BACKGROUND OF THE INVENTION
1. Field of the Invention
[0001] The invention relates to radio-frequency (rf) power generators. More particularly,
it relates to rf generators for generating and exciting an inductively coupled plasma
(ICP) employed in atomic emission spectrometry.
2. Description of the Prior Art
[0002] Inductively coupled plasmas (ICP) have been used to excite samples for analytical
emission spectroscopy.
[0003] The paper "Automatic Multi-Sample Simultaneous MultiElement Analysis with a M.F.
Plasma Torch and Direct Reading Spectrometer" by S. Greenfield, I. LL. Jones, H. MCD.
McGeachin and P.B. Smith, published in Analytica Chimica Acta; 74 (1975); discusses
an ICP coupled with a 30-channel direct reading spectrometer with fully automatic
sequential sampling, exposure and read-out.
[0004] The paper ..A Stabilized R.F. Argon-Plasma Torch for Emission Spectroscopy" by P.W.J.M.
Bowmans, F.J. deBoer and J. W. Ruiter, published in Philips Technical Review (1973);
discusses a rf generator system for producing an inductively coupled argon plasma
(ICAP). The system of Boumans, et al. is adapted to provide stabilized power to the
ICAP and minimize plasma intensity variations which occur when a sample is introduced
into the plasma.
[0005] In conventional excitation systems, such as those of Greenfield, et al. and Boumans,
et al., a rf generator ordinarily provides power to combined tuning- work coil. This
coil operates both as the inductor coil in the output tuning (tank) circuit of the
generator and as the plasma producing work coil. The plasma is typically annular in
shape, providing a tunnel region into which a sample is introduced for excitation.
[0006] Conventional exciter apparatus and systems have been adequate when the plasma is
established and operating. However, during the critical periods of startup and plasma
ignition, such prior systems typically operate in an unstable region of their operational
envelopes. Complex controls have been required to closely regulate the power into
the tuning-work coil to ensure reliable plasma ignition. As a result, the prior devices
have been expensive, complex and bulky and have ordinarily required complicated three-phase
power.
[0007] When generating power at radio-frequencies, the radiated power from the generator
may be closely regulated and the AC frequency of operation kept within a specific
allowed bandwidth to prevent rf interference with other devices, such as nearby communications
equipment. Typically, the AC frequency has been substantially fixed by use of a crystal
controlled oscillator. Generators with crystal controlled rf oscillators, however,
typically require additional amplifier stages to develop the output power needed to
produce and sustain an ICP, and often employ special rf transmission cables, rf connectors
and associated impedance matching circuitry. In addition, special, complex tuning
adjustment circuits have been required to compensate for resonant frequency shifts
that occur in the output tuning circuits during periods of plasma ignition and plasma
excitation of an analytic sample. During such periods, the rf power output tuning
circuit becomes mismatched from the fixed oscillator frequency. This changes the power
delivered into the tuning-work coil and causes fluctuations in the plasma intensity.
The plasma may even extinguish. To compensate for this problem, complex circuits have
been employed to closely regulate power output, voltage phase relations and resonant
frequencies of the output tuning circuits to ensure adequate power into the plasma.
[0008] Radio-frequency generators which employ a free-running oscillator have generally
been preferred because they are simpler and more economical than generators with fixed
frequency oscillators. However, ordinary exciter systems using such generators experience
very large frequency shifts sweeping over hundreds of kilohertz, particularly during
plasma ignition. As a result, conventional generators with free-running oscillators
exceed allowable operational bandwidths and have required bulky and costly rf shielding
to prevent disruptive rf interference with other equipment.
[0009] Thus, these conventional plasma exciter apparatus have remained complex, expensive
and bulky and have generally required complicated power supplies. Apparatus in which
the generator output frequency is closely controlled have required additional amplifiers,
additional transmission components and complicated control circuitry, particularly
during plasma ignition, to regulate power into the plasma. Apparatus in which the
rf generator employs a free-running oscillator have exhibited excessive frequency
shifts and required substantial rf shielding. Because of their complexity, bulk and
high cost, these conventional plasma excitation devices have been unsuitable for use
in small office-type laboratories.
