(19)
(11) EP 4 824 601 A1

(12)

(43) Date of publication:
21.10.2026 Bulletin 2026/43

(21) Application number: 24828691.6

(22) Date of filing: 11.12.2024
(51) International Patent Classification (IPC): 
G02B 21/24(2006.01)
G02B 21/36(2006.01)
G02B 21/08(2006.01)
G01N 21/64(2006.01)
G01N 33/543(2006.01)
(52) Cooperative Patent Classification (CPC):
G02B 21/244; G02B 21/367; G01N 21/6458; G02B 21/088
(86) International application number:
PCT/US2024/059535
(87) International publication number:
WO 2025/128682 (19.06.2025 Gazette 2025/25)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
GE KH MA MD TN

(30) Priority: 15.12.2023 US 202363610573 P

(71) Applicant: IDEXX Laboratories, Inc
Westbrook, Maine 04092 (US)

(72) Inventor:
  • ERICSON, Carleton
    Westbrook, Maine 04092 (US)

(74) Representative: Grey, Ian Michael 
Venner Shipley LLP TIDE Bankside 8 Emerson Street
London SE1 9DU
London SE1 9DU (GB)

   


(54) PROCESS AND SYSTEMS FOR AUTOFOCUSING AND MEASURING TILT OF SAMPLE PLANE