ELECTRONIC DEVICE, SYSTEM AND METHOD FOR INSULATION RESISTANCE MEASUREMENTS WITH FUNCTIONS OF SELF-DIAGNOSIS AND DIAGNOSIS OF INSULATION LOSS WITH RESPECT TO GROUND OF AN ENERGIZED ELECTRICAL APPARATUS

Description

TECHNOLOGICAL BACKGROUND OF THE INVENTION

Field of application.

[0001] The present invention relates to a device, a system and a method for measuring the insulation resistance of an energized electrical apparatus with respect to ground, and therefore also for a diagnosis of insulation loss of such an apparatus.

[0002] It is worth noting that, although the present description particularly illustrates the application of the invention to a battery for an electric or hybrid motor by way of example, it will be apparent that the invention is in the same manner applicable to any energized electrical apparatus or system with respect to earth or to a generic reference or safety ground.

[0003] The present invention also relates to a self-diagnosis method of the above device.

Description of the known art.

[0004] The ever-increasing diffusion in the use of electrochemical batteries with high nominal voltages, for example in electric and hybrid vehicles, results in the possibility of electrical risk associated with the use of such voltages which are potentially dangerous for persons and things. Therefore, the danger associated with the use of electricity, to date considered mainly associated with the use of electricity within working or domestic context, now arises also on electric or hybrid vehicles equipped with storage systems characterized by potentially dangerous electric voltages.

[0005] The further diffusion of electrical traction on vehicles, expected in the next few years, associated with the frequent and widespread use thereof for transporting persons and things, could result in the electrical risk and potential danger associated with the use of lithium batteries for traction becoming in the future one of the main causes of risk for the safety of persons using such means of transportation.

[0006] Possible drawbacks (such as for example, malfunctioning due to the obsolescence of the components of the electrical apparatus, dielectric breakdown or electric discharges) pose the problem of protection from potentially dangerous events, such as the occurrence of short-circuits or insulation losses, which may cause fires and/or explosions, which may be also particularly serious if they are in the presence of flammable or explosive substances, and such as to even put people's lives in danger.

[0007] Among such possible drawbacks, insulation loss of the battery voltage with respect to the earth or to a generic reference or safety ground (such as for example, the chassis of the vehicle) is one of the faults which may occur most frequently.

[0008] For example, in the case of a fault due to a cable with a damaged sheath in contact with the vehicle body, a drastic decrease of the insulation resistance is generated between the high-voltage circuit and the vehicle body. Such a decrease in the insulation resistance can be diagnosed by means of an electronic circuit, also of known type, which is capable of detecting the insulation resistance.

[0009] Indeed, the use is known in electric and hybrid vehicles equipped with high-voltage systems, of am insulation detection circuit, which is conveniently inserted in the electrical system and is capable of measuring in "run-time" the insulation resistance between the high-voltage circuit and the chassis of the vehicle.

[0010] The specific safety and person protection requirements against electrical risks which are applicable to rechargeable energy storage systems on board electric vehicles (both battery-operated electric vehicles and vehicles with "fuel-cells") and hybrid vehicles are defined in international Standard ISO 6469. Further safety related aspects refer to Standard ISO 26262.

[0011] Among the various safety and protection requirements, in ISO 6469, inter alia, the possibility is indicated of using a system for monitoring the insulation resistance by means of an "insulation resistance monitoring system" installed on the vehicle to check the integrity of the high-voltage circuit of the battery by means of a periodic measurement (preferably performed automatically) of the value of the insulation resistance of the battery with respect to earth or to a generic reference or safety ground.

[0012] However, the desired functionality of automatically performing the insulation resistance measurement poses the significant technical problem of succeeding in discriminating whether, with respect to an anomalous measurement of the insulation resistance, this is due to a fault of insulation loss of the battery with respect to the ground or to a fault of the insulation resistance measurement circuit itself.

[0013] Moreover, the further and even more critical technical problem arises of remediating possible circumstances in which the insulation resistance measurement circuit has failed, or was damaged, or has deteriorated over time, and accordingly is no longer capable of recognizing an insulation loss if this occurs.

[0014] With respect to the above, the need is strongly felt for the insulation resistance measurement circuit or system to have effective self-diagnosis functionalities adapted to avoid that a fault in the circuit may compromise the correct detection of the insulation loss. Additionally, there is an ever-increasing need for accuracy in the measurement of insulation resistance in order to provide accurate information to the battery management system and to render the subsequent safety and protection procedures more timely and effective.

[0015] Within the background herein considered, the solutions for the insulation resistance measurement that are currently known and employed do not fully meet the above-illustrated needs and requirements.

[0016] Indeed, although the prior art has several solutions for making circuits adapted to measure the insulation resistance of an apparatus with respect to a generic ground or chassis, such known solutions do not resolve, and often do not even consider the issue of the electronic circuit adapted to insulation resistance measurement having a good or increased "diagnosability". Such an aspect, although underestimated, is very delicate because, as noted above, a breakdown or alteration of the insulation resistance measurement circuit, which in practice is rather frequent, may result in an incorrect detection of fault circumstances that nay be potentially dangerous for the health of people.

[0017] In light of the above, the need is strongly felt, mainly within the scope of automobile applications but also within other application scopes (it is easy to understand that similar needs may emerge for energized apparatuses other than a battery and used in other contexts), to provide an electronic measurement device of the insulation resistance that is conveniently designed both to perform the primary task of accurately measuring the value of the insulation resistance and to allow self-diagnosis procedures in order to avoid possible circumstances failed or incorrect detection of insulation loss.

[0018] The U.S. Patent Application US 2014/159908 A1 describes a possible solution for an isolation resistance measuring apparatus having fault self-diagnosing function, and a related fault self-diagnosing method.

[0019] The U.S. Patent Application US 2010/315096 A1 discloses an apparatus for detecting insulation resistance.

[0020] The U.S. Patent Application US 2009/001993 A1 describe systems and methods for detecting a faulty ground strap connection.

SUMMARY OF THE INVENTION

[0021] It is the object of the present invention to provide an electronic device for insulation resistance measurement, and therefore for a diagnosis of insulation loss, such as to allow at least partly obviating the drawbacks indicated above with reference to the known art and to allow meeting the above-mentioned needs, particularly felt in the technical field considered.

[0022] In particular, the device for measuring the insulation resistance of the present invention provides a solution both to the problem of the accurate measurement of the insulation resistance and to the problem of the self-diagnosis of the device itself, without resorting to costly redundant measurement circuits.

[0023] To this end, the device of the invention provides a "dynamic" type measurement (and not a "static" type measurement, as in known solutions) based on a particular switching technique capable of detecting deterioration or breakdown problems of the device itself in a more effective manner.

[0024] It is also the object of the invention to provide a system and a method for measuring insulation resistance and for a diagnosis of insulation loss employing the aforesaid device.

[0025] Closely correlated with the above-mentioned objects, there is the further object of providing a method for the self-diagnosis of the aforesaid device, that is a method adapted to check the correct functionality, or lack thereof, of the device and to identify possible faults.

[0026] The aforesaid device, system, measurement method and self-diagnosis method may be mainly employed within the "automotive" scope, for example in motion systems for an electric traction or hybrid vehicle with a class B battery (from 60 V DC to 1500 V DC).

[0027] However, they may be used profitably in all other contexts or applications requiring a continuous monitoring of the insulation resistance of a circuit with respect to a generic ground or safety system.

[0028] The above-mentioned objects are achieved by means of an electronic device for the diagnosis of insulation loss according to claim 1.

[0029] Further embodiments of such a device are defined in claims 2 to 6.

[0030] A system according to the invention employing the aforesaid device, is defined in claim 7.

[0031] Further embodiments of such a system are defined in claims 8 to 12.

[0032] A method for measuring an insulation resistance according to the invention is defined in claim 13.

[0033] Further embodiments of such a method are defined in claims 14 to 16.

[0034] A method for diagnosing an insulation loss employing the aforesaid measurement method, is defined in claim 17.

[0035] A self-diagnosis method of a device according to the invention is defined in claim 18.

[0036] Further embodiments of the self-diagnosis method are defined in claims 19 to 25.

BRIEF DESCRIPTION OF THE DRAWINGS

[0037] Further features and advantages of such an electronic device and system according to the invention will become apparent from the following description of preferred embodiments thereof, given only by way of non-limiting, indicative example, with reference to the accompanying drawings, in which:

• figure 1 shows a schematic diagram of an electronic device according to one embodiment of the present invention, in association with a battery of which the insulation resistance has to be measured;
• figure 2 schematically shows a portion of a device according to a further embodiment of the invention;
• figure 3 shows a schematic diagram of a system employing the device in figure 1;
• figure 4 depicts a diagram of driving signals used in the system of figure 3;
• figures 5 and 6 depict example time diagrams of the evolution of voltage signals detected by the device of the invention and used by the measurement method according to the invention.

[0038] It is worth noting that equal or similar elements in the aforesaid drawings are indicated with the same numbers and/or letters.

DETAILED DESCRIPTION.

[0039] With reference to figure 1, firstly there is described an electronic device 1 for the diagnosis of the insulation loss, with respect to a ground 3, of an energized electrical apparatus 2 having a negative terminal 21 and a positive terminal 22, through the measurement of the insulation resistance RI_minus referring to the negative terminal 21, that is present between the negative terminal 21 and ground 3 of apparatus 2, and of the insulation resistance RI_plus referring to the positive terminal 22, that is present between the positive terminal 22 and ground 3 of apparatus 2.

[0040] It is worth noting that the aforesaid insulation resistances RI_minus and RI_plus are parasitic resistances: indeed, under ideal conditions, the insulation resistances between terminals of the energized electrical apparatus 2 and ground 3 should be virtually infinite value resistances.

[0041] It is also worth noting that the energized electrical apparatus 2 with which the device is associated, is, in a preferred application example, a battery 2 for electric or hybrid motor, in the automotive field. However, in other examples of the application of device 1, such an apparatus may be any other system (such as for example, an inverter, again in the automotive field, or an electric apparatus used in any other field) which is energized with respect to earth or to a generic reference or safety ground.

[0042] Device 1 comprises a first device terminal 11 and a second device terminal 12, adapted to be connected to the negative 21 and positive 22 terminals, respectively, of the energized electrical apparatus 2. Moreover, device 1 comprises a first resistance-switch group 13, a second resistance-switch group 14, a first measurement circuit 15, arranged between the first device terminal 11 and the ground 3 in parallel to the first resistance-switch group 13, and a second measurement circuit 16, arranged between the second device terminal 12 and the ground 3 in parallel to the second resistance-switch group 14.

[0043] The first resistance-switch group 13 comprises a first sample resistance RS_minus adapted to be connected or disconnected in a controlled manner between the first device terminal 11 and the ground 3 by means of a first sample resistance input switch S_minus.

[0044] The second resistance-switch group 14 comprises a second sample resistance RS_plus adapted to be connected or disconnected in a controlled manner between the second device terminal 12 and the ground 3 by means of a second sample resistance input switch S_plus.

[0045] The first measurement circuit 15 in turn comprises a first detection circuit 150, a first charge modulation circuit 151 and a first partition resistor RB_minus connected between the first device terminal 11 and the first detection circuit 150, so that the first partition resistor RB_minus and the first detection circuit 150 are arranged mutually in series.

[0046] The first detection circuit 150 comprises at least a first resistor R2 and a first capacitor C1 arranged mutually in parallel, so that at the ends of the first capacitor C1, when the first device terminal 11 is connected to the energized electrical apparatus 2, after a transient required for the measurement to reach a first steady state, there is a first detection voltage VC_minus depending on the negative voltage V_minus of the energized electrical apparatus 2. The first detection circuit 150 further comprises a first voltage meter U_minus.

[0047] The first charge modulation circuit 151 is arranged in parallel to the first detection circuit 150 and comprises a first modulation resistance R1 and a first modulation switch SW1, which is arranged in series with the first modulation resistance R1 and is adapted to be controlled by means of a first driving signal V_SW-minus, so that when the first device terminal 11 is connected to the energized electrical apparatus 2, the first capacitor C1 is partially discharged and recharged during each closing and opening period of the first modulation switch SW1, respectively, so that the first detection voltage VC_minus oscillates between a first detection voltage maximum value VC_minus-MAX and a first detection voltage minimum value VC_minus-MIN, around a first detection voltage intermediate value VC_minus representative of the negative voltage V_minus of the energized electrical apparatus 2.

[0048] The second measurement circuit 16 in turn comprises a second detection circuit 160, a second charge modulation circuit 161 and a second partition resistor RB_plus connected between the second device terminal 12 and the second detection circuit 160 so that the second partition resistor RB_plus and the second detection circuit 160 are arranged mutually in series.

[0049] The second detection circuit 160 comprises at least a second resistor R6 and a second capacitor C2 arranged mutually in parallel, so that at the ends of the second capacitor C2, when the second device terminal 12 is connected to the energized electrical apparatus 2, after a transient required for the measurement to reach a second steady state, there is a second detection voltage VC_plus depending on the positive voltage V_plus of the energized electrical apparatus. The second detection circuit 160 further comprises a second voltage meter U_plus.

[0050] The second charge modulation circuit 161 is arranged in parallel to the second detection circuit 160 and comprises a second modulation resistance R5 and a second modulation switch SW2, which is arranged in series with the second modulation resistance R5 and is adapted to be controlled by a second driving signal V_SW-plus, so that, when the second device terminal 12 is connected to the energized electrical apparatus 2, the second capacitor C2 is partially discharged and recharged during each closing and opening period of the second modulation switch SW2, respectively, so that the second detection voltage VC_plus oscillates between a second detection voltage maximum value VC_plus-MAX and a second detection voltage minimum value VC_plus-MIN, around a second detection voltage intermediate value VC_plus representative of the positive voltage V_plus of the energized electrical apparatus 2.

[0051] The aforesaid first voltage meter U_minus is configured to provide the first detection voltage VC_minus under both opening and closing conditions of the first resistance-switch group switch S_minus, in which conditions the first sample resistance RS_minus is connected and disconnected, respectively.

[0052] The aforesaid second voltage meter U_plus is configured to provide the second detection voltage VC_plus under both opening and closing conditions of the second resistance-switch group switch S_plus, in which conditions the second sample resistance RS_plus is connected and disconnected, respectively.

[0053] According to one embodiment, the device further comprises a first device switch M_minus adapted to connect or disconnect in a controlled manner the first terminal of device 11 to/from the negative terminal 21 of the energized electrical apparatus 2, and a second device switch M_plus adapted to connect or disconnect in a controlled manner the second terminal of device 12 to/from the positive terminal 22 of the energized electrical apparatus 2.

[0054] In one implementing example, each of the aforesaid first device switch M_minus and second device switch M_plus comprises an electromechanical switch. Each of the aforesaid first modulation switch SW1 and second modulation switch SW2 comprises a respective solid state electronic switch.

[0055] According to an implementation option of the device, the first detection circuit 150 further comprises a third resistor R3 connected between the parallel of the first resistor R2 and of the first capacitor C1 and the ground 3; and the second detection circuit 160 further comprises a fourth resistor R7 connected between the parallel of the second resistor R6 and the second capacitor C2 and the ground 3.

[0056] According to an implementation example, the first detection circuit 150 further comprises an output resistor R4 and an output diode D1, which are connected between the output of the first voltage meter U_minus and ground. Similarly, the second detection circuit 180 further comprises an output resistor R8 and an output diode D2, which are connected between the output of the first voltage meter U_plus and ground.

[0057] According to a particular implementing example, the first measurement circuit 15 and the second measurement circuit 16 have an identical circuit structure and have electrical parameters of corresponding resistors and capacitors respectively identical.

[0058] In one implementing option, each of the aforesaid first voltage meter U_minus and second voltage meter U_plus comprises a respective operational amplifier.

[0059] According to an implementation example, the aforesaid first sample resistance RS_minus and second sample resistance RS_plus have values which conform with the ones set forth in Standard ISO 6469.

[0060] With reference to the details shown in figure 1 and to the conventions used, it is worth noting the following.

[0061] Figure 1 depicts (in the dashed box) the equivalent circuit of the battery pack 2 (which is not part of the device, but in this example is the energized electrical apparatus 2 to which device 1 can be connected to perform its functions). Shown at the sides of the battery pack, and connectable to it, is the measurement device 1 of the insulation resistance of the battery pack, which consists of two parts, which are depicted in figure 1 to the right and to the left, respectively, of the battery pack. The two driven switches M_minus and M_plus can connect device 1 to the two terminals of the DC BUS when there it is required to perform the measurement of the insulation resistance, or otherwise disconnect it.

[0062] With reference to the equivalent scheme of the battery pack 2, V_B indicates the voltage present between the terminals of the battery connected to the DC BUS and of which the insulation resistance with respect to a ground 3 is to be determined. Such a ground may be a safety ground, for example the chassis of the vehicle in the case of an electric vehicle, or a generic earth.

[0063] References V_plus and V_minus indicate, respectively, the voltage of the positive pole and the negative pole of the battery with respect to the aforesaid ground.

[0064] The relation between the aforesaid quantities V_B = V_plus - V_minus is valid, where by convention, consistently to what is shown, V_minus always has a negative sign.

[0065] The insulation resistance of the battery pack is represented by means of two concentrated parameters, which are not known in advance, one, indicated as RI_plus, referring to the positive terminal of the DC BUS, and one, indicated as RI_minus, referring to the negative terminal of the DC BUS.

[0066] Such insulation resistances represent leakage resistances toward ground distributed along the whole battery, through which small leakage currents pass due to an imperfect insulation between the active elements of the battery and the ground. Obviously, the leakage currents and the leakage resistances are spurious quantities, the result of unwanted parasitic phenomena, and therefore they should be ideally null.

[0067] For the sake of information completeness, in the model of the battery the parasitic capacitive components CI_minus and CI_plus are also indicated, which in fact are always present and are associated with the insulation resistances. Such capacitive components introduce a delay in the measurement operations, and theoretically should be considered for the purposes of the measurement of the insulation resistance.

[0068] When "Y" capacities have been placed between the DC BUS and the ground of the chassis in order to limit the electromagnetic emissions, they have a predefined and generally higher value than the parasitic capacitors CI_minus and CI_plus, and therefore the delay due to the latter can be neglected.

[0069] If the aforesaid "Y" capacitors are not present, CI_minus and CI_plus are to be considered for the purposes of assessing the delays, and the presence thereof can be neglected, for the purposes of the calculations, only if the measurement acquisitions are performed after the exhaustion of the voltage transients caused by CI_minus and CI_plus.

[0070] With reference to figures 1 and 3, an electronic system 10 for the diagnosis of the insulation loss of an energized electrical apparatus (e.g., a battery) is now described.

[0071] Such a system 10 comprises an electronic device 1 according to any one of the embodiments shown above, for the diagnosis of the insulation loss of an energized electrical apparatus, and further comprises a control device 5.

[0072] The control device 5 is configured to generate and provide the first modulation switch SW1 with the aforesaid first driving signal V_SW-minus, and to generate and provide the second modulation switch SW2 with the aforesaid second driving signal V_SW-plus.

[0073] Moreover, the control device 5 is configured to receive the first detection voltage VC_minus from the first voltage meter U_minus and the second detection voltage VC_plus from the second voltage meter U_plus.

[0074] The control device 5 is also configured to determine a first value of first detection voltage VC1_minus, under condition of disconnection of the first sample resistance RS_minus, and to determine a second value of first detection voltage VC2_minus, under condition of connection of the first sample resistance RS_minus.

[0075] The control device 5 is also configured to determine a first value of second detection voltage VC1_plus, under condition of disconnection of the second sample resistance RS_plus, and to determine a second value of second detection voltage VC2_plus, under condition of connection of the second sample resistance RS_plus.

