[0001] The invention relates to a method for adjusting a first and a second array relatively
to each other in a printing device having a carrying structure for mounting the first
and second arrays, the first array having nozzles arranged in a first row substantially
parallel to a first direction for forming first marks on a recording substrate, the
second array having nozzles arranged in a second row substantially parallel to the
first direction for forming second marks on the recording substrate, wherein in an
attainable relative position, the first and second arrays at least partially flank
each other, thereby defining a degree of a longitudinal overlap along the first direction,
the method comprising forming a test pattern having first and second test marks and
detecting the locations of the first and second test marks .
[0002] In an ink jet printer known from the prior art and having at least a first and a
second printhead, a carriage whereon the printheads are mounted is generally moved
over a recording substrate in a main scanning direction parallel to an y-axis for
the purpose of recording a swath of an image. The first and second printheads have
respectively a first and a second arrays of nozzles extending in a direction substantially
parallel to the x-axis, which is the sub-scanning direction. The sub-scanning direction
x is perpendicular to the main scanning direction y. An image swath consisting of
a certain number of pixel lines, corresponding to the number of activated nozzles
of the printheads is thus recorded during a pass of the carriage along the main scan
direction. In a given relative position of the first and second arrays along the x-axis,
the first and second arrays at least partially flank each other and are arranged for
forming respectively first and second marks (also referred to as dots) on a substrate.
Some pixels lines are thus constituted by first marks, corresponding to the nozzles
of the first row, while other pixels lines are constituted by second marks, corresponding
to the nozzles of the second row. Since the first and second rows at least partially
flank each other, pixel lines constituted by first marks and pixel lines constituted
by second marks both are formed in a same image swath onto the recording substrate
during a single pass of the carriage. Generally, interlacing of such pixel lines is
desired to obtain a high resolution of the recording image and the spacing between
the lines should be as regular as possible. During one single pass of the carriage
with two printheads, a printing resolution twice as high as the resolution of a single
printhead may be achieved. Therefore, the relative position of a first and a second
printhead along the x-axis has to be adjusted with a high degree of precision. Furthermore,
a common error in the positioning of the pixel lines is caused by jet angles which
deviate from the ideal jet angle. Such defects may be caused by impurities present
in the nozzles. Such defects may lead, for graphical applications, to the appearance
of white or light stripes in an image, known as 'banding' effect.
[0003] A method for adjusting a first and a second array relatively to each other in a printing
device of the type set forth is known from
US 4,675,696. A reference pattern is recorded, wherein the reference pattern comprises 'recording
elements' formed by each printhead for detecting the relative positional aberration
of the printheads in the sub-scanning direction. The recorded reference pattern is
read for providing an output indicative of the relative locations of the 'recording
elements'. This enables detection means to provide an output indicative of the intervals
between the printheads in the sub-scanning direction. This is turn enables control
means to control and adjust the relative position of the printheads in the sub-scanning
direction. However, the method of the prior art is not suited for adjusting the relative
position of the first and second printheads such that interlaced pixel lines are obtained
with a recording resolution twice as high as the resolution of a single printhead.
Furthermore, the known method is not able to solve the problem of 'banding'.
[0004] The object of the present invention is to improve a method for adjusting a first
and a second array relatively to each other in a printing device such that interlaced
pixel lines can be obtained in one carriage single pass with a regular spacing between
the pixel lines. With a regular spacing between pixel lines, a high resolution image
swath can be obtained within a single pass of the carriage. At the same time, the
phenomenon of 'banding' is significantly reduced.
[0005] This object is achieved by a method for adjusting a first and a second array relatively
to each other in a printing device, further comprising determining a plurality of
deviation factors for a plurality of attainable relative positions based on said detected
locations, wherein each one of said deviation factors is an attribute of a distinct
attainable relative position and is indicative of an amount by which distances between
neighbouring first and second marks deviate from a nominal distance, and selecting
an attainable relative position among the plurality of attainable relative positions
which satisfies a selection criterion applied to the plurality of deviation factors.
[0006] Since a deviation factor which is an attribute of an attainable relative position
is determined, the defects that would appear in the spacing between lines comprising
first marks and lines comprising second marks can be quantified for the corresponding
attainable relative position. The deviation factor is characteristic of an amount
by which distances between pixel lines deviate from a nominal distance. Deviation
factors are determined for a plurality of attainable relative positions. Thus, for
each of said attainable positions, the defects that would appear in a printed image
are quantified. This enables the selection of an attainable relative position which
is the optimum attainable relative position of the first and second arrays. To select
the optimum attainable relative position, a selection criterion is applied to the
plurality of deviation factors attributed to the plurality of attainable relative
positions.
[0007] In one embodiment of the method according to the invention, the selected attainable
relative position is the one having the smallest deviation factor among the plurality
of deviation factors. With such a selection criterion, the selected attainable relative
position leads to printed images wherein the appearance of the defects such as caused
by deviating jetting angles is minimised.
[0008] In another embodiment of the method according to the invention, a maximum function
constrains the deviation factor attributed to a distinct attainable relative position
to take the value of the largest difference, in absolute value, among an ensemble
of differences computed between the nominal distance and the distances between neighbouring
first and second marks. The use of this maximum function in order to set the deviation
factor leads to the selection of an attainable relative position wherein large spacing
between pixel lines in a printed image are avoided. This embodiment is particularly
interesting for applications directed to printed electronics, such as printing etch-resist,
where maximum deviations in a printed pattern must be minimised and are more important
than uniform distributions in droplet positioning. When this method is applied, reliable
printed circuit boards are obtained.
[0009] In yet another embodiment of the method according to the invention, an average function
constrains the deviation factor attributed to a distinct attainable relative position
to take the value of an averaged difference, computed in absolute value between the
nominal distance and the distances between neighbouring first and second marks. The
use of this average function in order to set the deviation factor leads to the selection
of an attainable relative position wherein the averaged spacing between pixel lines
is as close as possible to the nominal value. This is particularly of interest for
graphical applications and leads to printed images with a good uniformity of the pixel
distribution.
[0010] In still another embodiment of the method according to the invention, a maximum function
constrains the deviation factor attributed to a distinct attainable relative position
to take the value of the largest difference between the nominal distance and the distances
between neighbouring first and second marks. With this maximum function, an attainable
relative position may be selected which leads to printed images wherein the image
banding is strongly reduced.
[0011] In a preferred embodiment, the method according to the invention further comprises
the step of displacing at least one of the first and second arrays for bringing the
first and second printheads into the selected relative attainable position. Once this
step is carried out, the arrays are positioned relatively to each other such that
printing under optimal conditions may start. This method may be applied from time
to time, in order to calibrate a printing device comprising a first and a second array.
Alternately, the method may be applied before every printing session.
[0012] The invention also relates to a printing device comprising a first and a second array
mounted on a carrying structure, the first array having nozzles arranged in a first
row substantially parallel to a first direction for forming first marks on a recording
substrate, the second array having nozzles arranged in a second row substantially
parallel to the first direction for forming second marks on the recording substrate,
wherein in an attainable relative position, the first and second arrays at least partially
flank each other, thereby defining a degree of a longitudinal overlap along the first
direction, displacement means for displacing at least one of the arrays thereby causing
a change in the degree of the longitudinal overlap and control means adapted to control
the first and second arrays for forming a test pattern having first and second test
marks and to control detecting means for detecting the locations of the first and
second test marks.
