EP 0346819 A3 19911127 - METHOD AND APPARATUS FOR THE CONTACTLESS MEASURING AND OPTIONALLY MACHINING OF SURFACES
Title (en)
METHOD AND APPARATUS FOR THE CONTACTLESS MEASURING AND OPTIONALLY MACHINING OF SURFACES
Publication
Application
Priority
DE 3820225 A 19880614
Abstract (en)
[origin: JPH02118407A] PURPOSE: To achieve the non-contact measuring method of a surface for measuring an arbitrarily formed surface accurately and inexpensively by measuring the interval of a reference contour from the measurement range of the surface while measuring it by an interferometer and determining each different between a measurement value and a target value. CONSTITUTION: First, the reference contour of at least one reference element essentially corresponding to the measurement range of a surface is measured by an interferometer regarding a known standard contour where an external form is known within the allowable range of the surface. Then, a surface to be measured is moved to a position that is limited in terms of space regarding a reference element. Then, the interval of the reference contour from the measurement range of the surface is measured while being increased from the interferometer and each difference between a measurement value and a target value is determined, thus measuring the actually measured contour of the work surface and at the same time controlling a machining tool during process until a desired target contour is obtained in some cases.
IPC 1-7
IPC 8 full level
G01B 11/24 (2006.01); B24B 13/015 (2006.01); B24B 49/04 (2006.01)
CPC (source: EP US)
B24B 13/015 (2013.01 - EP US); B24B 49/04 (2013.01 - EP US)
Citation (search report)
- [A] GB 2175687 A 19861203 - SUHL FEINMESSZEUGFAB VEB
- [A] FR 2448417 A1 19800905 - INST KOSM I [SU]
- [A] MESSTECHNIK, Band 81, Nr. 1, Januar 1973, Seiten 23-30, München, DE; K. ECKOLT et al.: "Verfahren zur Ebenheitsmessung"
Designated contracting state (EPC)
CH DE FR GB LI
DOCDB simple family (publication)
DE 3820225 C1 19890713; EP 0346819 A2 19891220; EP 0346819 A3 19911127; JP H02118407 A 19900502; US 5067282 A 19911126
DOCDB simple family (application)
DE 3820225 A 19880614; EP 89110657 A 19890613; JP 15353289 A 19890614; US 62564090 A 19901207