SUMMARY OF THE INVENTION
[0010] The invention provides an economical and efficient radio-frequency (rf) excitor apparatus
and method for producing an inductively coupled plasma to heat an analytic sample.
Generally stated the excitor apparatus includes a radio-frequency generator means
for producing electrical power of selected radio frequency. The generator means has
power output tuning means comprised of at least one output tuning inductor for determining
the generator radio frequency. A separated plasma load circuit is coupled to the generator
means and is comprised of a work coil and a series connected, impedance matching capacitor.
The work coil is adapted to produce an inductively coupled plasma and the capacitor
is adapted to substantially balance and counteract the combined inductive reactances
of the work coil and plasma. Control means for controlling the power input into the
plasma load circuit stabilize the plasma.
[0011] In accordance with the invention, there is further provided an excitation method
for producing an inductively coupled plasma to heat an analytic sample. Electrical
power of selected radio frequency is generated with an rf generator means having a
power output tuning means. The power from the generator means is directed to a plasma
load circuit having a separate work coil adapted to produce the inductively coupled
plasma, and the power input to the separated work coil is controlled with control
means operably coupled between the plasma load circuit and the generator means.
[0012] The exciter apparatus of the invention is versatile and suitable for use in small,
office-type laboratories where three-phase power is generally unavailable. The apparatus
requires only single-phase power and includes a free-running oscillator. Since the
oscillator is free running, it automatically compensates for changing load impedance
by shifting its frequency of oscillation to sustain maximum power transfer into the
plasma.
[0013] The plasma load circuit advantageously separates and substantially isolates the plasma
producing work coil from the output tuning circuit of the rf generator, and preferably
is directly coupled to the rf generator to minimize coupling losses. Since the work
coil is separated and substantially isolated from the rf generator tuning circuit,
changes in the work coil impedance which occur during plasma ignition and the introduction
of a sample into the plasma are for the most part not reflected back into the generator
rf tuning circuit. As a result, the rf generator and exciter apparatus exhibit only
a small frequency shift of less than about 100 KHZ even under the widely changing
plasma load conditions of plasma ignition. In addition, the isolation of the work
coil advantageously permits use of a longer work coil having a greater number of turns
to produce a longer and broader plasma. The broader plasma, in turn, produces a more
intense excitation of the sample which allows detection of smaller amounts of constituent
elements and renders a more precise analysis. Moreover, full power is delivered to
the work coil even when the gas present at the coil is un-ionized. As a result, the
complexity of plasma ignition is greatly reduced. Rf power into the plasma is stable
throughout the ignition sequence, and the plasma can be initiated and expanded without
utilizing complex controls to regulate power input to the work coil and plasma.
[0014] Thus, compared to conventional exciter devices having the work coil combined and
integral with the rf power output tuning coil, the invention provides a more compact,
efficient and economical exciter apparatus. The exciter apparatus more precisely analyzes
a selected sample and more efficiently delivers maximum power to ignite and sustain
an ICP load. Power into the ICP is stabilized without complex power supplies, without
complicated power regulation and without causing excessive shifts in the rf power
frequency.
BRIEF DESCRIPTION OF THE DRAWINGS
[0015] The invention will be more fully understood and further advantages will become apparent
when reference is made to the following detailed description of the preferred embodiment
of the invention and the accompanying drawings in which:
FIG. 1 shows a schematic representation of the use of an inductively coupled plasma
for atomic emissions spectroscopy;
FIG. 2 shows a schematic representation of the exciter apparatus of the invention;
FIG. 3 shows a schematic of an equivalent circuit for an inductively coupled plasma;
FIG 4 shows a circuit diagram of the exciter apparatus employing an electron tube
amplifier connected to tuning means to provide a Hartley-type rf oscillator;
FIG. 5 shows a circuit diagram of a power supply employed with the invention;
FIG. 6 shows a schematic of an inductively couplied plasma coupled to the plasma load
circuit of the invention and a graph of power output versus an impedance ratio;
FIG. 7 shows a schematic representation of a longitudinal cross-section of an annular
inductively coupled plasma; and
FIG. 8 shows a graph of plate voltage, plate current and grid voltage as a function
of time.