[0013] A printing device of the type set forth may be used for graphical applications or
for special applications such as printing an etch-resist material on a substrate for
printed circuit board manufacturing or printing directly metallic patterns for similar
purposes. For graphical applications, a high printing resolution as well as a high
productivity are generally required. When a plurality of arrays are positioned relatively
to each other such that they at least partially flank each other, a high resolution
can be achieved in a single pass of a carriage supporting the arrays. In this case,
the quality of a printed image depends strongly on the regularity of the spacing between
the printed pixel lines obtained in one single pass of the carriage. Therefore, it
is important to align the arrays relatively to each other such that the spacing is
as regular as possible, even in the case that some droplets are jetted according to
angles which deviate from the ideal angle. Defects in jet angles may cause the undesired
phenomenon of 'banding' within a printed swath of an image. With the printing devices
of the prior art, images wherein the problem related to 'banding' appears are common.
[0014] As far as special applications such as printed electronics are concerned, a high
accuracy of the placements of the marks on the recording substrate is essential. Indeed,
errors in the relative positions of printed lines lead to the occurrence of conductive
tracks having errors in spacing widths. This may cause insufficient electrical isolation
between adjacent tracks. Moreover, in such applications, a configuration is possible
wherein the first and second arrays at least partially flank each such that the first
array is normally used for printing purposes, while the second array is used for backup
purposes in the case that malfunctioning of some nozzles of the first array is detected.
When this happens, the malfunctioning nozzles of the first array can be set in an
inactive state, while nozzles of the second array take over their function. In this
kind of application, it is essential that the second marks, formed by the second array,
come to lie on the recorded substrate at substantially the same locations as the first
marks formed by the first array would do if the first array was functioning properly.
The printing devices of the prior art have the problem that the second marks are not
positioned properly with respect to the desired locations.
[0015] The object of the present invention is to improve a printing device of the type set
forth such that these problems are minimised.
[0016] This object is achieved in a printing device having control means adapted to control
a computing module for executing the steps of determining a plurality of deviation
factors for a plurality of attainable relative positions based on said detected locations,
wherein each one of said deviation factors is an attribute of a distinct attainable
relative position and is indicative of an amount by which distances between neighbouring
first and second marks deviate from a nominal distance, and selecting an attainable
relative position among the plurality of attainable relative positions which satisfies
a selection criterion applied to the plurality of deviation factors.
[0017] Since a deviation factor which is an attribute of an attainable relative position
is determined, the defects that would appear in the spacing between lines comprising
first marks and lines comprising second marks can be quantified for the corresponding
attainable relative position. The deviation factor is characteristic of an amount
by which distances between pixel lines deviate from a nominal distance. Deviation
factors are determined for a plurality of attainable relative positions. Thus, for
each of said attainable positions, the defects that would appear in a printed image
are quantified. This enables the selection of an attainable relative position which
is the optimum attainable relative position of the first and second arrays. To select
the optimum attainable relative position, a selection criterion is applied to the
plurality of deviation factors attributed to the plurality of attainable relative
positions.
[0018] In one embodiment of the printing device according to the invention, the control
means are adapted to control the displacement means for causing the first and second
arrays to have a degree of longitudinal overlap corresponding to the selected attainable
relative position. This enables a calibrating procedure for adjusting the first and
second arrays relatively to each other which may easily be executed automatically,
for example before each time an image is to be printed.
[0019] In another embodiment of the printing device according to the invention, the detecting
means is a CCD camera mounted on a carriage and arranged for scanning the test pattern.
Preferably, the CCD camera is arranged for determining a geometrical centre of gravity
of each one of the first and second test marks in the test pattern and extracting
coordinates of said first and second test marks along an axis. With such a CCD camera,
the locations of the test marks in the test pattern can be accurately determined.
Moreover, with the extracted coordinates, the distances between neighbouring first
and second marks can be also accurately extracted. This leads to determined deviation
factors which characterise properly the defects in an image depending on the attainable
relative position.
[0020] In yet another embodiment of the printing device according to the invention, the
nozzles of the first array are regularly spaced according to a pitch and the nozzles
of the second array are regularly spaced according to the same pitch. This is useful
for many applications, such as high resolution graphical applications or printed electronics
applications. When the nominal distance is equal to half the pitch, printing with
a double resolution may be achieved with a good quality. When the nominal distance
is equal to zero, a printing device for printed electronics with a high reliability
can be achieved, since the second array can serve as a backup array in the event that
some nozzles in the first array have to be set inactive due to their malfunctions.
[0021] The invention also relates to a computer program product residing on a computer readable
medium comprising instructions for causing at least one process unit to perform the
method of any of the claims 1 to 10.
[0022] Embodiments of the method and of the printing device according to the invention are
elucidated hereinafter with reference to the figures.
Figure 1 is a schematic view of essential parts of a printing device having a first
and a second printhead, together with an ideal mark pattern recorded on a substrate.
Figures 2A and 2B are cross-sectional views of the first and second arrays that show
the deviation of the jet angles associated to each nozzle of the arrays.
Figure 3 is a schematic representation of a printed pattern when the arrays are aligned
according to a method of the prior art.
Figure 4 is a schematic representation of a recorded test pattern comprising test
marks, together with the normal projection of the marks onto the x-axis.
Figures 5A to 5F represent marks pattern that would be obtained in six different attainable
relative positions of the first and second arrays.
Figure 6 is a table which associates an x-coordinate to each recorded mark of the
test pattern shown in Figure 4.
Figures 7A and 7B list the distances between adjacent first and second points that
would arise if the first and second arrays were in the relative position 1 (Figure
5A) and in the relative position 3 (Figure 5C), respectively.
Figures 8A and 8B are cross-sectional views of the first and second arrays in the
relative position 3.
Figure 9 is a schematic representation of a printed pattern when the arrays are aligned
according to the method of the invention.
Figure 10 is flow diagram representing the steps of a method according to an embodiment
of the invention.
Figure 11 shows cross-sectional views of the first and second arrays in a relative
position suited for printing overlapping pixel lines.
Figure 12A illustrates an arrangement of marks for graphical applications.
Figure 12B illustrates an arrangement of marks for special applications such as printing
etch-resist ink and/or conductive material for printed circuit board manufacturing.
[0023] Figure 1 schematically shows a carriage 10 of an ink jet printer having a first printhead
and a second printhead which are mounted on the carriage 10. The first printhead has
a first array 12 of nozzles 18 aligned in a row and the second printhead has a second
array 14 of nozzles 20 aligned in a row. Although only two arrays 12 and 14 are shown
in the drawing, it is possible to mount additional arrays on the carriage 10. The
arrays 12 and 14 may be suited for recording marks of the same marking substance,
such as black ink or an etch-resist ink suited for printed electronics applications.
The arrays 12 and 14 may also be suited for recording marks of different marking substances
such as a conductive material and an etch-resist material. With even more arrays,
a full colour printer may be obtained, whereby the plurality of additional arrays
are used for printing the colours yellow, cyan and magenta. The method for adjusting
two arrays such as described hereinafter easily translates to more than two arrays.
[0024] The arrays 12 and 14 may be of any type suited for ejecting ink droplets according
to a recording signal. A known ink jet printhead with an array of nozzles is provided
with a plurality of pressure chambers each of which is fluidly connected on the one
hand, via an ink supply path, to an ink reservoir and on the other hand to a nozzle,
wherein an actuator is provided for each pressure chamber for pressurising the ink
contained therein, so as to eject an ink droplet through the nozzle in accordance
with a recording signal supplied by a control unit. The nozzles are arranged in a
row, so that a plurality of pixel lines of an image can be recorded simultaneously.
