[0001] The present invention relates to a gas ion source such as used in industry for material
processing and surface analysis in vacuum.
[0002] In known ion sources ion beams are generated either by a glow discharge, electron
bombardment excitation or radio frequency (RF) excitation. In the present invention,
a gas stream is ionised by an electric field set up between a first electrode in the
form of a hollow needle through which a gas to be ionised may flow and a second electrode
situated adjacent the needle in such a manner that gas issuing from the interior of
the needle is ionised by electrons excited by the electric field. Typically, the gas
used is argon, but the ionisation of other gases and volatile metals is also possible.
[0003] Satisfactory ionisation of gas depends on two factors: gas pressure and excitation
force. The structure of the preferred embodiment of the ion source of this invention
localises these two factors to provide a well-defined origin of ionisation unlike,
for example, the conventional gas discharge source which can ionise anywhere between
two spaced plates. The existence of a well-defined origin of ionisation leads to improved
focussing of the ion beam and greater current density.
[0004] Thus, in the preferred embodiment of the invention, the relatively narrow needle
orifice opens into a large space, with the second, or extractor, electrode positioned
in front of, but spaced from, the open end of the needle. This construction leads
to the two necessary conditions for satisfactory ionisation of the gas: firstly, emergence
of gas from the narrow orifice into the large space leads to a localised region of
relatively high gas pressure in the immediate area of the orifice; secondly the physical
narrowness of the needle about the orifice means that the electric field set up between
the needle and the extractor electrode is also in the same area.
[0005] As the atoms of gas emerge from the needle, they enter the high pressure region and
are ionised by electrons traversing the inter-electrode space. The resulting ions
are then accelerated away from the needle in a well-defined narrow beam by means of
the extractor electrode. The extractor electrode is formed with an aperture through
which the ion beam may pass.
[0006] In order that the invention may be better understood, an embodiment thereof will
now be described by way of example only and with reference to the accompanying drawings
in which:-
Figure 1 is a general side elevation of a gas ion source constructed in accordance
with the invention;
Figure 2 is an enlarged sectional view of part of the gas ion source of Figure 1;
and
Figure 3 is a diagrammatic view of an experimental system designed to test the gas
ion source.
[0007] Referring to Figures 1 and 2, the gas ion source comprises a needle assembly 1 and
extractor 2 which are carried on a mounting flange 3 by means of a pair of spaced
pillars 4. The needle assembly comprises a hollow needle 5 made of refractory metal
such as tungsten which is mounted in an insulating support 6. Gas is supplied to the
interior passage 7 within the needle 5 via a tube 8 which passes through the flange
3. If desired preheating of the gas may be carried out by means of a heater (not shown)
associated with the tube 8. Such preheating may be desirable in certain circumstances
in order to prevent the condensation of volatile vapours in the tube. The needle tapers
at its free end to a diameter typically of 75yc. The outlet end of passage 7 likewise
tapers at the free end of the needle to provide a constriction having a diameter typically
of 25 µ.
[0008] The extractor 2 comprises a flat circular extractor electrode 9 having a through-aperture
10, typically of 100 µ. diameter, at its centre. The electrode 9 is supported by a
generally cylindrical electrode support member 11 in such a way that the aperture
10 lies directly in front of the exit of the needle 5. The distance between the extractor
electrode and the tip of the needle is typically lmm.
[0009] The extractor electrode and needle are connected by way of pillars 4 to respective
terminals of an electrical power supply unit (not shown) so that, in use, the needle
has a positive potential with respect to the extractor electrode. The voltage applied
between the needle and the extractor electrode is typically between 5,000 and 10,000
volts.
