(19)
(11) EP 4 824 848 A1

(12)

(43) Date of publication:
21.10.2026 Bulletin 2026/43

(21) Application number: 24820359.8

(22) Date of filing: 03.12.2024
(51) International Patent Classification (IPC): 
H01J 37/147(2006.01)
H01J 37/04(2006.01)
H01J 37/28(2006.01)
(52) Cooperative Patent Classification (CPC):
H01J 37/28; H01J 37/1474; H01J 2237/2817; H01J 2237/04; H01J 37/04
(86) International application number:
PCT/EP2024/084581
(87) International publication number:
WO 2025/125017 (19.06.2025 Gazette 2025/25)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
GE KH MA MD TN

(30) Priority: 13.12.2023 US 202363609855 P

(71) Applicant: ASML Netherlands B.V.
5500 AH Veldhoven (NL)

(72) Inventors:
  • ZHOU, Yongjian
    San Jose, California 95134 (US)
  • GONG, Zizhou
    San Jose, California 95134 (US)
  • JI, Xiaoyu
    San Jose, California 95134 (US)
  • REN, Weiming
    San Jose, California 95134 (US)

(74) Representative: ASML Netherlands B.V. 
Corporate Intellectual Property P.O. Box 324
5500 AH Veldhoven
5500 AH Veldhoven (NL)

   


(54) METHOD OF SCANNING A SAMPLE WITH NON-CIRCULAR BEAM SPOTS