The actuators may be formed by piezoelectric or thermal elements that are arranged
along each ink channel. When an ink droplet is to be expelled from a specific nozzle,
the associated actuator is energised so that the liquid ink contained in the ink channel
is pressurised and an ink droplet is ejected through the nozzle.
[0025] The array 12 is provided with a row of nozzles 18 and the array 14 is provided with
a row of nozzles 20. Each row extends in a so-called sub-scanning direction which
is parallel to an x-axis. The sub-scanning direction is the direction in which a recording
substrate 26 (such as a sheet of paper) is advanced step-wise. In order to print a
swath of an image, the carriage 10 is moved across the substrate 26 in a main scanning
direction parallel to an y-axis, normal to the x-axis. The control unit 11 is connected
to the first printhead with the array 12 and to the second printhead with the array
14 and is arranged for supplying recording signals to the first and second printheads
so as to activate image-wise the nozzles.
[0026] The carriage 10 has an element 16 configured for adjusting the relative position
of the arrays 12 and 14 along the x-axis. The element 16 is mechanically connected
to at least one of the arrays, for example the array 14, in order to displace the
array along the x-axis such that the relative position of the arrays is modified.
The element 16 may be a piezoelectric element adapted to expand and retract along
the x-axis, in response to electrical signals supplied by the control unit 11.
[0027] In the example shown in Figure 1, the nozzles 18 of the array 12 are spaced from
one another according to a substantially constant pitch p. The nozzles 20 of the array
14 are regularly spaced according to the same pitch p. The array 12 is suited for
printing marks (or dots) 22, which result from the ejection of ink droplets out of
the nozzles 18, with a resolution along the x-axis substantially equal to 1/p (usually
expressed in dots per inch). As is seen in Figure 1, first pixel lines having first
marks 22 are formed on the recording substrate 26 and extend along the y-axis. Similarly,
the array 14 is suited for printing marks 24 with the same resolution. Second pixel
lines having second marks 24 and extending along the y-axis are formed. When the arrays
12 and 14 are relatively aligned such that the nozzles 18 and 20 are in a longitudinal
staggered arrangement, a pattern with alternating first and second lines such as shown
in Figure 1 may be obtained, with printing resolution substantially equal to 2/p.
To achieve this printing resolution in an image swath with one single pass of the
carriage 10, represented by the arrow S, both arrays 12 and 14 are activated image-wise
within one single carriage pass. In Figure 1, a pattern extending along the y-axis
is represented, whereby all possible nozzles are activated. However, in practice,
the arrays are driven by the control unit 11 in order to activate the nozzles image-wise.
For applications such as printed electronics, lines may be recorded using a special
etch-resistant ink in order to later on produce tracks of a conductive material by
means of an etching process.
[0028] The recorded pattern with the marks 22 and 24 such as represented in Figure 1 is
however unrealistic, and in practice, a recorded pattern is imperfect. A source of
defaults lies within the fact that jet angles considered in the x-z plane deviate
from the ideal jet angle of 90 degrees. Deviations of jet angles from the ideal jet
angle are illustrated schematically for the nozzles 20 of the array 14 and for the
nozzles 18 of the array 12 in Figures 2A and 2B, respectively. In these drawings,
each of the arrays 14 and 12 is represented according to a cross section and their
relative position is assumed to be the same as is shown in Figure 1. In the rest of
the description, the situation is described wherein each array has 21 nozzles (20a...
20u and 18a... 18u), but in reality, an array may comprise much more nozzles. Some
nozzles (for example 20a, 20c, 20g, 18b, 18c, 18g etc) eject droplets according to
a trajectory having a medium deviation to the left. Other nozzles (for example 20e)
have a major deviation to the left. Yet other nozzles have a minor deviation to the
right (for example 20b, 20d, 20f, 18a, 18d, 18e etc). The fact that the jet angles
deviate from the ideal angle may cause banding in a recorded dot pattern, as is shown
in Figure 3. At some locations of the pattern, undesired empty (or 'white') lines
appear while at some other locations, undesired dark appear due to overlapping. These
defects are particularly pronounced in an area 23, wherein a strong overlap as well
as a large spacing between vertical lines are visible. The phenomenon of banding is
visually unpleasant. For printed electronics application, this leads to isolation
problems between conductive tracks.
[0029] The pattern represented in Figure 3 may appear when a prior art method for adjusting
sidewise the relative position of the arrays is implemented. For example, according
to a known method, the arrays are aligned by a control means which utilises signals
from a sensor for determining and controlling the position of reference markers formed
on the arrays. The arrays are deemed aligned correctly when such reference markers
are brought into registration.
[0030] A method for adjusting the first and the second array relatively to each other according
to an embodiment of the invention is now described with reference to the flowchart
diagram of Figure 10. The steps of the method may be automated. For this purpose,
the control unit 11 is adapted to issue instructions to different modules such as
described hereinafter. To performs its tasks, the control unit 11 comprises for example
a processor, first memory means such as a RAM whereon data may be written during the
adjusting procedure and second memory means such as an EPROM for storing instructions
executable by the processor. Alternately, the procedure may be carried out semi-automatically
or manually.
[0031] In a first step S2, the adjusting procedure is started by a user in order to launch
a program for adjusting the relative position of the arrays which may be installed
on the control unit 11.
[0032] In step S4, the control unit 11 issues an instruction to the printing device for
recording a test pattern on the recording substrate. In step S4, the first and second
arrays are arranged according to an initial relative position, such as shown in Figs.
2A and 2B. An example of a suitable test pattern is shown in Figure 4. The test pattern
is obtained by activating all nozzles of both arrays such that each nozzle expels
at least one ink droplet for forming marks on the recording substrate. When the test
pattern shown in Figure 4 is formed, the arrays 12 and 14 are in the initial position
and the carriage 10 is immobile. The recorded test pattern comprises a group of first
test marks 22a... 22h...22j etc and a group of second test marks 24a... 24h... 24j
etc whereby both groups extend in a direction parallel to the x-axis. Alternately,
to record a test pattern, the arrays 12 and 14 are in the initial position and the
carriage 10 is moved along the y-axis in order to form a swath of an image. In this
case, when all nozzles are activated while the carriage 10 is moved, pixel lines would
be formed on the recording substrate.
[0033] In step S6, the control unit 11 issues an instruction to opto-electronic sensors
such as a CCD camera (not shown) in order to generate data suited for detecting the
locations on the substrate of the first and second test marks of the test pattern.
The CCD camera (not shown) may be installed on the carriage 10 of the printing device
and is suited for scanning optically the test pattern. The scanned test pattern may
then be saved in a suitable image format onto the first memory means for further analysis
by the control unit 11. Based on the scanned pattern, which is an image comprising
data representing the first and second test marks, the location of the first and second
test marks are determined by an image analysis software module running on the control
unit 11. As is represented in Figure 4, a normal projection of the recorded first
marks defines points having x-coordinates (x22a...x22h... x22i etc). Similarly, a
normal projection of the recorded second marks defines points having x-coordinates
(x24a...x24h... x24i etc). Based on the determined locations of the first and second
test marks, the analysis module of the control unit 11 extracts the x-coordinates
of the points and generates a list of x-coordinates corresponding to the recorded
first and second marks. An example of such a list is represented in Figure 6. Alternately,
the CCD camera may be provided with a micro-processor for performing the tasks of
determining the locations of the first and second test marks and extracting the x-coordinates.
In this case, the CCD camera is preferably arranged for determining a geometrical
centre of gravity of each recorded test mark. The determination of the centres of
gravity leads directly to the x-coordinates (such as exemplified in Figure 6) which
are transmitted by the CCD camera to the control unit 11 via connection means.