[0076] The control device 5 is also configured to calculate the negative terminal insulation resistance RI_minus and the positive terminal insulation resistance RI_plus of the energized electrical apparatus on the basis of the aforesaid first value of first detection voltage VC1_minus and second value of first detection voltage VC2_minus and/or of the aforesaid first value of second detection voltage VC1_plus and second value of second detection voltage VC2_plus.

[0077] According to an implementation option of system 10, the control device 5 is configured to determine the first value of first detection voltage VC1_minus on the basis of the first detection voltage maximum value VC1_minus-MAX and the first detection voltage minimum value VC1_minus-MIN, under condition of disconnection of the first sample resistance RS_minus, and to determine the second value of first detection voltage VC2_minus on the basis of the first detection voltage maximum value VC2_minus-MAX and the first detection voltage minimum value VC2_minus-MIN under condition of connection of the first sample resistance RS_minus.

[0078] Similarly, the control device 5 is configured to determine the first value of second detection voltage VC1_plus on the basis of the second detection voltage maximum value VC1_plus-MAX and the second detection voltage minimum value VC1_plus-MIN under condition of disconnection of the second sample resistance RS_plus, and to determine the second value of second detection voltage VC2_plus on the basis of the second detection voltage maximum value VC2_plus-MAX and the second detection voltage minimum value VC2_plus-MIN under condition of connection of the second sample resistance RS_plus.

[0079] According to an alternative implementation option, the determination of the aforesaid first or second value of first or second detection voltage is performed by the control device 5 on the basis of an average of samples detected by the respective signals.

[0080] According to one embodiment of the system, the aforesaid first driving signal V_SW-minus is a pulse signal having a first frequency, in which the presence and absence of the pulse control the closing and opening, or the opening and closing, of the first modulation switch SW1, and in which the pulse duration with respect to period T associated with a first frequency defines a first close-open duty-cycle DC1. Similarly, the aforesaid second driving signal V_SW-plus is a pulse signal having a second frequency, in which the presence and absence of the pulse control the closing and opening, or the opening and closing, of the second modulation switch SW2, and in which the pulse duration with respect to period T associated with the second frequency defines the second close-open duty-cycle DC2.

[0081] According to one embodiment, the control device 5 is further configured to dynamically adjust, during the measurement, one or any combination of the following parameters: first frequency of the first driving signal V_SW-minus; second frequency of the second driving signal V_SW-plus; first close-open duty-cycle DC1; second close-open duty-cycle (DC2).

[0082] In an implementing example, the first and the second driving signals V_SW-minus, V_SW-plus are periodic signals of Pulse Width Modulation (PWM) type; the first and the second driving frequency are equal to each other; the first close-open duty-cycle DC1 and the second close-open duty-cycle DC2 are equal to each other.

[0083] In a particular example, the driving signals V_SW-minus and V_SW-plus are identical or derive from a same signal. Such a circumstance is depicted by way of example in figure 4.

[0084] Considering now jointly figures 1 and 3, the following further descriptive details are considered.

[0085] The measurement device 1 uses a kind of switching technique in each of the parts thereof.

[0086] On the negative side of the battery, the measurement device 1 comprises, in the example herein contemplated, the resistors RB_minus, R1, R2, R3, capacitor C1, switch SW1 and an operational amplifier U_minus in inverting configuration, which measures the voltage difference present at the ends of capacitor C1. Such a portion of the device is shown in figure 2.

[0087] Similarly, on the positive side of the battery, the measurement device 1 comprises, in the example herein considered, the resistors RB_plus, R5, R6, R7, capacitor C2, switch SW2 and the operational amplifier in inverting configuration, which measures the voltage difference present at the ends of capacitor C2.

[0088] The switches SW1 and SW2 are controlled by two driving signals of frequency type, references mentioned above, and indicated in figure 4 with numerals V_SW-minus and V_SW-plus. In the simplest case, shown in figure 4, the two driving signals are PMW having frequency and duty-cycle which can be modified within a given range allowed: for example, the period may be of 2 ms with duty-cycle = 50%, thus obtaining a square wave at a frequency of 500 Hz which is perfectly symmetrical with T_on = T_off.

[0089] With reference to the negative branch of the device (a similar disclosure applies mutatis mutandis for the positive branch), capacitor C1 serves to filter over time the voltage present at the ends of resistor R2; when switch SW1 is open, and therefore resistor R1 is excluded from the measurement circuit, the leakage current which crosses RB_minus reaches the ground through resistance R2 and is partly intercepted by capacitor C1, which is therefore charged, thus increasing the voltage at the ends thereof. Instead, when switch SW1 is closed, resistor R1, which has a significantly lower value with respect to R2, is arranged in parallel to the series consisting of R2 and R3; accordingly, the resistance of that parallel decreases and capacitor C1 starts to be discharged.

[0090] The charging and discharging cycle of capacitor C1 repeats periodically, stabilizing around a position of equilibrium, or stationary steady state, after a given transient.

[0091] The average voltage at the ends of capacitor C1 and of resistor R2 depends on the current which crosses resistor RB_minus and on a proportionality factor which is dependent on the relative value of resistor R2 with respect to resistor R1 and R3 and on the duty-cycle with which switch SW1 is driven. The current which crosses resistance RB_minus is in turn proportional to voltage V_minus of the negative pole of the battery pack with respect to ground. Therefore, the voltage at the ends of capacitor C1 and the voltage VC_minus acquired by the insulation resistance measurement system is proportional to voltage V_minus.

[0092] Advantageously, this may result in the proportionality factor between VC_minus and V_minus being dynamically varied (for example by varying the duty-cycle) according to the voltages measured, when required. On the contrary, in known measurement methods, the proportionality factor between VC_minus and V_minus is constant over time and cannot be changed once the measurement circuit is defined.

[0093] The switching period of switch SW1 can be selected so as to be lower than the time constants due to the parasitic parameters present in the circuit of the battery (this is true, for example, for a switching period equal to 2 ms). Thereby, the charge and discharge of capacitor C1 has an approximately linear trend over time.

[0094] Therefore, once a condition of the equilibrium is reached during the measurement, when the voltages V_minus and V_plus are stabilized by reaching a steady state, a triangular-shaped signal is present at the ends of capacitor C1 oscillating between two values, the maximum of which is reached at the end of the charge and the minimum of which is reached at the end of the discharge, thus causing an overall time evolution like the one shown by way of example in figure 5 (with reference to V_minus; it is also worth noting that V_plus has a similar trend).

[0095] The average value of each of the voltages VC_minus and VC_plus can easily be obtained, for example, by alternatively sampling the respective signal on the maximum value and on the minimum value.

[0096] The voltages VC_minus and VC_plus are directly proportional to the negative and positive voltages of the battery with respect to ground. Therefore, when the measurement has stabilized, at steady-state, VC_minus and VC_plus also indirectly depend on the unknown value of the insulation resistances RI_minus, RI_plus, besides depending on the known resistances and duty-cycles of the measurement circuits.

[0097] The considerations hereinto made refer to the case when the two switches S_minus and S_plus are both kept open.

[0098] The effect obtained following the activation of such switches will be described later to illustrate the measurement method of the present invention.

[0099] In various embodiments, system 10 is configured to perform measurement methods and diagnoses, and/or to operate self-diagnosis procedures as described later.

[0100] A method is now described for measuring the negative terminal insulation resistance RI_minus, present between a negative terminal 11 and the ground 3 of an energized electrical apparatus 2, and the positive terminal insulation resistance RI_plus, present between a positive terminal 12 and ground 3 of the same energized electrical apparatus 2.

[0101] In a typical application example, such a ground 3 is a "main" ground of the motor vehicle, for example the chassis of the motor vehicle itself.

[0102] The method firstly comprises the steps of connecting a first measurement circuit 15 between the aforesaid negative terminal 11 and ground 3 of the energized electrical apparatus 2 to detect a first value VC1_minus of a first detection voltage VC_minus, depending on the negative voltage V_minus of the energized electrical apparatus 2; furthermore, connecting a second measurement circuit 16 between the aforesaid positive terminal 12 and ground 3 of the energized electrical apparatus 2 to detect a first value VC1_plus of a second detection voltage VC_plus, depending on the positive voltage V_plus of the energized electrical apparatus 2.

[0103] Then, the method comprises one of the following two alternative steps: connecting a first sample resistance RS_minus in parallel to the first measurement circuit 15, between the aforesaid negative terminal 11 and ground 3; or connecting a second sample resistance RS_plus in parallel to the second measurement circuit 16, between the aforesaid positive terminal 12 and ground 3.

[0104] The method then provides detecting a second value VC2_minus of the first detection voltage VC_minus and detecting a second value VC2_plus of the second detection voltage VC_plus under the aforesaid connection condition of connection of one between the first sample resistance RS_minus and the second sample resistance RS_plus.

[0105] Finally, the method comprises the step of calculating the negative terminal insulation resistance RI_minus and the positive terminal insulation resistance RI_plus of the energized electrical apparatus on the basis of the aforesaid first value of first detection voltage VC1_minus, second value of first detection voltage VC2_minus, first value of second detection voltage VC1_plus and second value of second detection voltage VC2_plus.

[0106] The aforesaid step of detecting a first value of first detection voltage VC1_minus comprises the steps of: modulating the first detection voltage VC_minus by means of a modulation signal; then detecting the modulated first detection voltage VC_minus; then determining the first value of first detection voltage VC1_minus on the basis of the modulated first detection voltage VC_minus.

[0107] The aforesaid step of detecting a first value of second detection voltage VC1_plus comprises the steps of: modulating the second detection voltage VC_plus by means of a modulation signal; then detecting the modulated second detection voltage VC_plus; then determining the first value of second detection voltage VC1_plus on the basis of the modulated second detection voltage VC_plus.

[0108] The aforesaid step of detecting a second value of first detection voltage VC2_minus comprises the steps of: modulating again the first detection voltage VC_minus by means of the modulation signal while the aforesaid first sample resistance RS_minus or second sample resistance RS_plus is connected; then detecting again the modulated first detection voltage VC_minus and determining the second value of first detection voltage VC2_minus on the basis of the modulated first detection voltage VC_minus detected while the aforesaid first sample resistance RS_minus or second sample resistance RS_plus is connected.

[0109] The aforesaid step of detecting a second value of second detection voltage VC2_plus comprises the steps of: modulating again the second detection voltage VC_plus by means of the modulation signal while the aforesaid first sample resistance RS_minus or second sample resistance RS_plus is connected; then detecting again the modulated second detection voltage VC_plus and determining a second value of second detection voltage VC2_plus on the basis of the modulated second detection voltage VC_plus detected while the aforesaid first sample resistance RS_minus or second sample resistance RS_plus is connected.

[0110] According to one particular embodiment, prior to the aforesaid step of connecting the first or second sample resistance, the method provides comparing the first value of first detection voltage VC1_minus with the first value of second detection voltage VC_plus; if the comparison results in the first detection voltage VC_minus being greater than the second detection voltage VC_plus, the first sample resistance RS_minus is connected; if instead the comparison results in the first detection voltage VC_minus being less than the second detection voltage VC_plus, the second sample resistance RS_plus is connected.

[0111] The above-described embodiment advantageously allows performing the measurement procedure which implies reaching smaller voltages in absolute value (see for example, figure 6), which reduces possible criticalities.

[0112] According to an implementation option of the method, the aforesaid step of modulating the first detection voltage VC_minus comprises modulating the first detection voltage VC_minus so that it oscillates between a first detection voltage maximum value VC1_minus-MAX and a first detection voltage minimum value VC1_minus-MIN.

[0113] The aforesaid the step of modulating again the first detection voltage VC_minus comprises modulating again the first detection voltage VC_minus so that it oscillates between a new first detection voltage maximum value VC2_minus-MAX and a new first detection voltage minimum value VC2_minus-MIN.

[0114] The aforesaid step of modulating the second detection voltage VC_plus comprises modulating the second detection voltage VC_plus so that it oscillates between a second detection voltage maximum value VC1_plus-MAX and a second detection voltage minimum value VC1_plus-MIN.

[0115] The aforesaid step of modulating again the second detection voltage VC_plus comprises modulating the second detection voltage VC_plus so that it oscillates between a new second detection voltage maximum value VC2_plus-MAX and a new second detection voltage minimum value VC2_plus-MIN.

[0116] It is worth noting that the insulation resistance measurement method described above provides various implementing options concerning how to perform the steps of detecting the first or second detection voltage and of determining the first and the second value of such a first or second detection voltage.

[0117] According to one implementing option, the aforesaid step of detecting a modulated first detection voltage VC_minus comprises measuring the first detection voltage maximum value VC1_minus-MAX and the first detection voltage minimum value VC1_minus-MIN; and determining a first value of first detection voltage VC1_minus on the basis of the first detection voltage maximum value VC1_minus-MAX and the first detection voltage minimum value VC1_minus-MIN.

[0118] Similarly, the aforesaid step of detecting again a modulated first detection voltage VC_minus comprises measuring the first detection voltage maximum value VC2_minus-MAX and the first detection voltage minimum value VC2_minus-MIN while the first sample resistance RS_minus or the second sample resistance RS_plus is connected, and then determining a second value of first detection voltage VC2_minus on the basis of said first detection voltage maximum value VC2_minus-MAX and first detection voltage minimum value VC2_minus-MIN detected while the first sample resistance RS_minus or the second sample resistance RS_plus is connected.

[0119] Moreover, the aforesaid step of detecting a second detection voltage VC_plus comprises measuring the second detection voltage maximum value VC1_plus-MAX and the second detection voltage minimum value VC1_plus-MIN, and determining a first value of second detection voltage VC1_plus on the basis of the second detection voltage maximum value VC1_plus-MAX and the second detection voltage minimum value VC1_plus-MIN.

[0120] Similarly, the aforesaid step of detecting again a modulated second detection voltage VC_plus comprises measuring the second detection voltage maximum value VC2_plus-MAX and the second detection voltage minimum value VC2_plus-MIN while the first sample resistance RS_minus or the second sample resistance RS_plus is connected; and then determining a second value of second detection voltage VC2_plus on the basis of said second detection voltage maximum value VC2_plus-MAX and second detection voltage minimum value VC2_plus-MIN detected while the first sample resistance RS_minus or the second sample resistance RS_plus is connected.

[0121] According to an alternative implementing option, the aforesaid steps of detecting a first or a second detection voltage comprise detecting a sequence of samples of the modulated first or second detection voltage; and the successive steps of determining a first or second value of first or second detection voltage comprise determining an average value of the samples respectively detected.

[0122] Preferably, the aforesaid measurements are performed in a stationary steady state, i.e., after a settlement time following the transient occurring each time branches of the circuit are connected or disconnected.

[0123] In this regard, the measurement of the detected signal samples also may be employed to check the end of the transient or recognize the achievement of the stationary steady state.

[0124] More precise details will be provided later concerning a further implementing example of the measurement method, in conjunction with an explicative mathematical disclosure aiming to clarify the relations between the various quantities involved.

[0125] Reference is made for example, to figure 2, which shows a portion of the "negative branch" of device 1 related to voltage V_minus (similar arguments and illustrations apply to the "positive branch" of device 1 related to voltage V_plus).

[0126] To determine the relation between V_minus and VC_minus, you may begin by calculating the voltage oscillation ΔVC_minus (equal to VC1_minus-MAX - VC1_minus-MIN) generated by the current I_C1 which charges and discharges capacitor C1 due to the effect of opening and closing switch SW1 (with periods T_ON and T_OFF).

relation valid in the hypothesis that the charge and discharge constant of the capacitor is much greater than the times T_ON and T_OFF.

[0127] By indicating as I0_minus the current which crosses the partition resistance RB_minus, the current which crosses capacitor C1 when switch SW1 is closed is:

[0128] Instead, when switch SW1 is open, and therefore resistance R1 is disconnected from the circuit, the current which crosses capacitor C1 is:

[0129] Moreover, let's consider the definition of Duty = T_ON / (T_ON + T_OFF). Such a parameter corresponds to the parameters DC1 or DC2, already mentioned above.

[0130] By replacing I_C1ON, I_C1OFF and Duty in the relation (1), the following is obtained:

[0131] By indicating as V0_minus the partitioned voltage present at the negative terminal of the inverting operational U_minus, V0_minus may be determined according to voltage VC_minus and current I0_minus when switch SW1 is closed (phase ON):

[0132] Nothing that

an expression is obtained for V_{minus ON}.

[0133] Similarly, using the same expression, by making the limit for R1 tending to infinite, the value V_{minus OFF}, valid in the case of phase OFF, with SW1 open, is obtained.

[0134] Voltage V_minus can be expressed as

[0135] For calculation simplicity, by way of example, consider the case in which Duty = 50%:

[0136] which, by solving V_{minus ON} and V_{minus OFF} and developing the algebraic expression, becomes:

[0137] Replacing the above-indicated expression [2] in such an expression results in:

[0138] With an entirely similar procedure, the following is obtained:

[0139] As noted above, amplifier U_minus is in inverting configuration with unitary gain so as to obtain a positive quantity output with respect to the ground of the chassis. Therefore, starting from an electrical quantity V_minus, which is negative with respect to the voltage of the chassis, a negative voltage VC_minus at the amplifier input and a positive voltage -VC_minus at the output of the same amplifier, are obtained.

[0140] On the contrary, amplifier U_plus is in non-inverting configuration since V_plus is already positive with respect to the voltage of the chassis.

[0141] When the two branches of the device are made in a symmetrical manner, RB_plus = RB_minus = RB, and moreover: R5 = R1, R6 = R2, R7 = R3.

[0142] In this case, the equations (3a) and (3b) become:



Defining

the following simplified formulae are obtained:

[0143] Formula (4) shows that it is always possible to determine the value of V_minus frorn the measurement of VC_minus, and the value of V_plus from the measurement of VC_plus, and the sum of which, in absolute value, is the battery voltage V_B.

[0144] However, from the determination of V_minus and V_plus, it is still not possible to calculate the value of the two insulation resistances because, according to the hypotheses made, the two equations (3a) and (3b) are linearly dependent on each other. To be able to calculate the value of the two insulation resistances RI_plus and RI_minus, a further measurement is performed of V_minus and of V_plus after inserting in the measurement circuit at least one of the two resistors RS_minus or RS_plus, which value is known, by closing of the respective switches S_minus or S_plus.

[0145] It is worth noting that in expression (4), all the parameters are known: A is known because it is a design datum dependent on the value of the resistances selected for the measurement circuit and the Duty and on the state of the switches S_minus or S_plus; VC_minus and VC_plus are acquired by the insulation resistance measurement system; the difference V_plus - V_minus is the voltage of BUS DC or of battery, which is acquired separately.

[0146] Therefore, unless there is a measurement error, it is always possible to perform an analysis of the consistency between the values VC_plus - VC_minus acquired by the insulation resistance measurement system and the battery voltage V_B = V_plus - V_minus independently acquired by the acquisition circuit of the battery voltage signals of the BMS. Thereby, gain or offset errors present in the measurement circuit of the insulation resistance can be diagnosed in advance (is worth noting that this is one of the possible self-diagnosis tests, which will be described later).

[0147] The value of the sample resistances RS_minus and RS_plus (which may be connected and disconnected to/from the negative pole and to/from the positive pole of the battery, respectively, with respect to the ground of the chassis) preferably shall conform with the provisions set out in Standard ISO 6469, while taking into consideration also the presence in parallel of the two resistances of the measurement circuit. In particular, the value of resistance RS_minus preferably takes on a value dependent on the battery voltage V_B so that the parallel of RS with RB ranges from about 100 ohm/V to about500 ohm/V.

[0148] By inserting one of the resistances RS_minus, RS_plus into the measurement circuit through the respective switches S_plus, S_minus, the voltages V_minus and V_plus can be unbalanced with respect to the ground and a new measurement of such voltages can be obtained with respect to the ground through the acquisition of the voltages VC_minus and VC_plus.

