BACKGROUND OF THE INVENTION:
[0001] The present invention relates to a thermal head for use in recording apparatuses
such as facsimile, full color printer, word processor and so on, and more particularly,
to improvements in a resistor layer which is one of major components of the thermal
head, and the manufacturing method thereof.
[0002] The thermal head is mainly composed of at least a pair of electrodes, resistor layers
in contact with both the electrodes, base plates for supporting the electrodes and
the resistor layers on the surfaces thereof, with at least the surfaces thereof being
of insulating property, and abrasion-resistant layers formed on the resistor layers.
And there are a thin film type and a thick film type depending upon how to manufacture
it. The thin film type is formed by the sputtering, evaporation, etc. of an electrode,
a resistor layer, an abrasion-resistant layer in vacuum. Also, the thick film type
obtains gold electrodes, a resistor layer composed of a glass layer, Ru0
2 being scattered therein, and an abrasion-resistant layer composed of glass, by the
respective printing, heating operations of, for example, paste of a decomposable organic
compound of the gold, paste containing R
U0
2 and glass frit, and paste of borosilicate glass frit, so that the thick film type
may provide a thermal head of higher reliability, lower cost than the thin film type.
[0003] The thermal head heats the specified region of the resistor layer in contact with
both the electrodes through the current flowing between a pair of electrodes so as
to heat the specified region of the recording member, for example, a heat sensitive
recording paper for giving one dot portion of recording. Accordingly, the important
characteristics to be demanded for the thermal head are that the heating of the resistor
layer is efficiently transmitted onto the side of the recording paper, and the heating
of the resistor layer between the individual electrode pair disposed normally in a
line shape is uniform. As the resistances of these resistor layers are unequal, and
the respective heating amount is uneven, the concentration of the individual recording
dots to be recorded on the recording paper become unequal, thus causing the lines
of variable density on the recording to make the recording quality worse. The characteristics
are emphasized especially as the thermal head for full color printer use which demands
the gradation record. A cause for such uneven record concentration is considered to
be the dispersion of the resistance values of the individual resistor dots. In order
to reduce the resistance value dispersion of such individual resistor dots, a trimming
step, in the thick film method, is adopted. This step applies the overload pulses
on the individual dots of the resistor layer, thus making it possible to have the
resistance value within ± 0.5 % of the target. On the other hand, in the thin film
type, the resistance value of the individual resistor dot may be provided within f
2.5 % by the controlling operation of the conditions of the evaporation and sputtering
for obtaining the resistor. But in the head of the thin film system, it is difficult
to further improve the dispersion of the present resistance value, and in the head
of the thick film system, the present system has problems as described hereinafter.
The resistor layer of the thermal head of the present thick film type is formed by
the screen-printing, heating of the paste composed of the resistor component Ru0
2, glass frit, organic binder. But, as the paste is a mixture between RuO
2 powder and glass powder, the resistor layer to be produced by the paste is also a
mixture of them. And, if R
U0
2 powder which is small in granular diameter is used, the resistor -layer to be produced
by the paste is often aggregated or is worse in the dispersion in the glass matrix,
so that the powder becomes very large in diameter in the resistor layer obtained.
In the result, the current is adapted to flow through the Ru0
2 powder in contact against each other. Accordingly, in order to obtain a resistor
having a uniform resistance value, it is necessary to provide a considerable amount
of Ru0
2 powder. On the other hand, as the preferential change in the resistance value is
caused at a portion easy to be trimmed, especially, in a one resistor dot even if
the dot resistance value is made constant -by the trimming, the heating is to be concentrated
in one portion of one dot in the actual recording even when the dot resistance value
has reached the target value, so that the normal dot shape is not obtained. The deviation
of the current pass in such one resistor dot is due to unequal distribution of the
conductive element like the Ru0
2 in one resistor dot.
[0004] As described hereinabove, in the conventional method of forming the resistor layer
from a mixture between the R
U0
2 and the glass powder, it was difficult to obtain the resistor layer uniform in the
resistor value.