[0034] The concept of 'an attainable relative position' is now elucidated. An attainable
relative position is a position wherein the first and second arrays at least partially
flank each other, thereby defining a degree of a longitudinal overlap along the x-axis.
The first and second arrays, in an attainable relative position could record a pattern
with alternating pixel lines comparable to the initial pattern of Figure 3, expect
the fact that the recorded pattern would be less wide in the x-direction since the
nozzles falling outside the overlapping area would not be usable anymore. Said nozzles
are not usable anymore because the resolution would not be acceptable anymore compared
to the desired resolution. Indeed, the nozzles falling outside the overlapping area
would produce a print resolution equal to 1/p while the nozzles falling within the
overlapping area would lead to a resolution equal to 2/p, which is in the example
the desired resolution. If the arrays 12 and 14 were brought into a certain attainable
position and all their nozzles were activated, the recorded mark pattern would be
as is illustrated in Figure 5A for position P1, in Figure 5B for position P2, in Figure
5C for position P3, in Figure 5D for position P4, in Figure 5E for position P5 and
in Figure 5F for position P6. The position P1 simply corresponds to the initial position
and the degree of longitudinal overlap is 100%. All nozzles may be used to record
a pattern. Position P2 corresponds to a position wherein the arrays have been relatively
displaced along the x-axis by a distance equal to one pitch p. The degree of longitudinal
overlap is about 95%. The outermost left nozzle of the array 14, i.e. the nozzle 20a
is not usable anymore. The same holds for the outermost right nozzle of the array
12, i.e. the nozzle 18u. Position P3 corresponds to a position wherein the arrays
have been relatively displaced along the x-axis by a distance equal to two pitches
(2p). The degree of longitudinal overlap is about 90%. The two outermost left nozzles
of the array 14 i.e. the nozzles 20a and 20b are not usable anymore. The same holds
for the two outermost right nozzles of the array 12, i.e. the nozzles 18u and 18t.
In position P4 (see Figure 5D), the nozzles 20a, 20b, 20c, 18u, 18t and 18s are not
usable anymore. In position P4, the degree of longitudinal overlap is about 85%. In
position P5 (see Figure 5E), the nozzles 20a, 20b, 20c, 20d, 18u, 18t, 18s and 18r
are not usable anymore. In position P5, the degree of longitudinal overlap is about
80%. Finally, in position P6 (see Figure 5F), the nozzles 20a, 20b, 20c, 20d, 20e,
18u, 18t, 18s, 18r and 18q are not usable anymore. In position P6, the degree of longitudinal
overlap is about 75%. The number of attainable positions may be freely chosen, and
depends mainly on the design of the arrays and on choices made for an acceptable minimum
print width.
[0035] Ideally, the projected distance onto the x-axis between adjacent first and second
marks should be equal to a nominal distance. In the present example, the nominal distance
is equal to half the pitch p. Here, the pitch p is supposed to be equal to 80 arbitrary
units (a.u.) Therefore, the projected distance between adjacent first and second marks
should ideally be equal to 40 a.u (the nominal distance). In step S8, a list of distances
between first and second neighbouring marks is computed by the control unit 11 for
each one of the attainable relative positions of the first and second arrays. The
term 'neighbouring marks' relates to first and second marks which are located next
to each other. A distance between first and second neighbouring marks may be the projected
distance onto the x-axis that would arise between adjacent first and second points
if the first and second arrays were brought into one of the attainable relative positions.
In Figs. 5A to 5F, a number of distances between first and second neighbouring marks
are illustrated. For example, for the position P1 shown in Figure 5A, d
11 is the projected distance between the second mark 24a and the first mark 22a. The
distance d
11 is simply obtained by the relationship d
11=x22a-x24a. In this position P1, other examples of relationships are the following:
d
115=x22h-x24h; d
116=x24i-x22h and so on. Hence, based on the x-coordinates represented in the table in
Figure 6, a list L
1 of distances between first and second neighbouring marks is computed for the relative
position P1 and is illustrated in Figure 7A.
[0036] In step S8, a list of distances between first and second neighbouring marks is also
computed for the position P2 (see Figure 5B). Since the nozzle 20a is not usable anymore
and since the relative position is shifted by a distance equal to one pitch p, the
first distance of the list for the position P2 is d
23, the projected distance between the first mark 22a and the second mark 24b. Due to
the shift by one pitch, d
23 is obtained by the following relationship: d
23=x22a+p-x24b. Other examples are d
215=x22g+p-x24h; d
216=x24i-x22g-p and so on.
[0037] In step S8, similarly, a list of distances between first and second neighbouring
marks is also computed for the position P3. Now, the nozzles 24a and 24b are not usable
anymore, since the relative position of the first and second arrays is shifted by
a distance equal to two pitches (2p) compared to the initial position. The first distance
of the list corresponding to the position P3 is then d
35 which is given by the following relationship d
35=x22a+2p-x24c. Other examples in the position P3 are d
315=x22f+2p-x24h; d
316=x24i-x22f-2p and so on. Based on the x-coordinates represented in a table in Figure
6, a list L
3 of distances between first and second neighbouring marks is computed for the relative
position P3 and is illustrated in Figure 7B.
[0038] Once a list of distances between first and second neighbouring marks has been calculated
for each one of the attainable positions P1, P2, P3, P4, P5 and P6, the program running
on the control unit 11 proceeds to step S10.
[0039] In step S10, a so-called deviation factor F is extracted by control unit 11 for each
one of the list of distances. The deviation factor F is an attribute of the relative
position (P1 or P2 or P3 etc.) and is indicative of an amount by which distances between
first and second neighbouring marks deviate from the nominal distance. A deviation
factor is actually indicative of an amount by which the distances in a list (in L
1 or L
3, for example) deviate from the nominal distance. As explained above, the nominal
distance may be the projected distance onto the x-axis between adjacent first and
second marks in the ideal case. The nominal value is in the present example equal
to half the pitch of the nozzles in a row, i.e. 40 a.u. It is seen in the list L
1 of Figure 7A that some distances between first and second neighbouring marks deviate
significantly from the nominal value of 40 a.u. The differences Δn computed between
the nominal distance and the distances between neighbouring first and second marks
are exemplified in the second part of the list L
1 and L
3. For example, the difference Δ
11 is obtained by the following relationship Δ
11= 40-d
11, wherein 40 is the nominal distance.
[0040] A maximum function may constrain the deviation factor attributed to a distinct attainable
relative position to take the value of the largest difference, in absolute value,
among the ensemble of differences Δn computed between the nominal distance and the
distances between neighbouring first and second marks. The deviation factor for a
given list (corresponding to an attainable relative position) may thus be equal to
the largest Δn found in the list. Indeed, the largest said value(s) is/are, the more
visible the defect(s) will be. When the deviation factor for a list is set to be the
largest difference, in absolute value, among the ensemble of differences Δn computed
between the nominal distance and the distances between neighbouring first and second
marks, the deviation factor is clearly indicative of a degree of deviation from an
ideal situation. The deviation factor F
1 for the list L
1 (see the greyed area in the list L
1 of Figure 7A) is 30 a.u., corresponding to Δ
19. For each list, corresponding to each attainable position, the deviation factor is
extracted. For example, the deviation factor F
3 for the list L
3 (see the greyed areas in the list L
3 of Figure 7B) is 20 a.u. corresponding to a number of difference Δn (Δ
35, Δ
310, Δ
319 etc.).
