(19)
(11) EP 1 003 010 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
12.09.2001 Bulletin 2001/37

(43) Date of publication A2:
24.05.2000 Bulletin 2000/21

(21) Application number: 99122760.4

(22) Date of filing: 16.11.1999
(51) International Patent Classification (IPC)7G01B 9/02, G01B 11/02
(84) Designated Contracting States:
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 17.11.1998 JP 32631498

(71) Applicant: Mitutoyo Corporation
Kanagawa 213-0012 (JP)

(72) Inventor:
  • Narumi, Tatsuya, Mitutoyo Corporation
    Kawasaki, Kanagawa 213-0012 (JP)

(74) Representative: Grünecker, Kinkeldey, Stockmair & Schwanhäusser Anwaltssozietät 
Maximilianstrasse 58
80538 München
80538 München (DE)

   


(54) Interferometer and measuring method using interferometer


(57) An interferometer and method for performing preliminary and main measurements quickly and with high precision are provided. Laser light and white light are successively introduced to the same interferometer booth. Laser light is introduced from a laser light source, and the interference fringe with a reference mirror as a reference is detected using a CCD and a personal computer. By setting the interference fringe to a preset value, the position of a work is adjusted. White light from a halogen lamp is then introduced, a corner cube moving mount is moved, interference fringe with a reference mirror as a reference is detected, and preliminary measurement of the work is performed. Next, laser light is introduced, interference fringe with a reference mirror as a reference is detected, and the main measurement of the work is performed. Because the preliminary and main measurements are performed within the same interferometer booth, the number of steps is reduced and high precision preliminary measurement can be performed.







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