SUMMARY OF THE INVENTION:
[0005] Accordingly, an essential object of the present invention is to provide a thermal
head which is free from such conventional inconveniences as described hereinabove,
and has a resistor layer uniform in the resistance value so as to give recordings
superior in quality.
[0006] Another important object of the present invention is to provide a method of obtaining
a thermal head which gives recordings superior in quality.
[0007] In a thermal head having at least a pair of electrodes, resistor layers in contact
against both the electrodes, base plates which support the electrodes and the resistor
layers on the surfaces thereof, with at least the surfaces thereof being of insulating
property, the thermal head of the present invention has the resistor layer composed
of the matrix of the glass, and metal and/or oxide of resistor component element existed
in the,gap of the atomic bond of the matrix. It is to be noted that the thermal head
usually has an abrasion-resistant layer covering the resistor layer.
[0008] Here, a preferable method of obtaining the resistor layer of the thermal head comprises
a step of forming by a printing, a spin coat, a painting method and so on the film
of the paste containing the thermally decomposable organic compound of the resistor
component element, and the thermally decomposable organic compound of the element
for forming the matrix of the glass, and a step of producing a resistor layer composed
of the glass matrix, the metal and/or oxide of the resistor component element dispersed
in the matrix through the thermally decomposition of the organic compound in the paste
by the heating processing.
[0009] The paste is preferable to be composed of the-organic compounds, and a solvent for
dissolving these organic compounds, an organic binder to be dissolved in the solvent.
In the paste, the organic compound of the resistor component element is mixed in a
molecular level with the organic compound of the element for forming the matrix of
the glass, the oxide of the element for forming the matrix of the glass the metal
and/or oxide of the resistor component element are formed through the pyrolytic decomposition
of them, and the metal and/or the oxide of the latter is taken into the matrix of
the glass to be caused by the fusion of the above-described oxide so as to form the
resistor layer. In the resistor layer to be produced in this manner,the metal and/or
the oxide of the resistor component element is in a condition, where it is put into
the gap of the atomic bond of the matrix of the glass in the atomic or molecular level.
Accordingly, the resistor layer becomes extremely uniform in the composition, and
the amount of the resistor component element becomes less than it was conventionally.
[0010] Fig. 1 shows the relationship between the ruthenium element containing percentage
of the resistor layer composed of the glass matrix and mainly the oxide of the ruthenium
dispersed in the matrix thereof, and the dispersion of the resistance value of the
resistor layer. It is to be noted that the axis of ordinate related to the resistance
value shows the value of α/R X 100. R is an average value of the resistance value,
a is a standard deviation value.
[0011] In Fig. 1, A is the characteristics of the resistor layer obtained by the method
of the present invention, B shows the characteristics of the resistor layer by the
conventional method. In the case of the A, the granular diameter of the oxide of ruthenium
is 1 or lower pm, while, in the case of the B, the granular diameter thereof is 5
or higher pm.
[0012] In the case of the B, when the Ru element containing amount is less than 10 % by
weight, the dispersion of the resistance value b#comes larger suddenly. On the other
hand, in the case of the A, if the Ru element containing amount is less, the dispersion
of the resistance value is extremely low.
[0013] As another method of obtaining the resistor layer, there is a method of using the
paste containing the thermally decomposable organic compound of the resistor component
element, and the glass frit, instead of the paste. Even in this case, it is better
for the paste to contain the solvent to dissolve the organic compound, and the organic
binder to be dissolved in the solvent. When the paste is used, the dispersion property
of the metal and/or oxide of the resistor component element in the producing resistor
layer is inferior to that of the above-described method, but is extremely superior
to that of the conventional method. Namely, the organic compound is in contact against
the particles of the glass frit in the condition of the liquid in the paste, the metal
and/or the oxide to be produced by the pyrolytic decomposition is dispersed in the
molecular level onto the glass frit granular surface, so that they are taken into
the glass matrix to be formed through the fusion of the glass frit in this condition.