[0041] In the next step (S12), a selection module of the control unit 11 selects a relative
attainable position among the plurality of relative attainable positions. The selected
relative position has to satisfy a selection criterion which is applied to the deviation
factors attributed to the plurality of relative attainable positions. An optimum attainable
position is thus selected based on the extracted plurality of deviation factors F
1... F
3 etc. For example, a relative attainable position satisfies the selection criterion
when the deviation factor attributed to said relative position is the smallest among
the attributed deviation factors. In the example described here, not all lists have
been illustrated. However, all lists are computed by the analysis module of the control
unit 11 and it appears that the list L
3 is characterised by the smallest deviation factor, which is F
3 equal to 20 a.u., as indicated above. Therefore, the position P3 (Figure 5C) appears
to be the most favourable relative position for the arrays 12 and 14. The position
P3 is selected by the selection module of the control unit 11.
[0042] In step S14, a signal is sent by the control unit 11 to the displacement means 16
for displacing the array 14 thereby bringing the first and second arrays in the selected
relative position which is position P3. The arrays are thus shifted from the initial
position P1 by a distance equal to two pitches (2p).
[0043] In step S16, the program is ended. The first and second arrays are now in an optimum
relative position, and the printing device can be used for recorded patterns. After
a certain period, or after a certain amount of recording, the deviation angles associated
with the nozzles may evolve. Therefore, the method, as illustrated by the flowchart
of Figure 10, has to be carried out again. Possibly, another relative position will
be selected.
[0044] The position P3 is illustrated by Figure 8A and 8B, wherein each one of the arrays
14 and 12 is represented in a cross-sectional view. The overlapping area 28 is also
shown. An example of a pattern that may be recorded by the arrays in the illustrated
arrangement is shown in Figure 9. As explained above, the nozzles 20a, 20b, 18t and
18 u are not usable anymore since they find themselves outside of the overlapping
area 28. Therefore, these nozzles are set inactive by the control unit 11. On the
other hand, the nozzles 20c to 20u and 18a to 18s find themselves within the overlapping
area and may be activated image-wise by the control unit. In the case that all of
said nozzles finding themselves within the overlapping area are activated to form
the pattern shown in Figure 9, a full recorded surface is obtained. Compared to the
pattern shown in Figure 3, obtained with the alignment method of the prior art, the
phenomenon of banding is less visible. Defects still exist (areas not filled, areas
wherein marks overlap) but however, at least one large defect has been suppressed
compared to the pattern obtained in Figure 3. Indeed, the area 23 in Figure 3 with
a large empty band has disappeared in the pattern of Figure 9.
[0045] In the example discussed above, the position P3 appears to be the most advantageous
relative position of the arrays 12 and 14. In the example illustrated by Figure 8A
and 8B, eighteen nozzles from the first row and eighteen nozzles from the second row
find themselves in the overlapping area. These in total thirty-six nozzles are activated
image-wise in order to record a pattern. If another position had been found to be
optimum, a different number of nozzles would find themselves in the overlapping area.
For the position P6 (see Figure 5F), sixteen nozzles from the first row and sixteen
nozzles from the second row find themselves in the overlapping area (in total thirty-two
nozzles). It might be undesirable to render the number of nozzles to be image-wise
activated dependent on the optimum relative position. Instead, a pre-defined number
of nozzles for image-wise activation may be chosen. This number may be equal to the
number of nozzles finding themselves in the overlapping area when the arrays are in
the most shifted possible position. In the example above, that would mean that, independently
from the optimum found for the relative position, the number of image-wise to be activated
nozzles would be thirty-two, i.e. the number of nozzles in the overlapping area when
the arrays are in the position P6. If such a choice was made, in the optimum relative
position P3, only thirty-two nozzles in the overlapping area would be chosen for image-wise
activation. The choice may be based again on an best possible relative positioning
of the first and second marks within the overlapping area.
[0046] In another embodiment of the method according to the invention, the first and second
arrays are adjusted respectively to each other such that the nominal distance is zero.
The adjustment with a nominal distance equal to zero is for example interesting for
applications wherein marks formed by ink of a first type have to be printed at the
same locations on the recording substrate as marks formed by ink of a second type.
In a printing device according to an embodiment of the invention, the nozzles of the
first array are regularly spaced according to a pitch and the nozzles of the second
array are regularly spaced according to the same pitch. When the first and second
arrays are adjusted respectively to each other such that the nominal distance is zero,
such as shown in Fig. 11, the pixel lines formed on the recording substrate by the
nozzles of the first array overlap the pixel lines formed by the nozzles of the second
array.
[0047] The adjustment with a nominal distance equal to zero is interesting for graphical
applications. The cross section of a possible resulting pattern is partly shown in
Figure 12A. On a recording substrate 30, marks 32 formed by ink droplets of a first
colorant are printed by the first array. Shortly following the formation of the marks
32, marks 34 formed by ink droplets of a second colorant are printed on top of the
marks 32, using the second array of nozzles. Of course, for graphical applications,
more colorants may be used. For graphical applications, the deviation factor is preferably
obtained by an average function which constrains the deviation factor attributed to
a distinct attainable relative position to take the value of an averaged difference,
computed in absolute value between the nominal distance and the distances between
neighbouring first and second marks. The selected attainable relative position is
the one having the smallest deviation factor among the plurality of deviation factors.
Consequently, the overlapping between first and second marks is on average as good
as is possible.
[0048] The adjustment with a nominal distance equal to zero may also be interesting for
special applications such as these related to the manufacturing for printed circuit
boards. The cross section of a possible arrangement of the marks is partly shown in
Fig. 12B. On an adequate recording substrate 36, first marks 38 are deposited by the
nozzles of the first array. Preferably, the material used for forming the first marks
38 is an electrically conductive ink or a metal. If liquid metal is to be jetted by
the nozzles of the first array, the printhead has to be adapted for expelling liquid
metal droplets. On top of the first mark 38, a second mark 40 is formed. The material
used for forming the marks 40 may be an electrically insulating ink. For printed circuit
boards applications, the deviation factor is preferably obtained by a maximum function
which constrains the deviation factor attributed to a distinct attainable relative
position to take the value of the largest difference, in absolute value, among an
ensemble of differences computed between the nominal distance and the distances between
neighbouring first and second marks. The selected attainable relative position is
the one having the smallest deviation factor among the plurality of deviation factors.
Consequently, largest errors in the overlap between first and second marks are, as
much as possible, avoided. This is of great importance for printed circuit boards
applications, to ensure good electrical insulation between conductive tracks, where
it is required on the board.
1. Method for adjusting a first (12) and a second array (14) relatively to each other
in a printing device having a carrying structure (10) for mounting the first (12)
and second (14) arrays, the first array having nozzles (18) arranged in a first row
substantially parallel to a first direction (X) for forming first marks (22) on a
recording substrate (26), the second array having nozzles (20) arranged in a second
row substantially parallel to the first direction (X) for forming second marks (24)
on the recording substrate (26), wherein in an attainable relative position, the first
(12) and second arrays (14) at least partially flank each other, thereby defining
a degree of a longitudinal overlap along the first direction (X), the method comprising
forming a test pattern (S4) having first and second test marks and detecting (S6)
the locations of the first and second test marks characterised in that the method further comprises determining (S10) a plurality of deviation factors (F1, F3) for a plurality of attainable relative positions (P1, P3) based on said detected
locations, wherein each one of said deviation factors (F1, F3) is an attribute of a distinct attainable relative position (P1, P3) and is indicative
of an amount by which distances between neighbouring first and second marks deviate
from a nominal distance, and selecting an attainable relative position among the plurality
of attainable relative positions (P1, P3) which satisfies a selection criterion applied
to the plurality of deviation factors (F1, F3).
