing: 15.11.2024
(51) International Patent Classification (IPC): 
G06T 7/00(2017.01)
G06F 18/21(2023.01)
G01N 21/95(2006.01)
(52) Cooperative Patent Classification (CPC):
G06T 2207/30148; G06T 2207/20084; G06T 2207/20081; G06T 7/0004; G01N 21/9501; G06V 10/82; G06V 10/764; G06V 10/141; G06V 2201/06
(86) International application number:
PCT/IB2024/061404
(87) International publication number:
WO 2025/120424 (12.06.2025 Gazette 2025/24)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
GE KH MA MD TN

(30) Priority: 07.12.2023 US 202363607109 P
22.01.2024 US 202418419497

(71) Applicant: Orbotech Ltd.
8110101 Yavne (IL)

(72) Inventor:
  • RAVEH, Gonen
    7986000 Timorim (IL)

(74) Representative: FRKelly 
Waterways House Grand Canal Quay
Dublin D02 PD39
Dublin D02 PD39 (IE)

   


(54) VERIFYING CORRECTNESS OF COMPUTER VISION DURING SEMICONDUCTOR INSPECTION