[0149] Since all the electronic components forming the measurement circuit of the insulation resistance have known values, the value of the insulation resistance of the battery can be obtained with respect to the ground of the chassis from the measurement of VC_minus and of VC_plus before and after the closing of one of the two switches S_plus and S_minus. Moreover, a more and more accurate estimate of the two insulation resistances can be obtained through the periodic acquisition of the voltages VC_minus and of VC_plus.

[0150] According to an implementing example, the procedure employed and the time evolution of the voltages VC_minus and VC_plus during the closing of one of the two switches S_plus and S_minus are depicted in figure 6, as described herein below.

[0151] To perform the estimate of the value of the insulation resistances RI_plus and RI_minus (which may occur in an almost continuous manner during the functioning of the system), a first acquisition of the voltages VC_minus and VC_plus is performed with the two switches S_minus and S_plus open. Then, one of the two switches S_plus or S_minus is closed depending on whether VC_minus is greater or less than VC_plus. Then, the stabilization of the two values to be acquired is awaited, and then a new acquisition is performed of the values VC_minus and VC_plus. After the double measurement, a first estimate of the value of the two insulation resistances RI_plus and RI_minus can be obtained.

[0152] Such a procedure may be performed periodically in order to improve the precision and reliability of the measurement over time.

[0153] Figure 6 shows, by way of example, the trend of the two voltages VC_minus and VC_plus acquired during the calculation procedure of the insulation resistances. In this specific case, it is assumed that RI_minus > RI_plus, therefore in the first step, in which the two switches S_plus and S_minus are open, voltage VC_minus is greater than VC_plus. This results in switch S_minus being closed in the second measurement step, putting in parallel resistance RI_minus to resistance RS_minus, the closing of which converts the unbalancing of the two voltages, and a successive measurement is performed of the two voltages VC_minus and VC_plus at the end of the transient. The value of the two insulation resistances is obtained from the measurements obtained through the two acquisitions, through a known conversion formula, which is indicated herein below.

[0154] Figure 6 also points out the oscillations of the two signals VC_minus and VC_plus, which are due to the imposed modulation, and therefore the values VC1_minus-max, VC1_minus-min, VC1_plus-max and VC1_plus-min (within which VC_minus and VC_plus oscillate, respectively, in the circumstance in which resistance RS_minus is not connected) and the values VC2_minus-max, VC2_minus-min, VC2_plus-max and VC2_plus-min (within which VC_minus and VC_plus oscillate, respectively, in the circumstance in which resistance RS_minus is connected), are indicated.

[0155] Herein below is described a possible algorithm for the calculation of the insulation resistances.

[0156] RB'_minus indicates the sum of resistance RB_minus and of the equivalent resistance of the measurement circuit consisting of resistances R1, R2, R3 and of capacitor C1 (also affected by the control Duty of SW1):

[0157] The case is considered in which VC_minus is greater than VC_plus, after the first acquisition step. In this case, switch S_minus is closed and a new value of VC_minus is acquired. Once the new value of VC_minus is known, the current which crosses the measurement circuit I0_minus is recalculated using the aforesaid equation [1].

[0158] Once I0_minus and VC_minus are known, similarly to that shown above, V0_minus-ON, V0_minus-OFF, and V0_minus are recalculated. Thus a new estimate of V_minus is obtained, which is indicated with V'_minus:

[0159] By indicating as RB2, the parallel between RB'_minus and RS_minus:

and substituting the expressions obtained above in the expressions[3a] and [3b], two algebraic relations are reached which allow calculating the values of the insulation resistances RI_plus and RI_minus, as a function of V_minus and V_minus':

[0160] Similarly, if VC_minus were less than VC_plus, S_plus would be closed and the following calculation would be obtained:

[0161] A method for diagnosing an insulation loss of an energized electrical apparatus 2 is now described.

[0162] Such a method comprises the steps of measuring a negative terminal insulation resistance RI_minus, present between a negative terminal 11 and the ground 3 of the energized electrical apparatus 2, and a positive terminal insulation resistance RI_plus, present between a positive terminal 12 and the ground 3 of the energized electrical apparatus; and therefore diagnosing the insulation loss of the energized electrical apparatus 2 on the basis of the negative terminal insulation resistance RI_minus and the positive terminal insulation resistance RI_plus which have been measured.

[0163] In such a diagnosis method, the aforesaid measurement step is performed by means of an insulation resistance measurement method according to one of the embodiments shown above.

[0164] Herein below, aspects will be shown, that are associated with the functions of self-diagnosis, which the device and the system of the invention are capable of performing, with the aim to ensure and check the integrity of the circuit for the measurement of insulation. Such functions comprise a group of tests having the task to periodically check the integrity of the measurement circuit of the insulation resistance.

[0165] The execution of such tests may occur according to a pre-ordered sequence, between one insulation resistance measurement and another, or according to the result of preceding tests or according to the functioning state of the system at a given moment.

[0166] The self-diagnosis functions may comprise any subgroup of tests herein below shown, by way of example, or other similar tests: indeed, given the flexibility of the measurement circuit, it is theoretically possible to perform many different tests, some of which perfectly equivalent to one other; only the simplest or most significant tests are described here.

[0167] The tests which may be executed are substantially "plausibility tests", which are performed under particular operating conditions of the device, and are capable of checking the correspondence or lack of correspondence between a value read and a respective value expected.

[0168] Let's consider the functioning self-diagnosis of the device switches M_minus, M_plus having the task to check the integrity of the two device switches, or relays, which allow the connection and disconnection of the insulation resistance measurement circuit to/from the poles of the battery. Whether they are of the electrical-mechanical type or they are made by means of electronic technology (for example, solid-state relays, photoMOS, MOSFET, and so on), such relays are often subjected to electrical stress and they may be damaged. When the two device switches are open, the measurement device is disconnected from the battery and it is not supplied; therefore, the voltages VC_{minus and} VC_plus are to be almost null. When the two device switches instead are closed, the measurement device is connected to the battery and it is supplied; therefore, the voltages VC_{minus and} VC_plus are to have values the sum of which is proportional to the battery voltage and to the duty cycle applied to the measurement device, which, in extreme cases, may also be null (when switch SW1 is always open) or unitary (when switch SW1 is always closed).

[0169] Let's consider now the functioning self-diagnosis of the first resistance-switch group (RS_minus, S_minus) and of the second resistance-switch group (RS_plus, S_plus).

[0170] Such a self-diagnosis in particular comprises a test for checking the integrity of the two input switches (or relays) of sample resistance S_plus and S_minus. Whether they are of electro-mechanical type or electronic type, these relays must support high potential differences at the ends thereof and are frequently subjected to electrical stresses which may damage them.

[0171] Here, the checking test may for example, consist in controlling the two input switches of sample resistance S_plus and S_minus sequentially in the four configurations possible and, for each one, reading the value either of VC_minus or of VC_plus or of both, and performing certain plausibility tests on the basis of the values read.

[0172] Let's consider now a self-diagnosis of integrity of the device based on a consistency test on the gain. Such a test is based on the fact that the sum of the voltages VC_plus and VC_minus is associated with the battery voltage V_B through a proportionality factor indicated with A, which depends on the duty. In particular, the following relation applies:

in which A is the attenuation of the acquisition circuit.

[0173] The self-diagnosis test of the gain comprises a group of safety mechanisms capable of detecting faults which may result in an incorrect estimate of the battery voltage, which is partitioned in the two voltages VC_plus and VC_minus referring to the ground, the occurrence of any condition which modifies the gain of the measurement circuit (for example, a variation of the resistances RB_minus or RB_plus or a gain error of the amplifiers U_minus or U_plus). Such a test may provide for example comparing the value of voltage V_B acquired through the insulation measurement device with respect to the direct measurement of the battery voltage V_B, which is a piece of information available through other measurement circuits.

[0174] Let's consider now the self-diagnosis of the modulation switches SW1 and SW2, which aims to check the correct operation of such switches by checking the presence and the amplitude of the modulation oscillation on the signals VC_minus and VC_plus. The signals VC_plus and VC_minus are measured (upon prior checking that any transients on such signals are concluded) at each switching front of SW1 and SW2, and it is observed whether the modulation oscillation is present on such signals and has the amplitude expected (in turn dependent on the amplitude of VC_plus and VC_minus). In the case of a positive result, the test is passed, otherwise not.

[0175] Let's consider a self-diagnosis of the breakdown or deterioration of the components forming the measurement device. Such a self-diagnosis comprise a series of elementary tests, which may be performed ad hoc or also during the normal functioning of the system. Such elementary tests are consistency tests which provide measuring both the absolute values of the signals V_plus and V_minus and the related modulation oscillations ΔVC_plus and ΔVC_minus; then comparing such values with certain thresholds and diagnosing the main faults or anomalies which may be present in the measurement device of the insulation resistance on the basis of such comparisons.

[0176] With reference to the aforesaid consistency and fault recognition tests, two summary tables are here reported merely by way of non-limiting example, including the results of the consistency tests and the type of fault assumed on the measurement circuit.

VCminus < VTHRL ≈ 0 VDC	Type of fault assumable on the measurement circuit
	R2 short-circuited
	R4 short-circuited
	D1 short-circuited
	C1 short-circuited
	R3 circuit open
	RBminus circuit open
	Uminus broken
	or short-circuited to ground

VCminus > VTHR-H1	Type of fault assumable
	R2 circuit open

VCminus > VTHR-H2	Type of fault assumable
	D1 circuit open

ΔVCminus < VTHRL ≈ 0 VDC	Type of fault assumable
	R1 circuit open
	RBminus short circuit or open circuit

ΔVCminus ≈ > VTHR-H3	Type of fault assumable
	C1 circuit open
	R2 circuit open

ΔVCminus < VTHR-H4	Type of fault assumable
	R3 circuit open
and, similarly,

VCplus < VTHRL ≈ 0 VDC	Type of fault assumable
	R6 short-circuited
	R8 short-circuited
	D2 short-circuited
	C2 short-circuited
	R7 circuit open
	RBminus circuit open
	Uminus broken
	or short-circuited to ground

VCplus > VTHR-H1	Type of fault assumable
	R6 circuit open

VCplus > VTHR-H2	Type of fault assumable
	D2 circuit open

AVCplus < VTHRL	Type of fault assumable
	R5 circuit open
	RBplus short circuit or open circuit

ΔVCplus ≈ > VTHR-H3	Type of fault assumable
	C2 circuit open
	R6 circuit open
ΔVCplus < VTHR-H4	Type of fault assumable
	R7 circuit open

[0177] On the basis of what disclosed above, a method of self-diagnosis of an electronic device 1 for the diagnosis of the insulation loss of an energized electrical apparatus 2 is now described, in which device 1 is according to any one of the embodiments described above.

[0178] Such a method comprises the steps of: performing a diagnosis of the functioning of the first resistance-switch group (RS_minus, S_minus) and of the second resistance-switch group (RS_plus, S_plus) of the device on the basis of measurements of the first VC_minus and of the second detection voltage VC_plus, performed by the device under conditions in which the first sample resistance input switch S_minus and the second sample resistance input switch S_plus are arranged under a plurality of conditions, respectively, belonging to the following set of conditions: open, open; closed, open; open, closed; closed, closed.

[0179] The method then provides performing a consistency test of the measurement taken by the device on the basis of the first detection voltage VC_minus and the second detection voltage VC_plus, as measured by the device, and of the battery voltage V_B (that is the difference between the positive voltage V_plus and the negative voltage V_minus of the battery), the value of which is available regardless of the measurements of device 1.

[0180] The method also provides checking the presence and measuring the amplitude of a first oscillation ΔVC_minus of the first detection voltage VC_minus around its steady state value while the first modulation switch SW1 switches between opening and closing, and further checking the presence and measuring the amplitude of a second oscillation ΔVC_plus of the second detection voltage VC_plus around its steady state value while the second modulation switch SW2 switches between opening and closing.

[0181] Finally, the method provides performing a diagnosis of the functioning of the first measurement circuit and of the second measurement circuit of the device on the basis of measurements of the first detection voltage VC_minus, the second detection voltage VC_plus, the amplitude of the first oscillation ΔVC_minus and the amplitude of the second oscillation ΔVC_plus.

[0182] According to one particular embodiment of the self-diagnosis method, it comprises, prior to the step of performing a diagnosis of the functioning of the first resistance-switch group 13, the further step of performing a diagnosis of the functioning of the devices switches (M_minus, M_plus) on the basis of the first detection voltage VC_minus and of the second detection voltage VC_plus, which are measured by the device under condition of closed device switches M_minus, M_plus.

[0183] According to an implementation option of the self-diagnosis method, the step of performing a diagnosis of the functioning of the resistance-switch groups comprises measuring the first VC_minus and the second detection voltage VC_plus under conditions in which the first sample resistance input switch S_minus and the second sample resistance input switch S_plus are arranged, respectively, under the following conditions: open, open; closed, open; open, closed; closed, closed.

[0184] According to an implementation example of the self-diagnosis method, the step of performing a diagnosis of the functioning of the resistance-switch groups 13, 14 comprises the following first, second, third and fourth tests.

[0185] The first test comprises opening the first sample resistance input switch S_minus and the second sample resistance input switch S_plus, measuring the first VC_minus and the second detection voltage VC_plus after reaching a steady state condition; then comparing the absolute value of the difference between the first and second detection voltage with a first threshold THR0, and determining a positive result of the first test if such an absolute value of the difference is less than the first threshold THR0 (in fact, a high voltage value is a symptom of an unbalancing of the two insulation resistances).

[0186] In one implementing example, the first test further comprises comparing the absolute value of the difference between the first and second detection voltage with a calibration threshold THRc to determine a first or a second value for the second threshold THR1 and for a third threshold THR2 (which will be employed in the successive tests), depending on whether the absolute value of the difference is higher or lower than the calibration threshold THRc.

[0187] The second test comprises closing the first sample resistance input switch S_minus and opening the second sample resistance input switch S_plus after reaching a steady state condition; then measuring the first VC_minus and the second detection voltage VC_plus, comparing the difference between the second detection voltage VC_plus and the first detection voltage VC_minus with the value determined (or saved) for the second threshold THR1, and determining a positive result of the second test if such a difference is greater than the second threshold THR1.

[0188] The third test comprises opening the first sample resistance input switch S_minus and closing the second sample resistance input switch S_plus, measuring the first VC_minus and the second detection voltage VC_plus, comparing the difference between the first detection voltage VC_minus and the second detection voltage VC_plus with the value determined (or saved) for the second threshold THR1, and determining a positive result of the third test if such a difference is greater than the second threshold THR1.

[0189] The fourth test comprises closing the first sample resistance input switch S_minus and the second sample resistance input switch S_plus, measuring the first VC_minus and the second detection voltage VC_plus, comparing the absolute value of the difference between the first and the second detection voltage with the value determined (or saved) for the third threshold THR2 and determining a positive result of the fourth test if such an absolute value of the difference is less than the third threshold THR2.

[0190] The method finally provides diagnosing a correct functioning of the resistance-switch groups if all the four tests shown above provide a positive result.

[0191] It is worth noting that the diagnosis of functioning of the resistance-switch groups may be performed in various manners. For example, according to an option alternative to the preceding one, such a diagnosis may be performed in the following manner.

[0192] The input switches of sample resistance S_minus and S_plus initially are open (while the switching switches SW1 and SW2 may be indifferently open or closed or in the step of switching). The voltages VC_minus and VC_plus are measured under such conditions.

[0193] Then, any one between S_minus and S_plus is closed and a check is made whether the respective insertion of the sample resistance RS_minus or RS_plus generates the unbalancing expected on the voltages VC_minus and VC_plus.

[0194] In particular, by indicating the voltages measured initially as VC_minus-1 and VC_plus-1, the voltages measured after the closing of one between S_minus and S_plus as VC_minus-2 and VC_plus-2 and two conveniently predefined thresholds with THRVC_minus and THRVC_plus so that the test is successfully passed, if S_minus is closed, it is necessary that:



and if instead S_plus is closed:

[0195] According to an implementation option of the self-diagnosis method, the step of performing a consistency test of the measurement taken by the device comprises: calculating the sum of the first detection voltage VC_minus and of the second detection voltage VC_plus; storing the difference between the positive V_plus and negative V_minus voltage of the battery, on the basis of the battery voltage V_B (which is precisely the difference between the positive voltage and the negative voltage of the battery) which is known independently on the measurements of the device (for example, known to a battery management system BMS of higher level); then calculating a comparison value by weighing the battery voltage with a factor (A) dependent on the electrical parameters of the device; finally, determining a positive result of the consistency test if the aforesaid sum of the first detection voltage VC_minus and the second detection voltage VC_plus differs from the aforesaid comparison value by less than a predefined amount.

[0196] In a particular implementing option, factor A is given by the following expression:

[0197] According to one implementation option of the self-diagnosis method, the step of checking the presence and measuring the amplitude of a first and a second oscillation comprises: switching the first modulation switch SW1 between opening and closing, by the first driving signal; then measuring the first detection voltage maximum value VC_minus-MAX and the first detection voltage minimum value VC_minus-MIN and calculating the difference between such maximum value and minimum value of first detection voltage to determine the first oscillation amplitude ΔVC_minus.

[0198] Similarly, it is provided to switch the second modulation switch SW2 between opening and closing, by the second driving signal; then measuring the second detection voltage maximum value VC_plus-MAX and the second detection voltage minimum value VC_plus-MIN and calculating the difference between such maximum value and minimum value of second detection voltage to determine the second oscillation amplitude ΔVC_plus.

[0199] Then, it is checked whether the first oscillation amplitude ΔVC_minus remains within a predefined range of acceptable values, which is dependent on the first detection voltage VC_minus; and whether the second oscillation amplitude ΔVC_plus is kept within a predefined range of acceptable values, which is dependent on the second detection voltage VC_plus.

[0200] According to one implementation option of the self-diagnosis method, the step of performing a diagnosis of the functioning of the first (15) and second measurement circuit (16) comprises: identifying a first group of possible faults of the first measurement circuit 15 if the first detection voltage VC_minus is lower than a low threshold (VTHRL); identifying a second group of possible faults of the first measurement circuit 15 if the first detection voltage VC_minus is higher than a first high threshold VTHR-H1; identifying a third group of possible faults of the first measurement circuit 15 if the amplitude of the first oscillation ΔVC_minus is lower than a low threshold VTHRL; identifying a fourth group of possible faults of the first measurement circuit 15 if the amplitude of the first oscillation ΔVC_minus is higher than a second high threshold VTHR-H2; identifying a first group of possible faults of the second measurement circuit 16 if the second detection voltage VC_plus is lower than a low threshold VTHRL; identifying a second group of possible faults of the second measurement circuit 16 if the second detection voltage VC_plus is higher than a third high threshold VTHR-H3; identifying a third group of possible faults of the second measurement circuit 16 if the amplitude of the second oscillation ΔVC_plus is lower than a low threshold VTHRL; identifying a fourth group of possible faults of the second measurement circuit 16 if the amplitude of the second oscillation ΔVC_plus is higher than a fourth high threshold VTHR-H4; finally, determining a correct functioning of the first (15) and the second measurement circuit (16) if no fault is identified as a result of the preceding steps of identifying.

[0201] For an exemplification of the aforesaid groups of faults which may be detected and identified by the above-described method, refer to the summary tables of the test results indicated above in the present description.

[0202] As may be noted, the object of the present invention is fully achieved by the above-described measurement device, measurement system, measurement method and self-diagnosis method, in light of the features thereof.

[0203] Indeed, due to the "dynamic" measurement technique employed, that is a "switching" technique, the measurement device is capable of measuring the insulation resistances in an accurate and adaptable manner within a broad range of insulation resistances and measurement voltages. In particular, the proportionality factory between the voltages detected (VC_minus and VC_plus) and the battery voltages (V_minus and V_plus) can be dynamically varied and adjusted according to the voltages measured, as noted above.