2. Method for adjusting a first and a second array according to claim 1, wherein the
selected attainable relative position is the one having the smallest deviation factor
among the plurality of deviation factors (F1, F3).
3. Method for adjusting a first and a second array according to claim 2, wherein a maximum
function constrains the deviation factor attributed to a distinct attainable relative
position to take the value of the largest difference, in absolute value, among an
ensemble of differences computed between the nominal distance and the distances between
neighbouring first and second marks.
4. Method for adjusting a first and a second array according to claim 2, wherein an average
function constrains the deviation factor attributed to a distinct attainable relative
position to take the value of an averaged difference, computed in absolute value between
the nominal distance and the distances between neighbouring first and second marks.
5. Method for adjusting a first and a second array according to claim 2, wherein a maximum
function constrains the deviation factor attributed to a distinct attainable relative
position to take the value of the largest difference between the nominal distance
and the distances between neighbouring first and second marks.
6. Method for adjusting a first and a second array according to claim 2, wherein a maximum
function constrains the deviation factor attributed to a distinct attainable relative
position to take the value of the largest difference between the distances between
neighbouring first and second marks and the nominal distance.
7. Method for adjusting a first and a second array according to any of the preceding
claims, wherein the nozzles of the first array are regularly spaced according to a
pitch (p) and the nozzles of the second array are regularly spaced according to the
same pitch (p).
8. Method for adjusting a first and a second array according to claim 7, wherein the
nominal distance is equal to half the pitch.
9. Method for adjusting a first and a second array according to claim 7, wherein the
nominal distance is equal to zero.
10. Method for adjusting a first and a second array according to any of the preceding
claims, further comprising displacing (S14) at least one of the first and second arrays
for bringing the first and second printheads into the selected relative attainable
position.
11. A printing device comprising a first (12) and a second array (14) mounted on a carrying
structure (10), the first array (12) having nozzles (18) arranged in a first row substantially
parallel to a first direction (X) for forming first marks (22) on a recording substrate
(26), the second array (14) having nozzles (20) arranged in a second row substantially
parallel to the first direction (X) for forming second marks (24) on the recording
substrate (26), wherein in an attainable relative position, the first (12) and second
(14) arrays at least partially flank each other, thereby defining a degree of a longitudinal
overlap along first the first direction (X), displacement means (16) for displacing
at least one of the arrays thereby causing a change in the degree of the longitudinal
overlap and control means (11) adapted to control the first (12) and second arrays
(14) for forming a test pattern having first and second test marks and to control
detecting means for detecting the locations of the first and second test marks, characterised in that the control means (11) are adapted to control a computing module for executing the
steps of determining a plurality of deviation factors (F1, F3) for a plurality of attainable relative positions (P1, P3) based on said detected
locations, wherein each one of said deviation factors (F1, F3) is an attribute of a distinct attainable relative position (P1, P3) and is indicative
of an amount by which distances between neighbouring first and second marks deviate
from a nominal distance, and selecting an attainable relative position among the plurality
of attainable relative positions (P1, P3) which satisfies a selection criterion applied
to the plurality of deviation factors (F1, F3).
12. A printing device according to claim 11, wherein the control means (11) are adapted
to control the displacement means (16) for causing the first and second arrays to
have a degree of longitudinal overlap corresponding to the selected attainable relative
position.
13. A printing device according to claim 11 or 12, wherein the detecting means is a camera
mounted on a carriage and arranged for scanning the test pattern.
14. A printing device according to claim 13, wherein the camera is a CCD camera which
is arranged for determining a geometrical centre of gravity of each one of the first
and second test marks in the test pattern and extracting coordinates of said first
and second test marks along an axis.
15. A printing device according to any of the claims 11-14, wherein the nozzles (18) of
the first array (12) are regularly spaced according to a pitch (p) and the nozzles
(20) of the second array (14) are regularly spaced according to the same pitch (p).
16. A printing device according to claim 15, wherein the nominal distance is equal to
half the pitch.
17. A printing device according to claim 15, wherein the nominal distance is equal to
zero.
18. A printing device according to any of the claims 11-17, wherein the first (12) and
second (14) arrays are mounted on carriage (10), and the carriage (10) and the recording
substrate (26) are moveable relatively to each other in a second direction (Y) normal
to the first direction (X).
19. A printing device according to any of the claims 11-18, wherein the displacement means
(16) comprises a piezoelectrical actuator.
20. Ink jet printer comprising a printing device according to any of the claims 11-19.
21. Computer program product residing on a computer readable medium comprising instructions
for causing at least one process unit to perform the method of any of the claims 1
to 10.
1. Verfahren zum Einstellen einer ersten (12) und einer zweiten Anordnung (14) relativ
zueinander in einem Druckergerät, das eine Tragstruktur (10) zum Halten der ersten
(12) und zweiten (14) Anordnungen aufweist, wobei die erste Anordnung Düsen (18) umfaßt,
die in einer ersten Reihe im wesentlichen parallel zu einer ersten Richtung (X) angeordnet
sind, um erste Markierungen (22) auf einem Aufzeichnungssubstrat (26) zu bilden, die
zweite Anordnung Düsen (20) umfaßt, die in einer zweiten Reihe im wesentlichen parallel
zu der ersten Richtung (X) angeordnet sind, um zweite Markierungen (24) auf dem Aufzeichnungssubstrat
(26) zu bilden, wobei in einer erreichbaren Relativposition die ersten (12) und zweiten
Anordnungen (14) einander wenigstens zum Teil flankieren, wodurch sie ein Ausmaß einer
longitudinalen Überlappung entlang der ersten Richtung (X) definieren, welches Verfahren
umfaßt: die Ausbildung eines Testmusters (S4), das erste und zweite Testmarkierungen
aufweist, und die Detektion (S6) der Orte der ersten und zweiten Testmarkierungen,
dadurch gekennzeichnet, daß das Verfahren weiterhin umfaßt: die Bestimmung (S10) einer Vielzahl von Abweichungsfaktoren
(F1, F3) für eine Vielzahl von erreichbaren Relativpositionen (P1, P3) auf der Grundlage
der detektierten Orte, wobei jeder einzelne dieser Abweichungsfaktoren (F1, F3) ein
Attribut einer einzelnen erreichbaren Relativposition (P1, P3) ist und ein Ausmaß
anzeigt, um wieviel Abstände zwischen benachbarten ersten und zweiten Markierungen
von einem nominalen Abstand abweichen, und die Auswahl einer erreichbaren Relativposition,
die ein auf die Vielzahl der Abweichungsfaktoren ((F1, F3)) angewendetes Auswahlkriterium
erfüllt, unter der Vielzahl der erreichbaren Relativpositionen (P1, P3).
2. Verfahren zum Einstellen einer ersten und einer zweiten Anordnung nach Anspruch 1,
bei dem die ausgewählte erreichbare Relativposition eine solche ist, die den kleinsten
Abweichungsfaktor unter der Vielzahl der Abweichungsfaktoren (F1, F3) aufweist.
3. Verfahren zum Einstellen einer ersten und einer zweiten Anordnung nach Anspruch 2,
bei dem eine Maximumfunktion den Abweichungsfaktor, der einer einzelnen erreichbaren
Relativposition zugeordnet ist, darauf beschränkt, den Wert der größten Differenz,
in absoluten Werten, in einem Ensemble von zwischen dem nominalen Abstand und dem
Abstand zwischen benachbarten ersten und zweiten Markierungen berechneten Differenzen
anzunehmen.
