EP 1634089 A1 20060315 - DELAY-FAULT TESTING METHOD, RELATED SYSTEM AND CIRCUIT
Title (en)
DELAY-FAULT TESTING METHOD, RELATED SYSTEM AND CIRCUIT
Title (de)
VERZÖGERUNGSFEHLER-TESTVERFAHREN, ZUGEHÖRIGES SYSTEM UND SCHALTUNG
Title (fr)
PROCEDE, SYSTEME ET CIRCUIT DE CONTROLE D'ERREURS DE RETARD
Publication
Application
Priority
- IB 2004001750 W 20040528
- US 47523903 P 20030603
Abstract (en)
[origin: WO2004106958A1] A testing approach involves selective application of clock signals to target circuitry. In an example embodiment (300), a target circuit (332) having logic circuitry that processes data in response to an operational clock signal (308) having at least one clock period, is analyzed for delay faults. Test signals are applied to the logic circuitry while the logic circuitry is clocked with a high-speed test clock (309) having several clock-state transitions that occur during at least one clock period of the operational clock (308). An output from the logic circuitry is analyzed for its state (e.g., as affected by delay in the circuitry). Delay faults are detected as a difference in state of the output of the logic circuitry. With this approach, circuits are tested using conventional testers (340) that operate at normal (e.g., slow) speeds while selectively clocking selected portions of the circuit at higher speeds for detecting speed-related faults therein.
IPC 1-7
IPC 8 full level
G01R 31/3185 (2006.01); G01R 31/3193 (2006.01)
CPC (source: EP KR)
G01R 31/3185 (2013.01 - KR); G01R 31/31858 (2013.01 - EP); G01R 31/3193 (2013.01 - KR); G01R 31/31937 (2013.01 - EP)
Citation (search report)
See references of WO 2004106958A1
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR
DOCDB simple family (publication)
WO 2004106958 A1 20041209; CN 1798980 A 20060705; EP 1634089 A1 20060315; KR 20060019565 A 20060303; TW 200508637 A 20050301
DOCDB simple family (application)
IB 2004001750 W 20040528; CN 200480015397 A 20040528; EP 04735277 A 20040528; KR 20057023159 A 20051202; TW 93115538 A 20040531