[0204] Moreover, due to the structure thereof, the device according to the invention allows to perform effective and simultaneously simple self-diagnosis procedures (shown above in detail), which are adapted to check the correct functioning of the device itself and to accurately identify a possible fault among a plurality of several possible faults which can be detected.

[0205] Overall, the device, system and methods described have various innovative aspects (as already shown in detail) which achieve the object of improving the accuracy of the measurement and the diagnosis while significantly decreasing the costs of the device with respect to the solutions commonly used in the prior art; and moreover, they achieve the object of making the measurement device easily self-diagnosable to check the correct functioning and integrity thereof over time, without the need to turn to redundant and costly measurement circuits.

[0206] Those skilled in the art may make several changes and adaptations to the above-described embodiments of the measurement device, measurement system, measurement method and self-diagnosis method, and may replace elements with others which are functionally equivalent in order to meet contingent needs, without departing from the scope of the following claims.

[0207] All of the features described above as belonging to a possible embodiment may be implemented irrespective of the other embodiments described. Furthermore, it is also worth noting that the term "comprising" does not exclude other elements or steps, the term "one" does not exclude a plurality. The drawings are not to scale since we favor the requirement of conveniently noting the various parts for increased illustrative clarity.

Claims

1. Electronic device (1) for the diagnosis of insulation loss, with respect to a ground (3), of an energized electrical apparatus (2) having a negative terminal (21) and a positive terminal (22), through the measurement of a negative terminal insulation resistance (RI_minus) present between said negative terminal (21) and said ground (3), and a positive terminal insulation resistance (RI_plus) present between said positive terminal (22) and said ground (3), the device (1) including:

- a first device terminal (11) and a second device terminal (12), suitable to be connected, respectively, to the negative (21) and positive (22) terminals of the energized electrical apparatus (2);

- a first resistance-switch group (13), comprising a first sample resistance (RS_minus) adapted to be connected or disconnected in a controlled manner between the first device terminal (11) and the ground (3) by means of a first sample resistance insertion switch (S_minus);

- a first measurement circuit (15), arranged between the first device terminal (11) and the ground (3), in parallel to the first resistance-switch group (13);

- a second resistance-switch group (14), comprising a second sample resistance (RS_plus) adapted to be connected or disconnected in a controlled manner between the second device terminal (12) and the ground (3) by means of a second sample resistance insertion switch (S_plus);

- a second measurement circuit (16), arranged between the second device terminal (12) and the ground (3), in parallel to the second resistance-switch group (14);

wherein the first measurement circuit (15) comprises:

- a first detection circuit (150), comprising at least a first resistor (R2) and a first capacitor (C1) arranged mutually in parallel, so that at the ends of the first capacitor (C1), when the first device terminal (11) is connected to the energized electrical apparatus (2), after a transient needed for the measurement to reach a first steady state, there is a first detection voltage (VC_minus) depending on the negative voltage (V_minus) of the energized electrical apparatus (2); the first detection circuit (150) further comprising a first voltage meter (U_minus);

- a first charge modulation circuit (151), arranged in parallel to the first detection circuit (150), and comprising a first modulation resistance (R1) and a first modulation switch (SW1), arranged in series with the first modulation resistance (R1) and adapted to be controlled by a first driving signal (V_SW-minus), so that, when the first device terminal (11) is connected to the energized electrical apparatus (2), the first capacitor (C1) is partially discharged and recharged, respectively, during each closing and opening period of the first modulation switch (SW1), so that the first detection voltage (VC_minus) oscillates between a first detection voltage maximum value (VC_minus-MAX) and a first detection voltage minimum value (VC_minus-MIN), around a first detection voltage intermediate value (VC_minus) representative of the negative voltage (V_minus) of the energized electrical apparatus (2);

- a first partition resistor (RB_minus) connected between the first device terminal (11) and the first detection circuit (150), so that the first partition resistor (RB_minus) and the first detection circuit (150) are arranged mutually in series;

and wherein the second measurement circuit (16) comprises:

- a second detection circuit (160), comprising at least a second resistor (R6) and a second capacitor (C2) arranged mutually in parallel, so that at the ends of the second capacitor (C2), when the second device terminal (12) is connected to the energized electrical apparatus (2), after a transient needed for the measurement to reach a second steady state, there is a second detection voltage (VC_plus) depending on the positive voltage (V_plus) of the energized electrical apparatus (2); the second detection circuit (160) further comprising a second voltage meter (U_plus);

- a second charge modulation circuit (161), arranged in parallel to the second detection circuit (160), and comprising a second modulation resistance (R5) and a second modulation switch (SW2), arranged in series with the second modulation resistance (R5) and adapted to be controlled by a second driving signal (V_SW-plus), so that, when the second device terminal (12) is connected to the energized electrical apparatus (2), the second capacitor (C2) is partially discharged and recharged, respectively, during each closing and opening period of the second modulation switch (SW2), so that the second detection voltage (VC_plus) oscillates between a second detection voltage maximum value (VC_plus-MAX) and a second detection voltage minimum value (VC_plus-MIN), around a second detection voltage intermediate value (VC_plus) representative of the positive voltage (V_plus) of the energized electrical apparatus (2);
a second partition resistor (RB_plus) connected between the second device terminal (12) and the second detection circuit (160), so that the second partition resistor (RB_plus) and the second detection circuit (160) are arranged mutually in series;
wherein said first voltage meter (U_minus) is configured to provide the first detection voltage (VC_minus) under both opening and closing conditions of the first resistance-switch group switch (S_minus), in which conditions the first sample resistance (RS_minus) is connected and disconnected, respectively;
and wherein said second voltage meter (U_plus) is configured to provide the second detection voltage (VC_plus) under both opening and closing conditions of the second resistance-switch group switch (S_plus), in which conditions the second sample resistance (RS_plus) is connected and disconnected, respectively.

2. Device (1) according to claim 1, comprising:

- a first device switch (M_minus), adapted to connect or disconnect in a controlled manner the first terminal (11) of the device to/from the negative terminal (21) of the energized electrical apparatus;

- a second device switch (M_plus), adapted to connect or disconnect in a controlled manner the second terminal (12) of the device to/from the positive terminal (22) of the energized electrical apparatus.

3. Device (1) according to claim 1 or 2, wherein:

- the first detection circuit (150) further comprises a third resistor (R3) connected between the parallel of the first resistor (R2) and first capacitor (C1) and the ground (3);

- the second detection circuit (160) further comprises a fourth resistor (R7) connected between the parallel of the second resistor (R6) and second capacitor (C2) and the ground (3).

4. Device (1) according to any one of claims 1-3, wherein the first measurement circuit (15) and the second measurement circuit (16) have an identical circuit structure and have electrical parameters of corresponding resistors and capacitors respectively identical.

5. Device (1) according to any one of the preceding claims, wherein:

- each of said first device switch (M_minus) and second device switch (M_plus) comprises an electromechanical switch, and wherein

- each of said first modulation switch (SW1) and second modulation switch (SW2) comprises a respective solid state electronic switch.

6. Device (1) according to any one of the preceding claims, wherein each of said first voltage meter (U_minus) and second voltage meter (U_plus) comprises a respective operational amplifier.

7. Electronic system (10) for the diagnosis of the insulation loss of an energized electrical apparatus (2), comprising an electronic device (1) according to any one of claims 1-6, and further comprising a control device (5), wherein the control device (5) is configured to:

- generate and provide to the first modulation switch (SW1) said first driving signal (V_SW-minus);

- generate and provide to the second modulation switch (SW2) said second driving signal (V_SW-plus);

- receive the first detection voltage (VC_minus) from the first voltage meter (U_minus) and the second detection voltage (VC_plus) from the second voltage meter (U_plus);

- determine a first value of first detection voltage (VC1_minus), under condition of disconnection of the first sample resistance (RS_minus), and determine a second value of first detection voltage (VC2_minus), under condition of connection of the first sample resistance (RS_minus);

- determine a first value of second detection voltage (VC1_plus), under condition of disconnection of the second sample resistance (RS_plus), and determine a second value of second detection voltage (VC2_plus), under condition of connection of the second sample resistance (RS_plus);

- calculate the negative terminal insulation resistance (RI_minus) and the positive terminal insulation resistance (RI_plus) of the energized electrical apparatus, on the basis of said first value of first detection voltage (VC1_minus) and second value of first detection voltage (VC2_minus) and/or said first value of second detection voltage (VC1_plus) and second value of second detection voltage (VC2_plus).

8. System (100) according to claim 7, further configured to:

- determine the first value of first detection voltage (VC1_minus), on the basis of said first detection voltage maximum value (VC1_minus-MAX) and first detection voltage minimum value (VC1_minus-MIN), in conditions of disconnection of the first sample resistance (RS_minus), and determine the second value of first detection voltage (VC2_minus), on the basis of said first detection voltage maximum value (VC2_minus-MAX) and first detection voltage minimum value (V2C_minus-MIN), in condition of connection of the first sample resistance (RS_minus);

- determine the first value of second detection voltage (VC1_plus), on the basis of said second detection voltage maximum value (VC1_plus-MAX) and second detection voltage minimum value (VC1_plus-MIN), in conditions of disconnection of the second sample resistance (RS_plus), and determine the second value of second detection voltage (VC2_plus), on the basis of said second detection voltage maximum value (VC2_plus-MAX) and second detection voltage minimum value (V2C_plus-MIN), in conditions of connection of the second sample resistance (RS_plus).

9. System (100) according to claim 7 or 8, wherein:

- said first driving signal (V_SW-minus) is a pulse signal having a first frequency, wherein the presence and absence of the pulse control the closing and opening, or the opening and closing, of the first modulation switch (SW1), and wherein the pulse duration with respect to the period associated with the first frequency defines a first close-open duty-cycle (DC1);

- said second driving signal (V_SW-plus) is a pulse signal having a second frequency, wherein the presence and absence of the pulse control the closing and opening, or the opening and closing, of the second modulation switch (SW2), and wherein the pulse duration with respect to the period associated with the second frequency defines a second close-open duty-cycle (DC2).

10. System (100) according to claim 9, wherein the control device (5) is further configured to dynamically adjust, during the measurement, one or any combination of the following parameters: first frequency of the first driving signal (V_SW-minus); second frequency of the second driving signal (V_SW-plus); first close-open duty-cycle (DC1); second close-open duty-cycle (DC2).

11. System (100) according to claim 9 or 10, wherein:

- the first and the second driving signal (V_SW-minus, V_SW-plus) are periodic signals of Pulse Width Modulation (PWM) type;

- the first and the second driving frequency are equal to each other;

- the first closing-opening duty-cycle (DC1) and the second close-open duty-cycle (DC2) are equal to each other;

- the first driving signal (V_SW-minus) and the second driving signal (V_SW-plus) are equal or complementary to each other.

12. System (100) according to any one of claims 7-11, wherein the system (100) is configured to perform a method according to any one of the following claims 13-17, and/or to carry out self-diagnosis procedures, according to one of claims 18-25.

13. Method for measuring a negative terminal insulation resistance (RI_minus), present between a negative terminal (11) and the ground (3) of an energized electrical apparatus (2), and a positive terminal insulation resistance (RI_plus), present between a positive terminal (12) and the ground (3) of the energized electrical apparatus (2), the method comprising the steps of:

- connecting a first measurement circuit (15) between said negative terminal (11) and ground (3) to detect a first value (VC1_minus) of a first detection voltage (VC_minus), depending on the negative voltage (V_minus) of the energized electrical apparatus (2);

- connecting a second measurement circuit (16) between said positive terminal (12) and ground (3) to detect a first value (VC1_plus) of a second detection voltage (VC_plus), depending on the positive voltage (V_plus) of the energized electrical apparatus (2);

- alternatively, connecting a first sample resistance (RS_minus) in parallel to the first measurement circuit (15) between said negative terminal (11) and ground (3), or connecting a second sample resistance (RS_plus) in parallel to the second measurement circuit (16) between said positive terminal (12) and ground (3);

- under said connection condition of connection of one of the first sample resistance (RS_minus) and the second sample resistance (RS_plus), detecting a second value (VC2_minus) of the first detection voltage (VC_minus), and detecting a second value (VC2_plus) of the second detection voltage (VC_plus);

- calculating the negative terminal insulation resistance (RI_minus) and the positive terminal insulation resistance (RI_plus) of the energized electrical apparatus (2), on the basis of said first value of first detection voltage (VC1_minus), second value of first detection voltage (VC2_minus), first value of second detection voltage (VC1_plus) and second value of second detection voltage (VC2_plus);
wherein said step of detecting a first value of first detection voltage (VC1_minus) comprises modulating the first detection voltage (VC_minus) by means of a modulation signal, detecting the modulated first detection voltage (VC_minus), and determining the first value of first detection voltage (VC1_minus) on the basis of the modulated first detection voltage VC_minus;
wherein said step of detecting a first value of second detection voltage (VC1_plus) comprises modulating the second detection voltage (VC_plus) by means of a modulation signal, detecting the modulated second detection voltage (VC_plus), and determining the first value of second detection voltage (VC1_plus) on the basis of the modulated second detection voltage (VC_plus);
wherein said step of detecting a second value of first detection voltage (VC2_minus) comprises: modulating again the first detection voltage (VC_minus) by means of the modulation signal, while said first sample resistance (RS_minus) or second sample resistance (RS_plus) is connected; detecting again the modulated first detection voltage (VC_minus); determining the second value of first detection voltage (VC2_minus) on the basis of the modulated first detection voltage (VC_minus), detected while said first sample resistance (RS_minus) or second sample resistance (RS_plus) is connected;
and wherein said step of detecting a second value of second detection voltage (VC2_plus) comprises: modulating again the second detection voltage (VC_plus) by means of the modulation signal, while said first sample resistance (RS_minus) or second sample resistance (RS_plus) is connected; detecting again the modulated second detection voltage (VC_plus); determining the second value of second detection voltage (VC2_plus) on the basis of the modulated second detection voltage (VC_plus), while said first sample resistance (RS_minus) or second sample resistance (RS_plus) is connected.

14. Method according to claim 13, including, prior to the step of connecting the first or second sample resistance, the further step of comparing the first value of first detection voltage (VC1_minus) and the first value of second detection voltage (VC_plus);
and wherein said step of connecting a first sample resistance (RS_minus) or a second sample resistance (RS_plus) comprises:

- connecting the first sample resistance (RS_minus), keeping the second sample resistance (RS_plus) disconnected, if the first detection voltage (VC_minus) is greater than the second detection voltage (VC_plus);

- connecting the second sample resistance (RS_plus), keeping the first sample resistance (RS_minus) disconnected, if the first detection voltage (VC_minus) is less than the second detection voltage (VC_plus).

15. Method according to claim 13 or 14, wherein:

- the step of modulating the first detection voltage (VC_minus) comprises modulating the first detection voltage (VC_minus) so that it oscillates between a first detection voltage maximum value (VC1_minus-MAX) and a first detection voltage minimum value (VC1_minus-MIN);

- the step of modulating again the first detection voltage (VC_minus) comprises modulating again the first detection voltage (VC_minus) so that it oscillates between a new first detection voltage maximum value (VC2_minus-MAX) and a new first detection voltage minimum value (VC2_minus-MIN);

- the step of modulating the second detection voltage (VC_plus) comprises modulating the second detection voltage (VC_plus) so that it oscillates between a of second detection voltage maximum value (VC1_plus-MAX) and a of second detection voltage minimum value (VC1_plus-MIN);

- the step of modulating again the second detection voltage (VC_plus) comprises modulating the second detection voltage (VC_plus) so that it oscillates between a new second detection voltage maximum value (VC2_plus-MAX) and a new second detection voltage minimum value (VC2_plus-MIN).

16. Method according to claim 15, wherein:

- the step of detecting the first detection voltage comprises measuring said first detection voltage maximum value (VC1_minus-MAX) and first detection voltage minimum value (VC1_minus-MIN); and the step of determining a first value of first detection voltage comprises determining the first value of first detection voltage (VC1_minus) on the basis of said first detection voltage maximum value (VC1_minus-MAX) and first detection voltage minimum value (VC1_minus-MIN);

- the step of detecting again the first detection voltage comprises measuring again the first detection voltage maximum value (VC2_minus-MAX) and the first detection voltage minimum value (VC2_minus-MIN), while the first sample resistance (RS_minus) or the second sample resistance (RS_plus) is connected; and the step of determining a second value of first detection voltage comprises determining the second value of first detection voltage (VC2_minus) on the basis of said first detection voltage maximum value (VC2_minus-MAX) and first detection voltage minimum value (VC2_minus-MIN), detected while the first sample resistance (RS_minus) or the second sample resistance (RS_plus) is connected;

- the step of detecting the second detection voltage comprises measuring said second detection voltage maximum value (VC1_plus-MAX) and second detection voltage minimum value (VC1_plus-MIN); and the step of determining a first value of second detection voltage comprises determining the first value of second detection voltage (VC1_plus) on the basis of said second detection voltage maximum value (VC1_plus-MAX) and second detection voltage minimum value (VC1_plus-MIN);

- the step of detecting again the second detection voltage comprises measuring again the second detection voltage maximum value (VC2_plus-MAX) and the second detection voltage minimum value (VC2_plus-MIN), while the first sample resistance (RS_minus) or the second sample resistance (RS_plus) is connected; and the step of determining a second value of second detection voltage comprises determining the second value of second detection voltage (VC2_plus) on the basis of said second detection voltage maximum value (VC2_plus-MAX) and second detection voltage minimum value (VC2_plus-MIS), detected while the first sample resistance (RS_minus) or the second sample resistance (RS_plus) is connected.

17. Method for diagnosing an insulation loss of an energized electrical apparatus (2), comprising:

- measuring a negative terminal insulation resistance (RI_minus), present between a negative terminal (11) and the ground (3) of an energized electrical apparatus, and a positive terminal insulation resistance (RI_plus), present between a positive terminal (12) and the ground (3) of the energized electrical apparatus;

- diagnosing the insulation loss of the energized electrical apparatus (2) on the basis of the negative terminal insulation resistance (RI_minus) measured and of the positive terminal insulation resistance (RI_plus) measured,
wherein said measuring step is performed by a method according to one of claims 13-16.

18. Method of self-diagnosis of an electronic device (1) for diagnosing the insulation loss of an energized electrical apparatus (2), the device (1) being according to any one of claims 1-6, the method comprising the steps of:

- performing a diagnosis of the functioning of the first resistance-switch group (RS_minus, S_minus) and of the second resistance-switch group (RS_plus, S_plus) of the device, on the basis of measurements of the first (VC_minus) and of the second detection voltage (VC_plus), carried out by the device under conditions in which the first sample resistance input switch (S_minus) and the second sample resistance input switch (S_plus) are in a plurality of conditions, respectively, belonging to the following set of conditions: open, open; closed, open; open, closed; closed, closed;

- performing a consistency test of the measurement made by the device on the basis of the first detection voltage (VC_minus) and the second detection voltage (VC_plus), as measured by the device, and of the battery voltage (VB), the value of which is available regardless of the measurements of the device (1);

- checking the presence and measuring the amplitude of a first oscillation (ΔVC_minus) of the first detection voltage (VC_minus) around its steady state value, while the first modulation switch (SW1) switches between opening and closing, and further checking the presence and measuring the amplitude of a second oscillation (ΔVC_plus) of the second detection voltage (VC_plus) around its steady state value, while the second modulation switch (SW2) switches between opening and closing;

- performing a diagnosis of the functioning of the first measurement circuit and of the second measurement circuit of the device, on the basis of measurements of the first detection voltage (VC_minus), the second detection voltage (VC_plus), the amplitude of the first oscillation (ΔVC_minus) and the amplitude of the second oscillation (ΔVC_plus).

19. Self-diagnosis method according to claim 18, wherein the device is according to claim 2, and wherein the method comprises, before the step of performing a diagnosis of the functioning of the first resistance-switch group (13), the further step of:

- performing a diagnosis of the functioning of the device switches (M_minus, M_plus), on the basis of the first detection voltage (VC_minus) and of the second detection voltage (VC_plus), measured by the device in condition of closed device switches (M_minus, M_plus).

