EP 4127686 A1 20230208 - NEW TYPE OF DEVICE(S) FOR AUTOMATICALLY MONITORING A COATING AND/OR STRUCTURE APPLIED TO A SUBSTRATE WITH DETERMINATION OF REFLECTION PROPERTIES AND/OR GEOMETRIC DIMENSIONS, AND A CORRESPONDING METHOD
Title (en)
NEW TYPE OF DEVICE(S) FOR AUTOMATICALLY MONITORING A COATING AND/OR STRUCTURE APPLIED TO A SUBSTRATE WITH DETERMINATION OF REFLECTION PROPERTIES AND/OR GEOMETRIC DIMENSIONS, AND A CORRESPONDING METHOD
Title (de)
NEUARTIGE VORRICHTUNG/EN ZUM AUTOMATISCHEN ÜBERWACHEN EINER AUF EINEM SUBSTRAT AUFGEBRACHTEN BESCHICHTUNG UND/ODER STRUKTUR MIT ERMITTLUNG VON REFLEXIONSEIGENSCHAFTEN UND/ODER GEOMETRISCHEN ABMESSUNGEN SOWIE EIN ENTSPRECHENDES VERFAHREN
Title (fr)
NOUVEAU TYPE DE DISPOSITIF(S) DESTINÉ(S) À CONTRÔLER AUTOMATIQUEMENT UN REVÊTEMENT ET/OU UNE STRUCTURE APPLIQUÉE À UN SUBSTRAT À DÉTERMINATION DE PROPRIÉTÉS DE RÉFLEXION ET/OU DE DIMENSIONS GÉOMÉTRIQUES, ET PROCÉDÉ CORRESPONDANT
Publication
Application
Priority
- DE 102020203850 A 20200325
- EP 2021057774 W 20210325
Abstract (en)
[origin: WO2021191363A1] The present invention relates, for example, to a material application and analysis apparatus (8). The material application and analysis apparatus (8) according to the invention preferably has at least one analysis apparatus (1) according to one of claims 1 to 8. The material application and analysis apparatus (8) further has a material application element (10, 12) for applying the second material application (6) onto a substrate (2) on which the first material application (4) has been provided, at least in some sections, wherein: the material application apparatus (10, 12) is arranged between the first radiation source and detection apparatus assembly (41) and the second radiation source and detection apparatus assembly (42); the first material application (4) is detected by means of the first radiation source and detection apparatus assembly (41) and the second material application (6) is detected by means of the second radiation source and detection apparatus assembly (42); the first image data are processed and the second image data are processed; the first processed image data are evaluated with respect to the physical parameter and the second processed image data are evaluated with respect to the geometric parameter.
IPC 8 full level
G01N 21/956 (2006.01); B05C 11/10 (2006.01); G01B 11/25 (2006.01)
CPC (source: EP US)
G01B 11/00 (2013.01 - EP); G01B 11/02 (2013.01 - EP); G01B 11/25 (2013.01 - EP US); G01N 21/17 (2013.01 - US); G01N 21/41 (2013.01 - US); G01N 21/55 (2013.01 - US); G01N 21/8851 (2013.01 - US); G01N 21/956 (2013.01 - EP); B05C 5/0216 (2013.01 - EP); B05C 11/1005 (2013.01 - EP); G01N 21/8851 (2013.01 - EP); G01N 2021/1765 (2013.01 - US); G01N 2021/4153 (2013.01 - US); G01N 2021/8427 (2013.01 - EP); G01N 2021/8438 (2013.01 - EP); G01N 2021/8887 (2013.01 - US)
Citation (search report)
See references of WO 2021191363A1
Designated contracting state (EPC)
AL AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO RS SE SI SK SM TR
Designated extension state (EPC)
BA ME
Designated validation state (EPC)
KH MA MD TN
DOCDB simple family (publication)
DE 102020203850 A1 20210930; CN 115867792 A 20230328; EP 4127686 A1 20230208; US 2023349692 A1 20231102; WO 2021191363 A1 20210930
DOCDB simple family (application)
DE 102020203850 A 20200325; CN 202180037001 A 20210325; EP 2021057774 W 20210325; EP 21720998 A 20210325; US 202117914284 A 20210325