(19)
(11) EP 1 291 132 A3

(12) EUROPEAN PATENT APPLICATION

(88) Date of publication A3:
31.03.2004 Bulletin 2004/14

(43) Date of publication A2:
12.03.2003 Bulletin 2003/11

(21) Application number: 02019759.6

(22) Date of filing: 04.09.2002
(51) International Patent Classification (IPC)7B24B 41/00, B24B 9/06
(84) Designated Contracting States:
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LI LU MC NL PT SE SK TR
Designated Extension States:
AL LT LV MK RO SI

(30) Priority: 06.09.2001 JP 2001269640

(71) Applicant: Speedfam Co., Ltd.
Kanagawa 252-1123 (JP)

(72) Inventor:
  • Hakomori, Shunji
    Ayase-city, Kanagawa-pref. 252-1123 (JP)

(74) Representative: HOFFMANN - EITLE 
Patent- und Rechtsanwälte Arabellastrasse 4
81925 München
81925 München (DE)

   


(54) Semiconductor wafer polishing apparatus and polishing method


(57) An object of the present invention is to unchange the order of wafers when passed through a wafer outer peripheral part polishing apparatus (1), thereby simplifying control for each wafer. In predetermined positions of a frame (10) of a wafer outer peripheral part polishing unit (5), there are arranged and attached a wafer cassette reception and discharge opening unit (2), a wafer position aligning unit (3), a wafer notch polishing unit (4), a wafer circumferential part polishing unit (5), an inside carrier unit, a first slurry supply device (49), and a second slurry supply device (59). The inside carrier unit has a first carrier sub-unit (81), a second carrier sub-unit (82), and a third carrier sub-unit (83). After a wafer taken out from the wafer cassette reception and discharge opening unit (2) is polished, the wafer is returned to the same slot of the same cassette from which it is taken out. Thus, the order is not changed.







Search report