BACKGROUND
[0001] The demand for improved power efficiency of power management units (PMUs) in battery-powered
electronic devices has grown extensively to extend battery life. Such PMUs can include
a low-dropout (LDO) regulator to provide direct current (DC) voltage regulation of
the battery voltage source. The advantages of an LDO regulator over other DC-to-DC
voltage regulators can include the absence of switching noise, smaller device size,
high power efficiency, and high bandwidth. There are, however, design challenges for
an LDO regulator in the presence of unpredictable load conditions, such as a transition
from no load to light load, a transition from moderate load to heavy load, an over-load
condition, and a short-circuit condition. There is a need in the art for an LDO regulator
that can achieve robust performance with sustainable current efficiency across different
load conditions.
SUMMARY
[0002] In an embodiment, a voltage regulator can include a first node configured to receive
a first direct-current (DC) voltage, a second node configured to supply a second DC
voltage, and a third node configured to supply an electrical ground. The voltage regulator
can include a first transistor coupled between the first node and the second node,
and a first network coupled between the second node and the third node, the first
network outputting a first voltage. The voltage regulator can include a control circuit.
The control circuit can include an error amplifier configured to supply a third voltage
to a gate of the first transistor based on comparison of the first voltage with a
second voltage. The control circuit can include a first circuit coupled between the
second node and the third node. The first circuit can be configured to provide a current
path between the second node and the third node in response to a first current through
the first transistor being less than a threshold and disconnect the current path otherwise.
[0003] In another embodiment, a voltage regulator can include a first node configured to
receive a first direct-current (DC) voltage, a second node configured to supply a
second DC voltage, and a third node configured to supply an electrical ground. The
voltage regulator can include a first transistor coupled between the first node and
the second node, and a first network coupled between the second node and the third
node, the first network outputting a first voltage. The voltage regulator can include
a control circuit. The control circuit can include a first error amplifier configured
to supply a third voltage to a gate of the first transistor based on comparison of
the first voltage with a second voltage. The control circuit can include a first circuit
configured to generate a second current proportional to a first current through the
first transistor and control the third voltage to limit the first current in response
to the second current exceeding a threshold.
[0004] In another embodiment, a voltage regulator can include a first node configured to
receive a first direct-current (DC) voltage, a second node configured to supply a
second DC voltage, and a third node configured to supply an electrical ground. The
voltage regulator can include a first transistor coupled between the first node and
the second node, and a first network coupled between the second node and the third
node, the first network outputting a first voltage. The voltage regulator can include
a control circuit. The control circuit can include a first error amplifier configured
to supply a third voltage to a gate of the first transistor based on comparison of
the first voltage with a second voltage. The control circuit can include a first circuit
configured to generate a second current proportional to a first current through the
first transistor and supply the second current to a second network coupled to the
second node and the first error amplifier.
BRIEF DESCRIPTION OF THE DRAWINGS
[0005]
Fig. 1 is a block diagram depicting a device according to some embodiments.
Fig. 2 is a schematic diagram depicting an LDO regulator coupled to load according
to some embodiments.
Fig. 3 is a schematic diagram depicting a control circuit for an LDO regulator according
to some embodiments.
Fig. 4 is a schematic diagram depicting a feedback loop of control a circuit according
to some embodiments.
Fig. 5 is a schematic diagram depicting another feedback loop of a control circuit
according to some embodiments.
Fig. 6 is a schematic diagram depicting an adaptive bias loop for an LDO regulator
according to some embodiments.
Fig. 7 is a schematic diagram depicting a transconductance clamp according to some
embodiments.
Fig. 8 is a schematic diagram depicting another feedback loop of a control circuit
according to some embodiments.
Fig. 9 is a schematic diagram depicting adaptive damping factor control (ADFC)-based
frequency compensation in a control circuit according to some embodiments.
DETAILED DESCRIPTION
[0006] Fig. 1 is a block diagram depicting a device 100 according to some embodiments. Device
100 can include an LDO regulator 102, a battery 104, and a load circuit ("load 106").
A battery may be a source of electric power using electrochemical cell(s). A voltage
regulator may be a circuit designed to output a stable voltage (referred to as a regulated
voltage) from an input voltage. The input voltage can vary over time. A linear regulator
may be a voltage regulator that can vary its resistance between input and output continuously
to maintain a stable output voltage. An LDO regulator may be a type of linear voltage
regulator that can generate regulated voltage even when the input-to-output voltage
differential across its resistance (referred to as the dropout voltage) is small (e.g.,
on the order of tens to hundreds of millivolts). While different subcategories of
voltage regulators are described by way of example (e.g., linear regulator or LDO
regulator), it is to be understood that the voltage regulator described herein is
not limited by any subcategory. Thus, LDO regulator 102 can be a voltage regulator
as described by the various embodiments and claims herein and can have a subcategory
of linear regulator or LDO regulator.
[0007] A load circuit may be a circuit that consumes power. In device 100, battery 104 can
supply an input voltage (Vin) to LDO regulator 102. LDO regulator 102 can generate
an output voltage (Vout) from the input voltage (Vin). LDO regulator 102 can supply
the output voltage (Vout) to load 106. Load 106 can consume current supplied by LDO
regulator 102. Load 106 can vary such that the current drawn from LDO regulator 102
varies. For example, load 106 can vary among no load, light load, moderate load, and
heavy load conditions. The load conditions described herein by way of example are
qualitative. No load can be a condition where load 106 draws no current. Light load
can be a condition where load 106 draws a current at or near a minimum amount of current.
