(19)
(11) EP 4 824 847 A1

(12)

(43) Date of publication:
21.10.2026 Bulletin 2026/43

(21) Application number: 24829390.4

(22) Date of filing: 11.12.2024
(51) International Patent Classification (IPC): 
H01J 37/12(2006.01)
H01J 37/153(2006.01)
(52) Cooperative Patent Classification (CPC):
H01J 37/153; H01J 2237/1532; H01J 2237/1516; H01J 37/12; H01J 2237/1205; H01J 2237/1202
(86) International application number:
PCT/EP2024/085606
(87) International publication number:
WO 2025/125289 (19.06.2025 Gazette 2025/25)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
GE KH MA MD TN

(30) Priority: 12.12.2023 US 202318536914

(71) Applicants:
  • ICT INTEGRATED CIRCUIT TESTING GESELLSCHAFT FÜR HALBLEITERPRÜFTECHNIK MBH
    85551 Heimstetten (DE)
  • Technische Universiteit Delft
    2628 CN Delft (NL)

(72) Inventor:
  • KRUIT, Pieter
    2611EB Delft (NL)

(74) Representative: Zimmermann & Partner Patentanwälte mbB 
P.O. Box 330 920
80069 München
80069 München (DE)

   


(54) OPTICAL SYSTEM FOR A PLURALITY OF PRIMARY BEAMLETS, CHARGED PARTICLE MULTI-BEAM APPARATUS AND METHOD OF FOCUSING A PLURALITY OF PRIMARY BEAMLETS