20. Self-diagnosis method according to claim 18, wherein the step of performing a diagnosis of the functioning of the resistance-switch groups comprises measuring the first (VC_minus) and the second detection voltage (VC_plus), under conditions in which the first sample resistance input switch (S_minus) and the second sample resistance input switch (S_plus) are respectively set in the following conditions: open, open; closed, open; open, closed; closed, closed.

21. Self-diagnosis method according to claim 20, wherein the step of performing a diagnosis of the functioning of the resistance-switch groups (13, 14) comprises:

- a first test comprising opening the first sample resistance input switch (S_minus) and the second sample resistance input switch (S_plus), measuring the first (VC_minus) and the second detection voltage (VC_plus), comparing the absolute value of the difference between said first and second detection voltage with a first threshold (THR0), and determining a positive result of the first test if said absolute value of the difference is less than the first threshold (THR0);

- a second test comprising closing the first sample resistance input switch (S_minus) and opening the second sample resistance input switch (S_plus), measuring the first (VC_minus) and the second detection voltage (VC_plus), comparing the difference between the second detection voltage (VC_plus) and the first detection voltage (VC_minus) with a second threshold (THR1), and determining a positive result of the second test if said difference is greater than the second threshold (THR1);

- a third test comprising opening the first sample resistance input switch (S_minus) and closing the second sample resistance input switch (S_plus), measuring the first (VC_minus) and the second detection voltage (VC_plus), comparing the difference between the first detection voltage (VC_minus) and the second detection voltage (VC_plus) with said second threshold (THR1), and determining a positive result of the third test if said difference is greater than the second threshold (THR1);

- a fourth test comprising closing the first sample resistance input switch (S_minus) and the second sample resistance input switch (S_plus), measuring the first (VC_minus) and the second detection voltage (VC_plus), comparing the absolute value of the difference between said first and second detection voltage with a third threshold (THR2), and determining a positive result of the fourth test if said absolute value of the difference is less than the third threshold (THR2);

- diagnosing a correct functioning of the resistance-switch groups if said first, second, third and fourth tests all provide a positive result.

22. Self-diagnosis method according to claim 21, wherein said first test further comprises comparing the absolute value of the difference between said first and second detection voltage with a calibration threshold (THRc) to determine a first or a second value for the second threshold (THR1) and a first or a second value for the third threshold (THR2), depending on whether said absolute value of the difference is higher or lower than the calibration threshold (THRc).

23. Self-diagnosis method according to claim 18, wherein the step of performing a consistency test of the measurement made by the device comprises:

- calculating the sum of the first detection voltage (VC_minus) and of the second detection voltage (VC_plus);

- storing the difference between the positive (V_plus) and negative (V_minus) voltage of the battery, on the basis of the battery voltage (V_B) that known is irrespective of the measurements of the device;

- calculating a comparison value, by weighing said difference between the battery voltages with a factor (A) dependent on the electrical parameters of the device;

- determining a positive result of the consistency test if said sum of the first detection voltage (VC_minus) and the second detection voltage (VC_plus) differs from said comparison value by less than a predefined amount.

24. Self-diagnosis method according to claim 18, wherein the step of checking the presence and measuring the amplitude of a first and of a second oscillation comprises:

- switching the first modulation switch (SW1) between opening and closing, by the first driving signal;

- measuring the first detection voltage maximum value (VC_minus-MAX) and the first detection voltage minimum value (VC_minus-MIN), and calculating the difference between said maximum value and minimum value of first detection voltage to determine the first oscillation amplitude (ΔVC_minus);

- switching the second modulation switch (SW2) between opening and closing, by the second driving signal;

- measuring the of second detection voltage maximum value (VC_plus-MAX) and the second detection voltage minimum value (VC_plus-MIN), and calculating the difference between said maximum value and minimum value of second detection voltage to determine the second oscillation amplitude (ΔVC_plus);

- checking that the first oscillation amplitude (ΔVC_minus) remains within a predefined range of acceptable values, dependent on the first detection voltage (VC_minus);

- checking that the second oscillation amplitude (ΔVC_plus) remains within a predefined range of acceptable values, dependent on the second detection voltage (VC_plus).

25. Self-diagnosis method according to claim 18, wherein the step of performing a diagnosis of the functioning of the first (15) and second measurement circuit (16) comprises:

- identifying a first group of possible faults of the first measurement circuit (15) if the first detection voltage (VC_minus) is lower than a low threshold (VTHRL);

- identifying a second group of possible faults of the first measurement circuit (15) if the first detection voltage (VC_minus) is higher than a first high threshold (VTHR-H1);

- identifying a third group of possible faults of the first measurement circuit (15) if the amplitude of the first oscillation (ΔVC_minus) is lower than a low threshold (VTHRL);

- identifying a fourth group of possible faults of the first measurement circuit (15) if the amplitude of the first oscillation (ΔVC_minus) is higher than a second high threshold (VTHR-H2);

- identifying a first group of possible faults of the second measurement circuit (16) if the second detection voltage (VC_plus) is lower than a low threshold (VTHRL);

- identifying a second group of possible faults of the second measurement circuit (16) if the second detection voltage (VC_plus) is higher than a third high threshold (VTHR-H3);

- identifying a third group of possible faults of the second measurement circuit (16) if the amplitude of the second oscillation (ΔVC_plus) is lower than a low threshold (VTHRL);

- identifying a fourth group of possible faults of the second measurement circuit (16) if the amplitude of the second oscillation (ΔVC_plus) is higher than a fourth high threshold (VTHR-H4);

- determining a correct functioning of the first (15) and the second measurement circuit (16) if, as a result of the preceding steps of identifying, no fault is identified.

Ansprüche

1. Elektronische Vorrichtung (1) für die Diagnose von Isolation-Verlust, in Bezug auf eine Erdung (3), einer betätigten elektrischen Vorrichtung (2), welche einen negativen Anschluss (21) und einen positiven Anschluss (22) aufweist, durch die Messung eines Negativanschluss-Isolation-Widerstands (RI_minus), welcher zwischen dem negativen Anschluss (21) und der Erdung (3) vorhanden ist, und eines Positivanschluss-Isolation-Widerstands (RI_plus), welcher zwischen dem positiven Anschluss (20) und der Erdung (3) vorhanden ist, wobei die Vorrichtung (1) umfasst:

- einen ersten Vorrichtung-Anschluss (11) und einen zweiten Vorrichtung-Anschluss (12), welche dazu geeignet sind, entsprechend mit den negativen (21) und positiven (22) Anschlüssen der betätigten elektrischen Vorrichtung (2) verbunden zu sein;

- eine erste Widerstand-Schalt-Gruppe (13), welche einen ersten Proben-Widerstand (RS_minus) umfasst, welcher dazu eingerichtet ist, in einer gesteuerten Weise zwischen dem ersten Vorrichtung-Anschluss (11) und der Erdung (3) mittels eines ersten Proben-Widerstand-Einsatz-Schalters (S_minus) verbunden oder getrennt zu werden;

- eine erste Messung-Schaltung (15), welche zwischen dem ersten Vorrichtung-Anschluss (11) und der Erdung (3) parallel zu der ersten Widerstand-Schalt-Gruppe (13) angeordnet ist;

- eine zweite Widerstand-Schalt-Gruppe (14), welche einen zweiten Proben-Widerstand (RS_plus) umfasst, welcher dazu eingerichtet ist, in einer gesteuerten Weise zwischen dem zweiten Vorrichtung-Anschluss (12) und der Erdung (3) mittels eines zweiten Proben-Widerstand-Einsatz-Schalters (S_plus) verbunden oder getrennt zu werden;

- eine zweite Messung-Schaltung (16), welche zwischen dem zweiten Vorrichtung-Anschluss (12) und der Erdung (3) parallel zu der zweiten Widerstand-Schalt-Gruppe (14) angeordnet ist;

wobei die erste Messung-Schaltung (15) umfasst:

- eine erste Detektion-Schaltung (150), welche wenigstens einen ersten Widerstand (R2) und einen ersten Kondensator (C1) umfasst, welche parallel zueinander angeordnet sind, so dass es an den Enden des ersten Kondensators (C1), wenn der erste Vorrichtung-Anschluss (11) mit der betätigten elektrischen Vorrichtung (2) verbunden ist, nach einer Transienten, welche für die Messung benötigt wird, um einen ersten stabilen Zustand zu erreichen, eine erste Detektion-Spannung (VC_minus) gibt, welche von der negativen Spannung (V_minus) der betätigten elektrischen Vorrichtung (2) abhängt; wobei die erste Detektion-Schaltung (150) ferner eine erste Spannung-Messeinheit (U_minus) umfasst;

- eine erste Ladung-Modulation-Schaltung (151), welche parallel zu der ersten Detektion-Schaltung (150) angeordnet ist und einen ersten Modulation-Widerstand (R1) und einen ersten Modulation-Schalter (SW1) umfasst, welcher in Reihe mit dem ersten Modulation-Widerstand (R1) angeordnet ist und dazu eingerichtet ist, durch ein erstes Antrieb-Signal (V_SW-minus) gesteuert zu werden, so dass, wenn der erste Vorrichtung-Anschluss (11) mit der betätigten elektrischen Vorrichtung (2) verbunden ist, der erste Kondensator (C1) teilweise entladen bzw. neu geladen wird, während jeder Schließ- und Öffnung-Periode des ersten Modulation-Schalters (SW1), so dass die erste Detektion-Spannung (VC_minus) zwischen einem ersten maximalen Detektion-Spannung-Wert (VC_minus-MAX) und einem ersten minimalen Detektion-Spannung-Wert (VC_minus-MIN) um einen ersten Detektion-Spannung-Zwischenwert (VC_minus) oszilliert, welcher die negative Spannung (V_minus) der betätigten elektrischen Vorrichtung (2) darstellt;

- einen ersten Teilung-Widerstand (RB_minus), welcher zwischen dem ersten Vorrichtung-Anschluss (11) und der ersten Detektion-Schaltung (150) verbunden ist, so dass der erste Teilung-Widerstand (RB_minus) und die erste Detektion-Schaltung (150) zueinander in Reihe angeordnet sind;

und wobei die zweite Messung-Schaltung (16) umfasst:

- eine zweite Detektion-Schaltung (160), welche wenigstens einen zweiten Widerstand (R6) und einen zweiten Kondensator (C2) umfasst, welche parallel zueinander angeordnet sind, so dass es an den Enden des zweiten Kondensators (C2), wenn der zweite Vorrichtung-Anschluss (12) mit der betätigten elektrischen Vorrichtung (2) verbunden ist, nach einer Transienten, welche für die Messung benötigt wird, um einen zweiten stabilen Zustand zu erreichen, eine zweite Detektion-Spannung (VC_plus) gibt, welche von der positiven Spannung (V_plus) der betätigten elektrischen Vorrichtung (2) abhängt; wobei die zweite Detektion-Schaltung (160) ferner eine zweite Spannung-Messeinheit (U_plus) umfasst;

- eine zweite Ladung-Modulation-Schaltung (161), welche parallel zu der zweiten Detektion-Schaltung (160) angeordnet ist und einen zweiten Modulation-Widerstand (R5) und einen zweiten Modulation-Schalter (SW2) umfasst, welcher in Reihe mit dem zweiten Modulation-Widerstand (R5) angeordnet ist und dazu eingerichtet ist, durch ein zweites Antrieb-Signal (V_SW-plus) gesteuert zu werden, so dass, wenn der zweite Vorrichtung-Anschluss (12) mit der betätigten elektrischen Vorrichtung (2) verbunden ist, der zweite Kondensator (C2) teilweise entladen bzw. neu geladen wird, während jeder Schließ- und Öffnung-Periode des zweiten Modulation-Schalters (SW2), so dass die zweite Detektion-Spannung (VC_plus) zwischen einem zweiten maximalen Detektion-Spannung-Wert (VC_plus-MAX) und einem zweiten minimalen Detektion-Spannung-Wert (VC_plus-MIN) um einen zweiten Detektion-Spannung-Zwischenwert (VC_plus) oszilliert, welcher die positive Spannung (V_plus) der betätigten elektrischen Vorrichtung (2) darstellt;

- einen zweiten Teilung-Widerstand (RB_plus), welcher zwischen dem zweiten Vorrichtung-Anschluss (12) und der zweiten Detektion-Schaltung (160) verbunden ist, so dass der zweite Teilung-Widerstand (RB_plus) und die zweite Detektion-Schaltung (160) zueinander in Reihe angeordnet sind;
wobei die erste Spannung-Messeinheit (U_minus) dazu eingerichtet ist, die erste Detektion-Spannung (VC_minus) unter sowohl Öffnung- als auch Schließ-Zuständen des ersten Widerstand-Schalt-Gruppen-Schalters (S_minus) bereitzustellen, in welchen Zuständen der erste Proben-Widerstand (RS_minus) verbunden bzw. getrennt wird;
und wobei die zweite Spannung-Messeinheit (U_plus) dazu eingerichtet ist, die zweite Detektion-Spannung (VC_plus) unter sowohl Öffnung- als auch Schließ-Zuständen des zweiten Widerstand-Schalt-Gruppen-Schalters (S_plus) bereitzustellen, in welchen Zuständen der zweite Proben-Widerstand (RS_plus) verbunden bzw. getrennt wird.

2. Vorrichtung (1) nach Anspruch 1, umfassend:

- einen ersten Vorrichtung-Schalter (M_minus), welcher dazu eingerichtet ist, in einer gesteuerten Weise den ersten Anschluss (11) der Vorrichtung mit dem negativen Anschluss (21) der betätigten elektrischen Vorrichtung zu verbinden oder von diesem zu trennen;

- einen zweiten Vorrichtung-Schalter (M_plus), welcher dazu eingerichtet ist, in einer gesteuerten Weise den zweiten Anschluss (12) der Vorrichtung mit dem positiven Anschluss (22) der betätigten elektrischen Vorrichtung zu verbinden oder von diesem zu trennen.

3. Vorrichtung (1) nach Anspruch 1 oder 2, wobei:

- die erste Detektion-Schaltung (150) ferner einen dritten Widerstand (R3) umfasst, welcher zwischen der Parallelen des ersten Widerstands (R2) und dem ersten Kondensator (C1) und der Erdung (3) verbunden ist;

- die zweite Detektion-Schaltung (160) einen vierten Widerstand (R7) umfasst, welcher zwischen der Parallelen des zweiten Widerstands (R6) und dem zweiten Kondensator (C2) und der Erdung (3) verbunden ist.

4. Vorrichtung (1) nach einem der Ansprüche 1 bis 3, wobei die erste Messung-Schaltung (15) und die zweite Messung-Schaltung (16) eine identische Schaltung-Struktur aufweisen und elektrische Parameter von entsprechenden Widerständen und Kondensatoren entsprechend identisch aufweisen.

5. Vorrichtung (1) nach einem der vorhergehenden Ansprüche, wobei:

- jeder aus dem ersten Vorrichtung-Schalter (M_minus) und dem zweiten Vorrichtung-Schalter (M_plus) einen elektromechanischen Schalter umfasst, und wobei

- jeder aus dem ersten Modulation-Schalter (SW1) und dem zweiten Modulation-Schalter (SW2) einen entsprechenden elektronischen Feststoff-Schalter umfasst.

6. Vorrichtung (1) nach einem der vorhergehenden Ansprüche, wobei jede aus der ersten Spannung-Messeinheit (U_minus) und der zweiten Spannung-Messeinheit (U_plus) einen entsprechenden betriebsmäßigen Verstärker umfasst.

7. Elektronisches System (10) für die Diagnose des Isolation-Verlustes einer betätigten elektrischen Vorrichtung (2), welches eine elektronische Vorrichtung (1) nach einem der Ansprüche 1 bis 6 umfasst, und ferner eine Steuervorrichtung (5) umfasst, wobei die Steuervorrichtung (5) dazu ein eingerichtet ist:

- das erste Antrieb-Signal (V_SW-minus) zu erzeugen und an den ersten Modulation-Schalter (SW1) bereitzustellen;

- das zweite Antrieb-Signal (V_SW-plus) zu erzeugen und an den zweiten Modulation-Schalter (SW2) bereitzustellen;

- die erste Detektion-Spannung (VC_minus) von der ersten Spannung-Messeinheit (U_minus) und die zweite Detektion-Spannung (VC_plus) von der zweiten Spannung-Messeinheit (U_plus) zu empfangen;

- einen ersten Wert einer ersten Detektion-Spannung (VC1_minus) unter einem Zustand einer Trennung des ersten Proben-Widerstands (RS_minus) zu bestimmen und einen zweiten Wert einer ersten Detektion-Spannung (VC2_minus) unter einem Zustand einer Verbindung des ersten Proben-Widerstands (RS_minus) zu bestimmen;

- einen zweiten Wert einer zweiten Detektion-Spannung (VC1_plus) unter einem Zustand einer Trennung des zweiten Proben-Widerstands (RS_plus) zu bestimmen und einen zweiten Wert einer zweiten Detektion-Spannung (VC2_plus) unter einem Zustand einer Verbindung des zweiten Proben-Widerstands (RS_plus) zu bestimmen;

- den Negativanschluss-Isolation-Widerstand (RI_minus) und den Positivanschluss-Isolation-Widerstand (RI_plus) der betätigten elektrischen Vorrichtung auf der Grundlage des ersten Wertes einer ersten Detektion-Spannung (VC1_minus) und des zweiten Wertes einer ersten Detektion-Spannung (VC2_minus) und/oder des ersten Wertes einer zweiten Detektion-Spannung (VC1_plus) und des zweiten Wertes einer zweiten Detektion-Spannung (VC2_plus) zu berechnen.

8. System (100) nach Anspruch 7, welches ferner dazu eingerichtet ist:

- den ersten Wert einer ersten Detektion-Spannung (VC1_minus) auf der Grundlage des ersten maximalen Detektion-Spannung-Wertes (VC1_minus-MAX) und des ersten minimalen Detektion-Spannung-Wertes (VC1_minus-MIN) in Zuständen einer Trennung des ersten Proben-Widerstands (RS_minus) zu bestimmen und den zweiten Wert einer ersten Detektion-Spannung (VC2_minus) auf der Grundlage des ersten maximalen Detektion-Spannung-Werts (VC2_minus-MAX) und des ersten minimalen Detektion-Spannung-Werts (V2C_minus-MIN) in einem Zustand einer Verbindung des ersten Proben-Widerstands (RS_minus) zu bestimmen;

- den ersten Wert einer zweiten Detektion-Spannung (VC1_plus) auf der Grundlage des zweiten maximalen Detektion-Spannung-Wertes (VC1_plus-MAX) und des zweiten minimalen Detektion-Spannung-Wertes (VC1_plus-MIN) in Zuständen einer Trennung des zweiten Proben-Widerstands (RS_plus) zu bestimmen und den zweiten Wert einer zweiten Detektion-Spannung (VC2_plus) auf der Grundlage des zweiten maximalen Detektion-Spannung-Werts (VC2_plus-MAX) und des zweiten minimalen Detektion-Spannung-Werts (V2C_plus-MIN) in Zuständen einer Verbindung des zweiten Proben-Widerstands (RS_plus) zu bestimmen.

9. System (100) nach Anspruch 7 oder 8, wobei:

- das erste Antrieb-Signal (V_SW-minus) ein Pulssignal mit einer ersten Frequenz ist, wobei die Anwesenheit und Abwesenheit des Pulses das Schließen und das Öffnen oder das Öffnen und das Schließen des ersten Modulation-Schalters (SW1) steuert, und wobei die Puls-Dauer in Bezug auf die Periode, welche der ersten Frequenz zugeordnet ist, einen ersten Schließ-Öffnung-Schaltzyklus (DC1) definiert;

- das zweite Antrieb-Signal (V_SW-plus) ein Pulssignal mit einer zweiten Frequenz ist, wobei die Anwesenheit und Abwesenheit des Pulses das Schließen und das Öffnen oder das Öffnen und das Schließen des zweiten Modulation-Schalters (SW2) steuert, und wobei die Puls-Dauer in Bezug auf die Periode, welche der zweiten Frequenz zugeordnet ist, einen zweiten Schließ-Öffnung-Schaltzyklus (DC2) definiert.