Heavy load can be a condition where load 106 draws a current at or near a maximum
amount of current. Moderate load can be a condition where load 106 draws an amount
of current between light load and heavy load. LDO regulator 102 and load 106 can be
part of one or more integrated circuits (ICs). An IC may be a circuit etched onto
a semiconductor material. Device 100 can be any of a myriad of battery-powered devices
known in the art.
[0008] One type of LDO regulator can include a reference voltage, an error amplifier, a
pass element, such as a transistor, and a feedback network. The pass element can be
coupled between the input and output of the LDO regulator. The pass element can control
the current from the input to the output based on the error amplifier's output signal.
The error amplifier can generate its output signal by comparing voltage from the feedback
network, which can be derived from the output voltage, and the reference voltage.
For low-current, low power LDO regulators (e.g., less than one microamp), the leakage
current (e.g., junction and channel leakages) of the transistor pass element can have
a large impact on output regulation at no load or light load conditions. To maintain
operation, an LDO regulator can require a certain minimum current to be consumed by
the load. This minimum current, however, may not be guaranteed (e.g., when LDO regulator
102 is designed separately from load 106).
[0009] For an LDO regulator that is not adaptive, the internal bias currents and control-loop
gains can be fixed to ensure stable operation and performance for a range of loads.
An LDO regulator can be adaptive where one or more parameters within the regulator's
control loop can be adjusted dynamically depending on operating conditions. For example,
an LDO regulator can sense the output current and adjust parameter(s) accordingly,
such as bias currents and the gate drive of the pass transistor. For such an LDO regulator,
the current sensing ratio can be large to ensure stability at light to moderate load
conditions. However, such a large current sensing ratio can result in DC headroom
issues and electromagnetic (EM) issues for heavy load conditions. Further, when an
over-current or short-circuit event occurs, the excessive current drawn from the battery
can degrade the current efficiency and battery life. An over-current event, which
can be caused by a short-circuit or the like, can be a load condition where more current
is drawn than the maximum current for which the LDO regulator is designed to output.
An LDO regulator can be coupled to an external output capacitor. When the external
output capacitor degrades under process/voltage/temperature (PVT) variations, the
bandwidth of the LDO regulator can become too large to be able to maintain good stability
margins and stable operation. Embodiments of LDO regulator 102 are described below
that can exhibit sustainable current efficiency over a range of load conditions, e.g.,
from no load to heavy load conditions.
[0010] Fig. 2 is a schematic diagram depicting LDO regulator 102 coupled to load 106 according
to some embodiments. LDO regulator 102 can include a control circuit 10, a transistor
12, and a network 24. LDO regulator 102 can include transistors, such as transistor
12. In embodiments, the transistors can be field effect transistors (FETs). A FET
can be a four-terminal device having gate, source, drain, and substrate terminals.
Unless otherwise indicated, the transistors described herein have their substrate
terminals coupled to their source terminals and, as such, the substrate terminals
are not explicitly shown. FETs can be p-channel FETs or n-channel FETs, where n and
p refer to the type of doping in the semiconductor material and the type of majority
charge carrier, as is known in the art. Consistent with convention, any n-channel
transistors are shown schematically with the source as an arrow facing away from the
gate and any p-channel transistors are shown schematically with the source as an arrow
facing towards the gate. There are many types of FETs known in the art. One skilled
in the art can select among one or more such FETs based on the description of the
examples and embodiments herein. Metal-oxide semiconductor field-effect transistors
(MOSFETs) are widely used and well-known FETs in ICs. P-channel MOSFETs can be referred
to as PMOS transistors and N-channel MOSFETs can be referred to as NMOS transistors.
Accordingly, for purposes of clarity, various examples and embodiments are described
below within the context of NMOS transistors, PMOS transistors, or a combination thereof.
[0011] LDO regulator 102 can have various nodes. A node may be a point in a circuit where
two or more circuit elements are connected. A node can be shown in the drawings as
a filled circle at a wire junction. Note that, for ease of illustration, a node may
be shown as two or more separate junctions connected by only wire(s) and no circuit
elements (e.g., a short-circuit connection). In such case, a reference numeral assigned
to the node can be at one of the junctions or at one of the wires between the junctions,
all of which collectively represent the node. An electrical network ("network") can
be an interconnection of electrical components or a model of such interconnection.
For example, network 24 can be an interconnection of a resistor 14, a resistor 16,
and a capacitor 18. Capacitor 20 and resistor 22 can be a network that models load
106. Capacitors and resistors are components well-known in the art.
[0012] In embodiments, transistor 12 can be a PMOS transistor. The source of transistor
12 can be coupled to a node 11 and the drain of transistor 12 can be coupled to a
node 15. Node 11 can receive the input voltage (Vin), e.g., from battery 104. Input
voltage (Vin) can be a DC voltage. Node 15 can supply the output voltage (Vout) to
load 106. Output voltage (Vout) can be a DC voltage. A DC voltage may be a voltage
that drives current in one direction. The gate of transistor 12 can be coupled to
a node 13, which supplies a gate voltage (vgp). Network 24 can be coupled between
node 15 and a node 19. Node 19 can be at electrical ground. Electrical ground can
be any voltage that provides a reference for other voltages (e.g., 0 volts). In an
embodiment, network 24 can include resistors 14 and 16 and a capacitor 18. Resistor
14 can be coupled between node 15 and a node 17, which supplies a feedback voltage
(vfb). Resistor 16 can be coupled between node 17 and node 19. Capacitor 18 can be
coupled between node 15 and node 17 (e.g., in parallel with resistor 14). In this
configuration, resistors 14 and 16 can form a voltage divider that supplies a fraction
of the output voltage (Vout) as the feedback voltage (vfb). Feedback in a circuit
may be when output is routed back as input. The voltage at node 17 can be a fraction
of the output voltage, which is routed back to control circuit 10 and used as input
to control transistor 12. Network 14 can have other configurations of components to
provide the feedback voltage (vfb).