[0014] Here, ruthenium is preferable among them, although there are ruthenium, gold, silver,
nickel, chromium, tantalum or the like as the resistor component element to be applied
to the present invention. The ruthenium exists mainly as an oxide in the resistor
layer. The resistor layer using the ruthenium is extremely large in the temperature
dependence property of the resistance value as shown in Fig. 2a. In order to improve
it, it is better to jointly use rhodium. By the joint use of the rhodium, the temperature
dependence property of the resistance value is improved as shown in Fig. 2b. Also,
by the addition of the rhodium, the film forming property of the resistor layer is
also improved. In the case of the joint use of the ruthenium and the rhodium, the
weight ratio is proper to be 0 < Rh / Ru < 5.
[0015] Then, as the element for forming the matrix of the glass, there are provided boron,
silicon for constituting glass borosilicate, and furthermore, lead for constituting
glass lead borosilicate, lanthanum for constituting lanthanum series glass, and besides,
bismuth and so on.
[0016] Also, in addition to the above description, when necessary, zirconium, titanium,
vanadium, aluminum, tantalum, zinc and so on may be added.
[0017] As the thermally decomposable organic compound of the above-described element, there
are alcohlate such as ethyl alcoxide, isopropoxide or the like, fatty acid ester to
be represented by hexane acid ester, polycyclic organic compound such as menthol alcohlate,
ester or the like, rosin compound such as abietic acid salt or the like, siloxanes,
boric acid organic compound and so on.
[0018] Although the temperatures for producing the desired metal or oxide through the heating
of the paste containing these organic compounds are different depending upon the compounds
to be used, the temperature is usually at 500 through 800 °C, which is preferable
under the atmosphere containing oxygen.
[0019] Although the organic compound of the thermally decomposable property was used in
the above description, there are a compound, which gives metal and/or oxide through
the decomposition by the application of ultraviolet rays, such as ruthenate of naphthoquinone
diazo compound having a carboxyl group, a novolak series of phenol resin compound,
a compound with lead, silicon or bismuth, and so on.
[0020] When these compounds are used, the ultraviolet ray is applied upon the film of the
paste for the decomposition operation.
[0021] By the present invention, a resistor layer of a uniform film of 0.3 through 3 pm
in thickness may be provided. The resistor layer is superior in thermal efficiency
during the recording operation, because it is thin, without defects such as air bubbles
being hardly provided therein.
[0022] It was difficult to obtain a uniform composition of film with the film thickness
of 0.3 µm or more in the resistor layer of the conventional thin film type. On the
other hand, in the thick film type, it was easy to obtain the stable film with thickness
being 0.3 pm or more, but it was difficult to form the uniform film. In this manner,
in the conventional art, it was difficult to have the stable film having the thickness
in the range of 0.3 µm through 3.0 pm. The present invention can provide a thermal
head which is provided with a resistor layer of a uniform, superior film having the
thickness of 0.3 through 3 p m unavailable conventionally.
[0023] The present invention may provide a thermal head which is superior in recording quality,
thermal efficiency.
BRIEF DESCRIPTION OF THE DRAWINGS:
[0024] These and other objects and features of the present invention will become apparent
from the following description taken in conjunction with the preferred embodiment
thereof with reference to the accompanying drawings, in which;
Fig. 1 is a graph showing the relationship between ruthenium containing amount of
a resistor layer with the ruthenium as the resistor component and the dispersion of
the resistance value of the resistor layer.
Fig. 2 is a graph showing the temperature dependence of the resistor value of the
resistor layer which contains also ruthenium; and
Fig. 3 and Fig. 4 are cross-sectional views each showing the essential portions of
the thermal head in accordance with the present invention.
DETAILED DES=IPTION OF THE INVENTON:
[0025] Before the description of the present invention proceeds, it is to be noted that
like parts are designated by like reference numerals through the accompanying drawings.