DESCRIPTION OF THE PREFERRED EMBODIMENTS
[0016] FIG. 1 illustrates a schematic representation of an apparatus for analyzing the constituent
elements of a sample of selected material. The apparatus is comprised of an exciter
1 and an analyzer means 8. Exciter 1 is comprised of rf generator 2, power supply
3 and plasma torch 7. Plasma torch 7 includes a torch tube 6, work coil 19 and a gas
supply 31. Analyzer means 8 is comprised of spectrometer 9, computer 11 and readout
means 13.
[0017] To analyze a sample, rf generator 2 generates rf power and provides it to torch 7.
Work coil 19 is wound around torch tube 6 and adapted to produce an inductively coupled
plasma 27 from a suitable gas, such as argon, supplied from gas source 31. Referring
to FIG. 7, sampler means 5 injects an analytic sample 25 (analyte) of selected material
through conduit 23 into plasma 27. The sample is heated and excited to radiate atomic
emission spectra 33, which are characteristic of the constituent elements in the material.
[0018] Referring again to FIG. 1, spectra 33 is detected by spectrometer 9 to produce a
spectrometer output signal. Computer 11 processes the spectrometer output signal and
provides a readout analysis of the constituent elements and quantities thereof. For
example, suitable readout means would include electronic displays and hard copy printouts.
[0019] FIG. 2 shows a more detailed schematic block diagram of rf generator 2. The rf generator
is comprised of rf amplifier 29, tuning means 15 and coupling means, such as capacitor
17. Power supply 3 provides power to rf amplifier 29 which is connected to power output
tuning means 15. Tuning means 15 is comprised of at least one tuning inductor 21 and
a tuning capacitor 35. Preferably the inductor and capacitor are connected in parallel
to form an electronic, parallel resonant tank circuit. Coupling capacitor 17 is operably
connected in series with separated work coil 19 and then operably connected to tuning
inductor 21.
[0020] In operation, rf amplifier 29 and tuning means 15 in combination form an rf oscillator
which provides the required rf power into tuning inductor 21. The resonant tank circuit
formed by tuning inductor 21 and capacitor 35 controls the frequency of oscillation
in accordance with well-known electronic principles. Preferably the component values
are selected to provide oscillation at 27.12 MHz, the U.S. Industrial Band.
[0021] Coupling capacitor 17 is preferably a vacuum, variable capacitor. Capacitor 17 couples
rf power into work coil 19 and provides an impedance matching means to maximize the
power delivered into the coil and into plasma 27. The reactance of capacitor 17 is
adjusted to balance and substantially counteract the combined reactances of coil 19
and plasma 27 to maximize the power delivered there into.
[0022] Substantially amounts of power are dissipated by tuning inductor 21 and work coil
19. Preferably these elements are constructed from tubular material, for example tubular
copper, to allow passage therethrough of a suitable fluid coolant, such as water.
[0023] Gas source 31 provides a suitable gas, such as argon or nitrogen into torch 7. The
high frequency magnetic field induced in coil 19 by rf generator 2 produces a magnetic
field which ionizes the gas to produce a plasma which can reach temperatures of about
10,000°K. Preferably the frequency of power and the gas flow are regulated to produce
a stable, annular shaped plasma 27. Annular plasma 27 advantageously forms a stable
"tunnel" region into which analyte can be efficiently and reliably introduced for
excitation.