[0013] Load 106 can be modeled by a capacitor 20 and a resistor 22. The circuit modeled
by capacitor 20 and resistor 22 can be any of a myriad of circuits used in devices,
such as battery-powered devices. Capacitor 20 and resistor 22 can be in parallel and
the parallel combination coupled between node 15 and node 19 (e.g., between Vout and
electrical ground). Load 106 can consume current supplied by LDO regulator 102 (Iout).
Quiescent current (Iq) for LDO regulator 102 can be the difference between input current
(Iin) and output current (Iout). Power efficiency of LDO regulator 102 may be a fraction
where the numerator is the product of the output current (Iout) and output voltage
(Vout) and the denominator is the product of the input voltage (Vin) and the sum of
the output current (Iout) and the quiescent current (Iq), e.g., (Iout*Vout)/[(Iout
+ Iq)*Vin]. For a given drop out voltage, minimizing quiescent current (Iq) can improve
power efficiency.
[0014] A control circuit can be a circuit that exhibits control over component(s). Control
circuit 10 can control transistor 12. Control circuit 10 can be coupled to nodes 11,
13, 15, 17, and 19. Control circuit 10 can control the gate voltage (vgp) supplied
to transistor 12. Control circuit 10 can include multiple feedback loops, as discussed
further below. A feedback loop may be a circuit that exhibits feedback. Control circuit
10 can use the output voltage (Vout), the feedback voltage (vfb), and a reference
voltage (Vref) in the feedback loops to control the gate voltage (vgp). A voltage
source 23 can supply the reference voltage (Vref) to a node 21. A voltage source may
be a circuit that outputs a voltage independent of its load and supplied current within
a range. Control circuit 10 can be coupled to node 21 to receive the reference voltage
(Vref). Voltage source 23 can be coupled between nodes 21 and 19. Some embodiments
of control circuit 10 are described below. Voltage source 23 can be, for example,
a voltage reference, such as a bandgap voltage reference or the like known in the
art.
[0015] Fig. 3 is a schematic diagram depicting control circuit 10 according to some embodiments.
Control circuit 10 can include transistors 30, 31, 32, and 33. Transistors 30 and
31 can be PMOS transistors. Transistors 32 and 33 can be NMOS transistors. The sources
of transistors 30 and 31 can be coupled to a node 39. The drain of transistor 30 can
be coupled to a node 38. The drain of transistor 31 can be coupled to a node 37. The
gate of transistor 30 can be coupled to node 17 to receive the feedback voltage (vfb).
The gate of transistor 31 can be coupled to node 21 to receive the reference voltage
(Vref). The drain of transistor 32 can be coupled to node 38. The drain of transistor
33 can be coupled to node 37. The sources of transistors 32 and 33 can be coupled
to node 19 (electrical ground). The gates of transistors 32 and 33 can be coupled
to node 37. Accordingly, transistor 33 can be a diode-connected transistor. A diode-connected
transistor may be a transistor having its drain coupled to its gate such that the
transistor becomes a two-terminal device having the source terminal and the gate/drain
terminal. Control circuit 10 can include a capacitor 34 and a resistor 35. A series
combination of capacitor 34 and resistor 35 can be coupled between node 38 and node
19 (electrical ground).
[0016] Control circuit 10 can include a current source 50, transistors 51 and 52, resistor
53, capacitor 54, resistors 55 and 56, transistors 59 and 60, and capacitor 61. A
current source may be a circuit that supplies current independent of the voltage across
the current source within a range. Current source 50 can be coupled between node 11
and node 39. Transistors 51 and 52 can be PMOS transistors. The drain of transistor
51 can be coupled to node 39. The source of transistor 51 can be coupled to node 11
through resistor 53 (e.g., resistor 53 can be coupled between node 11 and the source
of transistor 51). The gate of transistor 51 can be coupled to a node 57. Capacitor
54 can be coupled between node 11 and node 57. Resistor 56 can be coupled between
node 57 and a node 58. Both the gate and the drain of transistor 52 can be coupled
to node 58. Thus, transistor 52 can be a diode-connected transistor. The source of
transistor 52 can be coupled to node 11 through resistor 55 (e.g., resistor 55 can
be coupled between node 11 and the source of transistor 52). Transistors 59 and 60
can be NMOS transistors. The drain of transistor 59 can be coupled to node 58. The
gate and the drain of transistor 60 can be coupled to a node 62. Thus, transistor
60 can be a diode-connected transistor. The sources of transistors 59 and 60 can be
coupled to node 19 (electrical ground). Capacitor 61 can be coupled between node 62
and node 19 (electrical ground).
[0017] Control circuit 10 can include transistors 36, 70, 71, and 72, and a current source
73. Transistors 36, 70, 71, and 72 can be NMOS transistors. The gate and the drain
of transistor 70 can be coupled to a node 74. Thus, transistor 70 can be a diode-connected
transistor. The source of transistor 70 can be coupled to node 19 (electrical ground).
The drain of transistor 71 can be coupled to a node 75. The gate of the transistor
71 can be coupled to node 74. The source of transistor 71 can be coupled to node 19
(electrical ground). Current source 73 can be coupled between node 11 and node 75.
The drain of transistor 72 can be coupled to node 13. The gate of transistor 72 can
be coupled to node 75. The source of transistor 72 can be coupled to the drain of
transistor 36. The source of transistor 36 can be coupled to node 19 (electrical ground).
The gate of transistor 36 can be coupled to node 38.