4. Verfahren zum Einstellen einer ersten und einer zweiten Anordnung nach Anspruch 2,
bei dem eine Mittelwertfunktion den Abweichungsfaktor, der einer einzelnen erreichbaren
Relativposition zugeordnet ist, darauf beschränkt, den Wert einer in absoluten Werten
berechneten gemittelten Differenz zwischen dem nominalen Abstand und den Abständen
zwischen benachbarten ersten und zweiten Markierungen anzunehmen.
5. Verfahren zum Einstellen einer ersten und zweiten Anordnung nach Anspruch 2, bei eine
Maximumfunktion den Abweichungsfaktor, der einer einzelnen erreichbaren Relativposition
zugeordnet ist, darauf beschränkt, den Wert der größten Differenz zwischen dem nominalen
Abstand und den Abständen zwischen benachbarten ersten und zweiten Markierungen anzunehmen.
6. Verfahren zum Einstellen einer ersten und zweiten Anordnung nach Anspruch 2, bei dem
eine Maximumfunktion den Abweichungsfaktor, der einer einzelnen erreichbaren Relativposition
zugeordnet ist, darauf beschränkt, den Wert der größten Differenz zwischen den Abständen
zwischen benachbarten ersten und zweiten Markierungen und dem nominalen Abstand einzunehmen.
7. Verfahren zum Einstellen einer ersten und zweiten Anordnung nach einem der vorstehenden
Ansprüche, bei dem die Düsen der ersten Anordnung regelmäßige Abstände entsprechend
einem Teilungsraster (p) zueinander aufweisen und die Düsen der zweiten Anordnung
regelmäßige Abstände entsprechend demselben Teilungsraster (p) zueinander aufweisen.
8. Verfahren zum Einstellen einer ersten und zweiten Anordnung nach Anspruch 7, bei dem
der nominale Abstand gleich der Hälfte des Teilungsrasters ist.
9. Verfahren zum Einstellen einer ersten und zweiten Anordnung nach Anspruch 7, bei dem
der nominale Abstand gleich null ist.
10. Verfahren zum Einstellen einer ersten und zweiten Anordnung nach einem der vorstehenden
Ansprüche, weiterhin umfassend die Verschiebung (S14) wenigstens einer der ersten
und zweiten Anordnungen, um die ersten und zweiten Druckköpfe in die ausgewählte erreichbare
Relativposition zu bringen.
11. Druckergerät mit einer ersten (12) und einer zweiten Anordnung (14), die auf einer
Tragstruktur (10) montiert sind, wobei die erste Anordnung (12) Düsen (18) aufweist,
die in einer ersten Reihe im wesentlichen parallel zu einer ersten Richtung (X) angeordnet
sind, um erste Markierungen (22) auf einem Aufzeichnungssubstrat (26) zu bilden, die
zweite Anordnung (14) Düsen (20) aufweist, die in einer zweiten Reihe im wesentlichen
parallel zu der ersten Richtung (X) angeordnet sind, um zweite Markierungen (24) auf
dem Aufzeichnungssubstrat (26) zu bilden, wobei in einer erreichbaren Relativposition
die ersten (12) und zweiten (14) Anordnungen einander wenigstens zum Teil flankieren,
wodurch sie ein Ausmaß einer longitudinalen Überlappung entlang der ersten Richtung
(X) definieren, einer Verstelleinrichtung (16) zum Verstellen wenigstens einer der
Anordnungen, um dadurch eine Änderung in dem Ausmaß der longitudinalen Überlappung zu bewirken, und einer
Steuereinrichtung (11), die dazu ausgebildet ist, die ersten (12) und zweiten Anordnungen
(14) so zu steuern, daß sie ein Testmuster erzeugen, das erste und zweite Testmarkierungen
umfaßt, und eine Detektionseinrichtung zum Detektieren der Orte der ersten und zweiten
Testmarkierungen zu steuern, dadurch gekennzeichnet, daß die Steuereinrichtung (11) dazu ausgebildet ist, ein Berechnungsmodul zu steuern,
um die folgenden Schritte auszuführen: Bestimmung einer Vielzahl von Abweichungsfaktoren
(F1, F3) für eine Vielzahl von erreichbaren Relativpositionen (P1, P3) auf der Grundlage
der detektierten Orte, wobei jeder einzelne der Abweichungsfaktoren (F1, F3) ein Attribut
einer einzelnen erreichbaren Relativposition (P1, P3) ist und ein Ausmaß angibt, um
wieviel Abstände zwischen benachbarten ersten und zweiten Markierungen von einem nominalen
Abstand abweichen, und Auswahl einer erreichbaren Relativposition, die ein auf die
Vielzahl der Abweichungsfaktoren (F1, F3) angewandtes Auswahlkriterium erfüllt, unter
der Vielzahl der erreichbaren Relativpositionen (P1, P3).
12. Druckergerät nach Anspruch 11, bei dem die Steuereinrichtung (11) dazu ausgebildet
ist, die Verstelleinrichtung (16) so anzusteuern, daß sie die ersten und zweiten Anordnungen
dazu bringt, ein Ausmaß der longitudinalen Überlappung anzunehmen, das der ausgewählten
erreichbaren Relativposition entspricht.
13. Druckergerät nach Anspruch 11 oder 12, bei dem die Detektionseinrichtung eine Kamera
ist, die auf einem Wagen montiert und zum Abtasten des Testmusters angeordnet ist.
14. Druckergerät nach Anspruch 13, bei dem die Kamera eine CCD-Kamera ist, die dazu eingerichtet
ist, einen geometrischen Schwerpunkt jeder einzelnen der ersten und zweiten Testmarkierungen
in dem Testmuster zu bestimmen und Koordinaten dieser ersten und zweiten Testmarkierungen
entlang einer Achse zu extrahieren.
15. Druckergerät nach einem der Ansprüche 11 bis 14, bei dem die Düsen (18) der ersten
Anordnung (12) in regelmäßigen Abständen zueinander entsprechend einem Teilungsraster
(p) angeordnet sind und die Düsen (20) der zweiten Anordnung (14) in regelmäßigen
Abständen entsprechend demselben Teilungsraster (p) zueinander angeordnet sind.
16. Druckergerät nach Anspruch 15, bei dem der nominale Abstand gleich der Hälfte des
Teilungsrasters ist.
17. Druckergerät nach Anspruch 15, bei dem der nominale Abstand gleich null ist.
18. Druckergerät nach einem der Ansprüche 11 bis 17, bei dem die ersten (12) und zweiten
(14) Anordnungen auf einem Wagen (10) montiert sind und der Wagen (10) und das Aufzeichnungssubstrat
(26) relativ zueinander in einer zweiten Richtung (Y) rechtwinklig zu der ersten Richtung
(X) bewegbar sind.
19. Druckergerät nach einem der Ansprüche 11 bis 18, bei dem die Verstelleinrichtung (16)
einen piezoelektrischen Aktor aufweist.
20. Tintenstrahldrucker mit einer Druckereinrichtung nach einem der Ansprüche 11 bis 19.
21. Computerprogrammprodukt, das auf einem computerlesbaren Medium residiert und Befehle
umfaßt, die wenigstens eine Verarbeitungseinheit veranlassen, das Verfahren nach einem
der Ansprüche 1 bis 10 auszuführen.