[0026] Fig. 3 is a longitudinally sectional view of the essential portions showing the construction
example of a thermal head in accordance with the present invention.
[0027] 1 is a base plate with the surfaces thereof being at least insulated. A steel plate
covered with porcelain enamel on the surface thereof, an alumina base plate having
a glaze layer on its surface, and so on are used. 2 is a resistor layer formed on
the surface thereof. 3, 4 are electrodes formed on the resistor layer 2. Normally
one electrode-is a common electrode, the other is an individual electrode, with such
electrode pair being arranged in the line shape by plurality. 5 is an abrasion-resistant
layer covering the surfaces of these electrodes 3, 4 and the resistor layer 2, and
comes into contact with the recording paper to transfer the heating of the resistor
layer to it so as, also, to prevent the electrodes and the resistor layers from being
worn out.
[0028] Fig. 4 shows the other construction example of the thermal head. 11 is a basic plate,
with the electrodes 13, 14 formed thereon, thereafter the resistor layer 12 and the
abrasion-resistant layer 15 being formed.
[0029] The concrete embodiment of the present invention will be described hereinafter.
Embodiment 1
[0030] A pair of electrode layers composed of gold are formed on the alumina base plate
having the glaze layer of 50 µm in thickness on the surface. The paste for resistor
use was screen printed, heated in contact with both the electrodes between the electrode
layers to form the resistor layer of 350 µm in width. The paste for resistor use was
made of the respective hexane acid salt of Ru, Rh, Si, B, Pb, ethylcellulose and terpineol,
and was 50000 c p in viscosity. After the paste printing, it was left as it was and
was dried, thereafter it was heated at 800 °C into the resistor layer. The paste of
borosilicate glass frit was printed on the resistor layer, heated to form the abrasion-resistant
layer. It was to be noted that the mixing ratio of the hexane acid salt in the paste
for resistor use was to become 10 : 4 : 14 : 4 : 68 by the weight ratio of Ru : Rh
: Si : B : Pb.
Embodiment 2
[0031] Octane acid salt of ruthenium, ethykalcoxide of ruthenium, respective ethylalcohlate
of Pb, Si, B were mixed to become 8 : 70 : 15 7 by the weight ratio of Ru : Pb : Si
: B, the paste with ethylcellulose, terpineol being added thereto was printed, heated
into the resistor layer. The other is the same as in the embodiment 1.
Embodiment 3
[0032] The same resistor layer as in the embodiment 1 was formed, silicon carbide of 3 µm
in thickness was formed into the abrasion-resistant layer by a sputtering method on
the resistor layer.
Embodiment 4
[0033] Terpineol was further added to the paste of the embodiment 1 to provide 1000 c p
in viscosity. The paste was applied with the use of a spinner onto the steel plate
having the enamel covered layer of 100 µm in thickness. The revolution number of the
spinner was 2000 rpm. After the drying operation, it was heated at 800 °C, then the
resistor was formed into the given pattern by a photolithography and etching method.
Here, the etching liquid was the mixing liquid of sulfuric acid and ammonium fluoride.
Then, the paste of gold ethylmerucaptid was printed, heated on the resistor layer
to form a gold layer, and continuously formed in the given pattern the gold electrode
layer by the photolithography and etching method. The paste composed of the respective
hexane acid salt of Si, B, Pb, ethylcellulose, terpineol was printed, burned on it
to form the abrasion-resistant layer.
Embodiment 5
[0034] The same paste film for resistor use in the embodiment 4 by a roll coater was provided
onto the steel plate having the- enamel covered layer, heated at 800 °C into the resistor
layer. A chrome - copper layer was formed by a sputtering method on the resistor layer,
the resistor layer, electrode layer were formed in a given pattern successively by
the photolithography and etching of. the chrome - copper layer, the photolitho etching
of the resistor layer. Thereafter, by the same method as in the embodiment 3, the
abrasion-resistant layer was formed.