[0024] Conventional excitor apparatus typically include a tuning inductor integral with
the work coil as schematically shown in FIG. 3, generally at 38. The tank circuit
has a tuned resonant frequency defined approximately by the formula l/LC where: L
= the inductance of coil 37 and C = the capacitance of capacitor 35. Such a configuration
provides an economy of parts. However, when a plasma is initiated or "lit", plasma
27 is equivalent to a series circuit 28 of inductance L and resistance R inductively
coupled to the tuning/work coil. Inductance L is substantially equivalent to a single
turn coil located coaxial with work coil 19, and its effective inductance changes
with the size and dimensions of plasma 27. When the plasma is lit, the tank circuit
develops a new tuned resonant frequency approximately equal to 1/L'C where: L' = the
effective equivalent inductance provided by the combination of coil 37 and the equivalent
plasma circuit 28. A detailed discussion of the phenomena is provided in the article
by Greenfield et al., particularly at pages 226-232. A similar phenomena occurs when
a sample is introduced into the plasma for excitation. The presence of the sample
changes the effective inductance of the work coil thus changing the resonant frequency
of the tuned tank circuit and affecting the amount of power delivered to the work
coil and plasma.
[0025] Fixed frequency rf generators, such as those employing crystal controlled oscillators
require complicated power regulators to assure delivery of adequate power to the work
coil to initiate and sustain plasma 27. Rf generators with free running oscillators,
can shift their frequency of oscillation to insure delivery of adequate power to work
coil 19, but the frequency shifts can often exceed the allowable operational band
widths and necessitate the use of expensive and bulky rf shielding.
[0026] As shown in FIGS. 2 and 6, the invention advantageously separates tuning inductor
21 from work coil 19 with an impedance matching capacitor 17. The reactance of capacitor
17 is adjusted to substantially balance and counteract the combined inductive reactances
of work coil 19 and plasma 27. Thus, the plasma load appears as a substantially resistive
load to the output of rf generator 2 over a large band width of frequencies. The configuration
minimizes changes in effective inductance seen by tuning means 15 during start-up
and during the injection of sample into plasma 27. In addition, the configuration
minimizes the shift in the tuned frequency of tuning means 15 and the output of rf
generator 2. In conventional excitor apparatus the frequency shift can be reduced
by limiting the number of turns in work coil 19 to about 1 or 2 turns. The fewer turns
in coil 19 provides a smaller inductance and thus a smaller effective inductance change
during changing plasma load conditions. As a result, less frequency shift occurs in
the tuned output circuitry of the rf generator.
[0027] The invention, however, allows a much greater change in the effective inductance
of work coil 19 while minimizing the effect on the tuned output of the rf generator.
As a result, a work coil with greater number of turns can be employed without adversely
affecting the rf generator output frequency. The greater number of turns provides
a larger and broader plasma. The larger plasma in turn provides a larger heating zone
which better excites an analytic sample. A more intense emissions spectra is then
available to the spectrometric detector. For example, the present embodiment of the
invention employs a three and one-half turn work coil.
[0028] FIG. 4 shows a preferred free running oscillator circuit employed in the excitor
apparatus of the invention. High voltage enters the circuit at A2JI, is filtered by
choke Ll and capacitors C3 and C5, and applied to the plates of Vl and V2 through
quarter wave choke L2. Electron tubes Vl and V2 are parallel connected to provide
the required power output and to reduce the effective plate impedance. It is readily
apparent that additional tubes could be employed to raise the power output or that
the multiple tubes could be reduced to a single large tube. Networks L3 and L4 are
heavily damped inductances called parasitic suppressors that prevent intertube resonances
in the parallel tube configuration. Transformer Tl provides filament power for both
tubes. Capacitors C6 and C16 bypass any rf energy generated at the two filaments to
ground. The voltage at the plates of the tubes is coupled to a parallel resonant circuit
comprised of a triple capacitor Cll, C12, C13 and an inductor L5 by way of coupling
capacitor C7. This resonant circuit is tuned to oscillate at a nominal 27.12 MHz.
In this circuit, a 180° out of phase voltage to power the tube grids is derived from
the lower section of L21. This voltage is applied in parallel to the grids of the
oscillator tubes Vl and V2 by way of the grid leak capacitor combinations Cl, C2 and
C9, C10. Negative grid bias for tube Vl is generated by grid leak resistor Rl. Negative
grid bias for tube V2 is generated by grid leak resistor R3. Resistors R2 and R4 provide
a measurement of the individual tube grid currents monitored in the power supply unit.
Power is coupled to the plasma load coil from the center section of inductor L21.
