EP 2009667 A4 20110302 - METHOD FOR MANUFACTURING SEALING PANEL AND PLASMA DISPLAY PANEL
Title (en)
METHOD FOR MANUFACTURING SEALING PANEL AND PLASMA DISPLAY PANEL
Title (de)
VERFAHREN ZUR HERSTELLUNG EINES ABGEDICHTETEN SCHIRMS UND PLASMAANZEIGESCHIRM
Title (fr)
PROCEDE DE FABRICATION DE PANNEAU DE SCELLEMENT ET ECRAN PLASMA
Publication
Application
Priority
- JP 2007057561 W 20070404
- JP 2006107547 A 20060410
Abstract (en)
[origin: EP2009667A1] A sealing panel (100) that can suppress a rise in discharge voltage is provided. The sealing panel (100) includes a resin material-containing sealing material (20) disposed on the whole periphery in a part between a pair of substrates (1, 2), wherein a getter (22), which adsorbs an impurity gas released from the sealing material (20) and an impurity gas passing through the sealing material (20), is formed continuously or intermittently along the inner periphery of the sealing material (20). Further, an ultraviolet shielding wall (24) for preventing ultraviolet light generated within the sealing panel (100) from being incident to the sealing material (20) is formed continuously along the inner periphery of the sealing material (20).
IPC 8 full level
H01J 17/24 (2006.01); H01J 5/20 (2006.01); H01J 7/18 (2006.01); H01J 9/02 (2006.01); H01J 9/24 (2006.01); H01J 9/26 (2006.01); H01J 11/24 (2012.01); H01J 11/36 (2012.01); H01J 11/46 (2012.01); H01J 11/48 (2012.01); H01J 11/52 (2012.01); H01J 17/18 (2006.01); H01J 17/49 (2006.01)
CPC (source: EP KR)
H01J 9/261 (2013.01 - EP); H01J 9/39 (2013.01 - KR); H01J 11/12 (2013.01 - EP); H01J 11/48 (2013.01 - KR); H01J 11/52 (2013.01 - EP KR)
Citation (search report)
- [A] WO 2006033380 A1 20060330 - ASAHI GLASS CO LTD [JP], et al
- [A] JP 2003281994 A 20031003 - FUJITSU LTD
- [A] US 2005099124 A1 20050512 - CHEN PO-CHENG [TW], et al
- [A] DATABASE INSPEC [online] THE INSTITUTION OF ELECTRICAL ENGINEERS, STEVENAGE, GB; December 2002 (2002-12-01), GEON-HO HWANG ET AL: "Physical properties of barrier ribs of plasma display panels. I. Formation of pores during sintering of lead borosilicate glass frits", XP002616088, Database accession no. 7695689 & JOURNAL OF THE AMERICAN CERAMIC SOCIETY AMERICAN CERAMIC SOC. USA, vol. 85, no. 12, 1 December 2002 (2002-12-01), pages 2956 - 2960, XP002616263, ISSN: 0002-7820
- See references of WO 2007119676A1
Designated contracting state (EPC)
IT
DOCDB simple family (publication)
EP 2009667 A1 20081231; EP 2009667 A4 20110302; EP 2009667 B1 20120613; CN 101421813 A 20090429; CN 101421813 B 20120530; JP 2007280838 A 20071025; JP 4787054 B2 20111005; KR 101042036 B1 20110616; KR 20080110612 A 20081218; KR 20100116716 A 20101101; RU 2008139894 A 20100420; RU 2395863 C2 20100727; WO 2007119676 A1 20071025
DOCDB simple family (application)
EP 07740997 A 20070404; CN 200780012717 A 20070404; JP 2006107547 A 20060410; JP 2007057561 W 20070404; KR 20087024645 A 20070404; KR 20107023382 A 20070404; RU 2008139894 A 20070404