10. System (100) nach Anspruch 9, wobei die Steuervorrichtung (5) ferner dazu eingerichtet ist, während der Messung eine oder eine beliebige Kombination der folgenden Parameter dynamisch einzustellen: eine erste Frequenz des ersten Antrieb-Signals (V_SW-minus), eine zweite Frequenz des zweiten Antrieb-Signals (V_SW-plus); einen ersten Schließ-Öffnung-Schaltzyklus (DC1); einen zweiten Schließ-Öffnung-Schaltzyklus (DC2).

11. System (100) nach Anspruch 9 oder 10, wobei:

- das erste und das zweite Antrieb-Signal (V_SW-minus, V_SW-plus) periodische Signale vom Pulsweitenmodulation (PWM) Typ sind;

- die erste und die zweite Antrieb-Frequenz zueinander gleich sind;

- der erste Schließ-Öffnung-Schaltzyklus (DC1) und der zweite Schließ-Öffnung-Schaltzyklus (DC2) zueinander gleich sind;

- das erste Antrieb-Signal (V_SW-minus) und das zweite Antrieb-Signal (V_SW-plus) zueinander gleich oder komplementär sind.

12. System (100) nach einem der Ansprüche 7 bis 11, wobei das System (100) dazu eingerichtet ist, ein Verfahren nach einem der folgenden Ansprüche 13 bis 17 durchzuführen und/oder Selbst-Diagnose-Prozeduren gemäß einem der Ansprüche 18 bis 25 auszuführen.

13. Verfahren zum Messen eines Negativanschluss-Isolation-Widerstands (RI_minus), welcher zwischen einem negativen Anschluss (11) und der Erdung (3) einer betätigten elektrischen Vorrichtung (2) vorhanden ist, und eines Positivanschluss-Isolation-Widerstands (RI_plus), welcher zwischen einem positiven Anschluss (12) und der Erdung (3) der betätigten elektrischen Vorrichtung (2) vorhanden ist, wobei das Verfahren die folgenden Schritte umfasst:

- Verbinden einer ersten Messung-Schaltung (15) zwischen dem negativen Anschluss (11) und der Erdung (3), um einen ersten Wert (VC1_minus) einer ersten Detektion-Spannung (VC_minus) abhängig von der negativen Spannung (V_minus) der betätigten elektrischen Vorrichtung (2) zu detektieren;

- Verbinden einer zweiten Messung-Schaltung (16) zwischen dem positiven Anschluss (12) und der Erdung (3), um einen ersten Wert (VC1_plus) einer zweiten Detektion-Spannung (VC_plus) abhängig von der positiven Spannung (V_plus) der betätigten elektrischen Vorrichtung (2) zu detektieren;

- alternativ, Verbinden eines ersten Proben-Widerstands (RS_minus) parallel zu der ersten Messung-Schaltung (15) zwischen dem negativen Anschluss (11) und der Erdung (3) oder Verbinden eines zweiten Proben-Widerstands (RS_plus) parallel zu der zweiten Messung-Schaltung (16) zwischen dem positiven Anschluss (12) und der Erdung (3);

- unter dem Verbindung-Zustand einer Verbindung von einem aus dem ersten Proben-Widerstand (RS_minus) und dem zweiten Proben-Widerstand (RS_plus), Detektieren eines zweiten Werts (VC2_minus) der ersten Detektion-Spannung (VC_minus) und Detektieren eines zweiten Werts (VC2_plus) der zweiten Detektion-Spannung (VC_plus);

- Berechnen des Negativanschluss-Isolation-Widerstands (RI_minus) und des Positivanschluss-Isolation-Widerstands (RI_plus) der betätigten elektrischen Vorrichtung (2) auf der Grundlage des ersten Wertes einer ersten Detektion-Spannung (VC1_minus), des zweiten Wertes einer ersten Detektion-Spannung (VC2_minus), des ersten Wertes einer zweiten Detektion-Spannung (VC1_plus) und des zweiten Wertes einer zweiten Detektion-Spannung (VC2_plus);
wobei der Schritt des Detektierens eines ersten Werts einer ersten Detektion-Spannung (VC1_minus) ein Modulieren der ersten Detektion-Spannung (VC_minus) mittels eines Modulation-Signals umfasst, wobei das Detektieren der modulierten ersten Detektion-Spannung (VC_minus) und ein Bestimmen des ersten Werts einer ersten Detektion-Spannung (VC1_minus) auf der Grundlage der modulierten ersten Detektion-Spannung VC_minus stattfinden;
wobei der Schritt des Detektierens eines ersten Werts einer zweiten Detektion-Spannung (VC1_plus) ein Modulieren der zweiten Detektion-Spannung (VC_plus) mittels eines Modulation-Signals umfasst, wobei das Detektieren der modulierten zweiten Detektion-Spannung (VC_plus) und ein Bestimmen des ersten Werts einer zweiten Detektion-Spannung (VC1_plus) auf der Grundlage der modulierten zweiten Detektion-Spannung (VC_plus) stattfinden;
wobei der Schritt des Detektierens eines zweiten Werts einer ersten Detektion-Spannung (VC2_minus) umfasst: erneutes Modulieren der ersten Detektion-Spannung (VC_minus) mittels des Modulation-Signals, während der erste Proben-Widerstand (RS_minus) oder der zweite Proben-Widerstand (RS_plus) verbunden wird; erneutes Detektieren der modulierten ersten Detektion-Spannung (VC_minus); Bestimmen des zweiten Werts einer ersten Detektion-Spannung (VC2_minus) auf der Grundlage der modulierten ersten Detektion-Spannung (VC_minus), welche detektiert wird, während der erste Proben-Widerstand (RS_minus) oder der zweite Proben-Widerstand (RS_plus) verbunden wird;
und wobei der Schritt des Detektierens eines zweiten Werts einer zweiten Detektion-Spannung (VC2_plus) umfasst: erneutes Modulieren der zweiten Detektion-Spannung (VC_plus) mittels des Modulation-Signals, während der erste Proben-Widerstand (RS_minus) oder der zweite Proben-Widerstand (RS_plus) verbunden wird; erneutes Detektieren der modulierten zweiten Detektion-Spannung (VC_plus); Bestimmen des zweiten Werts einer zweiten Detektion-Spannung (VC2_plus) auf der Grundlage der modulierten zweiten Detektion-Spannung (VC_plus), während der erste Proben-Widerstand (RS_minus) oder der zweite Proben-Widerstand (RS_plus) verbunden wird.

14. Verfahren nach Anspruch 13, umfassend vor dem Schritt des Verbindens des ersten oder zweiten Proben-Widerstands den weiteren Schritt eines Vergleichens des ersten Werts einer ersten Detektion-Spannung (VC1_minus) und des ersten Werts einer zweiten Detektion-Spannung (VC_plus);
und wobei der Schritt des Verbindens eines ersten Proben-Widerstands (RS_minus) oder eines zweiten Proben-Widerstands (RS_plus) umfasst:

- Verbinden des ersten Proben-Widerstands (RS_minus), Halten des zweiten Proben-Widerstands (RS_plus) getrennt, wenn die erste Detektion-Spannung (VC_minus) größer ist als die zweite Detektion-Spannung (VC_plus);

- Verbinden des zweiten Proben-Widerstands (RS_plus), Halten des ersten Proben-Widerstands (RS_minus) getrennt, wenn die erste Detektion-Spannung (VC_minus) geringer ist als die zweite Detektion-Spannung (VC_plus).

15. Verfahren nach Anspruch 13 oder 14, wobei:

- der Schritt des Modulierens der ersten Detektion-Spannung (VC_minus) ein Modulieren der ersten Detektion-Spannung (VC_minus) umfasst, so dass sie zwischen einem ersten maximalen Detektion-Spannung-Wert (VC1_minus-MAX) und einem ersten minimalen Detektion-Spannung-Wert (VC1_minus-MIN) oszilliert;

- der Schritt des erneuten Modulierens der ersten Detektion-Spannung (VC_minus) ein erneutes Modulieren der ersten Detektion-Spannung (VC_minus) umfasst, so dass sie zwischen einem neuen ersten maximalen Detektion-Spannung-Wert (VC2_minus-MAX) und einem neuen ersten minimalen Detektion-Spannung-Wert (VC2_minus-MIN) oszilliert;

- der Schritt des Modulierens der zweiten Detektion-Spannung (VC_plus) ein Modulieren der zweiten Detektion-Spannung (VC_plus) umfasst, so dass sie zwischen einem zweiten maximalen Detektion-Spannung-Wert (VC1_plus-MAX) und einem zweiten minimalen Detektion-Spannung-Wert (VC1_plus-MIN) oszilliert;

- der Schritt des erneuten Modulierens der zweiten Detektion-Spannung (VC_plus) ein erneutes Modulieren der zweiten Detektion-Spannung (VC_plus) umfasst, so dass sie zwischen einem neuen zweiten maximalen Detektion-Spannung-Wert (VC2_plus-MAX) und einem neuen zweiten minimalen Detektion-Spannung-Wert (VC2_plus-MIN) oszilliert.

16. Verfahren nach Anspruch 15, wobei:

- der Schritt des Detektierens der ersten Detektion-Spannung ein Messen des ersten maximalen Detektion-Spannung-Werts (VC1_minus-MAX) und des ersten minimalen Detektion-Spannung-Werts (VC1_minus-MIN) umfasst; und der Schritt eines Bestimmens eines ersten Werts einer ersten Detektion-Spannung ein Bestimmen des ersten Werts einer ersten Detektion-Spannung (VC1_minus) auf der Grundlage des ersten maximalen Detektion-Spannung-Werts (VC1_minus-MAX) und des ersten minimalen Detektion-Spannung-Werts (VC1_minus-MIN) umfasst;

- der Schritt eines erneuten Detektierens der ersten Detektion-Spannung ein erneutes Messen des ersten maximalen Detektion-Spannung-Werts (VC2_minus-MAX) und des ersten minimalen Detektion-Spannung-Werts (VC2_minus-MIN) umfasst, während der erste Proben-Widerstand (RS_minus) oder der zweite Proben-Widerstand (RS_plus) verbunden wird; und der Schritt des Bestimmens eines zweiten Werts einer ersten Detektion-Spannung ein Bestimmen des zweiten Werts der ersten Detektion-Spannung (VC2_minus) auf der Grundlage des ersten maximalen Detektion-Spannung-Werts (VC2_minus-MAX) und des ersten minimalen Detektion-Spannung-Werts (VC2_minus-MIN) umfasst, detektiert während der erste Proben-Widerstand (RS_minus) oder der zweite Proben-Widerstand (RS_plus) verbunden wird;

- der Schritt eines Detektierens der zweiten Detektion-Spannung ein Messen des zweiten maximalen Detektion-Spannung-Werts (VC1_plus-MAX) und des zweiten minimalen Detektion-Spannung-Werts (VC1_plus-MIN) umfasst; und der Schritt eines Bestimmens eines ersten Werts einer zweiten Detektion-Spannung ein Bestimmen des ersten Werts einer zweiten Detektion-Spannung (VC1_plus) auf der Grundlage des zweiten maximalen Detektion-Spannung-Werts (VC1_plus-MAX) und des zweiten minimalen Detektion-Spannung-Werts (VC1_plus-MIN) umfasst;

- der Schritt eines erneuten Detektierens der zweiten Detektion-Spannung ein erneutes Messen des zweiten maximalen Detektion-Spannung-Werts (VC2_plus-MAX) und des zweiten minimalen Detektion-Spannung-Werts (VC2_plus-MIN) umfasst, während der erste Proben-Widerstand (RS_minus) oder der zweite Proben-Widerstand (RS_plus) verbunden wird; und der Schritt eines Bestimmens eines zweiten Werts einer zweiten Detektion-Spannung ein Bestimmen des zweiten Werts der zweiten Detektion-Spannung (VC2_plus) auf der Grundlage des zweiten maximalen Detektion-Spannung-Werts (VC2_plus-MAX) und des zweiten minimalen Detektion-Spannung-Werts (VC2_plus-MIN) umfasst, detektiert während der erste Proben-Widerstand (RS_minus) oder der zweite Proben-Widerstand (RS_plus) verbunden wird;

17. Verfahren zum Diagnostizieren eines Isolation-Verlustes einer betätigten elektrischen Vorrichtung (2), umfassend:

- Messen eines Negativanschluss-Isolation-Widerstands (RI_minus), welcher zwischen einem negativen Anschluss (11) und der Erdung (3) einer betätigten elektrischen Vorrichtung (2) vorhanden ist, und eines Positivanschluss-Isolation-Widerstands (RI_plus), welcher zwischen einem positiven Anschluss (12) und der Erdung (3) der betätigten elektrischen Vorrichtung vorhanden ist;

- Diagnostizieren des Isolation-Verlustes der betätigten elektrischen Vorrichtung (2) auf der Grundlage des gemessenen Negativanschluss-Isolation-Widerstands (RI_minus) und des gemessenen Positivanschluss-Isolation-Widerstands (RI_plus),
wobei der Mess-Schritt durch ein Verfahren nach einem der Ansprüche 13 bis 16 durchgeführt wird.

18. Verfahren einer Selbst-Diagnose einer elektrischen Vorrichtung (1) zum Diagnostizieren des Isolation-Verlustes einer betätigten elektrischen Vorrichtung (2), wobei die Vorrichtung (1) nach einem der Ansprüche 1 bis 6 ist, wobei das Verfahren die Schritte umfasst:

- Durchführen einer Diagnose der Funktionalität der ersten Widerstand-Schalt-Gruppe (RS_minus, S_minus) und der zweiten Widerstand-Schalt-Gruppe (RS_plus, S_plus) der Vorrichtung auf der Grundlage von Messungen der ersten (VC_minus) und der zweiten Detektion-Spannung (VC_plus), welche durch die Vorrichtung unter Zuständen ausgeführt werden, in welchen der erste Proben-Widerstand-Eingabe-Schalter (S_minus) und der zweite Proben-Widerstand-Eingabe-Schalter (S_plus) entsprechend in einer Mehrzahl von Zuständen sind, welche zu dem folgenden Satz von Zuständen gehören: offen, offen; geschlossen, offen; offen, geschlossen; geschlossen, geschlossen;

- Durchführen eines Konsistenz-Tests der Messung, welche durch die Vorrichtung gemacht worden ist, auf der Grundlage der ersten Detektion-Spannung (VC_minus) und der zweiten Detektion-Spannung (VC_plus), wie durch die Vorrichtung gemessen, und der Batterie-Spannung (VB), wobei der Wert davon verfügbar ist, ungeachtet der Messungen der Vorrichtung (1);

- Überprüfen der Anwesenheit und Messen der Amplitude einer ersten Oszillation (ΔVC_minus) der ersten Detektion-Spannung (VC_minus) um seinen Stabilzustand-Wert, während der erste Modulation-Schalter (SW1) zwischen einem Öffnen und einem Schließen schaltet, und ferner Überprüfen der Anwesenheit und Messen der Amplitude einer zweiten Oszillation (ΔVC_plus) der zweiten Detektion-Spannung (VC_plus) um seinen Stabilzustand-Wert, während der zweite Modulation-Schalter (SW2) zwischen einem Öffnen und einem Schließen schaltet;

- Durchführen einer Diagnose der Funktionalität der ersten Messung-Schaltung und der zweiten Messung-Schaltung der Vorrichtung auf der Grundlage von Messungen der ersten Detektion-Spannung (VC_minus), der zweiten Detektion-Spannung (VC_plus), der Amplitude der ersten Oszillation (ΔVC_minus) und der Amplitude der zweiten Oszillation (ΔVC_plus).

19. Selbst-Diagnose-Verfahren nach Anspruch 18, wobei die Vorrichtung nach Anspruch 2 ist, und wobei das Verfahren vor dem Schritt des Durchführens einer Diagnose der Funktionalität der ersten Widerstand-Schalt-Gruppe (13) den weiteren Schritt umfasst:

- Durchführen einer Diagnose der Funktionalität der Vorrichtung-Schalter (M_minus, M_plus) auf der Grundlage der ersten Detektion-Spannung (VC_minus) und der zweiten Detektion-Spannung (VC_plus), welche durch die Vorrichtung in einem Zustand von geschlossenen Vorrichtung-Schaltern (M_minus, M_plus) gemessen werden.

20. Selbst-Diagnose-Verfahren nach Anspruch 18, wobei der Schritt des Durchführens einer Diagnose der Funktionalität der Widerstand-Schalt-Gruppen ein Messen der ersten (VC_minus) und der zweiten Detektion-Spannung (VC_plus) unter Zuständen umfasst, in welchen der erste Proben-Widerstand-Eingabe-Schalter (S_minus) und der zweite Proben-Widerstand-Eingabe-Schalter (S_plus) entsprechend in den folgenden Zuständen festgelegt sind: offen, offen; geschlossen, offen; offen, geschlossen; geschlossen, geschlossen.

21. Selbst-Diagnose-Verfahren nach Anspruch 20, wobei der Schritt des Durchführens einer Diagnose der Funktionalität der Widerstand-Schalt-Gruppen (13, 14) umfasst:

- einen ersten Test, umfassend ein Öffnen des ersten Proben-Widerstand-Eingabe-Schalters (S_minus) und des zweiten Proben-Widerstand-Eingabe-Schalters (S_plus), Messen der ersten (VC_minus) und der zweiten Detektion-Spannung (VC_plus), Vergleichen des absoluten Werts der Differenz zwischen der ersten und der zweiten Detektion-Spannung mit einem ersten Schwellenwert (THR0) und Bestimmen eines positiven Ergebnisses des ersten Tests, wenn der absolute Wert der Differenz geringer ist als der erste Schwellenwert (THR0);

- einen zweiten Test, umfassend ein Schließen des ersten Proben-Widerstand-Eingabe-Schalters (S_minus) und ein Öffnen des zweiten Proben-Widerstand-Eingabe-Schalters (S_plus), Messen der ersten (VC_minus) und der zweiten Detektion-Spannung (VC_plus), Vergleichen der Differenz zwischen der zweiten Detektion-Spannung (VC_plus) und der ersten Detektion-Spannung (VC_minus) mit einem zweiten Schwellenwert (THR1) und Bestimmen eines positiven Ergebnisses des zweiten Tests, wenn die Differenz größer ist als der zweite Schwellenwert (THR1);

- einen dritten Test, umfassend ein Öffnen des ersten Proben-Widerstand-Eingabe-Schalters (S_minus) und ein Schließen des zweiten Proben-Widerstand-Eingabe-Schalters (S_plus), Messen der ersten (VC_minus) und der zweiten Detektion-Spannung (VCpius), Vergleichen der Differenz zwischen der ersten Detektion-Spannung (VC_minus) und der zweiten Detektion-Spannung (VC_plus) mit dem zweiten Schwellenwert (THR1) und Bestimmen eines positiven Ergebnisses des dritten Tests, wenn die Differenz größer ist als der zweite Schwellenwert (THR1);

- einen vierten Test, umfassend ein Schließen des ersten Proben-Widerstand-Eingabe-Schalters (S_minus) und des zweiten Proben-Widerstand-Eingabe-Schalters (S_plus), Messen der ersten (VC_minus) und der zweiten Detektion-Spannung (VC_plus), Vergleichen des absoluten Werts der Differenz zwischen der ersten und der zweiten Detektion-Spannung mit einem dritten Schwellenwert (THR2) und Bestimmen eines positiven Ergebnisses des vierten Tests, wenn der absolute Wert der Differenz geringer ist als der dritte Schwellenwert (THR2);

- Diagnostizieren einer korrekten Funktionalität der Widerstand-Schalt-Gruppen, wenn die ersten, zweiten, dritten und vierten Tests alle ein positives Ergebnis bereitstellen.