[0010] To use the ion source, a suitable gas such as argon is passed along the tube 8 to
the passage 7 within the needle. The constricted portion at the mouth of the passage
7 has a self-regulating effect and ensures that a well defined stream of gas emerges
into the space between the needle and the extractor electrode. The sudden emergence
of gas from the constricted portion of passage 7 into the relatively wide space within
the extractor results in a localised region of relatively high pressure at the exit
of the passage 7 and it is in this high pressure region, subjected as it is to the
electric field existing between the needle and the extractor electrode, that the ionisation
of the gas takes place. The ions are created in a highly localised self contained
and self sustaining discharge which is initiated by some random external event. Usually
this is attributable to a cosmic ray ionising a single atom - the resulting electron
is then accelerated in the high electric field to cause more ionisation and a cascade
of electrons within the region close to the exit of the needle. The resulting ions
are accelerated through the aperture 10 in the extractor electrode in a narrow beam.
There is, however, no net electron flow between the needle and the extractor electrode.
[0011] In practice the ion source is used in an evacuated atmosphere, with ambient pressures
no greater than 10-
5 mm Hg. Typically the ambient pressure is 1 millionth of an atmosphere while the pressure
in the localised high pressure region adjacent the exit to the passage 7 is typically
k atmosphere. This leads to a very considerable pressure gradient in the 1 mm space
between the tip of the needle and the extractor electrode.
[0012] Figure 3 shows a typical experimental test set-up. The ion source is mounted within
a vacuum chamber 12 above a collector electrode 13. Gas to be ionised is supplied
to tube 8 form a cylinder 14, the inlet gas pressure being monitored by a gauge 15.
An electrical power supply 16 has positive and negative outputs connected to the needle
5 and extractor 2 respectively in order to produce a high electric field between the
two. The collector electrode is likewise connected to the negative output, via a microammeter.
The ion beam is drawn out of the ion source by means of the electric field existing
between the extractor electrode and the needle. The extractor electrode is intended
to provide the high electrical gradient needed for ionisation and also to provide
the acceleration of the ion beam as it leaves the region of ionisation. The collector
electrode is intended to represent a target workpiece which is to be bombarded, and
is not part of the ion source per se. The energy of the ion beam as it strikes the
collector electrode is dependent upon the magnitude of the voltage between the needle
and the collector electrode. Thus, in practice, the potential of the collector electrode
will be capable of adjustment independently of that of the extractor electrode in
order to take account of varying requirements in use.
[0013] The ion source described above can be used with a wide variety of gases and volatile
metals. Examples are argon, helium, neon, nitrogen, hydrogen, deuterium, oxygen or
volatile arsenic or boron. In the case of oxygen, problems can arise due to erosion
of the needle, and the source should be operated at a lower current to reduce this.
Typically the gas pressure, as recorded on gauge 15, is in the region of 120 to 280
mm Hg.
[0014] The ion source described above will produce a reliable high intensity beam of ions
and finds wide application in industry in particular for material processing and surface
analysis. In use, the ion source is mounted within a vacuum chamber and the beam of
ions for example argon ions, produced by the source is directed at the target material.
The resultant ion bombardment will sputter or etch away material from the target.
Electrons and ions released by the target during ion bombardment can be analysed to
determine the existence and concentration of the various elements present.
1. A gas ion source comprising a first electrode in the form of a hollow needle having
a bore through which a gas to be ionised may flow and a second electrode positioned
immediately in front of, but spaced from, said first electrode, said second electrode
having a through aperture in line with said bore, and means for establishing an electric
field between said first electrode and said second electrode whereby gas emerging
from said needle is ionised by the electric field.
2. A gas ion source as claimed in claim 1 wherein the size of the end of the needle
through which, in use, gas emerges is small to give a high density electric field
in the region where gas emerges from the needle.
3. A gas ion source as claimed in claim 2 wherein the end of the needle through which
gas emerges tapers.
4. A gas ion source as claimed in claim 3 wherein the end of the needle through which
gas emerges is about 75 in diameter.
5. A gas ion source as claimed in any one of the preceding claims wherein the bore
of the needle has a region of smaller diameter at that end of the needle through which
gas emerges in order to tend to regulate the flow of gas through the needle.
6. A gas ion source as claimed in any one of claims 1 to 4 wherein the needle is made
of tungsten.
7. A gas ion source substantially as hereinbefore described with reference to the
accompanying drawings.