(19)
(11) EP 4 771 902 A1

(12)

(43) Date of publication:
08.07.2026 Bulletin 2026/28

(21) Application number: 23950171.1

(22) Date of filing: 31.08.2023
(51) International Patent Classification (IPC): 
H04W 24/10(2009.01)
(52) Cooperative Patent Classification (CPC):
H04W 24/10; H04W 24/08
(86) International application number:
PCT/CN2023/116054
(87) International publication number:
WO 2025/043584 (06.03.2025 Gazette 2025/10)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
KH MA MD TN

(71) Applicant: QUALCOMM INCORPORATED
San Diego, California 92121-1714 (US)

(72) Inventors:
  • LIU, Jianhua
    San Diego, California 92121-1714 (US)
  • KRISHNAN, Shankar
    San Diego, California 92121-1714 (US)

(74) Representative: Jaeger, Michael David et al
Maucher Jenkins Seventh Floor Offices Artillery House 11-19 Artillery Row
London SW1P 1RT
London SW1P 1RT (GB)

   


(54) PER-APPLICATION QUALITY OF EXPERIENCE MEASUREMENT COLLECTION