22. Selbst-Diagnose-Verfahren nach Anspruch 21, wobei der erste Test ferner ein Vergleichen des absoluten Werts der Differenz zwischen der ersten und der zweiten Detektion-Spannung mit einem Kalibration-Schwellenwert (THRc) umfasst, um einen ersten oder einen zweiten Wert für den zweiten Schwellenwert (THR1) und einen ersten oder einen zweiten Wert für den dritten Schwellenwert (THR2) abhängig davon zu bestimmen, ob der absolute Wert der Differenz höher oder niedriger ist als der Kalibration-Schwellenwert (THRc).

23. Selbst-Diagnose-Verfahren nach Anspruch 18, wobei der Schritt des Durchführens eines Konsistenz-Tests der Messung, welche durch die Vorrichtung gemacht wird, umfasst:

- Berechnen der Summe der ersten Detektion-Spannung (VC_minus) und der zweiten Detektion-Spannung (VC_plus);

- Speichern der Differenz zwischen der positiven (V_plus) und der negativen (V_minus) Spannung der Batterie auf der Grundlage der Batterie-Spannung (VB), welche bekannt ist, ungeachtet der Messungen der Vorrichtung;

- Berechnen eines Vergleich-Werts durch Gewichten der Differenz zwischen den Batterie-Spannungen mit einem Faktor (A) abhängig von den elektrischen Parametern der Vorrichtung;

- Bestimmen eines positiven Ergebnisses des Konsistenz-Tests, wenn die Summe der ersten Detektion-Spannung (VC_minus) und der zweiten Detektion-Spannung (VC_plus) von dem Vergleich-Wert um weniger als eine vorbestimmte Menge abweicht.

24. Selbst-Diagnose-Verfahren nach Anspruch 18, wobei der Schritt des Überprüfens der Anwesenheit und des Messens der Amplitude einer ersten und einer zweiten Oszillation umfasst:

- Schalten des ersten Modulation-Schalters (SW1) zwischen einem Öffnen und einem Schließen durch das erste Antrieb-Signal;

- Messen des ersten maximalen Detektion-Spannung-Werts (VC_minus-MAX) und des ersten minimalen Detektion-Spannung-Werts (VC_minus-MIN) und Berechnen der Differenz zwischen dem maximalen Wert und dem minimalen Wert der ersten Detektion-Spannung, um die erste Oszillation-Amplitude (ΔVC_minus) zu bestimmen;

- Schalten des zweiten Modulation-Schalters (SW2) zwischen einem Öffnen und einem Schließen durch das zweite Antrieb-Signal;

- Messen des zweiten maximalen Detektion-Spannung-Werts (VC_plus-MAX) und des zweiten minimalen Detektion-Spannung-Werts (VC_plus-MIN) und Berechnen der Differenz zwischen dem maximalen Wert und dem minimalen Wert der zweiten Detektion-Spannung, um die zweite Oszillation-Amplitude (ΔVC_plus) zu bestimmen;

- Überprüfen, dass die erste Oszillation-Amplitude (ΔVC_minus) innerhalb eines vorbestimmten Bereichs von akzeptablen Werten abhängig von der ersten Detektion-Spannung (VC_minus) verbleibt;

- Überprüfen, dass die zweite Oszillation-Amplitude (ΔVC_plus) innerhalb eines vorbestimmten Bereichs von akzeptablen Werten abhängig von der zweiten Detektion-Spannung (VC_plus) verbleibt.

25. Selbst-Diagnose-Verfahren nach Anspruch 18, wobei der Schritt des Durchführens einer Diagnose der Funktionalität der ersten (15) und der zweiten Messung-Schaltung (16) umfasst:

- Identifizieren einer ersten Gruppe von möglichen Fehlern der ersten Messung-Schaltung (15), wenn die erste Detektion-Spannung (VC_minus) geringer ist als ein niedriger Schwellenwert (VTHRL);

- Identifizieren einer zweiten Gruppe von möglichen Fehlern der ersten Messung-Schaltung (15), wenn die erste Detektion-Spannung (VC_minus) höher ist als ein erster hoher Schwellenwert (VTHR-H1);

- Identifizieren einer dritten Gruppe von möglichen Fehlern der ersten Messung-Schaltung (15), wenn die Amplitude der ersten Oszillation (ΔVC_minus) geringer ist als ein geringer Schwellenwert (VTHRL);

- Identifizieren einer vierten Gruppe von möglichen Fehlern der ersten Messung-Schaltung (15), wenn die Amplitude der ersten Oszillation (ΔVC_minus) höher ist als ein zweiter hoher Schwellenwert (VTHR-H2);

- Identifizieren einer ersten Gruppe von möglichen Fehlern der zweiten Messung-Schaltung (16), wenn die zweite Detektion-Spannung (VC_plus) geringer ist als ein niedriger Schwellenwert (VTHRL);

- Identifizieren einer zweiten Gruppe von möglichen Fehlern der zweiten Messung-Schaltung (16), wenn die zweite Detektion-Spannung (VC_plus) höher ist als ein dritter hoher Schwellenwert (VTHR-H3);

- Identifizieren einer dritten Gruppe von möglichen Fehlern der zweiten Messung-Schaltung (16), wenn die Amplitude der zweiten Oszillation (ΔVC_plus) geringer ist als ein geringer Schwellenwert (VTHRL);

- Identifizieren einer vierten Gruppe von möglichen Fehlern der zweiten Messung-Schaltung (16), wenn die Amplitude der zweiten Oszillation (ΔVC_plus) höher ist als ein vierter hoher Schwellenwert (VTHR-H4);

- Bestimmen einer korrekten Funktionalität der ersten (15) und der zweiten Messung-Schaltung (16), wenn als ein Ergebnis der voranstehenden Schritte des Identifizierens kein Fehler identifiziert wird.

Revendications

1. Dispositif électronique (1) pour le diagnostic de perte d'isolation, par rapport à une masse (3), d'un appareil électrique alimenté (2) comportant une borne négative (21) et une borne positive (22), par la mesure d'une résistance d'isolation de borne négative (RI_minus) présente entre ladite borne négative (21) et ladite masse (3), et d'une résistance d'isolation de borne positive (RI_plus) présente entre ladite borne positive (22) et ladite masse (3), le dispositif (1) comprenant :

- une première borne de dispositif (11) et une deuxième borne de dispositif (12), appropriées pour être connectées, respectivement, aux bornes négative (21) et positive (22) de l'appareil électrique alimenté (2) ;

- un premier groupe résistance-commutateur (13), comprenant une première résistance d'échantillonnage (RS_minus) adaptée de façon à être déconnectée ou déconnectée d'une manière commandée entre la première borne de dispositif (11) et la masse (3) à l'aide d'un premier commutateur d'insertion de résistance d'échantillonnage (S_minus) ;

- un premier circuit de mesure (15), disposé entre la première borne de dispositif (11) et la masse (3), en parallèle avec le premier groupe résistance-commutateur (13) ;

- un deuxième groupe résistance-commutateur (14), comprenant une deuxième résistance d'échantillonnage (RS_plus) adaptée de façon à être déconnectée ou déconnectée d'une manière commandée entre la deuxième borne de dispositif (12) et la masse (3) à l'aide d'un deuxième commutateur d'insertion de résistance d'échantillonnage (S_plus) ;

- un deuxième circuit de mesure (16), disposé entre la deuxième borne de dispositif (12) et la masse (3), en parallèle avec le deuxième groupe résistance-commutateur (14) ;

dans lequel le premier circuit de mesure (15) comprend :

- un premier circuit de détection (150), comprenant au moins une première résistance (R2) et un premier condensateur (C1) disposés mutuellement en parallèle, de telle sorte qu'aux extrémités du premier condensateur (C1), lorsque la première borne de dispositif (11) est connectée à l'appareil électrique alimenté (2), après une transitoire nécessaire pour que la mesure atteigne un premier état stable, il y ait une première tension de détection (VC_minus) en fonction de la tension négative (V_minus) de l'appareil électrique alimenté (2) ; le premier circuit de détection (150) comprenant de plus un premier dispositif de mesure de tension (U_minus) ;

- un premier circuit de modulation de charge (151), disposé en parallèle avec le premier circuit de détection (150), et comprenant une première résistance de modulation (R1) et un premier commutateur de modulation (SW1), disposé en série avec la première résistance de modulation (R1) et adapté de façon à être commandé par un premier signal d'attaque (V_SW-minus), de telle sorte que, lorsque la première borne de dispositif (11) est connectée à l'appareil électrique alimenté (2), le premier condensateur (C1) soit partiellement déchargé et rechargé, respectivement, durant chaque période de fermeture et d'ouverture du premier commutateur de modulation (SW1), de telle sorte que la première tension de détection (VC_minus) oscille entre une première valeur maximale de tension de détection (VC_minus-MAX) et une première valeur minimale de tension de détection (VC_minus-MIN), autour d'une première valeur intermédiaire de tension de détection (VC_minus) représentative de la tension négative (VC_minus) de l'appareil électrique alimenté (2) ;

- une première résistance de séparation (RB_minus) connectée entre la première borne de dispositif (11) et le premier circuit de détection (150), de telle sorte que la première résistance de séparation (RB_minus) et le premier circuit de détection (150) soient mutuellement disposés en série ;

et dans lequel le deuxième circuit de mesure (16) comprend :

- un deuxième circuit de détection (160), comprenant au moins une deuxième résistance (R6) et un deuxième condensateur (C2) mutuellement disposés en parallèle, de telle sorte qu'aux extrémités du deuxième condensateur (C2), lorsque la deuxième borne de dispositif (12) est connectée à l'appareil électrique alimenté (2), après une transitoire nécessaire pour que la mesure atteigne un deuxième état stable, il y ait une deuxième tension de détection (VC_plus) en fonction de la tension positive (V_plus) de l'appareil électrique alimenté (2) ; le deuxième circuit de détection (160) comprenant de plus un deuxième dispositif de mesure de tension (U_plus) ;

- un deuxième circuit de modulation de charge (161), disposé en parallèle avec le deuxième circuit de détection (160), et comprenant une deuxième résistance de modulation (R5) et un deuxième commutateur de modulation (SW2), disposé en série avec la deuxième résistance de modulation (R5) et adapté de façon à être commandé par un deuxième signal d'attaque (V_SW-plus), de telle sorte que, lorsque la deuxième borne de dispositif (12) est connectée à l'appareil électrique alimenté (2), le deuxième condensateur (C2) soit partiellement déchargé et rechargé, respectivement, durant chaque période de fermeture et d'ouverture du deuxième commutateur de modulation (SW2), de telle sorte que la deuxième tension de détection (VC_plus) oscille entre une deuxième valeur maximale de tension de détection (VC_plus-MAX) et une deuxième valeur minimale de tension de détection (VC_plus-MIN), autour d'une deuxième valeur intermédiaire de tension de détection (VC_plus) représentative de la tension positive (V_plus) de l'appareil électrique alimenté (2) ;

- une deuxième résistance de séparation (RB_plus) connectée entre la deuxième borne de dispositif (12) et le deuxième circuit de détection (160), de telle sorte que la deuxième résistance de séparation (RB_plus) et le deuxième circuit de détection (160) soient mutuellement disposés en série ;
dans lequel ledit premier dispositif de mesure de tension (U_minus) est configuré de façon à délivrer la première tension de détection (VC_minus) dans les deux conditions d'ouverture et de fermeture du premier commutateur de groupe résistance-commutateur (S_minus), conditions dans lesquelles la première résistance d'échantillonnage (RS_minus) est connectée et déconnectée, respectivement ;
et dans lequel ledit deuxième dispositif de mesure de tension (U_plus) est configuré de façon à délivrer la deuxième tension de détection (VC_plus) dans les deux conditions d'ouverture et de fermeture du deuxième commutateur de groupe résistance-commutateur (S_plus), conditions dans lesquelles la deuxième résistance d'échantillonnage (RS_plus) est connectée et déconnectée, respectivement.

2. Dispositif (1) selon la revendication 1, comprenant :

- un premier commutateur de dispositif (M_minus) adapté de façon à connecter ou à déconnecter d'une façon commandée la première borne (11) du dispositif à/à partir de la borne négative (21) de l'appareil électrique alimenté ;

- un deuxième commutateur de dispositif (M_plus), adapté de façon à connecter ou à déconnecter d'une façon commandée la deuxième borne (12) du dispositif à/à partir de la borne positive (22) de l'appareil électrique alimenté.

3. Dispositif (1) selon la revendication 1 ou 2, dans lequel :

- le premier circuit de détection (150) comprend de plus une troisième résistance (R3) connectée entre le montage parallèle de la première résistance (R2) et du premier condensateur (C1) et la masse (3) ;

- le deuxième circuit de détection (160) comprend de plus une quatrième résistance (R7) connectée entre le montage parallèle de la deuxième résistance (R6) et du deuxième condensateur (C2) et la masse (3).

4. Dispositif (1) selon l'une quelconque des revendications 1 à 3, dans lequel le premier circuit de mesure (15) et le deuxième circuit de mesure (16) ont une structure de circuit identique et ont des paramètres électriques de résistances et de condensateurs correspondants respectivement identiques.

5. Dispositif (1) selon l'une quelconque des revendications précédentes, dans lequel :

- chacun desdits premier commutateur de dispositif (M_minus) et deuxième commutateur de dispositif (M_plus) comprend un commutateur électromécanique, et dans lequel :

- chacun desdits premier commutateur de modulation (SW1) et deuxième commutateur de modulation (SW2) comprend un commutateur électronique à semiconducteurs respectif.

6. Dispositif (1) selon l'une quelconque des revendications précédentes, dans lequel chacun desdits premier dispositif de mesure de tension (U_minus) et deuxième dispositif de mesure de tension (U_plus) comprend un amplificateur opérationnel respectif.

7. Système électronique (10) pour le diagnostic de la perte d'isolation d'un appareil électrique alimenté (2), comprenant un dispositif électronique (1) selon l'une quelconque des revendications 1 à 6, et comprenant de plus un dispositif de commande (5), le dispositif de commande (5) étant configuré de façon à :

- générer et délivrer au premier commutateur de modulation (SW1) ledit premier signal d'attaque (V_SW-minus) ;

- générer et délivrer au deuxième commutateur de modulation (SW2) ledit deuxième signal d'attaque (V_SW-plus) ;

- recevoir la première tension de détection (VC_minus) à partir du premier dispositif de mesure de tension (U_minus) et la deuxième tension de détection (VC_plus) à partir du deuxième dispositif de mesure de tension (U_plus) ;

- déterminer une première valeur de première tension de détection (VC1_minus), sous une condition de déconnexion de la première résistance d'échantillonnage (RS_minus), et déterminer une deuxième valeur de première tension de détection (VC2_minus), sous une condition de connexion de la première résistance d'échantillonnage (RS_minus) ;

- déterminer une première valeur de deuxième tension de détection (VC1_plus), sous une condition de déconnexion de la deuxième résistance d'échantillonnage (RS_plus), et déterminer une deuxième valeur de deuxième tension de détection (VC2_plus), sous une condition de connexion de la deuxième résistance d'échantillonnage (RS_plus) ;

- calculer la résistance d'isolation de borne négative (RI_minus) et la résistance d'isolation de borne positive (RI_plus) de l'appareil électrique alimenté, en fonction desdites première valeur de première tension de détection (VC1_minus) et deuxième valeur de première tension de détection (VC2_minus) et/ou desdites première valeur de deuxième tension de détection (VC1_plus) et deuxième valeur de deuxième tension de détection (VC2_plus).

8. Système (100) selon la revendication 7, configuré de plus pour :

- déterminer la première valeur de première tension de détection (VC1_minus), en fonction desdites première valeur maximale de tension de détection (VC1_minus-MAX) et première valeur minimale de tension de détection (VC1_minus-MIN), dans des conditions de déconnexion de la première résistance d'échantillonnage (RS_minus), et déterminer la deuxième valeur de première tension de détection (VC2_minus), en fonction desdites première valeur maximale de tension de détection (VC2_minus-MAX) et première valeur minimale de tension de détection (VC2_minus-MIN), dans des conditions de connexion de la première résistance d'échantillonnage (RS_minus) ;

- déterminer la première valeur de deuxième tension de détection (VC1_plus), en fonction desdites deuxième valeur maximale de tension de détection (VC1_plus-MAX) et deuxième valeur minimale de tension de détection (VC1_plus-MIN), dans des conditions de déconnexion de la deuxième résistance d'échantillonnage (RS_plus), et déterminer la deuxième valeur de deuxième tension de détection (VC2_plus), en fonction desdites deuxième valeur maximale de tension de détection (VC2_plus-MAX) et deuxième valeur minimale de tension de détection (VC2_plus-MIN), dans des conditions de connexion de la deuxième résistance d'échantillonnage (RS_plus).

9. Système (100) selon la revendication 7 ou 8, dans lequel :

- ledit premier signal d'attaque (V_SW-minus) est un signal d'impulsion ayant une première fréquence, dans lequel la présence et l'absence de l'impulsion commandent la fermeture et l'ouverture, ou l'ouverture et la fermeture, du premier commutateur de modulation (SW1), et dans lequel la durée d'impulsion par rapport à la période associée à la première fréquence définit un premier rapport cyclique de fermeture-ouverture (DC1) ;

- ledit deuxième signal d'attaque (V_SW-plus) est un signal d'impulsion ayant une deuxième fréquence, dans lequel la présence et l'absence de l'impulsion commandent la fermeture et l'ouverture, ou l'ouverture et la fermeture, du deuxième commutateur de modulation (SW2), et dans lequel la durée d'impulsion par rapport à la période associée à la deuxième fréquence définit un deuxième rapport cyclique de fermeture-ouverture (DC2).

10. Système (100) selon la revendication 9, dans lequel le dispositif de commande (5) est de plus configuré de façon à ajuster de façon dynamique, durant la mesure, l'un ou une quelconque combinaison des paramètres suivants : première fréquence du premier signal d'attaque (V_SW-minus) ; deuxième fréquence du deuxième signal d'attaque (V_SW-plus) ; premier rapport cyclique de fermeture-ouverture (DC1) ; deuxième rapport cyclique de fermeture-ouverture (DC2).

11. Système (100) selon la revendication 9 ou 10, dans lequel :

- le premier et le deuxième signaux d'attaque (V_SW-minus, V_SW-plus) sont des signaux périodiques du type à modulation de largeur d'impulsion (PWM) ;

- la première et la deuxième fréquences d'attaque sont égales l'une à l'autre ;

- le premier rapport cyclique de fermeture-ouverture (DC1) et le deuxième rapport cyclique de fermeture-ouverture (DC2) sont égaux l'un à l'autre ;

- le premier signal d'attaque (V_SW-minus) et le deuxième signal d'attaque (V_SW-plus) sont égaux l'un à l'autre ou complémentaires l'un de l'autre.

12. Système (100) selon l'une quelconque des revendications 7 à 11, le système (100) étant configuré de façon à mettre en œuvre un procédé selon l'une quelconque des revendications 13 à 17 qui suivent, et/ou à effectuer des procédures d'auto-diagnostic selon l'une des revendications 18 à 25.