Tuning capacitor C17 compensates for the inductance formed by the plasma work coil
L19 and the plasma itself. Air cooling is provided by a fan Bl, and both inductor
L21 and the plasma work coil L19 are water cooled. Thus, the shown circuit forms a
Hartley-type oscillator, and with proper selection of the reactances of capacitor
35 and inductor 21, the circuit will oscillate at the preferred nominal frequency
of 27.12 MHz.
[0029] A vacuum tube is able to act as an oscillator because of its ability to amplify.
Since the power required by the input of an amplifier tube is much less than the amplified
output, it is possible to make the amplifier supply its own input. When this is done,
oscillations will be generated and the tube acts as a power converter that changes
the direct current power supplied to the plate circuit into alternating current energy
in the amplifier output. In general, the voltage fed back from the output and applied
to the grid of the tube must be 180° out of phase with the voltage existing across
the load impedance of the plate circuit of the amplifier, and must have a magnitude
sufficient to produce the output power necessary to develop the required input voltage.
In the Hartley circuit this is accomplished by applying to the grid a portion of the
voltage developed in the resonant circuit. This grid leak bias makes the oscillator
self-starting and insures stable operation under the desired voltage and current relations.
The use of a grid leak makes the oscillator self-starting because when the plate voltage
is first supplied, the grid bias is zero, making the plate current, and hence the
amplification, large. The transient voltage generated will start building up oscillations
at the frequency of the resonant circuit. These oscillations cause the grid to draw
current which biases the grid negative as a result of the grid leak resistance. This
reduces the DC plate current until ultimately equilibrium is established at an amplitude
such that the plate current is reduced to the point where the amplification is exactly
1. The grid leak provides a stability because any decrease in the amplitude of oscillation
also reduces the bias developed by the grid leak arrangement, thereby increasing the
grid drive and increasing the amplitude of oscillation.
[0030] Referring to FIG. 3, the rf coil containing the plasma (plasma work coil) may be
regarded as the primary coil of a kind of a transformer. A plasma, which also has
inductance, acts as the secondary winding 85 consisting of a single turn. The coupling
between the primary and secondary windings (coupling factor) increases with the diameter
of the plasma. Fluctuations in the energy content of the plasma affect the diameter
of the plasma through temperature changes; the situation resembles that of a gas at
constant pressure and changing temperature.
[0031] FIG. 6 illustrates how the variation of the coupling factor can give stabilization.
Arranged in series, L
t and R represent the effective impedance constituted by the plasma work coil and the
plasma. Variable capacitor C is adjusted such that the maximum power to the plasma
is delivered when X(C) = X(L
t), where capacitive impedance X(C) = 1/wC, and inductive impedance, X(L
t) = wL
t. At this point, the load appears to be entirely resistive. It is well known that
during the growth of a plasma the coupling factor increases and the inductance,
Lt decreases. However, during injection of a sample, the plasma is cooled and shrinks.
The coupling factor decreases causing L
t to increase. If an operating point is chosen to the left of load circuit resonance,
as L increases X(L
t) will increase, increasing power to the plasma to compensate for the reduced temperature
from the sample aspiration. Operation to the right of load circuit resonance results
in an unstable plasma. If under these conditions L
t increases, X(L
t) will still increase but power to the plasma will now decrease causing the plasma
to oscillate or even extinguish.
[0032] A second form of compensation stabilizes the magnitude of the oscillations in the
resonant circuit. With reference to FIG. 8, it can be seen that changing the load
resistance in the resonsant circuit; i.e. the plasma; has little effect on the amplitude
of oscillation but does change the DC plate current. When the resistance of the resonant
circuit increases, the amplitude of the oscillations tends to decrease because the
added resistance causes more energy to be consumed in the resonant circuit than is
supplied from the plate voltage source. This makes the minimum plate voltage, e
p (min) larger, increasing the amplitude of the plate current (ip) pulses and resulting
in the resonant circuit receiving additional energy. The amplitude of oscillation
assumes a new equilibrium point in which the enlarged plate current impulses supply
sufficient energy to the resonant circuit to stabilize the amplitude. A small percentage
change in ep peak-to-peak amplitude causes a much greater percentage change in ep
(
min) resulting in a boot strap effect to stabilize the amplitude. The plot of e represents
the grid voltage.
