Global Patent Index - EP 2340442 A1

EP 2340442 A1 20110706 - MEASUREMENT ARRANGEMENT HAVING A CALIBRATION SUBSTRATE AND ELECTRONIC CIRCUIT

Title (en)

MEASUREMENT ARRANGEMENT HAVING A CALIBRATION SUBSTRATE AND ELECTRONIC CIRCUIT

Title (de)

MESSANORDNUNG MIT KALIBRIERSUBSTRAT UND ELEKTRONISCHER SCHALTUNG

Title (fr)

SYSTÈME DE MESURE MUNI D UN SUBSTRAT D ÉTALONNAGE ET D UNE COMMANDE ÉLECTRONIQUE

Publication

EP 2340442 A1 20110706 (DE)

Application

EP 09778770 A 20090929

Priority

  • EP 2009007009 W 20090929
  • DE 202008013687 U 20081015

Abstract (en)

[origin: CA2738716A1] The invention relates to a calibration substrate (100) having at least one calibration standard (12, 14, 16; 102, 104, 108) comprising at least two electrical connection points, each for one measurement gate (38, 42) of a vector network analyzer (40). According to the invention, at least one electrical connection point is formed of at least one calibration standard (12, 14, 16; 102, 104, 108) having a switch (20, 22, 24), wherein the switch (20, 22, 24) comprises a first electrical contact (30) electrically connected to an electrical connection point of the calibration standard (12, 14, 16; 102, 104, 108), a second electrical contact (32) designed for electrically connecting to a measurement gate (38, 42) of the vector network analyzer (40), and a third electrical contact (34), wherein the switch (20, 22, 24) is designed such that an electrical contact is established either between the first and third electrical contact (30, 34) or between the first and second electrical contact (30, 32).

IPC 8 full level

G01R 35/00 (2006.01); G01R 27/28 (2006.01)

CPC (source: EP KR US)

G01D 18/00 (2013.01 - US); G01R 1/0416 (2013.01 - US); G01R 27/28 (2013.01 - KR); G01R 27/32 (2013.01 - EP US); G01R 31/00 (2013.01 - US); G01R 31/28 (2013.01 - KR); G01R 35/00 (2013.01 - KR); G01R 35/005 (2013.01 - EP US)

Citation (search report)

See references of WO 2010043309A1

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

Designated extension state (EPC)

AL BA RS

DOCDB simple family (publication)

DE 202008013687 U1 20090102; CA 2738716 A1 20100422; CN 102187243 A 20110914; CN 102187243 B 20130821; EP 2340442 A1 20110706; HK 1158758 A1 20120720; KR 101246363 B1 20130322; KR 20110070902 A 20110624; US 2011254536 A1 20111020; US 2014300380 A1 20141009; US 8791705 B2 20140729; US 9470713 B2 20161018; WO 2010043309 A1 20100422

DOCDB simple family (application)

DE 202008013687 U 20081015; CA 2738716 A 20090929; CN 200980141121 A 20090929; EP 09778770 A 20090929; EP 2009007009 W 20090929; HK 11112859 A 20111128; KR 20117010790 A 20090929; US 200913123114 A 20090929; US 201414310505 A 20140620