[0018] Control circuit 10 can include transistors 63, 64, 65, and 66, and resistors 67 and
68. Transistors 63, 64, 65, and 66 can be PMOS transistors. The source of transistor
63 can be coupled to node 11 through resistor 67 (e.g., resistor 67 can be coupled
between node 11 and the source of transistor 63). The drain of transistor 63 can be
coupled to the source of transistor 65. The drain of transistor 65 can be coupled
to node 62. The source of transistor 64 can be coupled to node 11 through resistor
68 (e.g., resistor 68 can be coupled between node 11 and the source of transistor
64). The drain of transistor 64 can be coupled to the source of transistor 66. The
drain of transistor 66 can be coupled to node 74. The gates of transistors 63 and
64 can be coupled to node 13. The gates of transistors 65 and 66 can be coupled to
a node 69.
[0019] Control circuit 10 can include transistors 40, 42, and 43, a current source 41, resistors
44, 45, and 46, and capacitor 47. Current source 41 can be coupled between node 11
and a node 48. Transistors 40, 42, and 43 can be NMOS transistors. The drain of transistor
40 can be coupled to node 48. The source of transistor 40 can be coupled to node 19
(electrical ground). The gate of transistor 40 can be coupled to node 38. The gate
and the drain of transistor 43 can be coupled to node 48. Thus, transistor 43 can
be a diode-connected transistor. The source of transistor 43 can be coupled to node
19 (electrical ground) through resistor 44 (e.g., resistor 44 can be coupled between
the source of transistor 43 and node 19). The drain of transistor 42 can be coupled
to node 15 through resistor 46 (e.g., resistor 46 can be coupled between node 15 and
the drain of transistor 42). Capacitor 47 can be coupled between the drain of transistor
42 and node 37. The source of transistor 42 can be coupled to node 19 (electrical
ground) through resistor 45 (e.g., resistor 45 can be coupled between the source of
transistor 42 and node 19). Resistor 45 can be a variable resistor or a device providing
a variable resistance.
[0020] Control circuit 10 can include transistors 80, 81, 82, and 86, resistors 84, 85,
and 88, capacitor 87, and error amplifier 83. An error amplifier may be a circuit
that amplifies the difference between its two inputs. An error amplifier can supply
a voltage as output based on comparison of the voltages on its inputs. Transistors
80, 81, 82, and 86 can be PMOS transistors. The source of transistor 80 can be coupled
to node 11. The drain of transistor 80 can be coupled to a node 89. The source of
transistor 81 can be coupled to node 11 through resistor 84 (e.g., resistor 84 can
be coupled between node 11 and the source of transistor 81). The drain of transistor
81 can be coupled to node 89. The source of transistor 86 can be coupled to node 11.
The drain of transistor 86 can be coupled to node 15 through resistor 88 (e.g., resistor
88 can be coupled between the drain of transistor 86 and node 15). The gates of transistors
80, 81, and 86 can be coupled to node 13. Capacitor 87 can be coupled between the
drain of transistor 86 and node 37. Resistor 85 can be coupled between node 11 and
node 13. The inverting input of error amplifier 83 can be coupled to node 89. The
non-inverting input of error amplifier 83 can be coupled to node 15. The output of
error amplifier 83 can be coupled to node 69. The source of transistor 82 can be coupled
to node 89. The drain of transistor 82 can be coupled to node 13. The gate of transistor
82 can be coupled to node 69.
[0021] Fig. 4 is a schematic diagram depicting a feedback loop 400 of control circuit 10
according to some embodiments. Elements of Fig. 4 that are the same or similar to
those of Fig. 3 are designated with identical reference numerals. Elements not relevant
to feedback loop 400 are omitted from Fig. 4 and shown in Fig. 3 described above.
In some embodiments, feedback loop 400 can apply an adaptive minimum current limit.
Feedback loop 400 can address the leakage-induced load regulation problem while offering
sustainable high-current efficiency from no load condition to light load condition.
Feedback loop 400 can provide a minimum load current automatically and thus maintain
proper output regulation. Feedback loop 400 can remain off at typical load conditions
and can be enabled automatically when minimum load current is needed. Feedback loop
400 can remain off automatically whenever enough system load is engaged, which can
provide for current efficiency and sustainable output regulation.
[0022] Transistor 40 can operate as a current-sensing device to sense current in the second
stage of the main feedback loop (discussed below). The second stage current flows
through transistor 36 (Fig. 3), which in turn tracks the current through transistor
12. Transistor 40 can share the same gate with transistor 36 and can form a current
mirror. A current mirror may be a circuit that supplies one current based on another
current (e.g., a type of current source). The two currents can be the same (e.g.,
mirrored) or proportional to each other. Current source 73 can supply a current (Iref1),
which can be a reference bias current used to define a threshold to enable the minimum
current limit. Transistor 42 can operate as the output driving stage with sinking
capability. At nominal conditions, the current through transistor 40 (Iminc_sns) can
be greater than the reference current (Iref1). In this case, reference current (Iref1)
can provide a threshold against which the current Iminc_sns can be compared in feedback
loop 400. In such case, the voltage at node 75 (vng2) can be pulled down to turn off
transistor 42. When transistor 42 is off, feedback loop 400 can be off and the current
(Imin) through transistor 42 can be at or near zero. A current path may be a path
for current in a circuit. When the voltage at node 75 is less than the threshold voltage
of transistor 42, a current path through resistor 46 and transistor 42 between nodes
15 and 19 can be disconnected. In case a large leakage exists or the existing current
drawn by the load is not adequate, the current through transistor 36 and the current
through transistor 40 (Iminc_sns) can be reduced and the gate voltage of transistor
36 can become too low to maintain proper loop gain and output regulation. Once the
sensed current (Iminc_sns) is less than the reference current (Iref1), the voltage
at node 75 (vng2) can be pulled high to turn on transistor 42, which conducts a current
(Imin) to sink the required minimum current and ensure proper output regulation. Thus,
in this scenario, feedback loop 400 can provide a current path through resistor 46
and transistor 42 between nodes 14 and 19 to conduct the current Imin. Resistor 45
can operate as a current-limiting resistor and can set an upper boundary of the minimum
current limit. In some embodiments, resistor 45 can be replaced with an NMOS transistor
having its drain coupled to the source of transistor 42 and its source coupled to
node 19 (electrical ground). Such an NMOS transistor can be a current source used
to set the upper boundary of the minimum current limit. Transistor 43 and resistor
44 can function as a local impedance attenuator to limit the loop gate and ensure
loop stability. Resistor 46 and capacitor 47 can form an adaptive damping factor control-based
frequency compensation network for feedback loop 400. This network is discussed further
below.