1. Procédé d'ajustement d'une première matrice (12) et d'une seconde matrice (14) l'une
par rapport à l'autre dans un dispositif d'impression comportant une structure porteuse
(10) permettant de fixer la première matrice (12) et la seconde matrice (14), la première
matrice comportant des buses (18) disposées en une première rangée sensiblement parallèle
à une première direction (X) pour former des premières marques (22) sur un substrat
d'impression (26), la seconde matrice comportant des buses (20) disposées en une seconde
rangée sensiblement parallèle à la première direction (X) pour former des secondes
marques (24) sur le substrat d'impression (26), dans lequel, dans une position relative
pouvant être atteinte, la première matrice (12) et la seconde matrice (14) sont au
moins en partie adjacentes l'une à l'autre, définissant ainsi un degré de chevauchement
longitudinal dans une première direction (X) ; ledit procédé consiste à former un
motif de test (S4) comportant des première et des secondes marques de test et à détecter
( S6) les emplacements des premières et secondes marques de test, caractérisé en ce que le procédé consiste en outre à déterminer (S10) une pluralité de coefficients d'écart
(F1, F3) pour une pluralité de positions relatives (P1, P3) pouvant être atteintes en fonction
desdits emplacements détectés, dans lequel chacun desdits coefficients d'écart (F1, F3) représente un attribut d'une position relative distincte (P1, P3) pouvant être atteinte
et indique la quantité selon laquelle les distances entre les premières et secondes
marques voisines s'écartent d'une distance nominale, et à sélectionner une position
relative pouvant être atteinte parmi la pluralité des positions relatives (P1, P3)
pouvant être atteintes satisfaisant à un critère de sélection appliqué à la pluralité
des coefficients d'écart (F1, F3).
2. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon la revendication
1, dans lequel la position relative sélectionnée pouvant être atteinte est la position
affichant le coefficient d'écart le plus faible parmi la pluralité des coefficients
d'écart (F1, F3).
3. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon la revendication
2, dans lequel une fonction maximale contraint le coefficient d'écart attribué à une
position relative distincte pouvant être atteinte à prendre la valeur de la plus grande
différence, en valeur absolue, parmi un ensemble de différences calculées entre la
distance nominale et les distances entre les premières et secondes marques voisines.
4. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon la revendication
2, dans lequel une fonction moyenne contraint le coefficient d'écart attribué à une
position relative distincte pouvant être atteinte à prendre la valeur d'une différence
moyenne, calculée en valeur absolue entre la distance nominale et les distances entre
les premières et secondes marques voisines.
5. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon la revendication
2, dans lequel une fonction maximale contraint le coefficient d'écart attribué à une
position relative distincte pouvant être atteinte à prendre la valeur de la plus grande
différence entre la distance nominale et les distances entre les premières et secondes
marques voisines.
6. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon la revendication
2, dans lequel une fonction maximale contraint le coefficient d'écart attribué à une
position relative distincte pouvant être atteinte à prendre la valeur de la plus grande
différence entre les distances entre les premières et secondes marques voisines et
la distance nominale.
7. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon l'une quelconque
des revendications précédentes, dans lequel les buses de la première matrice sont
régulièrement espacées d'un pas (p) et les buses de la seconde matrice sont régulièrement
espacées du même pas (p).
8. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon la revendication
7, dans lequel la distance nominale est égale à la moitié du pas.
9. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon la revendication
7, dans lequel la distance nominale est égale à zéro.
10. Procédé d'ajustement d'une première matrice et d'une seconde matrice selon l'une quelconque
des revendications précédentes, consistant en outre à déplacer (S14) au moins l'une
des première et seconde matrices pour amener les première et seconde têtes d'impression
dans la position relative pouvant être atteinte sélectionnée.
11. Dispositif d'impression comprenant une première matrice (12) et une seconde matrice
(14) fixées sur une structure porteuse (10), la première matrice comportant des buses
(18) disposées en une première rangée sensiblement parallèle à une première direction
(X) pour former des premières marques (22) sur un substrat d'impression (26), la seconde
matrice (14) comportant des buses (20) disposées en une seconde rangée sensiblement
parallèle à la première direction (X) pour former des secondes marques (24) sur le
substrat d'impression (26), dans lequel, dans une position relative pouvant être atteinte,
la première matrice (12) et la seconde matrice (14) sont au moins en partie adjacentes
l'une à l'autre, définissant ainsi un degré de chevauchement longitudinal tout d'abord
dans la première direction (X), un moyen de déplacement (16) destiné à déplacer au
moins l'une des matrices, provoquant ainsi un changement du degré de chevauchement
longitudinal et des moyens de commande (11) destinés à commander la première matrice
(12) et la seconde matrice (14) afin de former un motif de test comportant des première
et seconde marques de test et afin de commander le moyen de détection destiné à détecter
les emplacements des première et seconde marques de test, caractérisé en ce que les moyens de commande (11) sont destinés à commander un module de calcul permettant
d'exécuter les étapes de détermination d'une pluralité de coefficients d'écart (F1, F3) pour une pluralité de positions relatives (P1, P3) pouvant être atteintes en fonction
desdits emplacements détectés, dans lequel chacun desdits coefficients d'écart (F1, F3) représente un attribut d'une position relative atteignable distincte (P1, P3) et
indique une quantité selon laquelle les distances entre les première et seconde marques
voisines s'écartent d'une distance nominale, et à sélectionner une position relative
pouvant être atteinte parmi la pluralité des positions relatives (P1, P3) pouvant
être atteintes satisfaisant à un critère de sélection appliqué à la pluralité des
coefficients d'écart (F1, F3).
12. Dispositif d'impression selon la revendication 11, dans lequel les moyens de commande
(11) sont conçus pour commander le moyen de déplacement (16) de façon que les première
et seconde matrices aient un degré de chevauchement longitudinal correspondant à la
position relative pouvant être atteinte sélectionnée.
13. Dispositif d'impression selon la revendication 11 ou la revendication 12, dans lequel
le moyen de détection est une caméra fixée sur un chariot et configurée pour balayer
le motif de test.
14. Dispositif d'impression selon la revendication 13, dans lequel la caméra est une caméra
CCD configurée pour déterminer un centre de gravité géométrique de chacune des première
et seconde marques de test du motif de test et pour extraire les coordonnées desdites
première et seconde marques de test le long d'un axe.
15. Dispositif d'impression selon l'une quelconque des revendications 11 à 14, dans lequel
les buses (18) de la première matrice (12) sont régulièrement espacées d'un pas (p)
et les buses (20) de la seconde matrice sont régulièrement espacées du même pas (p).
16. Dispositif d'impression selon la revendication 15, dans lequel la distance nominale
est égale à la moitié du pas.
17. Dispositif d'impression selon la revendication 15, dans lequel la distance nominale
est égale à zéro.
18. Dispositif d'impression selon l'une quelconque des revendications 11 à 17, dans lequel
la première matrice (12) et la seconde matrice (14) sont fixées sur le chariot (10)
et le chariot (10) et le substrat d'impression (26) sont mobiles l'un par rapport
à l'autre dans une seconde direction (Y) perpendiculaire à la première direction (X).
19. Dispositif d'impression selon l'une quelconque des revendications 11 à 18, dans lequel
le moyen de déplacement (16) comprend un actionneur piézoélectrique.
20. Imprimante à jet d'encre comprenant un dispositif d'impression selon l'une quelconque
des revendications 11 à 19.
21. Produit programme informatique résidant sur un support lisible par ordinateur comprenant
des instructions pour qu'au moins une unité de traitement mette en oeuvre le procédé
de l'une quelconque des revendications 1 à 10.