[0033] The third form of stabilization is provided by the fact that when the L
t of FIG. 6 changes, the inductance of the resonant circuit changes. However, the current
in the resonant circuit will remain at a maximum by slightly shifting the fundamental
frequency. This insures the basic system stays "in tune" over the required operating
conditions.
[0034] The resultant free running oscillator design minimizes changes in the power delivered
to tuning inductor 21 caused by the ignition of plasma 27 or caused by the introduction
of analytic sample into the plasma. Thus, rf amplifier 29 can oscillate and deliver
substantially full power to work coil 19 even when un-ionized argon gas is present
in torch 7. Full power is available to ignite and sustain the plasma without complex
regulation of power frequency and phase relation during the ignition process. During
plasma ignition or during the introduction of sample into the plasma, small frequency
shifts automatically occur to maintain the rf power delivered to the plasma. The configuration
advantageously produces only a very small frequency shift, and the rf output easily
stays within the allowed bandwidth. The maximum frequency shift is typically limited
to less than about 100 KHz.
[0035] A regulated power supply connected to terminals A2J1 regulates the plate voltages
of tubes Vl and V2, thereby maintaining substantially constant AC voltage output from
rf generator 2 under conditions of changing plasma load and changing primary line
power. FIG. 5 shows a schematic diagram of a power supply employed in the invention.
Control of the rf output of the rf excitor, or head unit, is accomplished by varying
the high voltage output of the power supply. This is accomplished by changing the
DC current in the control winding of saturable reactor Ll. Increasing the current
causes the iron core of the saturable reactor to saturate allowing a greater percentage
of the input power to be applied to the primary of transformer T2, thereby increasing
the high voltage output.
[0036] Line power enters through line filter FL1 and is protected and switched by front
panel circuit breaker CBl. For control purposes, this power is applied through fuse
Fl to supply primary power for the filament transformer in the rf head as well as
primary power for the control transformer Tl. Control transformer Tl provides power
for relay and plasma head control and the fan circuits as well as power for use by
the regulator board. Main power is switched by relay Kl which is controlled by front
panel push button switches Sl and S2. The front panel pilot lights indicate the presence
of control power and the position of relay Kl. Power from relay Kl is controlled by
saturable reactor Ll and is applied through the front panel tab select run-start switch
S3 to the primary of high voltage transformer T2. The output of transformer T2 is
rectified by the voltage doubler circuit consisting of rectifiers CR1 and CR2 and
capacitor bank C90-C99. The output voltage is transferred to the rf exciter generator
head 2 by cable Wl. The return current from the rf head unit is measured through resistor
13 and overload relay K2. Overload currents cause the contact of K2 to open, thereby
dropping out relay Kl which turns off the high voltage.
[0037] The regulator printed circuit (PC) board generates the DC currents to control the
saturable reactor. Referring to the P.C. board section 77 of FIG. 5, two external
inputs provide input signals for use by the regulator board. The first, potentiometer
R6 located on the front panel provides an input to set the high voltage level of the
power supply unit. The second, a percentage of the output voltage, is generated by
a voltage divider comprised of resistors R14-R23 along with resistor R24.
[0038] Potentiometer R6 acting through resistor R5 and transistor Q2 controls the set point
of a three terminal regulator Ql. Input power for Ql is generated from the low voltage
winding of Tl, full-wave rectifier CR1 and capacitor Cl. The output of Ql is connected
to the control winding of the saturable reactor Ll to directly control the high voltage
level. Regulation of the high voltage level is accomplished by feeding back the voltage
divider signal to operational amplifier Q3 by resistors R2 and R3. Since the junction
of R2 and R3 are connected to the negative terminal of Q3, the output of Q3 changes
inversely with changes in the high voltage level. The output of Q3 is applied through
Q2 to the control input of Ql closing the inverse feed back loop. A connector J2 is
provided to supply 110V power and interlock with the plasma torch enclosure system.