[0023] Fig. 5 is a schematic diagram depicting another feedback loop 500 of control circuit
10 according to some embodiments. Elements of Fig. 5 that are the same or similar
to those of Fig. 3 are designated with identical reference numerals. Elements not
relevant to feedback loop 500 are omitted from Fig. 5 and shown in Fig. 3 described
above. Feedback loop 500 can be a main feedback loop with adaptive bias for adjusting
the gate voltage (vgp) at node 13. Feedback loop 500 can ensure power efficiency at
light load conditions while achieve high bandwidth at heavy load conditions.
[0024] Feedback loop 500 can be formed by a first gain stage (transistors 30, 31, 32, and
33), a second gain stage (transistors 36 and 80), the output power transistor (transistor
12), and network 24 (e.g., resistors 14, 16 and capacitor 18). A current source 504
coupled between nodes 11 and 39 can model the adaptive bias current (Iab), discussed
further below with respect to Fig. 6. Transistor 80 can operate as a current sensing
device to boost gain and slew rate at the output of the second stage (e.g., transistor
36). Error amplifier 83 and transistor 82 can form a local negative feedback loop
to ensure the drain voltage of transistor 80 matches the drain voltage of transistor
12 (output stage). This can be to ensure proper current sensing by transistor 80.
[0025] Transistors 30 and 31 can be a differential transistor pair. A differential transistor
pair may be a circuit that amplifies a difference between two input voltages. The
first and second gain stages described above can form an error amplifier. The inputs
of the error amplifier can be the feedback voltage (vfb) and the reference voltage
(Vref). The output of the error amplifier can be the second stage current (I2stg)
through transistor 36, which is converted to the voltage (vgp) to control transistor
12.
[0026] Fig. 6 is a schematic diagram depicting an adaptive bias loop 600 for an LDO regulator
according to some embodiments. Elements of Fig. 6 that are the same or similar to
those of Fig. 3 are designated with identical reference numerals. Elements not relevant
to the adaptive bias loop 600 are omitted from Fig. 6 and shown in Fig. 3 described
above. Adaptive bias loop 600 can include two PMOS current mirrors (transistor 63,
transistor 52, and transistor 51) and one NMOS current mirror (transistor 59 and transistor
60). Transistor 65 can operate as a cascode for transistor 63, which can be a current
sensor. Error amplifier 83 and transistor 65 can for a local negative feedback loop
to ensure the drain voltage of transistor 63 matches the drain voltage of transistor
12 (output stage). This can be to ensure proper current sensing by transistor 63.
The adaptive bias loop 600 can boost the bandwidth at heavy load condition.
[0027] Fig. 7 is a schematic diagram depicting a transconductance clamp 700 according to
some embodiments. Elements of Fig. 7 that are the same or similar to those of Fig.
3 are designated with identical reference numerals. Elements not relevant to transconductance
clamp 700 are omitted from Fig. 7 and shown in Fig. 3 described above. Transconductance
clamp 700 can provide a large gain at light to moderate load conditions, can address
headroom issues, and can improve current efficiency at moderate to heavy load conditions.
Transconductance may be the ratio of the change in current at an output terminal of
a device to the change in voltage at an input terminal of the device. Transconductance
clamp 700 can include transistor 80, transistor 81, and resistor 84. The effective
transconductance can be gms1 + gms2 / (1 + gms2*Rs2), where gms1 is the transconductance
of transistor 80, gms2 is the transconductance of transistor 81, and Rs2 is the resistance
of resistor 84. At light to moderate load conditions, the transconductance of clamp
700 can be as large as (gms1 + gms2), as the impact of resistor 84 can be negligible.
At moderate to heavy load conditions, the equivalent transconductance can be reduced
to gms1 + 1 / Rs2, given gms2*Rs2 > 1. In this manner, a larger second stage current
(I2stg) conducted by transistor 36 and a larger loop gain can be achieved at light
to moderate load conditions for proper voltage regulation. Further, the second stage
current (I2stg) can be reduced for improved current efficiency at moderate to heavy
load conditions.
