(19)
(11) EP 4 824 850 A1

(12)

(43) Date of publication:
21.10.2026 Bulletin 2026/43

(21) Application number: 24798749.8

(22) Date of filing: 23.10.2024
(51) International Patent Classification (IPC): 
H01J 37/22(2006.01)
(52) Cooperative Patent Classification (CPC):
H01J 37/222; H01J 2237/226; G01N 2223/401; G01N 23/20058
(86) International application number:
PCT/EP2024/079919
(87) International publication number:
WO 2025/124784 (19.06.2025 Gazette 2025/25)
(84) Designated Contracting States:
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC ME MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated Extension States:
BA
Designated Validation States:
GE KH MA MD TN

(30) Priority: 13.12.2023 EP 23216143

(71) Applicant: Universiteit Antwerpen
2000 Antwerpen (BE)

(72) Inventors:
  • VERBEECK, Johan
    2020 Antwerpen (BE)
  • LALANDEC ROBERT, Hoelen
    2020 Antwerpen (BE)

(74) Representative: De Clercq & Partners 
Edgard Gevaertdreef 10a
9830 Sint-Martens-Latem
9830 Sint-Martens-Latem (BE)

   


(54) METHOD AND SYSTEM FOR RECONSTRUCTION OF AN IMAGE FROM ELECTRON DIFFRACTION DATA