Global Patent Index - EP 2054732 A1

EP 2054732 A1 20090506 - METHOD FOR TESTING THE CURRENT FLOW THROUGH SINGLE WIRES OF A LITZ WIRE, AND APPARATUS FOR CARRYING OUT SAID METHOD

Title (en)

METHOD FOR TESTING THE CURRENT FLOW THROUGH SINGLE WIRES OF A LITZ WIRE, AND APPARATUS FOR CARRYING OUT SAID METHOD

Title (de)

VERFAHREN ZUR ÜBERPRÜFUNG DES STROMFLUSSES DURCH EINZELDRÄHTE EINES LITZENDRAHTES SOWIE VORRICHTUNG ZUR DURCHFÜHRUNG DES VERFAHRENS

Title (fr)

PROCÉDÉ DE VÉRIFICATION DE LA CONDUCTION DE COURANT AU TRAVERS DES BRINS D'UN FIL TORSADÉ, ET DISPOSITIF DE MISE EN UVRE DU PROCÉDÉ

Publication

EP 2054732 A1 20090506 (DE)

Application

EP 08759306 A 20080620

Priority

  • EP 2008004985 W 20080620
  • DE 102007028965 A 20070623

Abstract (en)

[origin: WO2009000469A1] In order to be able to safely and reliably detect a defective point with great responsiveness in a litz wire (4) composed of several single wires (12), an electrical current (I) is conducted through the litz wire (4), and a sensor (22) detects and evaluates the magnetic field generated as a result of the current flowing through the litz wire (4). A defective point is recognized if the length (A) of an oscillation of the measured magnetic field (B) is a multiple of a length of lay (L) of the litz wire (4) and especially matches the length of lay (L). Said method is especially also used for nondestructively testing the quality of a contacting connection (6) of a contact element (8) to the litz wire (4).

IPC 8 full level

G01R 31/02 (2006.01)

CPC (source: EP US)

G01R 31/58 (2020.01 - EP US); D07B 1/145 (2013.01 - EP US); G01R 31/083 (2013.01 - EP US)

Citation (search report)

See references of WO 2009000469A1

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR

Designated extension state (EPC)

AL BA MK RS

DOCDB simple family (publication)

DE 102007028965 A1 20081224; CN 101542301 A 20090923; CN 101542301 B 20110831; EP 2054732 A1 20090506; JP 2010532651 A 20101007; JP 5285068 B2 20130911; US 2009219031 A1 20090903; US 8058881 B2 20111115; WO 2009000469 A1 20081231

DOCDB simple family (application)

DE 102007028965 A 20070623; CN 200880000736 A 20080620; EP 08759306 A 20080620; EP 2008004985 W 20080620; JP 2010512603 A 20080620; US 40446709 A 20090316