[0028] Fig. 8 is a schematic diagram depicting another feedback loop 800 of control circuit
10 according to some embodiments. Elements of Fig. 8 that are the same or similar
to those of Fig. 3 are designated with identical reference numerals. Elements not
relevant to feedback loop 800 are omitted from Fig. 8 and shown in Fig. 3 described
above. Feedback loop 800 can provide an adaptive maximum current limit to limit the
current drawn from the DC voltage source (e.g., the battery) in case of over-load
or short-circuit conditions. This can prolong battery life in case of such abnormal
conditions. Feedback loop 800 can be formed from transistor 64, resistor 68, transistor
70, transistor 71, current source 73, and transistor 72. Feedback loop 800 can be
off at normal load conditions. Feedback loop 800 can be nearly off at no load condition,
which can help minimize quiescent current (Iq). Feedback loop 800 can be enabled automatically
in response to an over-load or short-circuit condition. Transistor 84 can be a current
sensing device to sense the load current. Transistor 84 can share the same gate with
transistor 12 (the output stage). Transistor 84 can form a current mirror with transistor
12. Resistor 68 can be a current limiter. Transistors 70 and 71 can form an NMOS current
mirror. Current source 73 can supply a reference bias current that can define the
threshold to enable feedback loop 800. Transistor 72 can be the output driving stage
of feedback loop 800. At normal load conditions, the current through transistor 71
(Ioc_sns) can be less than the reference current (Iref2) from current source 73. The
gate voltage of transistor 72 can be pulled up to the input voltage (Vin) to turn
on transistor 72 so that feedback loop 800 is open (off). Transistor 72 can behave
as an active resistor having a small resistance that does not impact the gate voltage
(vgp) on node 13. Given an over-load/short-circuit condition, the current in transistor
71 (Ioc_sns) can be increased. Once the sensed current (Ioc_sns) is greater than the
reference current (Iref2) from current source 73, the gate voltage vgnoc of transistor
72 can be pulled down to limit the driving capability of transistor 72, providing
a maximum load current. That is, feedback loop 800 can generate a current (Ioc_sns)
that is proportional to the current through transistor 12. Feedback loop 800 can control
the gate voltage vgnoc to limit the current through transistor 12 in response to the
current Ioc_sns exceeding a threshold. Feedback loop 800 can achieve better accuracy
than that of open-loop control. The maximum current can be set to Iref2*k, where k
represents the current mirror ratio.
[0029] Fig. 9 is a schematic diagram depicting adaptive damping factor control (ADFC)-based
frequency compensation in control circuit 10 according to some embodiments. Elements
of Fig. 9 that are the same or similar to those of Fig. 3 are designated with identical
reference numerals. Elements not relevant to ADFC-based frequency compensation are
omitted from Fig. 9 and shown in Fig. 3 described above. The ADFC-based frequency
compensation can be employed for boosting stability margin at moderate to heavy load
conditions to support a wide range of load capacitance. The ADFC-based frequency compensation
does not consume additional power since the sensed current can be recycled to the
output load and thus current efficiency can be maintained. Transistor 86, resistor
88, and capacitor 87 can form a frequency compensation network 902 to boost stability
margin. The current through transistor 86 can be proportional to the current through
transistor 12. Transistor 86 can supply current to the network comprising resistor
88 and capacitor 87. Frequency compensation network 902 can provide a feed-forward
zero that is controlled by gm_c * Rc * Cc, where gm_c is the transconductance of transistor
86, Rc is the resistance of resistor 88, and Cc is the capacitance of capacitor 87.
At no load to light load conditions, where the transconductance of transistor 86 can
be small, the network can be considered as a parasitic capacitance. For moderate to
heavy load conditions, network 902 can start to provide an additional zero controlled
by gm_c * Rc * Cc to boost stability margin. Transistor 42, resistor 46, and capacitor
47 can form a frequency compensation network 904 that functions similar to network
902.
[0030] While some processes and methods having various operations have been described, one
or more embodiments also relate to a device or an apparatus for performing these operations.
The apparatus may be specially constructed for required purposes, or the apparatus
may be a general-purpose computer selectively activated or configured by a computer
program stored in the computer. Various general-purpose machines may be used with
computer programs written in accordance with the teachings herein, or it may be more
convenient to construct a more specialized apparatus to perform the required operations.
[0031] As used herein, the phrase "at least one of" preceding a series of items, with the
term "and" or "or" to separate any of the items, modifies the list as a whole, rather
than each member of the list (i.e., each item). The phrase "at least one of" does
not require selection of at least one of each item listed; rather, the phrase allows
a meaning that includes at least one of any one of the items, and/or at least one
of any combination of the items. By way of example, the phrases "at least one of A,
B, and C" or "at least one of A, B, or C" each refer to only A, only B, or only C;
and/or any combination of A, B, and C. In instances where it is intended that a selection
be of "at least one of each of A, B, and C ," or alternatively, "at least one of A,
at least one of B, and at least one of C," it is expressly described as such.
[0032] It will be understood that, although the terms "first," "second," etc. may be used
herein to describe various elements, these elements should not be limited by these
terms. These terms are only used to distinguish one element from another. For example,
a first element could be termed a second element, and, similarly, a second element
could be termed a first element, without departing from the scope of the present disclosure.
[0033] As used herein, the term "couple" or "connect" and its derivatives include: (a) electrical
and communicative coupling or connecting; and (b) do not imply a direct coupling or
connection, but rather may include intervening elements, unless described as "directly
coupled" or "directly connected."
[0034] Although one or more embodiments of the present invention have been described in
some detail for clarity of understanding, certain changes may be made within the scope
of the claims. Accordingly, the described embodiments are to be considered as illustrative
and not restrictive, and the scope of the claims is not to be limited to details given
herein but may be modified within the scope and equivalents of the claims. In the
claims, elements and/or steps do not imply any particular order of operation unless
explicitly stated in the claims.
[0035] Boundaries between components, operations, and data stores are somewhat arbitrary,
and particular operations are illustrated in the context of specific illustrative
configurations. Other allocations of functionality are envisioned and may fall within
the scope of the invention. In general, structures and functionalities presented as
separate components in exemplary configurations may be implemented as a combined structure
or component. Similarly, structures and functionalities presented as a single component
may be implemented as separate components. These and other variations, additions,
and improvements may fall within the scope of the appended claims.
