EP 1264190 A1 20021211 - CIRCUIT AND METHOD FOR EVALUATING CAPACITORS IN MATRICES
Title (en)
CIRCUIT AND METHOD FOR EVALUATING CAPACITORS IN MATRICES
Title (de)
SCHALTUNGSANORDNUNG UND VERFAHREN ZUM BEWERTEN VON KAPAZITÄTEN IN MATRIZEN
Title (fr)
ENSEMBLE DE CIRCUITS ET PROCEDE POUR EVALUER DES CONDENSATEURS DANS DES MATRICES
Publication
Application
Priority
- DE 0100626 W 20010216
- DE 10010888 A 20000306
Abstract (en)
[origin: DE10010888A1] The capacitance evaluation circuit has a test path (2) coupled to one electrode of each capacitance (Cchar) to be measured, for providing 2 different potentials (V1,V2) and a measuring path (3) coupled to the other electrode of the capacitance, having 2 parallel arms coupled to a common potential (V0), one of which contains a measuring instrument for evaluation of the capacitance. A control device allows each individual capacitance to be measured to be coupled to the 2 different potentials, using integrated switching transistors (T5,T6,T7,T8), using signals provided by an address decoder (10,11).
IPC 1-7
IPC 8 full level
G11C 7/06 (2006.01); G11C 11/405 (2006.01); G11C 11/4091 (2006.01)
CPC (source: EP KR US)
G01R 27/26 (2013.01 - KR); G11C 7/06 (2013.01 - EP US); G11C 11/405 (2013.01 - EP US); G11C 11/4091 (2013.01 - EP US); G11C 2207/063 (2013.01 - EP US)
Citation (search report)
See references of WO 0167119A1
Designated contracting state (EPC)
AT BE FR IT
DOCDB simple family (publication)
DE 10010888 A1 20010927; DE 10010888 B4 20040212; EP 1264190 A1 20021211; KR 20030009381 A 20030129; US 2003062905 A1 20030403; US 6870373 B2 20050322; WO 0167119 A1 20010913
DOCDB simple family (application)
DE 10010888 A 20000306; DE 0100626 W 20010216; EP 01913677 A 20010216; KR 20027011686 A 20020906; US 23688902 A 20020906