Embodiment 6
[0035] Many individual electrodes were formed in the line shape on the alumina base plate
having the glaze layer on the surface and also the common electrode was formed in
opposition to the individual electrode. The paste for resistor use was discharged
to form the film which comes into contact with both the electrodes, with the use of
painting pen having a.slit of 350 µm X 10 µm in size between the electrodes. The paste
for resistor use here is the same as in the embodiment 1. The paste film was heated
at 800 °C after the drying operation into the resistor layer. The paste of the borosilicate
glass frit was printed, heated on the resistor layer to form the abrasion-resistant
layer.
Embodiment 7
[0036] Ethylcellulose and terpineol was added to a mixture of 1 : 10 in the weight ratio
between hexane acid salt and borosilicate glass frit so as to be used as the paste
for resistor use. The other was the same as in the embodiment 1.
Embodiment 8
[0037] Paste composed of gold ethylmercaptid, diphenyl siloxane, menthol compound of boron,
ethylcellulose and terpneol was used as paste for resistor use. The other is the same
as in the embodiment 1. However, the mixing ratio of organic compound in the paste
was to become 0.15 : 1 by the weight ratio of gold : (Si + B).
Comparison embodiment 1
[0038] A thermal head of a thick film type has an abrasion -proof layer composed of gold
electrode, resistor layer, glass formed through the printing, burning of the paste
on the alumina base plate having the glaze layer on the surface. Here, the paste which
was used to form the resistor was provided by the addition of ethylcellulose and terpineol
into the mixture of oxide ruthenium powder 40 % by weight of 0.1 µm in average granular
diameter, 0.8 µm in maximum granular diameter, and borosilicate glass frit 60 % by
weight. The printed paste film was heated at 800 °C. Comparison embodiment 2
[0039] A thermal head of a thin film type has a resistor layer composed of Ta - Si, an electrode
layer of Cr - Cu, and an abrasion-resistant layer composed of silicon carbide formed
the alumina base plate having the glaze layer on the surface.
[0040] The various characteristics of the thermal heads in the above-described respective
embodiments and the comparison embodiments will be shown in the following table.

[0041] As is clear from the foregoing description, according to the arrangement of the present
invention, the resistor layer of the thermal head in accordance with the present invention
has homogeneous composition distribution, is thin in film, with thermal capacity being
small, so that the thermal efficiency is superior in the recording and the superior
quality of recordings are given. Therefore, the present invention may be applied to
a full color printer of higher gradation, a facsimile or a word processor and so on.
[0042] Although the present invention has been fully described by way of example with reference
to the accompanying drawings, it is to be noted here that various changes and modifications
will be apparent to those skilled in the art. Therefore, unless otherwise such changes
and modifications depart from the scope of the present invention, they should be construed
as included therein.
1. A thermal head comprising, as components, at least a pair, of electrodes, resistor
layers in contact against both the electrodes, and base plate w4th the electrodes
and the resistor layers being supported on the surfaces thereof, at least the surface
thereof being of an insulation property, being characterized in that the resistor
layer is composed of the matrix of glass, a metal and/or an oxide of a resistor component
element existed in the gap of the atomic bonding of the matrix.
2. A thermal head described in claim 1, wherein a resistor component element is ruthenium,
and is dispersed in the glass matrix mainly as oxide.
3. A thermal head described in claim 2, wherein rhodium is further contained as the
resistor component element.
4. A thermal head described in claim 2 or claim 3, wherein ruthenium-contained in
the resistor layer is 10 % or lower by weight.
5. A thermal head described in claim 1, wherein the resistor component element is
selected from a group composed of gold, silver, nickel, chrome and tantalum.
6. A thermal head described in claim 1, wherein glass for constituting the resistor
layer is borosilicate series glass or lead borosilicate series glass.
7. A thermal head described in claim 1, wherein glass for forming the resistor layer
is of a lanthanum series glass.