[0036] The invention also comprises the following embodiments forming part of the description:
- 1. A voltage regulator, comprising:
a first node configured to receive a first direct-current (DC) voltage;
a second node configured to supply a second DC voltage;
a third node configured to supply an electrical ground;
a first transistor coupled between the first node and the second node;
a first network coupled between the second node and the third node, the first network
outputting a first voltage; and
a control circuit including: an error amplifier configured to supply a third voltage
to a gate of the first transistor based on comparison of the first voltage with a
second voltage; and a first circuit coupled between the second node and the third
node, the first circuit configured to provide a current path between the second node
and the third node in response to a first current through the first transistor being
less than a threshold and disconnect the current path otherwise.
- 2. The voltage regulator of embodiment 1, wherein the first circuit comprises:
a second transistor coupled between the second node and the third node;
a third transistor coupled between a gate of the second transistor and the third node;
and
a current source configured to supply a second current to the third transistor.
- 3. The voltage regulator of embodiment 2, wherein the error amplifier includes a differential
transistor pair having an input configured to receive the first voltage and the second
voltage and an output having a fourth node configured to supply a fourth voltage and
a fifth node configured to a fifth voltage, and wherein a gate of the third transistor
is coupled to the fourth node.
- 4. The voltage regulator of embodiment 3, wherein the first circuit comprises:
a resistor coupled between the second node and the second transistor; and
a capacitor coupled between the second transistor and the fifth node.
- 5. The voltage regulator of embodiment 3, wherein the error amplifier comprises a
fourth transistor coupled between the gate of the first transistor and the third node,
a gate of the fourth transistor coupled to the fourth node.
- 6. The voltage regulator of embodiment 2, wherein the first circuit comprises:
a resistor or fourth transistor coupled between the second transistor and the third
node.
- 7. The voltage regulator of embodiment 2, wherein the first circuit comprises:
a diode-connected transistor and a resistor coupled in series between second transistor
and the third node.
- 8. A voltage regulator, comprising:
a first node configured to receive a first direct-current (DC) voltage;
a second node configured to supply a second DC voltage;
a third node configured to supply an electrical ground;
a first transistor coupled between the first node and the second node;
a first network coupled between the second node and the third node, the first network
outputting a first voltage; and
a control circuit including: a first error amplifier configured to supply a third
voltage to a gate of the first transistor based on comparison of the first voltage
with a second voltage; and a first circuit configured to: generate a second current
proportional to a first current through the first transistor; and control the third
voltage to limit the first current in response to the second current exceeding a threshold.
- 9. The voltage regulator of embodiment 8, wherein the first circuit comprises:
a second transistor coupled to the first node, a gate of the second transistor coupled
to the gate of the first transistor;
a diode-connected transistor coupled between the second transistor and the third node;
a current source;
a third transistor coupled between the current source and the third node; and
a fourth transistor coupled between an output of the first error amplifier and the
gate of the first transistor, a gate of the fourth transistor coupled to the third
transistor and the current source.
- 10. The voltage regulator of embodiment 9, wherein the first circuit further comprises:
a fifth transistor coupled between the second transistor and the diode-connected transistor;
a second error amplifier having an output coupled to a gate of the fifth transistor,
a first input coupled to the second node, and a third input coupled to a fourth node
to receive a fourth voltage.
- 11. The voltage regulator of embodiment 10, wherein the control circuit comprises:
a sixth transistor coupled between the first node and the fourth node, a gate of the
sixth transistor coupled to the gate of the first transistor.
- 12. The voltage regulator of embodiment 11, wherein the control circuit comprises:
a seventh transistor coupled between the first node and the fourth node, a gate of
the seventh transistor coupled to the gate of the first transistor; and
a resistor coupled between the seventh transistor and the first node.
- 13. The voltage regulator of embodiment 10, wherein the first circuit further comprises:
a resistor coupled between the second transistor and the first node.
- 14. The voltage regulator of embodiment 10, further comprising:
a resistor coupled between the first node and the gate of the first transistor.
- 15. A voltage regulator, comprising:
a first node configured to receive a first direct-current (DC) voltage;
a second node configured to supply a second DC voltage;
a third node configured to supply an electrical ground;
a first transistor coupled between the first node and the second node;
a first network coupled between the second node and the third node, the first network
outputting a first voltage; and
a control circuit including: a first error amplifier configured to supply a third
voltage to a gate of the first transistor based on comparison of the first voltage
with a second voltage; and a first circuit configured to: generate a second current
proportional to a first current through the first transistor; and supply the second
current to a second network coupled to the second node and the first error amplifier.
- 16. The voltage regulator of embodiment 15, wherein the first circuit comprises a
second transistor coupled to the first node, a gate of the second transistor coupled
to the gate of the first transistor, and wherein the second network comprises a resistor
coupled between the second transistor and the second node, and a capacitor coupled
between the second transistor and the first error amplifier.
- 17. The voltage regulator of embodiment 15, further comprising:
a second circuit configured to supply a third current to the first error amplifier,
the second circuit including: a first current mirror configured to supply a fifth
current in response to a fourth current; a second current mirror configured to supply
a sixth current in response to the fifth current; and a current source configured
to supply a seventh current, the third current being a sum of the sixth and seventh
currents.
- 18. The voltage regulator of embodiment 17, wherein the second circuit further comprises:
a second transistor coupled between the first node and the first current mirror, the
second transistor configured to supply the fourth current.
- 19. The voltage regulator of embodiment 18, wherein the second circuit further comprises
a resistor coupled between the second transistor and the first node.