A terminal of connector J2 is interlocked with the plasma torch enclosure system to
shut down the rf power under certain error conditions, such as low cooling water pressure,
and low argon gas pressure.
[0039] Having thus described the invention in rather full detail, it will be understood
that these details need not be strictly adhered to but that various changes and modifications
may suggest themselves to one skilled in the art, all falling within the scope of
the invention as defined by the subjoined claims.
1. A radio frequency excitator apparatus for producing an inductively coupled plasma
to heat an analytic sample, comprising:
(a) radio frequency generator means for producing electrical power of selected radio
frequency, said generator means having power output tuning means comprised of at least
one output tuning inductor for determining said generator radio frequency;
(b) a separate plasma load circuit coupled to said generator means and comprised of
a working coil and a series connected, impedance matching capacitor, wherein said
work coil is adapted to produce an inductively coupled plasma and said capacitor is
adapted to substantially balance the combined inductive reactances of said work coil
and plasma; and
(c) control means for controlling the power input into said plasma load circuit to
stabilize said plasma.
2. An apparatus as recited in claim 1, wherein said control means comprises a series
circuit comprised of said work coil and said impedance matching capacitor, wherein
said capacitor is adjusted to maintain a capacitive impedance which is equal to or
greater than the combined inductive impedances of said work coil and plasma when heating
said sample.
3. An apparatus as recited in claim 2, wherein said control means further comprises
a variable resistive impedance in said plasma, said resistive impedance being inductively
coupled into and through the series circuit comprised of said work coil and said impedance
matching capacitor to the output tuning inductor of said generator means and adapted
to increase the rf power delivered to said output tuning inductor as said resistive
impedance is increased by the heating of said sample.
4. An apparatus as recited in claim 1, wherein said generator means comprises an electron
tube amplifier connected with said tuning means to provide a Hartley-type radio frequency
oscillator.
5. An apparatus as recited in claim 1, wherein said impedance matching capacitor is
a vacuum, variable capacitor.
6. An apparatus as recited in claim 1, further comprising power supply means for regulating
the power input to said radio frequency generator, thereby maintaining a substantially
constant generator output voltage.
7. An apparatus for atomic emission spectrometric analysis, comprising:
(a) radio frequency generator means for producing electrical power of selected radio
frequency, said generator means having power output tuning means comprised of at least
one output tuning inductor for determining said generator radio frequency;
(b) a separate plasma load circuit coupled to said generator means and comprised of
a work coil and a series connected, impedance matching capacitor, wherein said work
coil is adapted to produce an inductively coupled plasma and said capacitor is adapted
to substan- tially balance the combined inductive reactances of said work coil and plasma;
(c) control means for controlling the power input into said plasma load circuit to
stabilize said plasma;
(d) sampler means for introducing a sample of material appointed for analysis into
said plasma to produce atomic emission spectra characteristic of the constituent elements
of said sample;
(e) spectrometric analyzer means for detecting said constituent elements and the quantities
thereof.
8. An excitation method for producing an inductively coupled plasma, comprising the
steps of:
(a) generating electrical power of selected radio frequency with a rf generating means
having power output tuning means;
(b) directing said rf power from said power output tuning means to a plasma load circuit
having a separated work coil adapted to produce said inductively coupled plasma; and
(c) controlling the power input to said separate work coil with control means operably
coupled between said plasma load circuit and said generator means to stabilize said
plasma.
9. A method for atomic emission spectrometric analysis, comprising the steps of:
(a) generating electrical power of selected radio frequency with radio frequency generator
means having power output tuning means;
(b) directing said radio frequency power from said tuning means to a plasma load circuit
having a separated work coil adapted to produce an inductively coupled plasma;
(c) stabilizing the power directed into said plasma with control means operably coupled
between said tuning means and said plasma load circuit;
(d) introducing an analytic sample of material into said plasma to produce atomic
emission spectra characteristic of the constituent elements of said sample; and
(e) analyzing said spectra to detect said constituent elements and the quantities
thereof.