8. A .thermal head comprising at least a pair of electrodes, resistor layers in contact
against both the electrodes, and basic plate for supporting the electrodes and the
resistor layers on the surface thereof, at least the surface thereof being of insulating
property, being characterized in that the resistor layer is composed of the matrix
of the glass, ruthenium oxide dispersed in molecular level mainly in the matrix.
9. A thermal head described in claim 8, wherein rhodium or the oxide thereof is further
dispersed at an atomic level or a molecular level in the matrix.
10. A thermal head described in claim 8, wherein the matrix is borosilicate series
glass or lead borosilicate series glass.
11. A thermal head described in claim 8, wherein the resistor component element is
selected from a group composed of gold, silver, nickel, chrome and tantalum.
12. A method of manufacturing a thermal head having, as components, at least a pair
of electrodes, resistor layers in contact against both the electrodes, and basic plate
for supporting the electrodes and the resistor layers on the surface thereof, at least
the surface thereof being of insulating property, being characterized in that a process
of forming the resistor layer is composed of a step of forming on the base plate provided
before the electrode is formed or after it is formed the film of the paste containing
the themally decomposable organic compound of the resistor component element and the
thermally decomposable organic compound of the element for forming the matrix of the
glass, and a step of pyrolytic decomposition of the organic compound in the paste
by the heating processing so as to produce a resistor layer composed of glass matrix,
metal and/or oxide of the resistor component element dis- persed in the matrix.
13. A method of manufacturing a thermal head described in claim 12, wherein the paste
is composed of organic compounds, and a solvent for dissolving them, an organic binder
soluble in the solvent.
14. A method of manufacturing a thermal head described in claim 12, wherein a resistor
component element is ruthenium.
15. A method of manufacturing a thermal head described in claim 12, wherein rhodium
is further contained as the resistor component element..
16. A method of manufacturing a thermal head having, as components, at least a pair
of electrodes, resistor layers in contact against both the electrodes, and base plate
which support both the electrodes and the resistor layers on the surface thereof,
at least the surface thereof being of insulating property, being characterized in
that a process for forming the resistor layers is composed of a step of forming on
the base plate provided before the electrode is formed or after it is -formed the
film of the paste containing the thermally decomposable organic compound of the resistor
component element and the glass frit, and a step of pyrolytic decomposition of the
organic compound in the paste by the heating processing so as to produce a resistor
layer composed of glass matrix, metal and/or oxide of the resistor component element
dispersed in the matrix.
17. A method of manufacturing a thermal head described in claim 16, wherein the paste
is composed of the organic compound and a solvent for dissolving them, an organic
binder soluble in the solvent.
18. A method of manufacturing a thermal head described in claim 16, wherein the resistor
component element is ruthenium.
19. A method of manufacturing a thermal head described in claim 18, wherein rhodium
is further contained as the resistor component element.
20. A method of manufacturing a thermal head described in claim 16, wherein the resistor
component element is selected from a group of gold, silver nickel, chrome and tantalum.
21. A method of manufacturing a thermal head having, as components, at least a pair
of electrodes, resistor layers in contact against both the electrodes, and basic plate
for supporting the electrodes and the resistor layers on the surface thereof, at least
the surface thereof being of insulating property, being characterized in that process
for forming the resistor layers is composed of a step of forming on the basic plate
provided before the electrode is formed or after it is formed the film of the paste
containing a ultraviolet-ray decomposable organic compound of the resistor component
element and a ultraviolet ray decomposable organic compound of the element for forming
the matrix of the glass, and a step of decomposable of the organic compound in the
paste by the application of the ultraviolet- ray so as to produce the resistor layer
composed of glass matrix, metal and/or oxide of the resistor component element dispersed
in the matrix.
22. A method of manufacturing a thermal head in accordance with claim 21, wherein
the paste is composed of the organic compound and a solvent for dissolving them, an
organic binder soluble in the solvent.