- 20. The voltage regulator of embodiment 19, wherein the control circuit further comprises:
a third transistor coupled between the second transistor and the first current mirror;
and
a second error amplifier having an output coupled to a gate of the third transistor,
a first input coupled to the second node, and a third input coupled to a fourth node
to receive a fourth voltage.
1. A voltage regulator, comprising:
a first node configured to receive a first direct-current (DC) voltage;
a second node configured to supply a second DC voltage;
a third node configured to supply an electrical ground;
a first transistor coupled between the first node and the second node;
a first network coupled between the second node and the third node, the first network
outputting a first voltage; and
a control circuit including: an error amplifier configured to supply a third voltage
to a gate of the first transistor based on comparison of the first voltage with a
second voltage; and a first circuit coupled between the second node and the third
node, the first circuit configured to provide a current path between the second node
and the third node in response to a first current through the first transistor being
less than a threshold and disconnect the current path otherwise.
2. The voltage regulator of claim 1, wherein the first circuit comprises:
a second transistor coupled between the second node and the third node;
a third transistor coupled between a gate of the second transistor and the third node;
and
a current source configured to supply a second current to the third transistor.
3. The voltage regulator of claim 2, wherein the error amplifier includes a differential
transistor pair having an input configured to receive the first voltage and the second
voltage and an output having a fourth node configured to supply a fourth voltage and
a fifth node configured to a fifth voltage, and wherein a gate of the third transistor
is coupled to the fourth node.
4. The voltage regulator of claim 3, wherein the first circuit comprises:
a resistor coupled between the second node and the second transistor; and
a capacitor coupled between the second transistor and the fifth node,
and/or wherein the error amplifier comprises a fourth transistor coupled between the
gate of the first transistor and the third node, a gate of the fourth transistor coupled
to the fourth node.
5. The voltage regulator of claim 2, claim 3 or claim 4, wherein the first circuit comprises:
a resistor or fourth transistor coupled between the second transistor and the third
node, and/or
wherein the first circuit comprises:
a diode-connected transistor and a resistor coupled in series between second transistor
and the third node.
6. A voltage regulator, comprising:
a first node configured to receive a first direct-current (DC) voltage;
a second node configured to supply a second DC voltage;
a third node configured to supply an electrical ground;
a first transistor coupled between the first node and the second node;
a first network coupled between the second node and the third node, the first network
outputting a first voltage; and
a control circuit including: a first error amplifier configured to supply a third
voltage to a gate of the first transistor based on comparison of the first voltage
with a second voltage; and a first circuit configured to: generate a second current
proportional to a first current through the first transistor; and control the third
voltage to limit the first current in response to the second current exceeding a threshold.
7. The voltage regulator of claim 6, wherein the first circuit comprises:
a second transistor coupled to the first node, a gate of the second transistor coupled
to the gate of the first transistor;
a diode-connected transistor coupled between the second transistor and the third node;
a current source;
a third transistor coupled between the current source and the third node; and
a fourth transistor coupled between an output of the first error amplifier and the
gate of the first transistor, a gate of the fourth transistor coupled to the third
transistor and the current source.
8. The voltage regulator of claim 7, wherein the first circuit further comprises:
a fifth transistor coupled between the second transistor and the diode-connected transistor;
a second error amplifier having an output coupled to a gate of the fifth transistor,
a first input coupled to the second node, and a third input coupled to a fourth node
to receive a fourth voltage.
9. The voltage regulator of claim 8, wherein the control circuit comprises:
a sixth transistor coupled between the first node and the fourth node, a gate of the
sixth transistor coupled to the gate of the first transistor,
in particular wherein the control circuit comprises:
a seventh transistor coupled between the first node and the fourth node, a gate of
the seventh transistor coupled to the gate of the first transistor; and
a resistor coupled between the seventh transistor and the first node.
10. The voltage regulator of claim 6, claim 7, claim 8 or claim 9, wherein the first circuit
further comprises a resistor coupled between the second transistor and the first node,
and/or further comprising a resistor coupled between the first node and the gate of
the first transistor.
11. A voltage regulator, comprising:
a first node configured to receive a first direct-current (DC) voltage;
a second node configured to supply a second DC voltage;
a third node configured to supply an electrical ground;
a first transistor coupled between the first node and the second node;
a first network coupled between the second node and the third node, the first network
outputting a first voltage; and
a control circuit including: a first error amplifier configured to supply a third
voltage to a gate of the first transistor based on comparison of the first voltage
with a second voltage; and a first circuit configured to: generate a second current
proportional to a first current through the first transistor; and supply the second
current to a second network coupled to the second node and the first error amplifier.
12. The voltage regulator of claim 11, wherein the first circuit comprises a second transistor
coupled to the first node, a gate of the second transistor coupled to the gate of
the first transistor, and wherein the second network comprises a resistor coupled
between the second transistor and the second node, and a capacitor coupled between
the second transistor and the first error amplifier.
13. The voltage regulator of claim 11 or claim 12, further comprising:
a second circuit configured to supply a third current to the first error amplifier,
the second circuit including: a first current mirror configured to supply a fifth
current in response to a fourth current; a second current mirror configured to supply
a sixth current in response to the fifth current; and a current source configured
to supply a seventh current, the third current being a sum of the sixth and seventh
currents.
14. The voltage regulator of claim 13, wherein the second circuit further comprises:
a second transistor coupled between the first node and the first current mirror, the
second transistor configured to supply the fourth current.
15. The voltage regulator of claim 14, wherein the second circuit further comprises a
resistor coupled between the second transistor and the first node, and/or
wherein the control circuit further comprises:
a third transistor coupled between the second transistor and the first current mirror;
and
a second error amplifier having an output coupled to a gate of the third transistor,
a first input coupled to the second node, and a third input coupled to a fourth node
to receive a fourth voltage.