13. Procédé pour mesurer une résistance d'isolation de borne négative (RI_minus), présente entre une borne négative (11) et la masse (3) d'un appareil électrique alimenté (2), et une résistance d'isolation de borne positive (RI_plus), présente entre une borne positive (12) et la masse (3) de l'appareil électrique alimenté (2), le procédé comprenant les étapes consistant à :

- connecter un premier circuit de mesure (15) entre ladite borne négative (11) et la masse (3) afin de détecter une première valeur (VC1_minus) d'une première tension de détection (VC_minus) en fonction de la tension négative (V_minus) de l'appareil électrique alimenté (2) ;

- connecter un deuxième circuit de mesure (16) entre ladite borne positive (12) et la masse (3) afin de détecter une première valeur (VC1_plus) d'une deuxième tension de détection (VC_plus) en fonction de la tension positive (V_plus) de l'appareil électrique alimenté (2) ;

- d'une autre façon, connecter une première résistance d'échantillonnage (RS_minus) en parallèle au premier circuit de mesure (15) entre ladite borne négative (11) et la masse (3), ou connecter une deuxième résistance d'échantillonnage (RS_plus) en parallèle au deuxième circuit de mesure (16) entre ladite borne positive (12) et la masse (3) ;

- sous ladite condition de connexion, de connexion de l'une de la première résistance d'échantillonnage (RS_minus) et de la deuxième résistance d'échantillonnage (RS_plus), détecter une deuxième valeur (VC2_minus) de la première tension de détection (VC_minus), et détecter une deuxième valeur (VC2_plus) de la deuxième tension de détection (VC_plus) ;

- calculer la résistance d'isolation de borne négative (RI_minus) et la résistance d'isolation de borne positive (RI_plus) de l'appareil électrique alimenté (2), en fonction desdites première valeur de première tension de détection (VC1_minus), deuxième valeur de première tension de détection (VC2_minus), première valeur de deuxième tension de détection (VC1_plus) et deuxième valeur de deuxième tension de détection (VC2_plus) ;
dans lequel ladite étape de détection d'une première valeur de première tension de détection (VC1_minus) comprend la modulation de la première tension de détection (VC_minus) à l'aide d'un signal de modulation, la détection de la première tension de détection modulée (VC_minus) et la détermination de la première valeur de première tension de détection (VC1_minus) en fonction de la première tension de détection modulée (VC_minus) ;
dans lequel ladite étape de détection d'une première valeur de deuxième tension de détection (VC1_plus) comprend la modulation de la deuxième tension de détection (VC_plus) à l'aide d'un signal de modulation, la détection de la deuxième tension de détection modulée (VC_plus) et la détermination de la première valeur de deuxième tension de détection (VC1_plus) en fonction de la deuxième tension de détection modulée (VC_plus) ;
dans lequel ladite étape de détection d'une deuxième valeur de première tension de détection (VC2_minus) comprend : la modulation, à nouveau, de la première tension de détection (VC_minus) à l'aide du signal de modulation, tandis que ladite première résistance d'échantillonnage (RS_minus) ou deuxième résistance d'échantillonnage (RS_plus) est connectée ; la détection, à nouveau, de la première tension de détection modulée (VC_minus) ; la détermination de la deuxième valeur de première tension de détection (VC2_minus) en fonction de la première tension de détection modulée (VC_minus), détectée lorsque ladite première résistance d'échantillonnage (RS_minus) ou deuxième résistance d'échantillonnage (RS_plus) est connectée ;
et dans lequel ladite étape de détection d'une deuxième valeur de deuxième tension de détection (VC2_plus) comprend : la modulation, à nouveau, de la deuxième tension de détection (VC_plus) à l'aide du signal de modulation, tandis que ladite première résistance d'échantillonnage (RS_minus) ou deuxième résistance d'échantillonnage (RS_plus) est connectée ; la détection, à nouveau, de la deuxième tension de détection modulée (VC_plus) ; la détermination de la deuxième valeur de deuxième tension de détection (VC2_plus) en fonction de la deuxième tension de détection modulée (VC_plus), tandis que ladite première résistance d'échantillonnage (RS_minus) ou deuxième résistance d'échantillonnage (RS_plus) est connectée.

14. Procédé selon la revendication 13, comprenant, avant l'étape de connexion de la première ou deuxième résistance d'échantillonnage, l'étape supplémentaire de comparaison de la première valeur de première tension de détection (VC1_minus) et de la première valeur de deuxième tension de détection (VC_plus) ;
et dans lequel ladite étape de connexion d'une première résistance d'échantillonnage (RS_minus) ou d'une deuxième résistance d'échantillonnage (RS_plus) comprend :

- la connexion de la première résistance d'échantillonnage (RS_minus) et le maintien de la deuxième résistance d'échantillonnage (RS_plus) déconnectée, si la première tension de détection (VC_minus) est supérieure à la deuxième tension de détection (VC_plus) ;

- la connexion de la deuxième résistance d'échantillonnage (RS_plus) et le maintien de la première résistance d'échantillonnage (RS_minus) déconnectée, si la première tension de détection (VC_minus) est inférieure à la deuxième tension de détection (VC_plus).

15. Procédé selon la revendication 13 ou 14, dans lequel :

- l'étape de modulation de la première tension de détection (VC_minus) comprend la modulation de la première tension de détection (VC_minus) de telle sorte qu'elle oscille entre une première valeur maximale de tension de détection (VC1_minus-MAX) et une première valeur minimale de tension de détection (VC1_minus-MIN) ;

- l'étape de modulation à nouveau de la première tension de détection (VC_minus) comprend la modulation, à nouveau, de la première tension de détection (VC_minus) de telle sorte qu'elle oscille entre une nouvelle première valeur maximale de tension de détection (VC2_minus-MAX) et une nouvelle première valeur minimale de tension de détection (VC2_minus-MIN) ;

- l'étape de modulation de la deuxième tension de détection (VC_plus) comprend la modulation de la deuxième tension de détection (VC_plus) de telle sorte qu'elle oscille entre une deuxième valeur maximale de tension de détection (VC1_plus-MAX) et une deuxième valeur minimale de tension de détection (VC1_plus-MIN) ;

- l'étape de modulation à nouveau de la deuxième tension de détection (VC_plus) comprend la modulation de la deuxième tension de détection (VC_plus) de telle sorte qu'elle oscille entre une nouvelle deuxième valeur maximale de tension de détection (VC2_plus-MAX) et une nouvelle deuxième valeur minimale de tension de détection (VC2_plus-MIN).

16. Procédé selon la revendication 15, dans lequel :

- l'étape de détection de la première tension de détection comprend la mesure desdites première valeur maximale de tension de détection (VC1_minus-MAX) et première valeur minimale de tension de détection (VC1_minus-MIN) ; et l'étape de détermination d'une première valeur de première tension de détection comprend la détermination de la première valeur de première tension de détection (VC1_minus) en fonction desdites première valeur maximale de tension de détection (VC1_minus-MAX) et première valeur minimale de tension de détection (VC1_minus-MIN) ;

- l'étape de détection à nouveau de la première tension de détection comprend la mesure, à nouveau, de la première valeur maximale de tension de détection (VC2_minus-MAX) et de la première valeur minimale de tension de détection (VC2_minus-MIN), tandis que la première résistance d'échantillonnage (RS_minus) ou la deuxième résistance d'échantillonnage (RS_plus) est connectée ; et l'étape de détermination d'une deuxième valeur de première tension de détection comprend la détermination de la deuxième valeur de première tension de détection (VC2_minus) en fonction desdites première valeur maximale de tension de détection (VC2_minus-MAX) et première valeur minimale de tension de détection (VC2_minus-MIN), détectées tandis que la première résistance d'échantillonnage (RS_minus) ou la deuxième résistance d'échantillonnage (RS_plus) est connectée ;

- l'étape de détection de la deuxième tension de détection comprend la mesure desdites deuxième valeur maximale de tension de détection (VC1_plus-MAX) et deuxième valeur minimale de tension de détection (VC1_plus-MIN) ; et l'étape de détermination d'une première valeur de deuxième tension de détection comprend la détermination de la première valeur de deuxième tension de détection (VC1_plus) en fonction desdites deuxième valeur maximale de tension de détection (VC1_plus-MAX) et deuxième valeur minimale de tension de détection (VC1_plus-MIN) ;

- l'étape de détection à nouveau de la deuxième tension de détection comprend la mesure, à nouveau, de la deuxième valeur maximale de tension de détection (VC2_plus-MAX) et de la deuxième valeur minimale de tension de détection (VC2_plus-MIN), tandis que la première résistance d'échantillonnage (RS_minus) ou la deuxième résistance d'échantillonnage (RS_plus) est connectée ; et l'étape de détermination d'une deuxième valeur de deuxième tension de détection comprend la détermination de la deuxième valeur de deuxième tension de détection (VC2_plus) en fonction desdites deuxième valeur maximale de tension de détection (VC2_plus-MAX) et deuxième valeur minimale de tension de détection (VC2_plus-MIN), détectées tandis que la première résistance d'échantillonnage (RS_minus) ou la deuxième résistance d'échantillonnage (RS_plus) est connectée.

17. Procédé pour diagnostiquer une perte d'isolation d'un appareil électrique alimenté (2), comprenant :

- la mesure d'une résistance d'isolation de borne négative (RI_minus), présente entre une borne négative (11) et la masse (3) d'un appareil électrique alimenté, et d'une résistance d'isolation de borne positive (RI_plus), présente entre une borne positive (12) et la masse (3) de l'appareil électrique alimenté ;

- le diagnostic de la perte d'isolation de l'appareil électrique alimenté (2) en fonction de la résistance d'isolation de borne négative (RI_minus) mesurée et de la résistance d'isolation de borne positive (RI_plus) mesurée,
dans lequel ladite étape de mesure est mise en œuvre par un procédé selon l'une des revendications 13 à 16.

18. Procédé d'auto-diagnostic d'un dispositif électronique (1) pour diagnostiquer la perte d'isolation d'un appareil électrique alimenté (2), le dispositif (1) étant selon l'une quelconque des revendications 1 à 6, le procédé comprenant les étapes consistant à :

- réaliser un diagnostic du fonctionnement du premier groupe résistance-commutateur (RS_minus, S_minus) et du deuxième groupe résistance-commutateur (RS_plus, S_plus) du dispositif, en fonction de mesures de la première (VC_minus) et de la deuxième tension de détection (VC_plus), effectuées par le dispositif dans des conditions dans lesquelles le premier commutateur d'entrée de résistance d'échantillonnage (S_minus) et le deuxième commutateur d'entrée de résistance d'échantillonnage (S_plus) sont dans une pluralité de conditions, respectivement, appartenant à l'ensemble de conditions suivant : ouvert, ouvert ; fermé, ouvert ; ouvert, fermé ; fermé, fermé ;

- réaliser un test de cohérence de la mesure effectuée par le dispositif en fonction de la première tension de détection (VC_minus) et de la deuxième tension de détection (VC_plus), mesurées par le dispositif, et de la tension de batterie (VB), dont la valeur est disponible quelles que soient les mesures du dispositif (1) ;

- vérifier la présence et mesurer l'amplitude d'une première oscillation (ΔVC_minus) de la première tension de détection (VC_minus) autour de sa valeur à l'état stable, tandis que le premier commutateur de modulation (SW1) effectue une commutation entre l'ouverture et la fermeture, et, de plus, vérifier la présence et mesurer l'amplitude d'une deuxième oscillation (ΔVC_plus) de la deuxième tension de détection (VC_plus) autour de sa valeur à l'état stable, tandis que le deuxième commutateur de modulation (SW2) effectue une commutation entre l'ouverture et la fermeture ;

- réaliser un diagnostic du fonctionnement du premier circuit de mesure et du deuxième circuit de mesure du dispositif, en fonction de mesures de la première tension de détection (VC_minus), de la deuxième tension de détection (VC_plus), de l'amplitude de la première oscillation (ΔVC_minus) et de l'amplitude de la deuxième oscillation (ΔVC_plus).

19. Procédé d'auto-diagnostic selon la revendication 18, dans lequel le dispositif est selon la revendication 2, et dans lequel le procédé comprend, avant l'étape de réalisation d'un diagnostic du fonctionnement du premier groupe résistance-commutateur (13), l'étape supplémentaire consistant à :

- réaliser un diagnostic du fonctionnement des commutateurs de dispositif (M_minus, M_plus), en fonction de la première tension de détection (VC_minus) et de la deuxième tension de détection (VC_plus), mesurées par le dispositif dans une condition de commutateurs de dispositif (M_minus, M_plus) fermés.

20. Procédé d'auto-diagnostic selon la revendication 18, dans lequel l'étape de réalisation d'un diagnostic du fonctionnement des groupes résistance-commutateur comprend la mesure de la première (VC_minus) et de la deuxième tension de détection (VC_plus), dans des conditions dans lesquelles le premier commutateur d'entrée de résistance d'échantillonnage (S_minus) et le deuxième commutateur d'entrée de résistance d'échantillonnage (S_plus) sont respectivement mis dans les conditions suivantes : ouvert, ouvert ; fermé, ouvert ; ouvert, fermé ; fermé, fermé.

21. Procédé d'auto-diagnostic selon la revendication 20, dans lequel l'étape de réalisation d'un diagnostic du fonctionnement des groupes résistance-commutateur (13, 14) comprend :

- un premier test comprenant l'ouverture du premier commutateur d'entrée de résistance d'échantillonnage (S_minus) et du deuxième commutateur d'entrée de résistance d'échantillonnage (S_plus), la mesure de la première (VC_minus) et de la deuxième tension de détection (VC_plus), la comparaison de la valeur absolue de la différence entre lesdites première et deuxième tensions de détection à un premier seuil (THR0), et la détermination d'un résultat positif du premier test si ladite valeur absolue de la différence est inférieure au premier seuil (THR0) ;

- un deuxième test comprenant la fermeture du premier commutateur d'entrée de résistance d'échantillonnage (S_minus) et l'ouverture du deuxième commutateur d'entrée de résistance d'échantillonnage (S_plus), la mesure de la première (VC_minus) et de la deuxième tension de détection (VC_plus), la comparaison de la différence entre la deuxième tension de détection (VC_plus) et la première tension de détection (VC_minus) à un deuxième seuil (THR1), et la détermination d'un résultat positif du deuxième test si ladite différence est supérieure au deuxième seuil (THR1) ;

- un troisième test comprenant l'ouverture du premier commutateur d'entrée de résistance d'échantillonnage (S_minus) et la fermeture du deuxième commutateur d'entrée de résistance d'échantillonnage (S_plus), la mesure de la première (VC_minus) et de la deuxième tension de détection (VC_plus), la comparaison de la différence entre la première tension de détection (VC_minus) et la deuxième tension de détection (VC_plus) audit deuxième seuil (THR1), et la détermination d'un résultat positif du troisième test si ladite différence est supérieure au deuxième seuil (THR1) ;

- un quatrième test comprenant la fermeture du premier commutateur d'entrée de résistance d'échantillonnage (S_minus) et du deuxième commutateur d'entrée de résistance d'échantillonnage (S_plus), la mesure de la première (VC_minus) et de la deuxième tension de détection (VC_plus), la comparaison de la valeur absolue de la différence entre lesdites première et deuxième tensions de détection à un troisième seuil (THR2), et la détermination d'un résultat positif du quatrième test si ladite valeur absolue de la différence est inférieure au troisième seuil (THR2) ;

- le diagnostic d'un fonctionnement correct des groupes résistance-commutateur si lesdits premier, deuxième, troisième et quatrième tests produisent tous un résultat positif.

22. Procédé d'auto-diagnostic selon la revendication 21, dans lequel ledit premier test comprend de plus la comparaison de la valeur absolue de la différence entre lesdites première et deuxième tensions de détection à un seuil d'étalonnage (THRc) pour déterminer une première ou une deuxième valeur pour le deuxième seuil (THR1) et une premier ou une deuxième valeur pour le troisième seuil (THR2), en fonction du fait que ladite valeur absolue de la différence est supérieure ou inférieure au seuil d'étalonnage (THRc).

23. Procédé d'auto-diagnostic selon la revendication 18, dans lequel l'étape de réalisation d'un test de cohérence de la mesure effectuée par le dispositif comprend :

- le calcul de la somme de la première tension de détection (VC_minus) et de la deuxième tension de détection (VC_plus) ;

- la mémorisation de la différence entre les tensions positive (V_plus) et négative (V_minus) de la batterie, en fonction de la tension de batterie (V_B) qui est connue quelles que soient les mesures du dispositif ;

- le calcul d'une valeur de comparaison, par la pondération de ladite différence entre les tensions de batterie avec un facteur (A) en fonction des paramètres électriques du dispositif ;

- la détermination d'un résultat positif du test de cohérence si ladite somme de la première tension de détection (VC_minus) et de la deuxième tension de détection (VC_plus) diffère de ladite valeur de comparaison de moins d'une quantité prédéfinie.

24. Procédé d'auto-diagnostic selon la revendication 18, dans lequel l'étape de vérification de la présence et de mesure de l'amplitude d'une première et d'une deuxième oscillations comprend :

- la commutation du premier commutateur de modulation (SW1) entre l'ouverture et la fermeture, par le premier signal d'attaque ;

- la mesure de la première valeur maximale de tension de détection (VC_minus-MAX) et de la première valeur minimale de tension de détection (VC_minus-MIN), et le calcul de la différence entre lesdites valeur maximale et valeur minimale de première tension de détection de façon à déterminer la première amplitude d'oscillation (ΔVC_minus) ;

- la commutation du deuxième commutateur de modulation (SW2) entre l'ouverture et la fermeture, par le deuxième signal d'attaque ;

- la mesure de la deuxième valeur maximale de tension de détection (VC_plus-MAX) et de la deuxième valeur minimale de tension de détection (VC_plus-MIN), et le calcul de la différence entre lesdites valeur maximale et valeur minimale de deuxième tension de détection de façon à déterminer la deuxième amplitude d'oscillation (ΔVC_plus) ;

- la vérification du fait que la première amplitude d'oscillation (ΔVC_minus) reste à l'intérieur d'une plage prédéfinie de valeurs acceptables, en fonction de la première tension de détection (VC_minus) ;

- la vérification du fait que la deuxième amplitude d'oscillation (ΔVC_plus) reste à l'intérieur d'une plage prédéfinie de valeurs acceptables, en fonction de la deuxième tension de détection (VC_plus).

25. Procédé d'auto-diagnostic selon la revendication 18, dans lequel l'étape de réalisation d'un diagnostic du fonctionnement des premier (15) et deuxième (16) circuits de mesure comprend :

- l'identification d'un premier groupe de défauts possibles du premier circuit de mesure (15) si la première tension de détection (VC_minus) est inférieure à un seuil bas (VTHRL) ;

- l'identification d'un deuxième groupe de défauts possibles du premier circuit de mesure (15) si la première tension de détection (VC_minus) est supérieure à un premier seuil haut (VTHR-H1) ;

- l'identification d'un troisième groupe de défauts possibles du premier circuit de mesure (15) si l'amplitude de la première oscillation (ΔVC_minus) est inférieure à un seuil bas (VTHRL) ;

- l'identification d'un quatrième groupe de défauts possibles du premier circuit de mesure (15) si l'amplitude de la première oscillation (ΔVC_minus) est supérieure à un deuxième seuil haut (VTHR-H2) ;

- l'identification d'un premier groupe de défauts possibles du deuxième circuit de mesure (16) si la deuxième tension de détection (VC_plus) est inférieure à un seuil bas (VTHRL) ;

- l'identification d'un deuxième groupe de défauts possibles du deuxième circuit de mesure (16) si la deuxième tension de détection (VC_plus) est supérieure à un troisième seuil haut (VTHR-H3) ;

- l'identification d'un troisième groupe de défauts possibles du deuxième circuit de mesure (16) si l'amplitude de la deuxième oscillation (ΔVC_plus) est inférieure à un seuil bas (VTHRL) ;

- l'identification d'un quatrième groupe de défauts possibles du deuxième circuit de mesure (16) si l'amplitude de la deuxième oscillation (ΔVC_plus) est supérieure à un quatrième seuil haut (VTHR-H4) ;

- la détermination d'un fonctionnement correct du premier (15) et du deuxième (16) circuits de mesure, si, en résultat des étapes d'identification précédentes, aucun défaut n'est identifié.

Drawing